JPH0714873Y2 - Ｘ線回折測定装置 - Google Patents

Ｘ線回折測定装置

Info

Publication number
JPH0714873Y2
JPH0714873Y2 JP1986152600U JP15260086U JPH0714873Y2 JP H0714873 Y2 JPH0714873 Y2 JP H0714873Y2 JP 1986152600 U JP1986152600 U JP 1986152600U JP 15260086 U JP15260086 U JP 15260086U JP H0714873 Y2 JPH0714873 Y2 JP H0714873Y2
Authority
JP
Japan
Prior art keywords
detector
ray
diffraction
sample
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1986152600U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6358740U (enrdf_load_stackoverflow
Inventor
繁 宗川
弘 円山
Original Assignee
理学電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機株式会社 filed Critical 理学電機株式会社
Priority to JP1986152600U priority Critical patent/JPH0714873Y2/ja
Publication of JPS6358740U publication Critical patent/JPS6358740U/ja
Application granted granted Critical
Publication of JPH0714873Y2 publication Critical patent/JPH0714873Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1986152600U 1986-10-06 1986-10-06 Ｘ線回折測定装置 Expired - Lifetime JPH0714873Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986152600U JPH0714873Y2 (ja) 1986-10-06 1986-10-06 Ｘ線回折測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986152600U JPH0714873Y2 (ja) 1986-10-06 1986-10-06 Ｘ線回折測定装置

Publications (2)

Publication Number Publication Date
JPS6358740U JPS6358740U (enrdf_load_stackoverflow) 1988-04-19
JPH0714873Y2 true JPH0714873Y2 (ja) 1995-04-10

Family

ID=31070730

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986152600U Expired - Lifetime JPH0714873Y2 (ja) 1986-10-06 1986-10-06 Ｘ線回折測定装置

Country Status (1)

Country Link
JP (1) JPH0714873Y2 (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4851679A (enrdf_load_stackoverflow) * 1971-10-29 1973-07-20
JPS55163445A (en) * 1979-06-06 1980-12-19 Kawasaki Steel Corp On-line measurement of austenitic quantity in rolled steel plate

Also Published As

Publication number Publication date
JPS6358740U (enrdf_load_stackoverflow) 1988-04-19

Similar Documents

Publication Publication Date Title
US7852983B2 (en) X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position
JPS5512406A (en) Method of compensating error in measuring circle or arc and meter with compensator
KR950703139A (ko) 금속시트의 온라인 단층촬영 측정방법 및 장치(online tomographic gauging of sheet metal)
JPH0714873Y2 (ja) Ｘ線回折測定装置
US4125771A (en) Apparatus for determining stress in nickel and titanium alloyed materials
JPS636428A (ja) 物体の表面温度測定方法
JPS5842904A (ja) 測長装置
EP0614068A1 (en) Method of measuring orientation flat width of single crystal ingot
US4442535A (en) Fluorescent X-ray film thickness gauge for very small areas
KR200418412Y1 (ko) Ｘ선을 이용한 결정체의 원자 간 거리 측정장치
SE7613514L (sv) Anordning for metning
SU1492208A1 (ru) Угломер
US4867556A (en) Apparatus for determining the path of a pulsed light beam
US3427451A (en) X-ray diffractometer having several detectors movable on a goniometer circle
JPS5582006A (en) Measuring method for thickness
JP2546092B2 (ja) コンプトン散乱ｘ線法による金属上塗膜の厚さ測定方法及び装置
Berger et al. Application of the/spl Omega/scan to the sorting of doubly rotated quartz blanks
SU1144040A1 (ru) Способ юстировки дифрактометра
SU718769A1 (ru) Трехкристальный рентгеновский спектрометр
SU1355866A1 (ru) Устройство дл измерени толщины покрыти
RU2132535C1 (ru) Способ определения формы профилей надрезов на поверхности твердых тел
SU1631265A1 (ru) Способ определени толщины покрыти и устройство дл его осуществлени
JPH03165243A (ja) Ｘ線回折装置
JPH11142129A (ja) 放射線厚さ計
SU1141321A1 (ru) Рентгеновский спектрометр