JPH0725726Y2 - 半導体試験装置のアドレス印加装置 - Google Patents

半導体試験装置のアドレス印加装置

Info

Publication number
JPH0725726Y2
JPH0725726Y2 JP13565788U JP13565788U JPH0725726Y2 JP H0725726 Y2 JPH0725726 Y2 JP H0725726Y2 JP 13565788 U JP13565788 U JP 13565788U JP 13565788 U JP13565788 U JP 13565788U JP H0725726 Y2 JPH0725726 Y2 JP H0725726Y2
Authority
JP
Japan
Prior art keywords
address
refresh
bit
semiconductor test
selection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13565788U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0257078U (OSRAM
Inventor
清 福島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP13565788U priority Critical patent/JPH0725726Y2/ja
Publication of JPH0257078U publication Critical patent/JPH0257078U/ja
Application granted granted Critical
Publication of JPH0725726Y2 publication Critical patent/JPH0725726Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP13565788U 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置 Expired - Lifetime JPH0725726Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13565788U JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13565788U JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Publications (2)

Publication Number Publication Date
JPH0257078U JPH0257078U (OSRAM) 1990-04-25
JPH0725726Y2 true JPH0725726Y2 (ja) 1995-06-07

Family

ID=31395481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13565788U Expired - Lifetime JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Country Status (1)

Country Link
JP (1) JPH0725726Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001338497A (ja) * 2000-05-24 2001-12-07 Fujitsu Ltd メモリ試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001338497A (ja) * 2000-05-24 2001-12-07 Fujitsu Ltd メモリ試験方法

Also Published As

Publication number Publication date
JPH0257078U (OSRAM) 1990-04-25

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