JPH0742137Y2 - プローブ装置 - Google Patents

プローブ装置

Info

Publication number
JPH0742137Y2
JPH0742137Y2 JP2036890U JP2036890U JPH0742137Y2 JP H0742137 Y2 JPH0742137 Y2 JP H0742137Y2 JP 2036890 U JP2036890 U JP 2036890U JP 2036890 U JP2036890 U JP 2036890U JP H0742137 Y2 JPH0742137 Y2 JP H0742137Y2
Authority
JP
Japan
Prior art keywords
connector
probe
measurement
cable
measurement cable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2036890U
Other languages
English (en)
Japanese (ja)
Other versions
JPH03110371U (en, 2012
Inventor
憲一朗 ▲はが▼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP2036890U priority Critical patent/JPH0742137Y2/ja
Publication of JPH03110371U publication Critical patent/JPH03110371U/ja
Application granted granted Critical
Publication of JPH0742137Y2 publication Critical patent/JPH0742137Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
JP2036890U 1990-02-28 1990-02-28 プローブ装置 Expired - Lifetime JPH0742137Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2036890U JPH0742137Y2 (ja) 1990-02-28 1990-02-28 プローブ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2036890U JPH0742137Y2 (ja) 1990-02-28 1990-02-28 プローブ装置

Publications (2)

Publication Number Publication Date
JPH03110371U JPH03110371U (en, 2012) 1991-11-12
JPH0742137Y2 true JPH0742137Y2 (ja) 1995-09-27

Family

ID=31523458

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2036890U Expired - Lifetime JPH0742137Y2 (ja) 1990-02-28 1990-02-28 プローブ装置

Country Status (1)

Country Link
JP (1) JPH0742137Y2 (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8513956B2 (en) * 2010-07-26 2013-08-20 Mettler-Toledo Thornton, Inc. Calibration of conductivity measurement system

Also Published As

Publication number Publication date
JPH03110371U (en, 2012) 1991-11-12

Similar Documents

Publication Publication Date Title
US4783625A (en) Wideband high impedance card mountable probe
US6276956B1 (en) Dual point test probe for surface mount type circuit board connections
US4962359A (en) Dual directional bridge and balun used as reflectometer test set
US7634370B2 (en) Waveform input circuit, waveform observation unit and semiconductor test apparatus
JPH0742137Y2 (ja) プローブ装置
JPH1183934A (ja) 半導体試験装置
JPH1090340A (ja) Rf回路の非破壊検査のためのシステムおよび方法
JPS54156479A (en) Test unit for integrated circuit device
US5966015A (en) Test fixture for circuit component
AU2398800A (en) Dual-pin probe for testing circuit boards
JP3660758B2 (ja) プリント基板
JPH07140202A (ja) 信号入力装置
JPH03205843A (ja) プローブ装置
JPS6221065A (ja) スプリング・コンタクト式プロ−ブ
JP3544845B2 (ja) 回路基板、無線通信装置
JPH06138144A (ja) 高周波回路用プローブ
JPH1082827A (ja) Ic評価治具
JPH04299548A (ja) 半導体測定装置
JPH0635189Y2 (ja) 高周波プローブ
JPH095461A (ja) 測定用信号の伝播遅延時間測定回路
JPS633234Y2 (en, 2012)
JPH05256900A (ja) Lsiテスタ
EP0257833A2 (en) Wideband high impedance card-mountable probe
JPH03226683A (ja) Lsi試験方法
JPH06102314A (ja) 半導体検査装置