JPH06318659A - Shape forming and treatment method of lead frame for semiconductor device - Google Patents

Shape forming and treatment method of lead frame for semiconductor device

Info

Publication number
JPH06318659A
JPH06318659A JP15403092A JP15403092A JPH06318659A JP H06318659 A JPH06318659 A JP H06318659A JP 15403092 A JP15403092 A JP 15403092A JP 15403092 A JP15403092 A JP 15403092A JP H06318659 A JPH06318659 A JP H06318659A
Authority
JP
Japan
Prior art keywords
processing
shape processing
shape
lead frame
step group
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15403092A
Other languages
Japanese (ja)
Other versions
JP2934804B2 (en
Inventor
Kenichi Fukuda
健一 福田
Kenichi Ishimatsu
憲一 石松
Isao Yonenaga
功 米永
Muneya Shibata
宗也 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui High Tec Inc
Original Assignee
Mitsui High Tec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui High Tec Inc filed Critical Mitsui High Tec Inc
Priority to JP15403092A priority Critical patent/JP2934804B2/en
Publication of JPH06318659A publication Critical patent/JPH06318659A/en
Application granted granted Critical
Publication of JP2934804B2 publication Critical patent/JP2934804B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Preventing Corrosion Or Incrustation Of Metals (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To comply with the diversification of the quality and the specification condition of a fine lead frame by a method wherein, while a thin-sheet stripe material is being run inside a line, a prescribed shape working and treatment is executed sequentially and continuously to the thin-sheet stripe material. CONSTITUTION:One shape working and treatment line is constituted in such a way that it is provided with a first shape working process group 10, a second shape working process group 11, a heat-treatment process group 12 continued after them, an electrolytic polishing process group 13, a multilayer plating process group 14, 3 tape pasting process group 15 and a third shape working process group and that it is connected via loop formation means 17 to 33 provided with a control device controlling the working and treatment process groups. Then, a thin-sheet stripe material in a vertical state is drawn out to the line, a required shape forming and treatment is executed sequentially on a lead frame while the thin-sheet stripe material is being run inside the line, and the lead frame provided with a prescribed quality and with prescribed specifications is former.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置用リードフ
レームの形状加工及び処理方法に係る。詳細には、異種
形状加工及び処理工程群を適切に組み合わせて連結した
形状加工及び処理ラインを構成して、該群間の搬送作業
を効率化し、搬送で生じる損傷を防ぐと共に多様化した
品質、使用の条件にフレキシビリティに対応して高品質
のリードフレームを提供する半導体装置用リードフレー
ムの形状加工及び処理方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of processing and processing a lead frame for a semiconductor device. In detail, by forming a shape processing and processing line in which different kinds of shape processing and processing step groups are appropriately combined and connected, the transfer operation between the groups is made efficient, damage caused by the transfer is prevented, and diversified quality, The present invention relates to a shape processing and processing method of a lead frame for a semiconductor device, which provides a high quality lead frame corresponding to flexibility in use conditions.

【0002】[0002]

【従来の技術】従来、図3に示すように構成された半導
体装置用リードフレームの形状加工及び処理方法は、図
4、図5、図6、図7によれば、第1の形状加工装置4
8の上流に薄板条材を装着し、水平状態で繰り出された
該薄板条材を第1の形状加工装置48に間欠搬送手段4
2でプレス装置43に装着して一体化した形状加工金型
装置44内に間欠供給しつつインナーリード先端部の形
成を残して所要の形状を形成する加工を行い、巻取り手
段47でコイル状に巻き取る工程と、このコイル状の薄
板条材を熱処理装置59の上流に装着して熱処理装置5
9に向かって繰り出し、熱処理装置59の上流及び下流
に備えたブライダル手段で前記薄板条材に所要のテンシ
ョンを付与しつつ前記熱処理装置59内を走行して滞有
した内部残留応力を除去する熱処理を行い、巻き取り手
段58でコイル状に巻き取る工程と、前記工程で形成し
たコイル状の薄板条材をめっき装置68の上流に装着し
て、めっき装置68に向かって繰り出し、前記めっき装
置内を走行しつつ前処理62、めっき処理63、後処理
64の所定の処理を行い、巻き取り手段67にコイル状
に巻き取る工程と、前記工程で形成したコイル状の薄板
条材を第1の形状加工装置の上流に装着し、第1の形状
加工装置に向かって水平状態で繰り出された該薄板条材
を第1の形状加工装置88に備えた間欠搬送手段82で
プレス装置83に装着した形状加工金型装置84内に間
欠供給しつつインナーリード先端部を所要の形状に形成
する加工を行い、巻き取り手段87でコイル状に巻き取
る工程との順序で加工、処理を行うバッチ方式でリード
フレームの形状加工及び処理する方法が一般的である。
2. Description of the Related Art Conventionally, a method of processing and processing a lead frame for a semiconductor device, which is constructed as shown in FIG. 3, will be described with reference to FIG. 4, FIG. 5, FIG. Four
8, a thin strip material is attached upstream, and the thin strip material fed in a horizontal state is intermittently conveyed to the first shape processing device 48 by the intermittent conveying means 4
In step 2, a desired shape is formed while the tip of the inner lead is left while being intermittently supplied into the shape processing mold device 44 which is mounted on the press device 43 and integrated. And the coiled thin strip material is mounted upstream of the heat treatment apparatus 59 to
9, a bridging means provided upstream and downstream of the heat treatment device 59 while applying a required tension to the thin strip material and traveling in the heat treatment device 59 to remove the retained internal residual stress. And the coiling thin plate material formed in the above step is mounted upstream of the plating device 68, and is fed toward the plating device 68, and inside the plating device. While performing traveling, the pretreatment 62, the plating treatment 63, and the posttreatment 64 are performed, and the coiled thin plate material formed in the above step is wound into the coil shape on the winding means 67. The thin strip material, which is mounted upstream of the shape processing device and is fed horizontally toward the first shape processing device, is transferred to the press device 83 by the intermittent transfer means 82 provided in the first shape processing device 88. A batch which performs processing and processing in the order of the step of forming the tip end portion of the inner lead into a desired shape while intermittently supplying it into the shape processing mold device 84 that has been attached, and winding it into a coil by the winding means 87. A method of processing and processing the lead frame by a method is common.

