JPH06214241A - Liquid crystal display device - Google Patents

Liquid crystal display device

Info

Publication number
JPH06214241A
JPH06214241A JP2164193A JP2164193A JPH06214241A JP H06214241 A JPH06214241 A JP H06214241A JP 2164193 A JP2164193 A JP 2164193A JP 2164193 A JP2164193 A JP 2164193A JP H06214241 A JPH06214241 A JP H06214241A
Authority
JP
Japan
Prior art keywords
liquid crystal
display device
crystal display
circuit
seal area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2164193A
Other languages
Japanese (ja)
Inventor
Shigetoshi Sugawa
成利 須川
Shigeki Kondo
茂樹 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2164193A priority Critical patent/JPH06214241A/en
Priority to EP03016342A priority patent/EP1378785A3/en
Priority to EP04012642A priority patent/EP1473585A1/en
Priority to EP00107888A priority patent/EP1022604B1/en
Priority to EP93103103A priority patent/EP0558058B1/en
Priority to DE69334236T priority patent/DE69334236D1/en
Priority to EP06115969A priority patent/EP1703317B1/en
Priority to DE69330318T priority patent/DE69330318T2/en
Priority to EP00100574A priority patent/EP1003065B1/en
Priority to EP00107887A priority patent/EP1022603B1/en
Priority to EP04022587A priority patent/EP1507162B1/en
Priority to DE69333753T priority patent/DE69333753T2/en
Priority to DE69334103T priority patent/DE69334103T2/en
Priority to DE69333192T priority patent/DE69333192T2/en
Priority to DE69333137T priority patent/DE69333137T2/en
Publication of JPH06214241A publication Critical patent/JPH06214241A/en
Priority to US08/419,762 priority patent/US5513028A/en
Pending legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

PURPOSE:To obtain the liquid crystal display device which is uniform in liquid crystal cell gap, free from an increase in chip size, and superior in productivity by providing with a liquid crystal seal area on a specific circuit element. CONSTITUTION:The liquid crystal display device consists of a pixel area 1 where signal lines are arranged longitudinally, gate lines are arranged horizontally, and transistor(TR) switches for transferring signals to respective pixel electrodes are arrayed at their intersections in two dimensions, a horizontal scanning circuit 2, a vertical scanning circuit 3, a horizontal dummy circuit 4, a vertical dummy circuit 5, and a liquid crystal seal area 6. Patterns 2-5 having the same steps are arranged at four sides at the periphery of the pixel area 1 on a semiconductor substrate and the liquid crystal seal area 6 is provided thereupon, so the liquid crystal cell gap becomes uniform. Further, the liquid crystal seal area 6 is arranged on the peripheral scanning circuits 2 and 3, so the chip size is reducible. Further, the dummy circuits 4 and 5 can be formed in the same process as the peripheral operation circuits 2 and 3, so the productivity superior.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、液晶表示装置に関す
る。更に詳しくは、液晶セルギャップの均一な液晶表示
装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device. More specifically, it relates to a liquid crystal display device having a uniform liquid crystal cell gap.

【0002】[0002]

【従来の技術】一般に液晶表示装置は、内面に電極を有
して対向する2枚の基板間に液晶層を設け、両基板を貼
り合わせてなり、画素領域周辺には液晶素子を駆動する
ための周辺回路が設けられる。
2. Description of the Related Art In general, a liquid crystal display device is provided with a liquid crystal layer between two opposing substrates each having an electrode on its inner surface, and the substrates are bonded together to drive a liquid crystal element around a pixel region. Peripheral circuits are provided.

【0003】従来、両基板を貼り合わせる場合、図5に
示す様にシール領域32を周辺回路31上に設けると液
晶ギャップの分布が生じ、これが±0.1μ以上になる
と色ムラが生じるという問題があった。
Conventionally, when both substrates are bonded together, if a seal region 32 is provided on the peripheral circuit 31 as shown in FIG. 5, a liquid crystal gap distribution occurs, and if it exceeds ± 0.1 μ, color unevenness occurs. was there.

【0004】これを避けるため、図6に示す様に周辺回
路31の外側にシール領域32を設けると、チップサイ
ズが大きくなり、特にビューファインダー等の非常に小
さいセルサイズが要求される液晶表示装置では大きな問
題となる。
In order to avoid this, if a seal region 32 is provided outside the peripheral circuit 31 as shown in FIG. 6, the chip size becomes large, and particularly a liquid crystal display device such as a viewfinder which requires a very small cell size. Then it becomes a big problem.

