JPH07263489A - Tab tape and semiconductor device using the same tape - Google Patents

Tab tape and semiconductor device using the same tape

Info

Publication number
JPH07263489A
JPH07263489A JP6079451A JP7945194A JPH07263489A JP H07263489 A JPH07263489 A JP H07263489A JP 6079451 A JP6079451 A JP 6079451A JP 7945194 A JP7945194 A JP 7945194A JP H07263489 A JPH07263489 A JP H07263489A
Authority
JP
Japan
Prior art keywords
lead
leads
glass
tab tape
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6079451A
Other languages
Japanese (ja)
Inventor
Hirotaka Ueda
弘孝 上田
Tetsuyuki Hirashima
哲之 平島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui High Tec Inc
Original Assignee
Mitsui High Tec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui High Tec Inc filed Critical Mitsui High Tec Inc
Priority to JP6079451A priority Critical patent/JPH07263489A/en
Publication of JPH07263489A publication Critical patent/JPH07263489A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To obtain a TAB tape in which multiple pins are not lead-deformed or not displaced by providing burning glass in a string or band state in a lead cross-sectional direction at an intermediate parts of inner leads, and forming a lead coupling zone. CONSTITUTION:Burning glass 11 provided at an intermediate part of inner leads 7 is, for example, low melting point glass, provided in a string or band state in a lead cross-sectional direction, an incoming pitch is maintained between the leads, the leads 7 are coupled and fixed. The glass 11 may be formed slightly higher than a lead surface. The glass 11 formed in the cross-sectional direction of the leads 7 performs a role of a dam, resin is introduced between the leads without leakage to seal the leads, and a thin semiconductor device can be formed. Thus, the attitude of the leads can be maintained without deforming and without displacement, and multiple pins can be further increased in number.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はリ−ド変形や変位のない
TABテ−プ及び半導体装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a TAB tape and a semiconductor device without lead deformation or displacement.

【0002】[0002]

【従来の技術】半導体装置は、多ピン化、小型化及び薄
型化を要請されている。この対応の一つとして例えば特
開平3−11641号公報に記載のように、キャリアフ
ィルムに接着した金属箔にインナーリード、アウターリ
ードの微細なリードパターンをエッチングで形成し、当
該キャリアフィルムに穿設しているデバイスホ−ルに設
ける半導体チップ(以下 チップという)と前記インナ
ーリードを接続して樹脂封止し半導体装置を製造するT
ABテ−プがある。
2. Description of the Related Art Semiconductor devices are required to have a large number of pins, a small size, and a thin shape. As one of the measures, for example, as described in JP-A-3-11641, a fine lead pattern of inner leads and outer leads is formed by etching on a metal foil bonded to a carrier film, and the carrier film is perforated. A semiconductor chip (hereinafter, referred to as a chip) provided in a device hole that is being manufactured is connected to the inner lead and resin-sealed to manufacture a semiconductor device.
There is an AB tape.

【0003】[0003]

【この発明が解決しようとする課題】TABテ−プはチ
ップの益々の高密度、高集積化に伴い多ピン化が図ら
れ、例えば400〜600ピンになり、リ−ドが微細と
なっている。当該リ−ドは変形や変位し易く、チップと
の接続や樹脂封止の際に接続不良や断線等の不良を生じ
るおそれが高まっている。
The TAB tape is designed to have a large number of pins as the chip density and density are further increased. For example, the number of pins is 400 to 600, and the lead is fine. There is. The lead is easily deformed or displaced, and there is an increased possibility that a defect such as a connection defect or a wire break will occur during connection with a chip or resin sealing.

【0004】また、TABテ−プによる半導体装置で
は、その信頼性及び長寿命等を図るにはインナーリード
の1本1本にも樹脂を塗布することが重要であるが、リ
−ドに変形や変位を生じさせないようにしなければなら
ない。
Further, in a TAB tape semiconductor device, it is important to apply resin to each inner lead in order to improve its reliability and longevity. Must not occur.

【0005】本発明は、多ピンであってもリ−ドに変形
や変位が生じないTABテ−プを得ることを第1の目的
とし、TABテ−プのインナーリードと搭載したチップ
を接続し樹脂封止した半導体装置において熱応力や多少
の外力では、当該リ−ドは変形や変位せず、また各リ−
ドとも完全に樹脂封止され信頼性が高く長寿命の半導体
装置を得ることを第2の目的とする。
A first object of the present invention is to obtain a TAB tape in which the lead is not deformed or displaced even with a large number of pins, and the inner lead of the TAB tape is connected to the mounted chip. However, in a resin-sealed semiconductor device, the lead is not deformed or displaced by thermal stress or some external force, and each lead is not
A second object is to obtain a semiconductor device which is completely resin-sealed and has high reliability and a long life.

