JPH06503877A - 物体の構造を規定するためのイメージング方法 - Google Patents

物体の構造を規定するためのイメージング方法

Info

Publication number
JPH06503877A
JPH06503877A JP3515253A JP51525391A JPH06503877A JP H06503877 A JPH06503877 A JP H06503877A JP 3515253 A JP3515253 A JP 3515253A JP 51525391 A JP51525391 A JP 51525391A JP H06503877 A JPH06503877 A JP H06503877A
Authority
JP
Japan
Prior art keywords
radiation
detector
imaging method
imaging
detectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3515253A
Other languages
English (en)
Japanese (ja)
Inventor
プーマライネン，パーティ
Original Assignee
ファブレッティ・ホールディングス・リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ファブレッティ・ホールディングス・リミテッド filed Critical ファブレッティ・ホールディングス・リミテッド
Publication of JPH06503877A publication Critical patent/JPH06503877A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0227—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging using imaging, e.g. a projected image of suspension; using holography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/178—Methods for obtaining spatial resolution of the property being measured
    • G01N2021/1785—Three dimensional
    • G01N2021/1787—Tomographic, i.e. computerised reconstruction from projective measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
JP3515253A 1990-10-02 1991-10-02 物体の構造を規定するためのイメージング方法 Pending JPH06503877A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI904845A FI94678C (fi) 1990-10-02 1990-10-02 Kuvausmenetelmä kappaleiden rakenteen määrittämiseksi
FI904845 1990-10-02
PCT/FI1991/000304 WO1992006367A1 (en) 1990-10-02 1991-10-02 Imaging method for defining the structure of objects

Publications (1)

Publication Number Publication Date
JPH06503877A true JPH06503877A (ja) 1994-04-28

Family

ID=8531157

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3515253A Pending JPH06503877A (ja) 1990-10-02 1991-10-02 物体の構造を規定するためのイメージング方法

Country Status (5)

Country Link
EP (1) EP0551313A1 (fi)
JP (1) JPH06503877A (fi)
CA (1) CA2093347A1 (fi)
FI (1) FI94678C (fi)
WO (1) WO1992006367A1 (fi)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007127617A (ja) * 2005-11-03 2007-05-24 Tsinghua Univ 高速中性子及び連続エネルギー・スペクトルｘ線により材料識別する方法及びその装置
WO2010074030A1 (ja) * 2008-12-22 2010-07-01 オムロン株式会社 Ｘ線検査方法およびｘ線検査装置
JP2014517319A (ja) * 2011-06-14 2014-07-17 アナロジック コーポレイション セキュリティースキャナー

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5940073A (en) 1996-05-03 1999-08-17 Starsight Telecast Inc. Method and system for displaying other information in a TV program guide
US9113107B2 (en) 2005-11-08 2015-08-18 Rovi Guides, Inc. Interactive advertising and program promotion in an interactive television system
NO327576B1 (no) * 2006-06-01 2009-08-17 Ana Tec As Framgangsmate og apparat for analyse av objekter
US8832742B2 (en) 2006-10-06 2014-09-09 United Video Properties, Inc. Systems and methods for acquiring, categorizing and delivering media in interactive media guidance applications
TWI394490B (zh) * 2008-09-10 2013-04-21 Omron Tateisi Electronics Co Ｘ射線檢查裝置及ｘ射線檢查方法
CN116773562B (zh) * 2023-08-22 2023-11-10 中国工程物理研究院激光聚变研究中心 基于单束激光的双粒子高时空分辨背光照相方法和装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4064440A (en) * 1976-06-22 1977-12-20 Roder Frederick L X-ray or gamma-ray examination device for moving objects
GB8623196D0 (en) * 1986-09-26 1986-10-29 Robinson M Visual screening system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007127617A (ja) * 2005-11-03 2007-05-24 Tsinghua Univ 高速中性子及び連続エネルギー・スペクトルｘ線により材料識別する方法及びその装置
WO2010074030A1 (ja) * 2008-12-22 2010-07-01 オムロン株式会社 Ｘ線検査方法およびｘ線検査装置
JP2014517319A (ja) * 2011-06-14 2014-07-17 アナロジック コーポレイション セキュリティースキャナー

Also Published As

Publication number Publication date
FI904845A0 (fi) 1990-10-02
FI94678B (fi) 1995-06-30
CA2093347A1 (en) 1992-04-03
WO1992006367A1 (en) 1992-04-16
EP0551313A1 (en) 1993-07-21
FI904845A (fi) 1992-04-03
FI94678C (fi) 1995-10-10

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