JPH0513633A - Manufacture of lead frame for semiconductor device - Google Patents

Manufacture of lead frame for semiconductor device

Info

Publication number
JPH0513633A
JPH0513633A JP19081891A JP19081891A JPH0513633A JP H0513633 A JPH0513633 A JP H0513633A JP 19081891 A JP19081891 A JP 19081891A JP 19081891 A JP19081891 A JP 19081891A JP H0513633 A JPH0513633 A JP H0513633A
Authority
JP
Japan
Prior art keywords
lead frame
plating
heat treatment
lead
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19081891A
Other languages
Japanese (ja)
Other versions
JP2622632B2 (en
Inventor
Masayuki Higuchi
正幸 樋口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui High Tec Inc
Original Assignee
Mitsui High Tec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui High Tec Inc filed Critical Mitsui High Tec Inc
Priority to JP19081891A priority Critical patent/JP2622632B2/en
Publication of JPH0513633A publication Critical patent/JPH0513633A/en
Application granted granted Critical
Publication of JP2622632B2 publication Critical patent/JP2622632B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To prevent stress corrosion cracking and completely remove oxide films to improve the adhesion of plating by heat-treating metal members of a lead frame and thus removing internal residual stress before multilayer plating. CONSTITUTION:A press shaping process 10, heat treatment process 11, multilayer plating process 12, curing process 13 to heat treat lead frames multilayer-plated and press working process 14 to stick a tape to the lead frames heat-treated and remove the tiebars in this order are provided. Thus, a heat treatment is given before multilayer plating to remove residual stress produced in the shaping process, which prevents stress corrosion cracking produced in pretreatment processes prior to plating, such as immersion and electrolytic degrease cleaning. Moreover, the heat treatment process with a furnace in an antioxidant atmosphere removes hydrogen occluded into metal members in metal plating.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置用リードフ
レームの製造方法に係り、特に異種金属の多層被覆を行
うに際して、リードフレーム部材中に吸蔵された水素と
部材中に滞有された内部残留応力を除去して、水素脆性
を防ぐと共に内部リードの微小な変形を防ぎ所定の寸法
精度を維持した信頼性の高いリードフレームを提供する
半導体装置用リードフレームの製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a lead frame for a semiconductor device, and more particularly to hydrogen stored in a lead frame member and an internal part of the lead frame member when multi-layer coating of different metals is performed. The present invention relates to a method of manufacturing a lead frame for a semiconductor device, which removes residual stress to prevent hydrogen embrittlement and also to prevent minute deformation of internal leads and maintain a predetermined dimensional accuracy to provide a highly reliable lead frame.

【0002】[0002]