【0006】[0006]

【課題を解決するための手段】本発明の要旨は、デバイ
スホ−ル、スプロケットホ−ル及びアウターリードホ−
ルを形成したキャリアフィルムに、接着された金属箔に
形成した複数のインナ−リ−ドの先端部が前記デバイス
ホ−ル上に突き出て、当該インナーリードと別途設けら
れるチップを電気的に接続するTABテ−プにおいて、
前記デバイスホ−ル上に突き出たインナーリードに焼成
ガラスがリード横断方向に紐状又は帯状に設けられ、イ
ンナーリードを連結しているTABテ−プにある。他の
要旨は、TABテ−プのインナーリードとチップを電気
的に接続し、樹脂封止してなる半導体装置において、前
記インナーリードの中間部にリ−ド横断方向へ焼成ガラ
スを紐状又は帯状に設けてリ−ド連結帯を構成し、該連
結帯の内方を樹脂封止しているTABテ−プを用いた半
導体装置にある。
The gist of the present invention is to provide a device hole, a sprocket hole and an outer lead hole.
The tips of a plurality of inner leads formed on the adhered metal foil are projected on the device hole to the carrier film on which the inner leads are formed to electrically connect the inner leads and a chip separately provided. In TAB tape,
In the TAB tape which connects the inner leads, the inner glass protruding above the device hole is provided with fired glass in a string shape or a band shape in the transverse direction of the leads. Another gist is that in a semiconductor device in which an inner lead of a TAB tape and a chip are electrically connected and resin-sealed, a sintered glass is formed in the middle of the inner lead in the cross direction of the lead in a string shape or There is a semiconductor device using a TAB tape in which a lead connecting band is provided in a band shape and the inside of the connecting band is resin-sealed.

【0007】[0007]

【作用】本発明のTABテ−プは、デバイスホ−ル上へ
突き出たインナーリードは耐熱性にすぐれ熱膨張係数の
小さい焼成ガラスで連結されているので、チップとの電
気的接続やその後の樹脂封止の際に加熱され熱衝撃や外
力を受けるが、当該リ−ドはしっかり保持され変形や位
置ズレを生じない。また、該TABテ−プの取扱いやチ
ップ搭載等においてもリ−ドに形状不良が生じることが
ない。
In the TAB tape of the present invention, the inner leads projecting onto the device hole are connected by the fired glass having excellent heat resistance and a small coefficient of thermal expansion. Although heated at the time of sealing and subjected to thermal shock and external force, the lead is firmly held and is not deformed or displaced. Further, even when the TAB tape is handled or a chip is mounted, a shape defect does not occur in the lead.

【0008】また、本発明の半導体装置は、TABテ−
プのインナーリードとチップを接続し、当該インナーリ
ードを焼成ガラスで連結した内方を樹脂封止しているの
で、該焼成ガラスは封止樹脂のダムとして機能し個々の
微細なリ−ドの間にも樹脂が行きわたり完全に塗布さ
れ、且つ封止厚みを薄くできる。また、当該焼成ガラス
が封止パッケージの最外側に位置し樹脂パッケージの耐
吸水性が強められ、剥離やクラックの発生がなく、信頼
性の優れた半導体装置が得られる。
The semiconductor device of the present invention is a TAB table.
Since the inner lead of the chip is connected to the chip, and the inner side of the inner lead connected with the fired glass is resin-sealed, the fired glass functions as a dam of the sealing resin, and each fine lead The resin is spread evenly between them and is completely applied, and the sealing thickness can be reduced. Further, since the fired glass is located on the outermost side of the sealed package, the water absorption resistance of the resin package is enhanced, and peeling or cracking does not occur, so that a highly reliable semiconductor device can be obtained.

【0009】[0009]

【実施例】本発明について1実施例に基づき図面を参照
し詳細に説明する。図面において、1はキャリアフィル
ムで、デバイスホ−ル2、スプロケットホ−ル3、アウ
ターリードホ−ル4が穿設され、該キャリアフィルム1
に接着した金属箔5例えば銅箔、銅合金箔にリードパタ
ーンが形成される。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail based on one embodiment with reference to the drawings. In the drawing, reference numeral 1 is a carrier film, on which a device hole 2, a sprocket hole 3 and an outer lead hole 4 are provided.
The lead pattern is formed on the metal foil 5 adhered to, for example, a copper foil or a copper alloy foil.