【0005】また、図7に示す様に絶縁層よりなる平坦
化膜34を設ける方法もあるが、平坦化膜34形成とい
う余分なプロセスが必要になり、また画素電極35上の
絶縁層が厚くなると印加電圧が大きくしなければならな
いという問題がある。更に、半導体基板としてアモルフ
ァスシリコン、ポリシリコンを用いた場合には周辺回路
部31の段差が小さく平坦化も容易であるが、単結晶シ
リコンを用いた場合には段差が大きいため、平坦化する
ためには平坦化膜34の膜厚を厚くしなければならない
という問題がある。
There is also a method of providing a flattening film 34 made of an insulating layer as shown in FIG. 7, but an extra process of forming the flattening film 34 is required, and the insulating layer on the pixel electrode 35 is thick. Then, there is a problem that the applied voltage must be increased. Further, when amorphous silicon or polysilicon is used as the semiconductor substrate, the step difference in the peripheral circuit portion 31 is small and easy to flatten, but when single crystal silicon is used, the step difference is large. However, there is a problem in that the film thickness of the flattening film 34 must be increased.

【0006】[0006]

【発明が解決しようとする課題】本発明は、上記従来の
問題点を解決し、液晶セルギャップが均一で、かつチッ
プサイズの拡大を伴わず、しかも生産性に優れる液晶表
示装置の提供を目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to solve the above-mentioned problems of the prior art and to provide a liquid crystal display device having a uniform liquid crystal cell gap, no increase in chip size, and excellent productivity. And

【0007】[0007]

【課題を解決するための手段】即ち、本発明は画素領域
の少なくとも対向する二辺の周囲に同一段差をもつ回路
素子を設け、前記回路素子上に液晶シール領域を設ける
ことを特徴とする液晶表示装置である。
That is, the present invention is characterized in that a circuit element having the same step is provided around at least two opposite sides of a pixel area, and a liquid crystal seal area is provided on the circuit element. It is a display device.

【0008】[0008]

【実施例】以下、実施例により本発明を詳細に説明す
る。
The present invention will be described in detail below with reference to examples.

【0009】(実施例1)図1は本実施例の液晶表示装
置の上面図、図2は図1のA−A’断面図である。図1
及び図2において、1は縦方向に信号線横方向にゲート
線、その交点に各画素電極に信号を転送するためのトラ
ンジスタスイッチが二次元的に配列された画素領域、2
は水平走査回路、3は水平走査回路2と同じ段差を持つ
垂直走査回路、4は水平走査回路2と同じ段差を持つ水
平方向ダミー回路、5は水平走査回路2と同じ段差を持
つ垂直方向ダミー回路、6は液晶シール領域、7は液
晶、8は半導体基板、9は対向基板である。
(Embodiment 1) FIG. 1 is a top view of a liquid crystal display device of this embodiment, and FIG. 2 is a sectional view taken along the line AA 'of FIG. Figure 1
In FIG. 2, 1 is a pixel region in which signal lines are arranged in the vertical direction and gate lines are arranged in the horizontal direction, and transistor switches for transferring signals to respective pixel electrodes are two-dimensionally arranged at the intersections thereof.
Is a horizontal scanning circuit, 3 is a vertical scanning circuit having the same step as the horizontal scanning circuit 2, 4 is a horizontal dummy circuit having the same step as the horizontal scanning circuit 2, and 5 is a vertical dummy having the same step as the horizontal scanning circuit 2. A circuit, 6 is a liquid crystal seal region, 7 is a liquid crystal, 8 is a semiconductor substrate, and 9 is a counter substrate.

【0010】半導体基板8は、図5に示す方法により製
造されたSi基板である。該Si基板は経済性に優れ
て、大面積に渡り均一平坦な極めて優れた結晶性を有す
るSi単結晶基板であり、半導体アクティブ素子が、欠
落の著しく少ないSi単結晶層上に作成されているた
め、上記半導体素子の浮遊容量が低減し、高速動作が可
能で、ラッチアップ現象等のない、耐放射線特性の優れ
た素子及び回路を液晶画像表示画素と同一基板上に集積
した高性能な液晶表示体を提供できる。
The semiconductor substrate 8 is a Si substrate manufactured by the method shown in FIG. The Si substrate is a Si single crystal substrate which is excellent in economy and has an extremely excellent crystallinity which is uniform and flat over a large area, and a semiconductor active element is formed on a Si single crystal layer having a significantly small number of defects. Therefore, the stray capacitance of the semiconductor element is reduced, high-speed operation is possible, and a high-performance liquid crystal in which elements and circuits excellent in radiation resistance without latch-up phenomenon are integrated on the same substrate as the liquid crystal image display pixel. A display can be provided.