【0003】[0003]

【発明が解決しようとする課題】近来、半導体装置の軽
薄短小に伴い、半導体装置用リードフレームにより高度
な品質、信頼性が要求されるようになった、しかしなが
ら、金属薄板条材の改良によってリードフレームに要求
される品質仕様の多様化に対応することは困難な状況に
あり、リードフレームを形成する過程の加工及び処理の
多様化で対応する必要性があり、異種加工及び処理手段
を所要の位置に随時接続、分離の変更が可能なフレキシ
ビリティな一工程の加工及び処理を行う半導体装置用リ
ードフレームの製造方法が要求されている。
Recently, as semiconductor devices have become lighter, thinner, shorter, and smaller, higher quality and reliability have been required for lead frames for semiconductor devices. However, due to improvements in thin metal strip material, the lead has been improved. It is difficult to deal with the diversification of quality specifications required for the frame, and it is necessary to deal with the diversification of processing and treatment in the process of forming the lead frame. There is a demand for a method of manufacturing a lead frame for a semiconductor device, which is capable of performing one-step processing and treatment with flexibility so that connection and separation can be changed at any time.

【0004】さらに、半導体装置の高集積化に伴い、回
路形成リード数の増加やリード幅及びリード間の間隔が
微細になり、薄板条材の形成加工やリードの形状加工及
び圧印加工時に滞有した内部残留応力及び打抜きカエリ
や突起が前記リードフレームの形成加工及び処理時に微
小な変形が生じ前記リードフレームの品質、歩留まりを
低下させるなどの問題があり、形状加工及び処理の途中
で中間処理を行う必要性が生じていた。
Further, with the high integration of semiconductor devices, the number of leads for circuit formation increases, the lead width and the interval between leads become finer, and there is a delay during the forming and forming of thin sheet material and the forming and coining of leads. There is a problem that internal residual stress and punching burrs and protrusions cause minute deformation during formation and processing of the lead frame and reduce the quality and yield of the lead frame.Intermediate processing is required during shape processing and processing. There was a need to do so.

【0005】さらに、リードフレームに要求される微細
な形状(回路形成リード数160以上)をプレス打抜き
加工のみで形成することは困難であり、異種の形状加工
方法や処理方法などを適切に組み合わせる必要があっ
た。
Further, it is difficult to form a fine shape required for a lead frame (the number of leads for forming a circuit is 160 or more) only by press punching, and it is necessary to appropriately combine different shape processing methods and processing methods. was there.

【0006】さらに、従来方法では、各加工、処理工程
毎にコイル状に巻き取り、装着繰り出しを行うので、リ
ードフレームの微細なリードに曲がり、寄り、巻きぐせ
などの変形、破損を生じると共に加工、処理部分に酸化
被膜を生じ後処理工程を増加させリードフレームの品
質、歩留まりを低下させるという問題があった。
Further, in the conventional method, since winding and winding are carried out in a coil shape for each processing and processing step, minute leads of the lead frame are bent, leaned, deformed or damaged such as curling, and processed. However, there is a problem in that an oxide film is formed on the treated portion, the number of post-treatment processes is increased, and the quality and yield of lead frames are reduced.

【0007】本発明はこのような事情に鑑みてなされた
もので、半導体装置用リードフレームの所定の形状加工
及び処理を行う際に、加工、処理工程間のそれぞれの搬
送作業を効率化し、搬送で生じる損傷を防ぐと共に異種
加工及び処理工程群の組み合わせが容易に行える形状加
工及び処理ラインを構成し、微細なリードフレームの品
質、仕様条件の多様化にフレキシビリティに対応するこ
とができる半導体装置用リードフレームの形状加工及び
処理方法の提供を目的とする。
The present invention has been made in view of the above circumstances, and when carrying out a predetermined shape processing and processing of a lead frame for a semiconductor device, the respective carrying operations between the processing and the processing steps are made efficient and carried. A semiconductor device that can prevent damage caused in the process and configure a shape processing and processing line that can easily combine different kinds of processing and processing steps, and can respond to the diversification of fine lead frame quality and specification conditions. The purpose of the present invention is to provide a lead frame shape processing and processing method.

【0008】[0008]