【従来の技術】近年、半導体装置用リードフレームは、
半導体装置の高集積化、高性能化及び半導体パッケージ
の小型化が進み、同一サイズ内の多ピン化が行われ、そ
のため、QFP(Quad Flat Packag
e)タイプで、アウターリードピッチ0.3mm、ピン数
は200〜300ピンが要求され、該リードフレームの
アウターリードやインナーリードなどのリード巾や間隔
が狭くなる傾向にある。前記傾向に対応する従来の半導
体装置用リードフレームの製造方法は、Cu−Fe系又
はNi−Fe系合金等の金属素材をエッチング又はプレ
ス加工で不要部分を除去して、半導体素子を搭載する素
子搭載部と、前記素子のボンディングパットをワイヤー
を介して接続する先端部に連結片を備えたインナーリー
ドと、該インナーリードに対応して外部接続端子を相互
に連結するダムバーを備えて構成されたアウターリード
とを含むリードフレームの所要の形状を形成する順送り
金型を用いた打抜き加工工程と、前記リードフレームの
全面または所要部分のみを多層被覆する多層めっき工程
と、前記インナーリード先端部を連結した前記連結片を
打抜き除去する加工工程とを順次行ってリードフレーム
を形成する方法が一般的である。
2. Description of the Related Art In recent years, lead frames for semiconductor devices have been
As semiconductor devices become more highly integrated, have higher performance, and semiconductor packages become smaller, the number of pins within the same size is increasing. Therefore, QFP (Quad Flat Packg)
The type e) requires an outer lead pitch of 0.3 mm and a number of pins of 200 to 300, and the lead widths and intervals of outer leads and inner leads of the lead frame tend to be narrow. A conventional method for manufacturing a lead frame for a semiconductor device, which corresponds to the above tendency, is an element for mounting a semiconductor element by removing an unnecessary portion by etching or pressing a metal material such as a Cu-Fe-based or Ni-Fe-based alloy. A mounting portion, an inner lead having a connecting piece at a tip end for connecting the bonding pad of the element via a wire, and a dam bar for connecting external connecting terminals to each other corresponding to the inner lead. A punching process using a progressive die for forming a desired shape of a lead frame including an outer lead, a multi-layer plating process for coating the entire surface of the lead frame or only a required part with a multilayer, and connecting the inner lead tip portion The method of forming the lead frame is generally performed by sequentially performing the processing step of punching and removing the connecting piece.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、前記方
法で多ピン系のリードフレームを製造した場合、異種金
属の薄めっき層を積層形成する多層めっき工程におい
て、前処理工程の酸侵漬・電解脱脂洗浄を行って前記リ
ードフレーム部材の表面の酸化膜、硬化層を除去する際
に、前記金属部材内の引っ張り方向の残留応力があると
金属部に応力腐食割れを生じ、金属めっき品質・長期信
頼性を低下させるなどの問題があった。また、電解作用
によって生じる水素が金属部材中に吸蔵されて水素脆性
破壊を生じ、長期の信頼性を低下させる問題があった。
そして、異種金属の多層めっきを施す際に、格子のずれ
(ミスフィット)によって素地金属とめっき金属の間に
歪みや硬度の差が生じ、残留応力が滞留するが、この残
留応力が後工程の加熱処理を経る際に、結晶格子内で原
子が移動して歪みの無い状態に戻る時に微細な内部リー
ドの先端などに捩じれ、寄り、曲がりなどの微小な変形
が生じ、半導体装置の歩留り・品質を低下させるという
問題点を有していた。本発明は、このような事情に鑑み
てなされたもので、めっきの品質を向上し、めっき部材
内に吸蔵された水素を除去して半導体装置の長期信頼性
を向上させると共に多ピン系のリードフレームのリード
の微小な変形を防ぎ品質の高い安定したリードフレーム
を得る半導体装置用リードフレームの製造方法を提供す
ることを目的とする。
However, when a multi-pin lead frame is manufactured by the above method, in a multi-layer plating process for laminating thin plating layers of different metals, acid immersion / electrolytic degreasing in a pretreatment process is performed. When removing the oxide film and hardened layer on the surface of the lead frame member by washing, if there is residual stress in the tensile direction in the metal member, stress corrosion cracking will occur in the metal part, resulting in metal plating quality and long-term reliability. There was a problem such as deterioration of sex. Further, there is a problem that hydrogen generated by the electrolysis is occluded in the metal member to cause hydrogen brittle fracture, which deteriorates long-term reliability.
When multi-layer plating of different metals is performed, a difference in strain or hardness occurs between the base metal and the plated metal due to a lattice shift (misfit), and residual stress stays. During the heat treatment, when the atoms move in the crystal lattice and return to a state without distortion, the tips of the minute internal leads are twisted, and slight deformations such as leaning and bending occur, which results in semiconductor device yield and quality. Had the problem of decreasing The present invention has been made in view of the above circumstances, and improves the quality of plating, removes hydrogen stored in a plated member to improve long-term reliability of a semiconductor device, and leads of a multi-pin system. An object of the present invention is to provide a method for manufacturing a lead frame for a semiconductor device, which can prevent minute deformation of leads of the frame and obtain a stable lead frame of high quality.

【0004】[0004]