【0011】以下に、図5に従いSi基板の製造方法の
一例を説明する。
An example of a method for manufacturing a Si substrate will be described below with reference to FIG.

【0012】300ミクロンの厚みを持ったP型(10
0)単結晶Si基板にHF溶液中において陽極化成を施
し、多孔質Si基板を形成する。
A P-type (10
0) A single crystal Si substrate is anodized in an HF solution to form a porous Si substrate.

【0013】上記陽極化性条件は以下の通りであった。The anodizing conditions were as follows.

【0014】印加電圧: 2.6 (V) 電流密度: 30 (mA・cm-2) 陽極化成溶液: HF:H2 O:C25 OH=1:
1:1 時間: 2.4 (時間) 多孔質Siの厚み:300 (μm) Porosity: 56 (%) こうして得られたP型(100)多孔質Si基板101
上に減圧CVD法により、Siエピタキシャル層102
を1.0ミクロンの層厚で成長させる。堆積条件は以下
のとおりである。
Applied voltage: 2.6 (V) Current density: 30 (mA · cm -2 ) Anodizing solution: HF: H 2 O: C 2 H 5 OH = 1:
1: 1 time: 2.4 (hour) Porous Si thickness: 300 (μm) Porosity: 56 (%) P-type (100) porous Si substrate 101 thus obtained
The Si epitaxial layer 102 is formed on the upper surface by low pressure CVD.
Are grown with a layer thickness of 1.0 micron. The deposition conditions are as follows.

【0015】ソースガス: SiH4 キャリヤーガス: H2 温度: 850℃ 圧力: 1×10-2Torr 成長速度: 3.3nm/sec 次に、このエピタキシャル層102の表面に1000オ
ングストロームの酸化層103を形成し、その酸化表面
に、表面に5000オングストロームの酸化層104、
1000オングストロームの窒化層105を形成したも
う一方のSi基板107を重ね合せ、窒素雰囲気中で8
00℃、0.5時間加熱することにより、2つのSi基
板を、強固に貼り合わせる。
Source gas: SiH 4 carrier gas: H 2 Temperature: 850 ° C. Pressure: 1 × 10 -2 Torr Growth rate: 3.3 nm / sec Next, an oxide layer 103 of 1000 Å is formed on the surface of the epitaxial layer 102. Forming an oxide layer 104 of 5000 angstroms on the surface,
The other Si substrate 107 on which the nitride layer 105 of 1000 angstrom is formed is laid on top of one another and placed in a nitrogen atmosphere for 8 hours.
By heating at 00 ° C. for 0.5 hour, the two Si substrates are firmly bonded together.

【0016】その後、該貼り合わせた基板を49%弗酸
とアルコールと30%過酸化水素水との混合液(10:
6:50)中で攪拌することなく選択エッチングした。
65分後には、非多孔質Si層だけがエッチングされず
に残り、単結晶Siをエッチング・ストップ材料とし
て、多孔質Si基板101は選択エッチングされ、完全
に除去された。非多孔質Si単結晶の該エッチング液に
対するエッチング速度は、極めて低く65分後でもエッ
チング層は50オングストローム以下であり、多孔質層
のエッチング速度との選択比は十の五乗以下にも達し、
非多孔質層におけるエッチング量(数十オングストロー
ム)は実用上無視できる程度のものである。こうする
と、200ミクロンの厚みをもった多孔質化されたSi
基板101は、除去され、SiO2 103上に1.0μ
mの厚みをもった単結晶Si層102が形成できる。ソ
ースガスとして、SiH2 Clを用いた場合には、成長
温度を数十度上昇させる必要があるが、多孔質基板に特
有な増速エッチング特性は、維持される。
Thereafter, the bonded substrates are mixed with a mixed solution of 49% hydrofluoric acid, alcohol, and 30% hydrogen peroxide solution (10:
Selective etching was carried out in a 6:50) without stirring.
After 65 minutes, only the non-porous Si layer remained without being etched, and the porous Si substrate 101 was selectively etched using single crystal Si as an etching stop material and completely removed. The etching rate of the non-porous Si single crystal with respect to the etching solution is extremely low, the etching layer is 50 angstroms or less even after 65 minutes, and the selectivity with the etching rate of the porous layer reaches 10 5 or less,
The etching amount (tens of angstroms) in the non-porous layer is practically negligible. In this way, porous Si having a thickness of 200 microns is obtained.
Substrate 101 was removed and 1.0 μ on SiO 2 103
A single crystal Si layer 102 having a thickness of m can be formed. When SiH 2 Cl is used as the source gas, it is necessary to raise the growth temperature by several tens of degrees, but the enhanced etching characteristic peculiar to the porous substrate is maintained.