【0010】その形成は、次のようにしてなされる。金
属箔5にフォトレジスト層6を設け、該フォトレジスト
層6にインナーリード7、アウターリード8のリードパ
ターンを焼付け、現像し、その後、エッチングして微細
なリードを形成する。インナーリード7は中間部から先
端にかけてデバイスホ−ル2上に突き出ていて、アウタ
ーリード8は大部分がアウターリードホ−ル4の上に位
置している。なお、テストパッド9とこれに連なるリ−
ドも形成している。10はインナーリード7の先端部下
面に設けられたバンプ10である。
The formation is performed as follows. A photoresist layer 6 is provided on the metal foil 5, and lead patterns of inner leads 7 and outer leads 8 are baked and developed on the photoresist layer 6, and then etched to form fine leads. The inner lead 7 projects from the middle portion to the tip on the device hole 2, and the outer lead 8 is mostly located on the outer lead hole 4. In addition, the test pad 9 and the lead connected to this are
Do also forms. Reference numeral 10 denotes a bump 10 provided on the lower surface of the tip of the inner lead 7.

【0011】11はインナーリード7の中間部に設けら
れた焼成ガラスで例えば低融点ガラスであり、リ−ド横
断方向に紐状又は帯状に設けられ、リ−ド間に入り込み
リードピッチを維持し、且つ当該インナーリード7を連
結し固定している。該焼成ガラス11はリ−ド面より多
少高く形成してもよい。
Reference numeral 11 denotes a fired glass provided in the middle portion of the inner lead 7, which is, for example, a low-melting glass and is provided in a string shape or a belt shape in the transverse direction of the leads and enters between the leads to maintain the lead pitch. The inner leads 7 are connected and fixed. The baked glass 11 may be formed to be slightly higher than the lead surface.

【0012】焼成ガラス11のインナーリード7への付
設は、例えば低融点の結晶化ガラス粉末、有機溶剤、有
機バインダ−を混ぜ合わせペイスト状とし、リ−ドの幅
方向に紐状又は帯状にスクリ−ン印刷法、ディスペンス
法等で塗布する。その後、例えば380〜440℃に加
熱し前記結晶化ガラス粉末を溶融する焼成を行うことで
形成される。
The fired glass 11 is attached to the inner lead 7 by mixing, for example, a low melting point crystallized glass powder, an organic solvent, and an organic binder into a paste shape, and a screen or strip shape in the width direction of the lead. -Apply by a printing method or a dispensing method. After that, for example, the crystallized glass powder is heated to 380 to 440 ° C. and baked to melt the crystallized glass powder.

【0013】TABテ−プに形成したリードパターンは
微細で特にインナーリード7の先端部はピッチが小さ
く、幅も狭く変形し易いが、その中間部を焼成ガラス1
1で連結し固定しているので変形や変位することがな
い。また、該TABテ−プにおいてチップ12との接続
はインナーリード7の先端部下面に設けたバンプ10を
チップ端子に押さえ付け熱圧着法あるいは超音波法等で
なされるが、かかる際にも当該リ−ド7はその姿勢が維
持され接続不良や短絡等を生じない。
The lead pattern formed on the TAB tape is fine, and especially the tip of the inner lead 7 has a small pitch and a narrow width and is easily deformed.
Since they are connected and fixed at 1, they will not be deformed or displaced. Further, in the TAB tape, the connection with the chip 12 is made by pressing the bump 10 provided on the lower surface of the tip of the inner lead 7 against the chip terminal by a thermocompression bonding method or an ultrasonic method. The posture of the lead 7 is maintained, and no connection failure or short circuit occurs.

【0014】TABテ−プにチップ12を搭載し前記リ
−ドと接続した後、当該チップ12とインナーリード7
を図2に示すように樹脂封止13する。この際、インナ
ーリード7の横断方向に設けた焼成ガラス11がダムの
役目を果たし、樹脂がリ−ド間にもれなく入り込み各リ
−ドが封止され且つ薄厚みの半導体装置14とすること
ができる。
After mounting the chip 12 on the TAB tape and connecting it to the lead, the chip 12 and the inner lead 7 are connected.
Is sealed with resin 13 as shown in FIG. At this time, the fired glass 11 provided in the transverse direction of the inner leads 7 serves as a dam, and the resin can be filled in between the leads to seal each lead and form a thin semiconductor device 14. it can.