【課題を解決するための手段】前記目的を達成する請求
項第1項記載の半導体装置用リードフレームの製造方法
は、リードフレーム用の金属素材から、素子搭載部、先
端部を連結する連結片を備えたインナーリード及びアウ
ターリードを含むリードフレームの所要の形状を備えた
金属部材を形成する加工を行い、前記金属部材の表面の
所要部分に多層の金属被膜層を形成した後、前記連結片
を除去すると共にインナーリードの先端を分離形成する
半導体装置用リードフレームの製造方法であって、予
め、前記金属部材の形成に際して滞有した内部残留応力
を除去する熱処理を施したリードフレームの金属部材を
使用し、前記リードフレームの金属部材の表面に異種金
属を多層被覆した後、該金属部材中に吸蔵された水素及
び滞有した残留応力を除去する熱処理を行い、次に、前
記インナーリードの所要領域に該インナーリード間の相
互位置を維持する樹脂テープを粘着すると共に該インナ
ーリード先端を連結した連結片を除去するプレス加工を
行って、所要のリードフレームの形状を形成するように
して構成されている。
According to a first aspect of the present invention, there is provided a method of manufacturing a lead frame for a semiconductor device, comprising: a connecting piece for connecting an element mounting portion and a tip portion from a metal material for a lead frame. After performing a process for forming a metal member having a required shape of a lead frame including an inner lead and an outer lead, and forming a multilayer metal coating layer on a required portion of the surface of the metal member, the connecting piece Is a method for manufacturing a lead frame for a semiconductor device, in which the tips of inner leads are separated and formed, wherein a metal member of a lead frame is previously subjected to a heat treatment for removing an internal residual stress that was retained when the metal member was formed. Is used to coat the surface of the metal member of the lead frame with multiple layers of dissimilar metals, and then hydrogen stored in the metal member and residual stress A heat treatment for removing is performed, and then a resin tape for maintaining a mutual position between the inner leads is adhered to a required area of the inner leads, and a pressing process for removing a connecting piece that connects the inner lead tips is performed, It is configured so as to form a required lead frame shape.

【0005】[0005]

【作用】請求項第1項記載の半導体装置用リードフレー
ムの製造方法においては、多層めっきに先立って、形状
加工で生じた残留応力を除去する熱処理が施されている
から、めっきの前処理の浸漬、電解脱脂洗浄などの工程
で発生する応力腐食割れを防止できる作用がある。ま
た、酸化防止雰囲気炉の熱処理工程を備えていることか
ら、金属めっきを施す際に金属部材に吸蔵した水素を除
去する作用がある。更に、連結片の除去に先立って、樹
脂テープを粘着しているからリード間の相互の位置を維
持し、連結片を除去する際の変形や搬送など取扱による
損傷を防ぐ作用がある。そして、樹脂テープを粘着する
ことによって素材の押さえ巾が広くなり、押圧力を低減
でき、ピッチ寸法の変化がなくなる作用がある。
In the method of manufacturing the lead frame for a semiconductor device according to the first aspect of the present invention, the heat treatment for removing the residual stress caused by the shape processing is applied prior to the multi-layer plating. It has the effect of preventing stress corrosion cracking that occurs in processes such as immersion and electrolytic degreasing cleaning. Further, since it is provided with the heat treatment process of the oxidation preventive atmosphere furnace, it has an action of removing hydrogen occluded in the metal member during metal plating. Further, prior to the removal of the connecting piece, since the resin tape is adhered, the mutual positions of the leads are maintained, and there is an action of preventing deformation due to handling such as deformation or transportation when removing the connecting piece. Then, by adhering the resin tape, the pressing width of the material is widened, the pressing force can be reduced, and there is an effect that the pitch dimension does not change.

【0006】[0006]

【実施例】続いて、添付した図面を参照しつつ、本発明
を具体化した実施例につき説明し、本発明の理解に供す
る。ここに、図1は本発明の一実施例の工程の概略ブロ
ック図、図2は該実施例で製造したリードフレームの平
面図、図3は前記実施例の中間工程でのリードフレーム
の平面図を示す。
Embodiments of the present invention will now be described with reference to the accompanying drawings to provide an understanding of the present invention. 1 is a schematic block diagram of a process of one embodiment of the present invention, FIG. 2 is a plan view of a lead frame manufactured in the embodiment, and FIG. 3 is a plan view of a lead frame in an intermediate process of the embodiment. Indicates.

【0007】図1に示すように、本発明の一実施例に係
る半導体装置用リードフレームの製造方法は、プレス加
工による形状加工工程10と、その後に続く熱処理工程
11と、多層めっき工程12と、該多層めっきされたリ
ードフレームの熱処理を行うキュアー処理工程13と、
熱処理の行われたリードフレームにテープを貼着して、
連結片を除去するプレス加工工程14とを有している。
以下、これらについて詳しく説明する。
As shown in FIG. 1, a method of manufacturing a lead frame for a semiconductor device according to an embodiment of the present invention comprises a shape processing step 10 by press working, a heat treatment step 11 following the shape working step 11, and a multi-layer plating step 12. A curing treatment step 13 for heat treating the multi-layer plated lead frame,
Attach the tape to the heat treated lead frame,
And a pressing step 14 for removing the connecting piece.
These will be described in detail below.