【課題を解決するための手段】前記目的に沿う、請求項
1記載の半導体装置用リードフレームの形状加工及び処
理方法は、リードフレームを形成する順送り金型装置の
形状ステージをそれぞれ独立した加圧手段を備えた形状
加工手段に分割し、該形状加工手段を適切に組み合わせ
て複数の形状加工工程群を構成すると共に該群又は該群
間に、上流の前記形状加工で滞有した内部残留応力を除
去するテンション付加手段を備えた熱処理工程群と上流
の該形状加工で生じる打抜きカエリや突起を除去する電
解研磨又は/及び化学研磨処理工程群と前記リードフレ
ームの所要部分を金属被覆するめっき処理工程群とリー
ドフレーム間の変形や寄りを防ぐテーピングなどリード
固定処理工程群等の異種処理工程群の内、少なくとも上
記処理工程群の1つを所要のループ量を維持する制御装
置で制御されたループを介して所要数連結してなり、こ
れらがU字状に連続した一工程の形状加工及び処理ライ
ンを構成しており、該形状加工及び処理ラインに、垂直
状態又は水平状態で繰り出された薄板条材を供給し、こ
の薄板条材を前記各加工及び処理手段のそれぞれに備え
た搬送装置で前記薄板条材を前記ライン内を走行させつ
つ、前記薄板条材に所要の形状加工と処理を順次連続し
て行い、所要のリードを形成することを特徴とするもの
である。
According to the first aspect of the present invention, there is provided a method for processing and processing a lead frame for a semiconductor device, wherein the shape stages of a progressive die device for forming the lead frame are independently pressed. And a plurality of shape processing means are appropriately combined to form a plurality of shape processing step groups, and an internal residual stress that is retained by the shape processing upstream between the groups or between the groups. Heat treatment step group including a tension applying means for removing the metal, electrolytic polishing or / and chemical polishing step group for removing punching burrs and protrusions generated in the upstream shape processing, and plating treatment for metallizing a required portion of the lead frame. At least one of the above-mentioned processing step group among the different kinds of processing step groups such as the lead fixing processing step group such as taping for preventing deformation and deviation between the step group and the lead frame Are connected by a required number of loops through a loop controlled by a controller that maintains a required loop amount, and these constitute a U-shaped continuous one-step shape processing and processing line. And, the thin strip material fed in a vertical state or a horizontal state is supplied to the processing line, and the thin strip material is moved in the line by a conveying device provided in each of the processing and processing means. At the same time, the thin strip material is subjected to required shape processing and treatment successively in order to form required leads.

【0009】請求項2記載の半導体装置用リードフレー
ムの形状加工及び処理方法は、前記請求項1記載の半導
体装置用リードフレームの形状加工及び処理方法にあっ
て、前記形状加工及び処理ラインが、前記形状加工工程
群の一部をフォトエッチングなどの異種形状加工工程群
に置換えて構成されていることを特徴とするものであ
る。
According to a second aspect of the present invention, there is provided a semiconductor device lead frame shape processing and processing method, wherein the semiconductor device lead frame shape processing and processing method comprises: A part of the shape processing step group is replaced with a different shape processing step group such as photo-etching.

【0010】[0010]

【作用】請求項1記載の半導体装置用リードフレームの
形状加工装置においては、従来の一体形式の順送り金型
装置に配列した形状加工ステージをそれぞれ独立した加
圧駆動手段を備えた形状加工手段に分割されているから
容易に該形状加工手段を適切に組み合わせて複数の形状
加工工程群を構成することが容易にできる。
In the shape processing apparatus of the lead frame for a semiconductor device according to claim 1, the shape processing stages arranged in a conventional integral type progressive die apparatus are provided as independent shape driving means. Since it is divided, it is possible to easily form a plurality of shape processing steps by appropriately combining the shape processing means.

【0011】さらに、複数の形状加工工程群を分割形成
しているから該群又は群間に熱処理工程群、電解研磨又
は/及び化学研磨処理工程群、めっき処理工程群、テー
ピングなどリード固定処理工程群等の異種処理工程群を
適切に組み合わせて一工程の各種形状加工及び処理ライ
ンを構成することが容易にできる。
Further, since a plurality of shape processing process groups are formed separately, a heat treatment process group, an electrolytic polishing or / and chemical polishing process group, a plating process group, a lead fixing process such as taping are formed between the groups. It is possible to easily form various shape processing and processing lines in one step by appropriately combining different processing step groups such as groups.

【0012】さらに、一工程の形状加工及び処理ライン
を構成するから薄板条材をコイル状に巻き取り、繰り出
す回数を削減し、加工待ちをなくすことができる。
Further, since the one-step shape processing and processing line is constructed, the number of times of winding and feeding the thin strip material into a coil can be reduced and the processing waiting can be eliminated.

【0013】請求項2記載の半導休装置用リードの形状
加工及び処理方法に於いては、形状加工工程群が分割さ
れているから形状、寸法を要求される微細なインナーリ
ードの形状加工をフォトエッチングなどの異種形状加工
工程群に容易に入れ替えて異種形状加工のコンビネーシ
ョンラインが構成できる。
In the method of processing and processing the lead for the semiconductor device according to the second aspect, since the shape processing process group is divided, the shape processing of the fine inner lead which requires the shape and size is performed. A combination line of different shape processing can be configured by easily replacing the different shape processing process group such as photo etching.

【0014】[0014]

【実施例】以下、本願明細書に添付した図面に基づき、
本発明を具体化した実施例につき説明し、本発明の理解
に供する。図1は、本発明の一実施例における半導体装
置用リードフレームの形状加工及び処理ラインの配列の
概要を説明するブロック図である。図2は、該実施例で
形成された単一リードフレームの平面図を示す。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Below, based on the drawings attached to this specification,
Examples for embodying the present invention will be described to provide an understanding of the present invention. FIG. 1 is a block diagram for explaining the outline of the shape processing of a semiconductor device lead frame and the arrangement of processing lines according to an embodiment of the present invention. FIG. 2 shows a plan view of a single lead frame formed in this example.