【0017】上記単結晶シリコン薄膜102にTFTを
形成し、そののちSi基板側に液晶画素部の直下を除い
て耐弗酸性ゴムを被覆し、弗酸、酢酸、硝酸の混合液を
用いて、絶縁層までシリコン基板を部分的に除去し、光
透過部110を形成する。こうして図5(d)に示すよ
うなTFT付基板を作成する。
A TFT is formed on the single crystal silicon thin film 102, and thereafter, the Si substrate side is covered with a hydrofluoric acid-resistant rubber except under the liquid crystal pixel portion, and a mixed solution of hydrofluoric acid, acetic acid, and nitric acid is used. The light transmitting portion 110 is formed by partially removing the silicon substrate up to the insulating layer. Thus, a substrate with TFT as shown in FIG. 5D is prepared.

【0018】半導体基板8としては、Siウェハ以外に
石英ガラスを用いることができるが、上述の如く平坦化
の困難な単結晶Si基板を用いた場合に、本発明は特に
有効である。
Although quartz glass can be used as the semiconductor substrate 8 in addition to the Si wafer, the present invention is particularly effective when a single crystal Si substrate, which is difficult to flatten as described above, is used.

【0019】本実施例によれば、半導体基板8上の画素
領域1周辺の四辺に同じ段差を持つパターン2〜5を配
置し、その上に液晶シール領域6を設けているため、液
晶セルギャップが均一になる。また、周辺走査回路2、
3上に液晶シール領域6を配置しているのでチップサイ
ズを小さくできる。更に、ダミー回路4、5は周辺操作
回路2、3と同一プロセスで形成できるため生産性にも
優れる。
According to the present embodiment, since the patterns 2 to 5 having the same step are arranged on the four sides around the pixel region 1 on the semiconductor substrate 8 and the liquid crystal seal region 6 is provided thereon, the liquid crystal cell gap is reduced. Becomes uniform. In addition, the peripheral scanning circuit 2,
Since the liquid crystal seal area 6 is arranged on the chip 3, the chip size can be reduced. Furthermore, since the dummy circuits 4 and 5 can be formed in the same process as the peripheral operation circuits 2 and 3, the productivity is excellent.

【0020】(実施例2)図3は本実施例の液晶表示装
置の上面図である。図3において、11は縦方向に信号
線横方向にゲート線、その交点に各画素電極に信号を転
送するためのトランジスタスイッチが二次元的に配列さ
れた画素領域、12は奇数信号線に映像信号を入力する
水平走査回路、13は偶数信号線に映像信号を入力する
水平走査回路、14は奇数ゲート線にゲート信号を入力
する垂直走査回路、15は偶数ゲート線にゲート信号を
入力する垂直走査回路、16は液晶シール領域であり、
走査回路12〜15は同一段差を有する。
(Embodiment 2) FIG. 3 is a top view of a liquid crystal display device of this embodiment. In FIG. 3, 11 is a signal line in a vertical direction, a gate line is in a horizontal direction, a pixel area in which transistor switches for transferring signals to each pixel electrode are two-dimensionally arranged at an intersection thereof, and 12 is an image in an odd signal line. A horizontal scanning circuit for inputting a signal, a horizontal scanning circuit for inputting a video signal on an even signal line, a vertical scanning circuit for inputting a gate signal on an odd gate line, and a vertical scanning circuit for inputting a gate signal on an even gate line. The scanning circuit 16 is a liquid crystal seal area,
The scanning circuits 12 to 15 have the same step.