【0008】前記プレス加工による形状加工工程10
は、プレス装置の上流側にコイル状に巻かれたテープ状
の金属素材を徐々に解く巻出装置及び、該金属素材をプ
レス処理工程に合わせて送る間欠搬送装置を備えて、プ
レス装置に金属素材を送っている。そして、プレス装置
においては、間欠送りされる前記テープ状の金属素材
に、図3に示すように中央の素子搭載部15、先端部に
連結片16を備えるインナーリード17、ダムバー18
によって連結されるアウターリード19等のリードフレ
ームの所要の形状を備えた金属部材をプレス成形し、下
流側に配置された巻取装置によって巻き取られる。
Shape processing step 10 by the press working
Is equipped with an unwinding device for gradually unwinding a tape-shaped metal material wound in a coil shape on the upstream side of the pressing device, and an intermittent conveying device for feeding the metal material in accordance with a press treatment process. Sending material. In the pressing device, the tape-shaped metal material that is intermittently fed is provided with an element mounting portion 15 at the center, an inner lead 17 provided with a connecting piece 16 at the tip end, and a dam bar 18 as shown in FIG.
A metal member having a required shape of the lead frame such as the outer lead 19 connected by is press-molded and is wound by a winding device arranged on the downstream side.

【0009】次に、熱処理工程11においては、前記巻
取装置によって巻き取られたコイルを再度巻出装置によ
って解いて、非酸化性雰囲気の熱処理炉にて応力除去焼
きなましを行う。これによって前記プレス加工によって
金属部材内に生じた残留応力が除去される。
Next, in the heat treatment step 11, the coil wound by the winding device is unwound by the unwinding device again, and stress relief annealing is performed in a heat treatment furnace in a non-oxidizing atmosphere. As a result, the residual stress generated in the metal member by the press working is removed.

【0010】そして、多層めっき工程12においては、
まず前処理工程によって酸洗脱脂、水洗、電解脱脂、水
洗、酸洗脱脂、水洗を行った後、表面の平滑及び活性化
を図る電解脱脂そして水洗を行い、付着した不純物を除
去し前記表面処理を行う。この後、多層めっきを行う
が、この多層めっきは金属部材の表面にNiストライプ
層をめっきし、次いで水洗または湯洗を行い中間層にS
n−Co合金層またはNi−Co合金層をめっきし、再
度水洗または湯洗を行い最上部にPd層をめっきするこ
とによって行う。
Then, in the multi-layer plating step 12,
First of all, after the pre-treatment process, pickling degreasing, washing with water, electrolytic degreasing, washing with water, pickling degreasing, and washing with water, followed by electrolytic degreasing and washing for smoothing and activation of the surface, and removing the adhering impurities to the surface I do. After that, multilayer plating is performed. In this multilayer plating, a Ni stripe layer is plated on the surface of the metal member, and then the intermediate layer is washed with water or hot water.
This is performed by plating the n-Co alloy layer or the Ni-Co alloy layer, washing again with water or hot water, and then plating the Pd layer on the uppermost portion.

【0011】そして、キュアー処理工程13によって再
度熱処理を行う。これは前記多層めっき工程12におい
て、吸蔵した水素と層間に滞有した内部残留応力を除去
する為に行うもので、非酸化性雰囲気下で、予熱、加
熱、冷却を行うことによって処理され、金属部材が充分
冷却した状態で巻取装置によって巻き取られる。
Then, the heat treatment is performed again in the curing process 13. This is carried out in the multi-layer plating step 12 in order to remove the stored hydrogen and the internal residual stress retained between the layers, and it is treated by preheating, heating and cooling in a non-oxidizing atmosphere, The member is wound by the winding device while being sufficiently cooled.

【0012】次に、前記プレス加工工程14にて処理さ
れるが、まず巻出装置から間欠搬送装置を通ってプレス
装置に間欠的に順次送られ、プレス装置にて図2に示す
ようにインナーリード17上に樹脂テープ20が粘着さ
れて、連結片16(図3参照)が除去される。これによ
って、連結片16を除去してもインナーリード17を所
定間隔に保つことができる。この後、再度巻取装置に連
結した金属部材が巻き取られて、半導体装置用リードフ
レームの製造が完了する。なお、図2、図3において2
1はサポートリードを示す。
Next, in the press working step 14, the unwinding device first intermittently feeds the press device through the intermittent transfer device, and the inner press is carried out by the press device as shown in FIG. The resin tape 20 is adhered onto the leads 17 and the connecting piece 16 (see FIG. 3) is removed. As a result, the inner leads 17 can be kept at a predetermined distance even if the connecting piece 16 is removed. After that, the metal member connected to the winding device is wound again, and the manufacturing of the semiconductor device lead frame is completed. In addition, in FIG. 2 and FIG.
1 indicates a support lead.