【0015】本発明の第一実施例に係る半導体装置用リ
ードフレームの形状加工及び処理方法は、図1によれ
ば、第一の形状加工工程群10と、第二の形状加工工程
群11と、そのあとに続いて配列した熱処理工程群12
と、電解研磨工程群13と、多層めっき工程群14と、
テープ粘着工程群15と、第三の形状加工工程群16と
を有し、これらの加工、処理の工程群を制御する制御装
置を備えたループ形成手段(17、18、19、20、
21、22、23、33)を介して連結した形状加工、
処理の一ラインを構成しており、この該ラインに薄板条
材を垂直状態で繰り出し、前記薄板条材が前記ライン内
を走行しつつ前記リードフレームの所要の形状加工、処
理を順次行い所定の品質仕様を備えたリードフレームが
形成される。以下、これらについて詳しく説明する。
According to the first embodiment of the present invention, a lead frame for a semiconductor device has a first shape processing step group 10 and a second shape processing step group 11 as shown in FIG. , The heat treatment process group 12 arranged after that
An electrolytic polishing step group 13, a multi-layer plating step group 14,
Loop forming means (17, 18, 19, 20) having a tape adhesion process group 15 and a third shape processing process group 16 and provided with a control device for controlling these processing and processing process groups.
21, 22, 23, 33) connected through the shape processing,
One line of processing is constituted, and the thin strip material is fed to this line in a vertical state, and while the thin strip material travels in the line, the required shape processing and processing of the lead frame are sequentially performed to perform predetermined processing. A lead frame with quality specifications is formed. These will be described in detail below.

【0016】前記第一の形状加工工程群10は、該加工
工程群10の上流にコイル状に巻かれた帯状の薄板条材
Aを間欠に繰り出す巻き出し装置24及び一定のループ
量を形成維持するループ形成手段17と前記加工工程群
10の加工速度に合わせて送る間欠搬送装置25をその
両側に配設して、前記加工工程群10に薄板条材Aを送
っている。
The first shape working process group 10 forms and maintains a winding device 24 for intermittently feeding the strip-shaped thin strip material A wound in a coil upstream of the working process group 10 and a constant loop amount. The loop forming means 17 and the intermittent conveying device 25 for feeding according to the machining speed of the machining step group 10 are arranged on both sides thereof, and the thin strip material A is fed to the machining step group 10.

【0017】この第一の形状加工工程群10は、図2に
示す、アウターリード73とこれを支持する内外枠70
及びパイロット孔75などの形状を形成する加工ステー
ジを独立した図示しない加圧駆動手段を備えた形状加工
手段に分割し、適切に配列して構成されたものである。
The first shape processing step group 10 includes an outer lead 73 and an inner / outer frame 70 that supports the outer lead 73, as shown in FIG.
Also, the processing stage for forming the shape of the pilot hole 75 and the like is divided into shape processing means provided with an independent pressure driving means (not shown) and appropriately arranged.

【0018】該形状加工工程群10に於いては、前記薄
板条材Aにアウターリード73とこれを支持する内外枠
70及びパイロット孔75などを形成して、図示しない
リードフレームの形状の一部が形成された薄板条材Bを
得る。
In the shape processing step group 10, an outer lead 73, an inner and outer frame 70 and a pilot hole 75 for supporting the outer lead 73 are formed in the thin strip material A, and a part of the shape of a lead frame (not shown) is formed. The thin strip material B in which is formed is obtained.

【0019】上記形状加工工程群10で形成された前記
薄板条材Bが加工工程群10の下流に配置されたループ
形成手段18で一定のループ量を維持した薄板条材Bの
ループを形成する。
The thin strip material B formed by the shape processing step group 10 forms a loop of the thin strip material B having a constant loop amount by the loop forming means 18 arranged downstream of the processing step group 10. .

【0020】次に、前記第二の形状加工工程群11は、
該加工工程群11の上流のループ形成手段18で形成さ
れた薄板条材Bを間欠的に繰り出す前記加工工程群11
の加工速度に合わせて送る間欠搬送装置25をその両側
に配設して、前記加工工程群11に薄板条材Bを送って
いる。
Next, the second shape processing step group 11
The processing step group 11 for intermittently feeding out the thin strip material B formed by the loop forming means 18 upstream of the processing step group 11
The thin sheet strip B is sent to the working step group 11 by disposing the intermittent feeding devices 25 for feeding at the working speed of No. 2 on both sides thereof.

【0021】この第二の形状加工工程群11は、図2に
示す、中央に素子搭載部71と、これを支持する吊りリ
ード74と、インナーリード72などを形成する加工ス
テージを図示しない独立した加圧駆動手段に分割し、適
切に配列して構成されたものである。
In the second shape processing step group 11, as shown in FIG. 2, an element mounting portion 71 in the center, a suspension lead 74 for supporting the element mounting portion 71, a processing stage for forming the inner lead 72 and the like are not shown and are independent. The pressure driving means is divided and appropriately arranged.

【0022】該形状加工工程群11に於いては、前記薄
板条材Bに前記素子搭載部71と、先端部を連結した連
結片を残した形状のインナーリード72などを追加工し
て図示しないリードフレームの中間形状が形成された薄
板条材Cを得る。
In the shape processing step group 11, the element mounting portion 71 and the inner lead 72 having a shape in which a connecting piece for connecting the leading end portions is left are additionally processed on the thin strip material B and not shown. A thin strip material C having an intermediate shape of the lead frame is obtained.

【0023】上記形状加工工程群11で形成された前記
薄板条材Cが加工工程群11の下流に配置されたループ
形成手段19で一定のループ量を維持した薄板条材Cの
ループを形成する。
The thin strip material C formed in the shape processing step group 11 forms a loop of the thin strip material material C having a constant loop amount by the loop forming means 19 arranged downstream of the processing step group 11. .

【0024】次に、前記熱処理工程群12は、該熱処理
工程群12の上流のループ形成手段19で形成された薄
板条材Cを繰り出す前記熱処理工程群12の処理速度に
合わせて送る搬送装置26をその両側に配設し、該搬送
装置26は、前記薄板条材Cに所要のテンションを付与
する図示しないブライダルロールを具備し、前記熱処理
工程群12に所定のテンションを付加した前記薄板条材
Cを送っている。
Next, the heat treatment step group 12 conveys the thin strip material C formed by the loop forming means 19 upstream of the heat treatment step group 12 at a processing speed of the heat treatment step group 12 which is fed out. Are provided on both sides thereof, and the conveying device 26 is provided with a bridal roll (not shown) for applying a required tension to the thin strip material C, and the thin strip material having a predetermined tension applied to the heat treatment step group 12. I am sending C.

