JPH01179247U - - Google Patents
Info
- Publication number
- JPH01179247U JPH01179247U JP7482988U JP7482988U JPH01179247U JP H01179247 U JPH01179247 U JP H01179247U JP 7482988 U JP7482988 U JP 7482988U JP 7482988 U JP7482988 U JP 7482988U JP H01179247 U JPH01179247 U JP H01179247U
- Authority
- JP
- Japan
- Prior art keywords
- elongated aperture
- polar
- optical axis
- small hole
- slit device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000001028 reflection method Methods 0.000 description 2
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7482988U JPH0645878Y2 (ja) | 1988-06-07 | 1988-06-07 | 極図形測定装置用スリット装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7482988U JPH0645878Y2 (ja) | 1988-06-07 | 1988-06-07 | 極図形測定装置用スリット装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01179247U true JPH01179247U (OSRAM) | 1989-12-22 |
| JPH0645878Y2 JPH0645878Y2 (ja) | 1994-11-24 |
Family
ID=31299919
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7482988U Expired - Lifetime JPH0645878Y2 (ja) | 1988-06-07 | 1988-06-07 | 極図形測定装置用スリット装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0645878Y2 (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006313157A (ja) * | 2005-05-02 | 2006-11-16 | F Hoffmann La Roche Ag | X線回折分析方法及び装置 |
-
1988
- 1988-06-07 JP JP7482988U patent/JPH0645878Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006313157A (ja) * | 2005-05-02 | 2006-11-16 | F Hoffmann La Roche Ag | X線回折分析方法及び装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0645878Y2 (ja) | 1994-11-24 |
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