【0013】以上のように本実施例によれば、形状加工
工程10と、多層めっき工程12の間に熱処理工程11
を設けたことにより、形状加工で生じた残留応力が除去
されているので次工程の多層めっき工程12では、該工
程の前処理工程及びめっき工程において発生する応力腐
食割れを防ぐことができる。また、多層めっき工程12
とテープ粘着とインナーリード先端部の形成と連結片1
6の除去工程からなるプレス加工工程14との間にめっ
き層に適応した低温焼きなまし温度の熱処理工程を設け
たことにより、該多層めっき工程12においてめっきを
施す際にリードフレームの金属部に吸蔵した水素が除去
されると共に、異種金属の薄めっき層で多層被覆した部
材に滞有した残留応力の影響を緩和することができる。
更に、テープ粘着とインナーリード17先端部の形成と
連結片16の除去工程では、連結片16の除去に先立っ
て、樹脂テープ20を粘着させていることからインナー
リード17間の相互の位置を維持し、連結片16を除去
する際に押圧が減少できるので、変形や搬送など取扱に
よる損傷を防ぐことができる。なお、本実施例では樹脂
テープ20として熱硬化性樹脂を用いたが、他の合成樹
脂材でもよい。
As described above, according to this embodiment, the heat treatment step 11 is performed between the shape processing step 10 and the multi-layer plating step 12.
Since the residual stress generated by the shape processing is removed by the provision of the above, it is possible to prevent stress corrosion cracking that occurs in the pretreatment step and the plating step of the next step in the multilayer plating step 12 of the next step. In addition, the multi-layer plating process 12
Adhesion of tape and tape, formation of inner lead tip and connecting piece 1
By providing a heat treatment process at a low temperature annealing temperature adapted to the plating layer between the press working process 14 including the removing process 6 and the press working process 14, the multi-layer plating process 12 occludes the metal part of the lead frame during plating. It is possible to remove the hydrogen and alleviate the effect of residual stress that is retained in the member that is multilayer-coated with thin plating layers of different metals.
Further, in the steps of tape adhesion, formation of the tips of the inner leads 17 and removal of the connecting piece 16, the resin tape 20 is adhered prior to the removal of the connecting piece 16, so the mutual positions of the inner leads 17 are maintained. However, since the pressing force can be reduced when the connecting piece 16 is removed, damage due to handling such as deformation or transportation can be prevented. Although the thermosetting resin is used as the resin tape 20 in this embodiment, other synthetic resin materials may be used.

【0014】[0014]

【発明の効果】請求項第1項記載の半導体装置用リード
フレームの製造方法は、以上の説明からも明らかなよう
に、多層めっきを行うにあたって予め熱処理を施して内
部残留応力を除去したリードフレームの金属部材を用い
たことから、応力腐食割れを防ぎ、酸化被膜を完全除去
し、金属相互に強い結合が生じて、めっきの密着性が向
上する。めっき処理工程の後に熱処理工程によって前記
金属部材中に滞有した残留応力が除去又は緩和されて、
微細な内部リード先端の微小な捩じれ、曲がり、寄りな
どの変形が無くワイヤリングの的中率が向上すると共
に、金属部材に吸蔵した水素を除去していることから水
素脆性破損を防ぐ。インナーリード間の相互位置を維持
するように樹脂テープを粘着させていることから連結片
の打ち抜き除去や搬送などによる損傷やパイロットピッ
チの伸びが無く、後工程の損傷を少なくし歩留りを向上
させる等リードフレームの長期的信頼性を維持した高品
質な半導体装置を得ることができる。
As is apparent from the above description, the method of manufacturing a lead frame for a semiconductor device according to the first aspect of the present invention is a lead frame in which internal residual stress is removed by performing heat treatment in advance when performing multilayer plating. Since the metal member of No. 3 is used, stress corrosion cracking is prevented, the oxide film is completely removed, strong bonding occurs between metals, and plating adhesion is improved. After the plating process, the heat treatment process removes or relieves residual stress in the metal member,
The internal lead is not twisted, bent, or deformed to a certain extent to improve the accuracy of the wiring, and hydrogen absorbed in the metal member is removed to prevent hydrogen embrittlement damage. Since the resin tape is adhered so as to maintain the mutual position between the inner leads, there is no damage due to punching and removal of the connecting pieces or extension of the pilot pitch, and there is less damage in the subsequent process, improving yield, etc. It is possible to obtain a high quality semiconductor device in which the long-term reliability of the lead frame is maintained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の工程の概略ブロック図であ
る。
FIG. 1 is a schematic block diagram of steps of an embodiment of the present invention.