【0025】前記熱処理工程群12は、余熱27、加熱
28、徐冷29の手段からなる酸化防止雰囲気炉を備え
て構成されたものである。
The heat treatment step group 12 comprises an oxidation preventive atmosphere furnace comprising means for residual heat 27, heating 28, and slow cooling 29.

【0026】該熱処理工程群12に於いては、前記薄板
条材Cを前記酸化防止雰囲気炉に供給し、余熱27、加
熱28、徐冷29の処理を経て第一、第二の形状加工で
生じた内部残留応力が除去された薄板条材Dを得る。
In the heat treatment step group 12, the thin strip material C is supplied to the oxidation preventive atmosphere furnace, and is subjected to residual heat 27, heating 28, and gradual cooling 29 to perform first and second shape processing. A thin strip material D from which the generated internal residual stress is removed is obtained.

【0027】上記、熱処理工程群12で処理された前記
薄板条材Dが前記熱処理工程群12の下流に配置された
ループ形成手段20で一定のループ量を維持した薄板条
材Dのループを形成する。
The thin strip material D processed in the heat treatment step group 12 forms a loop of the thin strip material D in which a constant loop amount is maintained by the loop forming means 20 arranged downstream of the heat treatment step group 12. To do.

【0028】次に、前記電解研磨工程群13は、該電解
研磨工程群13の上流のループ形成手段20で形成され
た薄板条材Dを繰り出す前記電解研磨工程群13の処理
速度に合わせて送る搬送装置25をその両側に配設し、
前記薄板条材Dを前記電解研磨工程群13に送ってい
る。
Next, the electrolytic polishing step group 13 sends the thin strip material D formed by the loop forming means 20 upstream of the electrolytic polishing step group 13 according to the processing speed of the electrolytic polishing step group 13 which is fed out. The transport devices 25 are arranged on both sides of the
The thin strip material D is sent to the electrolytic polishing step group 13.

【0029】前記電解研磨工程群13は、図示しない電
解液槽と薄板条材Dに電解電流を印加する電源装置を備
えて構成されたものである。
The electropolishing process group 13 comprises an electrolytic solution tank (not shown) and a power supply device for applying an electrolytic current to the thin strip material D.

【0030】前記電解研磨工程群13に於いては、前記
薄板条材Dを該電解研磨工程群13に供給し、電解研磨
液としてCrO系を用いて陽極電解研磨処理を行っ
て、第一、第二の形状加工で生じた打抜きカエリ、凸部
などの突起が除去された薄板条材Eを得る。
In the electropolishing step group 13, the thin strip material D is supplied to the electropolishing step group 13 and subjected to anodic electropolishing treatment using CrO 3 system as an electropolishing solution. A thin strip material E from which punching burrs and protrusions such as protrusions generated in the second shape processing are removed is obtained.

【0031】上記、前記電解研磨工程群13で処理され
た前記薄板条材Eが前記電解研磨手段群13の下流に配
置されたループ形成手段21で一定のループ量を維持し
た薄板条材Eのループを形成する。
The thin strip material E processed in the electropolishing process group 13 is maintained in a constant loop amount by the loop forming means 21 arranged downstream of the electrolytic polishing means group 13. Form a loop.

【0032】次に、前記多層めっき工程群14は、多層
めっき工程群14の上流のループ形成手段21で形成さ
れた薄板条材Eを繰り出す前記多層めっき工程群14の
処理速度に合わせて送る搬送装置30a、30b、30
cを所要の位置に配設し、該搬送装置30a、30b、
30cは前記薄板条材Eに所要のテンションを付与して
前記多層めっき工程群14に前記薄板条材Eに付加して
送っている。
Next, the multi-layer plating step group 14 feeds the thin strip material E formed by the loop forming means 21 upstream of the multi-layer plating step group 14 in accordance with the processing speed of the multi-layer plating step group 14. Devices 30a, 30b, 30
c is arranged at a required position, and the transfer devices 30a, 30b,
30c applies a required tension to the thin strip material E, adds the thin strip material E to the multi-layer plating step group 14 and sends the thin strip material E.

【0033】前記多層メッキ工程群14は、所定のめっ
き電流を前記薄板条材Eの接触面に印加する給電手段
と、垂直状態で揺動を規制しながら移送する前記搬送装
置30a、30b、30cと、前記薄板条材Eにめっき
前処理及び下地めっきを処理する前処理手段31と、下
地めっきされた前記薄板条材Eの所要部分にめっきを処
理する多層めっき処理手段32と、剥離、洗浄処理する
後処理手段34を有して構成されたものである。
The multi-layer plating step group 14 is a power feeding means for applying a predetermined plating current to the contact surface of the thin strip E, and the transfer devices 30a, 30b, 30c for transferring while vertically controlling the swing. A pretreatment means 31 for treating the thin strip material E with a pretreatment for plating and a base plating; a multi-layer plating treatment means 32 for treating a required portion of the thin strip material E with the undercoat with peeling and cleaning. It is configured to have a post-processing means 34 for processing.