【0015】[0015]

【発明の効果】本発明のTABテ−プはインナーリード
が焼成ガラスで連結されているので、リ−ドは微細で機
械的強度が微弱であっても補強され、またチップとの接
続時、あるいはその後の樹脂封止時に加熱作用を受けて
も熱応力が生ぜず、当該リ−ドに変形や変位はなくその
姿勢が維持され一層の多ピン化を図ることができる。
In the TAB tape of the present invention, since the inner leads are connected by the sintered glass, the lead is fine and reinforced even if the mechanical strength is weak, and when the lead is connected to the chip, Alternatively, thermal stress does not occur even if a heating action is applied during the subsequent resin sealing, the lead is not deformed or displaced, its posture is maintained, and the number of pins can be further increased.

【0016】本発明の半導体装置はTABテ−プのイン
ナーリードを連結した焼成ガラスが、チップ及びこれと
接続したインナーリードを樹脂封止する際に、ダムにな
りリ−ドの1本1本にもれなく樹脂が流動して塗布され
るとともに、封止厚みを薄くできる。また、封止された
半導体装置は当該パッケージの最外側に焼成ガラスが存
在するので耐吸水性にすぐれ、剥離やクラック等の発生
が著しく低減する。
In the semiconductor device of the present invention, the fired glass to which the inner leads of the TAB tape are connected becomes a dam when the chip and the inner leads connected thereto are resin-sealed, and each lead is lead. The resin can flow and be applied without exception, and the sealing thickness can be reduced. In addition, since the sealed semiconductor device has the baked glass on the outermost side of the package, it has excellent water absorption resistance, and the occurrence of peeling, cracks, etc. is significantly reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の1実施例におけるTABテ−プを示す
図。
FIG. 1 is a diagram showing a TAB tape according to an embodiment of the present invention.

【図2】本発明の1実施例での半導体装置を示す図。FIG. 2 is a diagram showing a semiconductor device according to one embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 キャリアフィルム 2 デバイスホ−ル 3 スプロケットホ−ル 4 アウターリードホ−ル 5 金属箔 6 フォトレジスト層 7 インナーリード 8 アウターリード 9 テストパッド 10 焼成ガラス 11 チップ 12 樹脂封止 13 半導体装置 1 Carrier Film 2 Device Hole 3 Sprocket Hole 4 Outer Lead Hole 5 Metal Foil 6 Photoresist Layer 7 Inner Lead 8 Outer Lead 9 Test Pad 10 Firing Glass 11 Chip 12 Resin Sealing 13 Semiconductor Device

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 デバイスホ−ル、スプロケットホ−ル及
びアウターリードホ−ルを形成したキャリアフィルム
に、接着された金属箔に形成した複数のインナーリード
の先端部が前記デバイスホ−ル上に突き出て、当該イン
ナーリードと別途設けられる半導体チップを電気的に接
続するTABテ−プにおいて、前記インナーリードの中
間部に焼成ガラスがリード横断方向に紐状又は帯状に設
けられ、当該インナーリードを連結していることを特徴
とするTABテ−プ。
1. A carrier film having a device hole, a sprocket hole and an outer lead hole formed thereon, wherein the tip ends of a plurality of inner leads formed on a metal foil adhered to the carrier film are projected onto the device hole. In a TAB tape for electrically connecting the inner lead and a semiconductor chip separately provided, a calcined glass is provided in a cord-like or band-like shape in the middle of the inner lead in a transverse direction of the lead and connects the inner lead. TAB tape that is characterized by.
【請求項2】 TABテ−プのインナーリードと半導体
チップを電気的に接続し、樹脂封止してなる半導体装置
において、前記インナーリードの中間部であってリ−ド
横断方向に設けた焼成ガラスによるリ−ド連結帯より内
方を、樹脂封止していることを特徴とするTABテ−プ
を用いた半導体装置。
2. In a semiconductor device in which an inner lead of a TAB tape and a semiconductor chip are electrically connected and resin-sealed, a firing is provided in an intermediate portion of the inner lead in a transverse direction of the lead. A semiconductor device using a TAB tape, characterized in that the inside of the lead connecting band made of glass is resin-sealed.
JP6079451A 1994-03-25 1994-03-25 Tab tape and semiconductor device using the same tape Pending JPH07263489A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6079451A JPH07263489A (en) 1994-03-25 1994-03-25 Tab tape and semiconductor device using the same tape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6079451A JPH07263489A (en) 1994-03-25 1994-03-25 Tab tape and semiconductor device using the same tape

Publications (1)

Publication Number Publication Date
JPH07263489A true JPH07263489A (en) 1995-10-13

Family

ID=13690252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6079451A Pending JPH07263489A (en) 1994-03-25 1994-03-25 Tab tape and semiconductor device using the same tape

Country Status (1)

Country Link
JP (1) JPH07263489A (en)

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