【0021】本実施例においては、画素領域11周辺の
四辺に同じ段差を持つパターン12〜15を配置し、か
つこれらを全て周辺走査回路として利用する。本実施例
も実施例1と同様に、同じ段差を持つ周辺走査回路12
〜15上に液晶シール領域16を配置しているので液晶
セルギャップの均一化、チップサイズの縮小化を達成で
きる。
In the present embodiment, the patterns 12 to 15 having the same step are arranged on the four sides around the pixel area 11, and all of them are used as a peripheral scanning circuit. In this embodiment, as in the first embodiment, the peripheral scanning circuit 12 having the same step difference is provided.
Since the liquid crystal seal region 16 is disposed on the upper surfaces 15 to 15, the liquid crystal cell gap can be made uniform and the chip size can be reduced.

【0022】(実施例3)図4は本実施例の液晶表示装
置の上面図である。図4において、21は縦方向に信号
線横方向にゲート線、その交点に各画素電極に信号を転
送するためのトランジスタスイッチが二次元的に配列さ
れた画素領域、22は水平走査回路、23は奇数ゲート
線にゲート信号を入力する垂直走査回路、24は垂直走
査回路23と同じ段差を持つ偶数ゲート線にゲート信号
を入力する垂直走査回路、25は液晶シール領域であ
る。
(Embodiment 3) FIG. 4 is a top view of a liquid crystal display device of this embodiment. In FIG. 4, reference numeral 21 is a vertical signal line, a horizontal gate line, and a pixel region in which transistor switches for transferring signals to respective pixel electrodes are two-dimensionally arranged at the intersections thereof, 22 is a horizontal scanning circuit, and 23 is a horizontal scanning circuit. Is a vertical scanning circuit for inputting a gate signal to an odd gate line, 24 is a vertical scanning circuit for inputting a gate signal to an even gate line having the same step as the vertical scanning circuit 23, and 25 is a liquid crystal seal region.

【0023】本実施例の如く、少なくとも画素領域21
の対向する二辺に同じ段差を持つパターン23、24を
配置し、その上に液晶シール領域25を設ければ、充分
に液晶セルギャップの均一化が達成できる。また、図4
よりも明らかな様に更なるチップサイズの縮小化が図れ
る。
As in this embodiment, at least the pixel region 21
By arranging the patterns 23 and 24 having the same level difference on the two opposite sides and providing the liquid crystal seal region 25 on the patterns 23 and 24, the liquid crystal cell gap can be sufficiently made uniform. Also, FIG.
As is clearer, the chip size can be further reduced.

【0024】[0024]

【発明の効果】以上説明の様に、本発明によればチップ
サイズの拡大を伴うことなく、更には余分な工程を追加
することなく、セルギャップが均一で、色ムラのない液
晶表示装置を得ることができる。
As described above, according to the present invention, a liquid crystal display device having a uniform cell gap and no color unevenness can be provided without enlarging the chip size and without adding extra steps. Obtainable.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明実施例1の液晶表示装置の上面図。FIG. 1 is a top view of a liquid crystal display device according to a first embodiment of the present invention.

【図2】図1のA−A’断面図。FIG. 2 is a sectional view taken along the line A-A ′ in FIG.

【図3】本発明実施例2の液晶表示装置の上面図。FIG. 3 is a top view of the liquid crystal display device according to the second embodiment of the present invention.

【図4】本発明実施例3の液晶表示装置の上面図。FIG. 4 is a top view of a liquid crystal display device according to a third embodiment of the present invention.

【図5】半導体基板の製造方法を示す図。FIG. 5 is a diagram showing a method of manufacturing a semiconductor substrate.

【図6】従来の液晶表示装置の断面図。FIG. 6 is a sectional view of a conventional liquid crystal display device.

【図7】従来の液晶表示装置の断面図。FIG. 7 is a cross-sectional view of a conventional liquid crystal display device.

【図8】従来の液晶表示装置の断面図。FIG. 8 is a sectional view of a conventional liquid crystal display device.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】画素領域の少なくとも対向する二辺の周囲
に同一段差をもつ回路素子を設け、前記回路素子上に液
晶シール領域を設けることを特徴とする液晶表示装置。
1. A liquid crystal display device comprising: a circuit element having the same level difference around at least two opposite sides of a pixel area; and a liquid crystal seal area provided on the circuit element.
JP2164193A 1992-02-27 1993-01-18 Liquid crystal display device Pending JPH06214241A (en)

Priority Applications (16)