【0034】該多層めっき工程群14に於いては、前記
薄板条材Eの所定部分にめっき前処理及び銅、ニッケル
などの下地めっき層の形成を行い、下地めっきされた前
記薄板条材Eの所要部分に金、銀、パラジュウムなどの
貴金属の多層めっきした後、銅などの不要部分を剥離、
洗浄を行って、前記薄板条材Eに多層めっきを施した薄
板条材Fを得る。
In the multi-layer plating step group 14, pre-plating treatment and formation of an underplating layer of copper, nickel or the like is performed on a predetermined portion of the thin strip material E, and the underplated thin strip material E is formed. Multilayer plating of noble metal such as gold, silver and palladium on required parts, then peel off unnecessary parts such as copper,
Washing is performed to obtain a thin strip material F in which the thin strip material E is subjected to multi-layer plating.

【0035】上記、前記多層めっき工程群14で処理さ
れた前記薄板条材Fが前記多層めっき工程群14の下流
に配置されたループ形成手段22で一定ループ量のルー
プを形成する。
The thin strip material F processed in the multi-layer plating step group 14 forms a loop of a constant loop amount by the loop forming means 22 arranged downstream of the multi-layer plating step group 14.

【0036】次に、前記テープ粘着工程群15は、テー
プ粘着工程群15の上流のループ形成手段22で形成さ
れた薄板条材Fを繰り出す前記テープ粘着工程群15の
処理速度に合わせて送る搬送装置35と、前記薄板条材
Fに粘着させるテープ36を供給するテープ供給装置3
7と、所要のテープ形状を形成する形成加工手段38と
加熱圧着手段39を有する形状加工装置40とを有し、
前記薄板条材Fとテープ36が交差位置で、所定のテー
プ形状を粘着するように構成されている。
Next, the tape adhering process group 15 sends the thin plate material F formed by the loop forming means 22 upstream of the tape adhering process group 15 according to the processing speed of the tape adhering process group 15. Device 35 and tape supply device 3 for supplying a tape 36 to be adhered to the thin strip material F
7 and a shape processing device 40 having a forming and processing means 38 for forming a desired tape shape and a thermocompression bonding means 39,
The thin strip material F and the tape 36 are configured to adhere in a predetermined tape shape at the intersecting position.

【0037】前記テープ粘着工程群15に於いては、供
給された前記薄板条材Fと前記テープ36の交差位置
で、前記薄板条材Fのリード所要部分に所定形状のテー
プが粘着されリードが固着された薄板条材Gを得る。
In the tape adhering step group 15, a tape of a predetermined shape is adhered to a lead required portion of the thin strip material F at a crossing position of the supplied thin strip material F and the tape 36, and leads are attached. The adhered thin strip material G is obtained.

【0038】上記、前記テープ粘着工程群15の下流に
配置されたループ形成手段23で一定のループ量の薄板
条材Gのループを形成する。
The loop forming means 23 arranged downstream of the tape adhering process group 15 forms a loop of the thin strip material G with a constant loop amount.

【0039】次に、前記第三の形状加工工程群16は、
該加工工程群16の上流のループ形成手段22で形成さ
れた前記薄板条材Gを間欠的に繰り出す前記加工工程群
16の加工速度に合わせて送る間欠搬送装置25をその
両側に配設して、前記加工手段群16に薄板条材Gを送
っている。
Next, the third shape processing group 16
Intermittent conveying devices 25 for feeding the thin strip material G formed by the loop forming means 22 on the upstream side of the processing group 16 at intermittent intervals are arranged on both sides of the conveying means 25. The thin strip material G is sent to the processing means group 16.

【0040】この第三の形状加工工程群16は、図示し
ない、前記インナーリード72の先端をつないだ連結片
の除去、先端の矯正、素子搭載部のディプレスなど打抜
き、圧印、曲げの形状加工を独立した駆動手段を備えた
形状加工手段に分割し、適切に配列して構成されたもの
である。
The third shape processing step group 16 includes shape processing such as removal of connecting pieces (not shown) connecting the tips of the inner leads 72, straightening of the tips, punching such as depressing of the element mounting portion, coining and bending. Is divided into shape processing means provided with independent driving means, and is appropriately arranged.

【0041】前記第三の形状加工工程群16に於いて
は、前記薄板条材Gの先端部及び素子搭載部に圧印、曲
げなどの加工を行って、連結片を除去した所要のリード
フレームの形状加工処理を行った薄板条材Hを得る。
In the third shape processing step group 16, the leading end of the thin strip material G and the element mounting portion are subjected to processing such as coining and bending to remove the connecting piece from the required lead frame. A thin strip material H that has been subjected to shape processing is obtained.

【0042】上記、第三の形状加工工程群16で形成さ
れた前記薄板条材Hが加工工程群16の下流に配置され
た巻き取り装置39で順次巻き取るか、または、前記第
三の形状加工工程群16に間欠カット手段を設けてリー
ドフレームの単体を所要数連結したユニットフレームを
形成して前記リードフレームを得る。
The thin strip material H formed in the third shape processing step group 16 is sequentially wound by the winding device 39 arranged downstream of the processing step group 16, or the third shape processing step 16 is performed. An intermittent cutting means is provided in the processing group 16 to form a unit frame in which a required number of individual lead frames are connected to obtain the lead frame.

