JPH0645878Y2 - 極図形測定装置用スリット装置 - Google Patents

極図形測定装置用スリット装置

Info

Publication number
JPH0645878Y2
JPH0645878Y2 JP7482988U JP7482988U JPH0645878Y2 JP H0645878 Y2 JPH0645878 Y2 JP H0645878Y2 JP 7482988 U JP7482988 U JP 7482988U JP 7482988 U JP7482988 U JP 7482988U JP H0645878 Y2 JPH0645878 Y2 JP H0645878Y2
Authority
JP
Japan
Prior art keywords
ray
slit
polar
small hole
transmission method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP7482988U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01179247U (OSRAM
Inventor
正雄 中山
Original Assignee
理学電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機株式会社 filed Critical 理学電機株式会社
Priority to JP7482988U priority Critical patent/JPH0645878Y2/ja
Publication of JPH01179247U publication Critical patent/JPH01179247U/ja
Application granted granted Critical
Publication of JPH0645878Y2 publication Critical patent/JPH0645878Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP7482988U 1988-06-07 1988-06-07 極図形測定装置用スリット装置 Expired - Lifetime JPH0645878Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7482988U JPH0645878Y2 (ja) 1988-06-07 1988-06-07 極図形測定装置用スリット装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7482988U JPH0645878Y2 (ja) 1988-06-07 1988-06-07 極図形測定装置用スリット装置

Publications (2)

Publication Number Publication Date
JPH01179247U JPH01179247U (OSRAM) 1989-12-22
JPH0645878Y2 true JPH0645878Y2 (ja) 1994-11-24

Family

ID=31299919

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7482988U Expired - Lifetime JPH0645878Y2 (ja) 1988-06-07 1988-06-07 極図形測定装置用スリット装置

Country Status (1)

Country Link
JP (1) JPH0645878Y2 (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1720006A1 (en) * 2005-05-02 2006-11-08 F. Hoffmann-La Roche Ag Method and apparatus for x-ray diffraction analysis

Also Published As

Publication number Publication date
JPH01179247U (OSRAM) 1989-12-22

Similar Documents

Publication Publication Date Title
JP3069865B2 (ja) 発散制御可能な多重チャネルの全反射光学装置
US6330301B1 (en) Optical scheme for high flux low-background two-dimensional small angle x-ray scattering
US5198680A (en) High precision single focus collimator and method for manufacturing high precision single focus collimator
US7123686B2 (en) Apparatus and method for X-ray analysis
EP0129939B1 (en) X-ray analysis apparatus including a monochromator crystal having crystal lattice surfaces
WO1996023209A1 (en) X-ray imaging system including a transforming element that selects radiation that forms an image
Nave et al. Facilities for solution scattering and fibre diffraction at the Daresbury SRS
DE3304780C2 (OSRAM)
Bzhaumikhov et al. Polycapillary conic collimator for micro-XRF
US20100135460A1 (en) X-ray optical element and diffractometer with a soller slit
JPH0645878Y2 (ja) 極図形測定装置用スリット装置
DE10020423B4 (de) Monochromator und spektrometrisches Verfahren
KR100576921B1 (ko) 고광도의 평행빔 생성 장치
DE69317702T2 (de) Optische Winkelmessanordnung
US20020054661A1 (en) Apparatus for analysing a sample
DE10107914A1 (de) Anordnung für röntgenanalytische Anwendungen
DE10125454A1 (de) Gerät zur Röntgenanalyse mit einem Mehrschichtspiegel und einem Ausgangskollimator
US20070280414A1 (en) Fluorescent x-ray analysis apparatus
JP2000146872A (ja) Ｘ線回折装置
JP3197104B2 (ja) Ｘ線解析装置
JPH05850Y2 (OSRAM)
JPH0117099B2 (OSRAM)
JPH11502312A (ja) 回転可能な一次コリメータを含むｘ線分析装置
JP3708596B2 (ja) Ｘ線回折測定用スリット装置
JP3819376B2 (ja) Ｘ線装置およびその散乱防止キャップ