Application Number Priority Date Filing Date Title
JP2164193A JPH06214241A (en) 1993-01-18 1993-01-18 Liquid crystal display device
DE69330318T DE69330318T2 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP04022587A EP1507162B1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP00107888A EP1022604B1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP93103103A EP0558058B1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
DE69334236T DE69334236D1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP06115969A EP1703317B1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP03016342A EP1378785A3 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP00100574A EP1003065B1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP00107887A EP1022603B1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
EP04012642A EP1473585A1 (en) 1992-02-27 1993-02-26 Liquid crystal display device
DE69333753T DE69333753T2 (en) 1992-02-27 1993-02-26 Liquid crystal display device
DE69334103T DE69334103T2 (en) 1992-02-27 1993-02-26 Liquid crystal display device
DE69333192T DE69333192T2 (en) 1992-02-27 1993-02-26 Liquid crystal display device
DE69333137T DE69333137T2 (en) 1992-02-27 1993-02-26 Liquid crystal display device
US08/419,762 US5513028A (en) 1992-02-27 1995-04-10 Liquid crystal display with display area having same height as peripheral portion thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2164193A JPH06214241A (en) 1993-01-18 1993-01-18 Liquid crystal display device

Publications (1)

Publication Number Publication Date
JPH06214241A true JPH06214241A (en) 1994-08-05

Family

ID=12060693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2164193A Pending JPH06214241A (en) 1992-02-27 1993-01-18 Liquid crystal display device

Country Status (1)

Country Link
JP (1) JPH06214241A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100488840B1 (en) * 2001-09-13 2005-05-11 세이코 엡슨 가부시키가이샤 Liquid crystal device and electronic equipment
KR100500186B1 (en) * 2000-07-26 2005-07-14 가시오게산키 가부시키가이샤 Liquid crystal display device having non-display area with reduced width
KR100755645B1 (en) * 2000-12-29 2007-09-04 엘지.필립스 엘시디 주식회사 Liquid Crystal Display Device And Method Of Fabricating The Same
KR100983501B1 (en) * 2003-06-26 2010-09-24 삼성전자주식회사 Display device
JP2013200573A (en) * 2013-06-05 2013-10-03 Semiconductor Energy Lab Co Ltd Liquid crystal display device
US9316880B2 (en) 1995-12-21 2016-04-19 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9316880B2 (en) 1995-12-21 2016-04-19 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
KR100500186B1 (en) * 2000-07-26 2005-07-14 가시오게산키 가부시키가이샤 Liquid crystal display device having non-display area with reduced width
KR100755645B1 (en) * 2000-12-29 2007-09-04 엘지.필립스 엘시디 주식회사 Liquid Crystal Display Device And Method Of Fabricating The Same
KR100488840B1 (en) * 2001-09-13 2005-05-11 세이코 엡슨 가부시키가이샤 Liquid crystal device and electronic equipment
KR100983501B1 (en) * 2003-06-26 2010-09-24 삼성전자주식회사 Display device
JP2013200573A (en) * 2013-06-05 2013-10-03 Semiconductor Energy Lab Co Ltd Liquid crystal display device

Similar Documents

Publication Publication Date Title
US5513028A (en) Liquid crystal display with display area having same height as peripheral portion thereof
US5530266A (en) Liquid crystal image display unit and method for fabricating semiconductor optical member
JPH05217825A (en) Manufacture of semiconductor substrate
JPH06214241A (en) Liquid crystal display device
JPH05210110A (en) Active matrix liquid crystal display device
JP2824818B2 (en) Active matrix liquid crystal display
JPH10293322A (en) Liquid crystal display and manufacture therefor
JPH05241200A (en) Liquid crystal display device
JP2653572B2 (en) Active matrix substrate manufacturing method
JPH05241139A (en) Liquid crystal display device
JP2862737B2 (en) Thin film transistor and method of manufacturing the same
JPH05241183A (en) Liquid crystal display body
JPH05210116A (en) Liquid crystal display device
JP3098815B2 (en) Liquid crystal display
JP3154100B2 (en) Manufacturing method of liquid crystal image display device
JPH0616560B2 (en) Method of manufacturing thin film transistor
JPH02306664A (en) Thin film transistor
JPH05210115A (en) Liquid crystal display device
JP3595568B2 (en) Manufacturing method of liquid crystal display device
JPH05210117A (en) Liquid crystal display device
JPS6380570A (en) Manufacture of thin film transistor
JP3023729B2 (en) Liquid crystal display
JPH05218316A (en) Semiconductor device and manufacture thereof
JPH03241874A (en) Manufacture of thin film semiconductor device
JPH04133034A (en) Single crystal thin film semiconductor device for optical valve substrate

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20010522