【0043】更に、本発明の第二の実施例に係る半導体
装置用リードフレームの形状加工及び処理方法は、図3
に示すように、第一の形状加工工程群301と、電解研
磨工程群302と、エッチング加工である第二の形状加
工工程群303と、多層めっき手段群304と、テープ
粘着工程群305と、第三の形状加工工程群306とを
有し、これらの加工、処理の工程群を制御する制御装置
を備えたループ形成手段(307、308、309、3
10、311、312、313、314)を介して連結
した第一の実施例と同様に形状加工、処理の一ラインを
構成しており、この該ラインに薄板条材を垂直状態で繰
り出し、前記薄板条材が前記ライン内を走行しつつ前記
第一の形状加工工程群301でリードフレームの形状加
工を行い、前記加工で生じた打抜きカエリ、凸部を除去
し、一般的に知られたドライフィルムを用いたエッチン
グ方法で微細なインナーリード部を形成する形状加工を
行ったのち、多層めっき処理工程群304、リード固定
処理工程群305、第三の形状加工工程群306前の処
理を順次行い微細なリード部分が所定の品質仕様を備え
たリードフレームを得る。
Furthermore, the method of processing and processing the lead frame for a semiconductor device according to the second embodiment of the present invention is shown in FIG.
As shown in, a first shape processing step group 301, an electrolytic polishing step group 302, a second shape processing step group 303 that is an etching process, a multilayer plating means group 304, a tape adhesion step group 305, A loop forming means (307, 308, 309, 3) having a third shape processing step group 306 and including a control device for controlling the processing and processing step groups.
10, 311, 312, 313, 314), and a line for forming and processing is formed in the same manner as in the first embodiment, and a thin strip material is vertically fed to the line, While the thin strip material is running in the line, the lead frame is shaped in the first shaping step group 301 to remove the punching burrs and protrusions generated by the above-mentioned processing. After performing shape processing to form a fine inner lead portion by an etching method using a film, the steps before the multilayer plating processing step group 304, the lead fixing processing step group 305, and the third shape processing step group 306 are sequentially performed. A lead frame in which fine lead portions have predetermined quality specifications is obtained.

【0044】[0044]

【発明の効果】以上説明したように、請求項1記載の半
導体装置用リードフレームの形状加工及び処理方法は、
前記形状加工工程群が独立した駆動手段を備えた形状加
工手段で容易に構成されているから従来の一体形式の順
送り金型に比べて、各種の形状加工工程群が容易に構成
できリードフレームの形状の多様化の要求に容易にしか
も迅速に対応することができる。
As described above, the method of processing and processing the lead frame for a semiconductor device according to claim 1 is
Since the shape processing step group is easily configured by the shape processing means having the independent driving means, various shape processing step groups can be easily configured as compared with the conventional integrated type progressive die. It is possible to easily and swiftly respond to the demand for diversified shapes.

【0045】更に、前記群又は群間に熱処理工程群、電
解研磨又は/及び化学研磨処理工程群、めっき処理工程
群、リード固定処理工程群等の異種処理工程群を容易に
接続して一工程の各種形状加工及び処理ラインを容易に
構成できるから少量多品種及び類似品種のリードフレー
ムを容易に提供することができる。
Further, one group of the above-mentioned groups or groups can be easily connected by a heterogeneous group of treatment steps such as a heat treatment step group, an electrolytic polishing and / or chemical polishing step group, a plating treatment step group and a lead fixing treatment step group. Since it is possible to easily configure various shape processing and processing lines, it is possible to easily provide lead frames of a large number of small quantities and similar kinds.

【0046】更に、薄板条材のコイル状に巻き取り、繰
り出し回数を削減し、加工待ちが減少するから巻き取
り、繰り出しによるリードフレームの変形などの損傷が
減少し、加工待ちによる錆や酸化被膜が減少し、後工程
の歩留まりを向上させてリードフレームの品質を向上さ
せる。
Furthermore, the thin plate material is wound into a coil, the number of times of feeding is reduced, and the waiting time for processing is reduced. Therefore, damage such as deformation of the lead frame due to winding and feeding is reduced, and rust and oxide film due to waiting for processing are reduced. Is reduced, and the yield of the subsequent process is improved to improve the quality of the lead frame.

【0047】請求項2記載の半導休装置用リードフレー
ムの形状加工及び処理に於いては、形状加工工程群が分
割されているから形状、寸法を要求される微細なインナ
ーリードの形状加工をフォトエッチング異種形状加工工
程群に容易に入れ替えて異種形状加工や処理のコンビネ
ーションラインが構成できる。
In the shape processing and processing of the lead frame for the semi-conductive device according to the second aspect, since the shape processing process group is divided, the shape processing of the fine inner lead which requires the shape and size is performed. A combination line of different shape processing and processing can be configured by easily replacing the photo etching different shape processing process group.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に於ける、半導体装置用リー
ドフレームの形状加工及び処理ラインの配列の概要を説
明するブロック図である。
FIG. 1 is a block diagram illustrating an outline of a shape processing of a semiconductor device lead frame and an arrangement of processing lines according to an embodiment of the present invention.

【図2】上記第一の実施例で形成された単一リードフレ
ームの平面図である。
FIG. 2 is a plan view of a single lead frame formed in the first embodiment.

【図3】本発明の第二の実施例に於ける、半導体装置用
リードフレームの形状加工及び処理ラインの配列の概要
を説明するブロック図である。
FIG. 3 is a block diagram illustrating an outline of the shape processing of the semiconductor device lead frame and the arrangement of the processing lines in the second embodiment of the present invention.

【図4】従来の形状加工装置を示す概要説明図である。FIG. 4 is a schematic explanatory view showing a conventional shape processing apparatus.

【図5】従来の熱処理装置を示す概要説明図である。FIG. 5 is a schematic explanatory view showing a conventional heat treatment apparatus.

【図6】従来のめっき装置を示す概要説明図である。FIG. 6 is a schematic explanatory view showing a conventional plating apparatus.

【図7】従来のめっき装置を示す概要説明図である。FIG. 7 is a schematic explanatory view showing a conventional plating apparatus.