【図2】本発明の一実施例によって製造したリードフレ
ームの平面図である。
FIG. 2 is a plan view of a lead frame manufactured according to an embodiment of the present invention.

【図3】本発明の一実施例による中間工程でのリードフ
レームの平面図である。
FIG. 3 is a plan view of a lead frame in an intermediate process according to an exemplary embodiment of the present invention.

【符号の説明】[Explanation of symbols]

10 形状加工工程 11 熱処理工程 12 多層めっき工程 13 キュアー処理工程 14 プレス加工工程 15 素子搭載部 16 連結片 17 インナーリード 18 ダムバー 19 アウターリード 20 樹脂テープ 21 サポートリード 10 Shape Processing Step 11 Heat Treatment Step 12 Multilayer Plating Step 13 Cure Processing Step 14 Press Processing Step 15 Element Mounting Part 16 Connection Piece 17 Inner Lead 18 Dam Bar 19 Outer Lead 20 Resin Tape 21 Support Lead

Claims (1)

【特許請求の範囲】 【請求項1】 リードフレーム用の金属素材から、素子
搭載部、先端部を連結する連結片を備えたインナーリー
ド及びアウターリードを含むリードフレームの所要の形
状を備えた金属部材を形成する加工を行い、前記金属部
材の表面の所要部分に多層の金属被膜層を形成した後、
前記連結片を除去すると共にインナーリードの先端を分
離形成する半導体装置用リードフレームの製造方法であ
って、 予め、前記金属部材の形成に際して滞有した内部残留応
力を除去する熱処理を施したリードフレームの金属部材
を使用し、 前記リードフレームの金属部材の表面に異種金属を多層
被覆した後、該金属部材中に吸蔵された水素及び滞有し
た残留応力を除去する熱処理を行い、 次に、前記インナーリードの所要領域に該インナーリー
ド間の相互位置を維持する樹脂テープを粘着すると共に
該インナーリード先端を連結した連結片を除去するプレ
ス加工を行って、 所要のリードフレームの形状を形成することを特徴とす
る半導体装置用リードフレームの製造方法。
Claim: What is claimed is: 1. A metal having a required shape of a lead frame including an inner lead and an outer lead, which are made of a metal material for a lead frame and include a connecting piece for connecting an element mounting portion and a tip portion. After performing a process for forming a member and forming a multi-layer metal coating layer on a required portion of the surface of the metal member,
A method of manufacturing a lead frame for a semiconductor device, in which the connecting pieces are removed and the tips of the inner leads are separately formed, wherein the lead frame is previously subjected to a heat treatment for removing an internal residual stress that has remained during the formation of the metal member. Using the metal member of, the multi-layered coating of different metals on the surface of the metal member of the lead frame, and then heat treatment to remove the hydrogen absorbed in the metal member and residual stress retained therein, Forming the required lead frame shape by applying a resin tape that maintains the mutual position between the inner leads to the required area of the inner leads and removing the connecting piece that connects the tips of the inner leads. A method for manufacturing a lead frame for a semiconductor device, comprising:
JP19081891A 1991-07-04 1991-07-04 Method for manufacturing lead frame for semiconductor device Expired - Fee Related JP2622632B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19081891A JP2622632B2 (en) 1991-07-04 1991-07-04 Method for manufacturing lead frame for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19081891A JP2622632B2 (en) 1991-07-04 1991-07-04 Method for manufacturing lead frame for semiconductor device

Publications (2)

Publication Number Publication Date
JPH0513633A true JPH0513633A (en) 1993-01-22
JP2622632B2 JP2622632B2 (en) 1997-06-18

Family

ID=16264269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19081891A Expired - Fee Related JP2622632B2 (en) 1991-07-04 1991-07-04 Method for manufacturing lead frame for semiconductor device

Country Status (1)

Country Link
JP (1) JP2622632B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08204111A (en) * 1995-01-26 1996-08-09 Nec Corp Lead frame and manufacture thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08204111A (en) * 1995-01-26 1996-08-09 Nec Corp Lead frame and manufacture thereof

Also Published As

Publication number Publication date
JP2622632B2 (en) 1997-06-18

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