JPH0729637Y2 - 半導体素子測定用治具 - Google Patents

半導体素子測定用治具

Info

Publication number
JPH0729637Y2
JPH0729637Y2 JP1987069228U JP6922887U JPH0729637Y2 JP H0729637 Y2 JPH0729637 Y2 JP H0729637Y2 JP 1987069228 U JP1987069228 U JP 1987069228U JP 6922887 U JP6922887 U JP 6922887U JP H0729637 Y2 JPH0729637 Y2 JP H0729637Y2
Authority
JP
Japan
Prior art keywords
tape
chip
wafer ring
wafer
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987069228U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63178333U (OSRAM
Inventor
勝規 西口
充明 藤平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP1987069228U priority Critical patent/JPH0729637Y2/ja
Publication of JPS63178333U publication Critical patent/JPS63178333U/ja
Application granted granted Critical
Publication of JPH0729637Y2 publication Critical patent/JPH0729637Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1987069228U 1987-05-09 1987-05-09 半導体素子測定用治具 Expired - Lifetime JPH0729637Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987069228U JPH0729637Y2 (ja) 1987-05-09 1987-05-09 半導体素子測定用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987069228U JPH0729637Y2 (ja) 1987-05-09 1987-05-09 半導体素子測定用治具

Publications (2)

Publication Number Publication Date
JPS63178333U JPS63178333U (OSRAM) 1988-11-18
JPH0729637Y2 true JPH0729637Y2 (ja) 1995-07-05

Family

ID=30909767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987069228U Expired - Lifetime JPH0729637Y2 (ja) 1987-05-09 1987-05-09 半導体素子測定用治具

Country Status (1)

Country Link
JP (1) JPH0729637Y2 (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5243101B2 (ja) * 2008-05-14 2013-07-24 株式会社ディスコ 破断装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5378173A (en) * 1976-12-22 1978-07-11 Toshiba Corp Manufacture of semiconductor device
JPS5478080A (en) * 1977-12-05 1979-06-21 Toshiba Corp Production of semiconductor element
JPS5483774A (en) * 1977-12-16 1979-07-04 Nec Corp Manufacture of semiconductor device
JPS59130437A (ja) * 1983-01-17 1984-07-27 Nec Home Electronics Ltd 半導体装置の選別方法
JPS61187247A (ja) * 1985-02-14 1986-08-20 Nec Kansai Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
JPS63178333U (OSRAM) 1988-11-18

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