【符号の説明】[Explanation of symbols]

10 第一の形状加工工程群 11 第二の形状加工工程群 12 熱処理工程群 13 電解研磨工程群 14 多層めっき処理工程群 15 リード固定処理工程群 16 第三の形状加工工程群 17〜23 ループ形成手段 24 巻き出し装置 25 間欠搬送装置 26 搬送装置 27 予熱部 28 加熱部 29 徐冷部 30a〜30c搬送装置 31 前処理手段 32 多層めっき処理手段 33 ループ形成手段 34 後処理手段 35 搬送装置 36 テープ 37 テープ供給装置 38 形成加工手段 39 加熱圧着手段 40 形状加工装置 A〜K 薄板条材 301 第一の形状加工工程群 302 電解研磨工程群 303 第二の形状加工工程群 304 多層めっき処理工程群 305 テープ粘着工程群 306 第三の形状加工工程群 17〜23 ループ形成工程 307〜313 ループ形成手段 10 First Shape Processing Step Group 11 Second Shape Processing Step Group 12 Heat Treatment Step Group 13 Electropolishing Step Group 14 Multilayer Plating Step Group 15 Lead Fixing Step Group 16 Third Shape Processing Step Group 17-23 Loop Formation Means 24 Unwinding device 25 Intermittent conveying device 26 Conveying device 27 Preheating part 28 Heating part 29 Slow cooling part 30a to 30c Conveying device 31 Pretreatment means 32 Multilayer plating means 33 Loop forming means 34 Post-treatment means 35 Conveying device 36 Tape 37 Tape supply device 38 Forming processing means 39 Thermocompression bonding means 40 Shape processing device AK Thin sheet material 301 First shape processing step group 302 Electropolishing step group 303 Second shape processing step group 304 Multi-layer plating step group 305 Tape Adhesive process group 306 Third shape processing process group 17-23 Loop forming process 307- 13 loop forming means

───────────────────────────────────────────────────── フロントページの続き (72)発明者 柴田 宗也 福岡県北九州市八幡西区小嶺2丁目10番1 号 株式会社三井ハイテック内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Muneya Shibata 2-10-1 Komine, Hachimansai-ku, Kitakyushu City, Fukuoka Mitsui High-Tech Co., Ltd.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 リードフレームを形成する順送り金型装
置の形状加工ステージをそれぞれ独立した加圧駆動手段
を備えた形状加工手段に分割し、該形状加工手段を適切
に組合わせて複数の形状加工工程群を構成すると共に該
群又は該群間に、上流の前記形状加工で滞有した内部残
留応力を除去するテンション付加手段を備えた熱処理工
程群と上流の該形状加工で生じる打抜きカエリや突起を
除去する電解研磨又は/及び化学研磨などの処理工程群
と前記リードフレームの所要部分を金属被覆するめっき
処理工程群とリード間の変形や寄りを防ぐテーピングな
どリード固定処理工程群等の異種処理工程群の内、少な
くとも上記処理工程群の1つを所要のループ量を維持す
る制御装置で制御されたループを介して所要数連結して
なり、これらがU字状に連続した一工程の形状加工及び
処理ラインを構成しており、該形状加工及び処理ライン
に、垂直状態又は水平状態で繰り出された薄板条材を供
給し、この薄板条材を前記各加工及び処理工程群のそれ
ぞれに備えた搬送装置で前記薄板条材を前記ライン内を
走行させつつ、前記薄板条材に所要の形状加工と処理を
順次連続して行い、所要のリードフレームを形成するこ
とを特徴とする半導体装置用リードフレームの形状加工
及び処理方法。
1. A shape processing stage of a progressive die apparatus for forming a lead frame is divided into shape processing means each provided with an independent pressure driving means, and the shape processing means are appropriately combined to form a plurality of shape processing means. A heat treatment step group that constitutes a step group and is provided between the groups or between the groups with a tension applying means for removing an internal residual stress that has remained in the upstream shape processing, and a punching burr or protrusion generated in the upstream shape processing. Heterogeneous treatments such as electrolytic polishing and / or chemical polishing treatment step group for removing the lead and plating treatment step group for metal-coating a required portion of the lead frame and lead fixing treatment step group such as taping for preventing deformation or deviation between the leads Among the process groups, at least one of the processing process groups is connected in a required number through a loop controlled by a controller that maintains a required loop amount, and these are U-shaped. Form a continuous one-step shape processing and processing line, and supply the thin strip material fed in the vertical state or the horizontal state to the shape processing and treatment line, And, while the thin strip material is traveling in the line by a transport device provided for each of the processing step groups, the thin strip material is successively subjected to required shape processing and treatment to form a required lead frame. A method for processing and processing a lead frame for a semiconductor device, comprising:
【請求項2】 前記形状加工及び処理ラインが、前記形
状加工工程群の一部をフォトエッチングの形状加工工程
群に置き換えて構成されていることを特徴とする請求項
1記載の半導体装置用リードフレームの形状加工及び処
理方法。
2. The lead for a semiconductor device according to claim 1, wherein the shape processing and processing line is configured by replacing a part of the shape processing step group with a photoetching shape processing step group. Frame shape processing and processing method.
JP15403092A 1992-04-28 1992-04-28 Shape processing and processing method of lead frame for semiconductor device Expired - Fee Related JP2934804B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15403092A JP2934804B2 (en) 1992-04-28 1992-04-28 Shape processing and processing method of lead frame for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15403092A JP2934804B2 (en) 1992-04-28 1992-04-28 Shape processing and processing method of lead frame for semiconductor device

Publications (2)

Publication Number Publication Date
JPH06318659A true JPH06318659A (en) 1994-11-15
JP2934804B2 JP2934804B2 (en) 1999-08-16

Family

ID=15575378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15403092A Expired - Fee Related JP2934804B2 (en) 1992-04-28 1992-04-28 Shape processing and processing method of lead frame for semiconductor device

Country Status (1)

Country Link
JP (1) JP2934804B2 (en)

Also Published As

Publication number Publication date
JP2934804B2 (en) 1999-08-16

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