JPH0639348Y2 - 集積回路の検査用掴み搬送装置 - Google Patents

集積回路の検査用掴み搬送装置

Info

Publication number
JPH0639348Y2
JPH0639348Y2 JP1988164754U JP16475488U JPH0639348Y2 JP H0639348 Y2 JPH0639348 Y2 JP H0639348Y2 JP 1988164754 U JP1988164754 U JP 1988164754U JP 16475488 U JP16475488 U JP 16475488U JP H0639348 Y2 JPH0639348 Y2 JP H0639348Y2
Authority
JP
Japan
Prior art keywords
integrated circuit
collet
head
inspection
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988164754U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0285373U (enrdf_load_stackoverflow
Inventor
昌史 新山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP1988164754U priority Critical patent/JPH0639348Y2/ja
Publication of JPH0285373U publication Critical patent/JPH0285373U/ja
Application granted granted Critical
Publication of JPH0639348Y2 publication Critical patent/JPH0639348Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Automatic Assembly (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Particle Accelerators (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1988164754U 1988-12-19 1988-12-19 集積回路の検査用掴み搬送装置 Expired - Lifetime JPH0639348Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988164754U JPH0639348Y2 (ja) 1988-12-19 1988-12-19 集積回路の検査用掴み搬送装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988164754U JPH0639348Y2 (ja) 1988-12-19 1988-12-19 集積回路の検査用掴み搬送装置

Publications (2)

Publication Number Publication Date
JPH0285373U JPH0285373U (enrdf_load_stackoverflow) 1990-07-04
JPH0639348Y2 true JPH0639348Y2 (ja) 1994-10-12

Family

ID=31450628

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988164754U Expired - Lifetime JPH0639348Y2 (ja) 1988-12-19 1988-12-19 集積回路の検査用掴み搬送装置

Country Status (1)

Country Link
JP (1) JPH0639348Y2 (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58171224A (ja) * 1983-02-09 1983-10-07 Hitachi Ltd 物体插入装置
JPH0124634Y2 (enrdf_load_stackoverflow) * 1984-09-17 1989-07-25

Also Published As

Publication number Publication date
JPH0285373U (enrdf_load_stackoverflow) 1990-07-04

Similar Documents

Publication Publication Date Title
CN113636337B (zh) 一种具有精定位功能的自动搬运系统、自动化系统及方法
JP2774264B2 (ja) 半導体素子検査機の素子積み降ろし装置
JP7145029B2 (ja) 半導体資材の切断装置
JP4192300B2 (ja) 光学ガラス素材の移載装置
JP2008124198A (ja) ハンドラのティーチング方法及びハンドラ
TWI448703B (zh) 電子部件測試設備用分選機及向裝載機構裝載電子部件之方法
JPH08295392A (ja) 半導体素子テスト用のトレーユニット
JP4683129B2 (ja) ハンドラのティーチング方法及びハンドラ
JP5375528B2 (ja) 電子部品検査装置
JPH1082830A (ja) 部材の受け渡し装置
JP5447565B2 (ja) ハンドラのティーチング方法及びハンドラ
JPH0639348Y2 (ja) 集積回路の検査用掴み搬送装置
JP4702262B2 (ja) ハンドラの半導体チップ検出方法及びハンドラ
JP5527463B2 (ja) 電子部品搬送装置
JPS6090641A (ja) Ｉｃ插入用ロボツトハンド
KR100223093B1 (ko) 수평식핸들러의 테스트트레이 이송방법
US6695546B2 (en) Single drive aligner elevation apparatus for an integrated circuit handler
KR20210000475A (ko) 이차전지 젤리롤 투입정도 개선 시스템
KR20220055406A (ko) 수지 밀봉 장치 및 워크 반송 방법
KR0177341B1 (ko) 모듈ic검사기의 모듈ic 홀딩장치
KR100251507B1 (ko) Bga 반도체패키지용 솔더볼범핑시스템
KR100639400B1 (ko) 리드 픽 앤 플레이스 장비
JP2551180B2 (ja) 半導体装置の製造方法
TWI841001B (zh) 半導體元件拾取裝置及其工作控制方法
JP3211454B2 (ja) ワークの位置決め方法