JPH0621166Y2 - 走査型表面仕事関数計測装置 - Google Patents
走査型表面仕事関数計測装置Info
- Publication number
- JPH0621166Y2 JPH0621166Y2 JP1990005201U JP520190U JPH0621166Y2 JP H0621166 Y2 JPH0621166 Y2 JP H0621166Y2 JP 1990005201 U JP1990005201 U JP 1990005201U JP 520190 U JP520190 U JP 520190U JP H0621166 Y2 JPH0621166 Y2 JP H0621166Y2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- sample
- work function
- tunnel current
- drive signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 44
- 230000006870 function Effects 0.000 claims description 13
- 238000005070 sampling Methods 0.000 claims description 6
- 238000006073 displacement reaction Methods 0.000 claims description 5
- 238000012545 processing Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990005201U JPH0621166Y2 (ja) | 1990-01-23 | 1990-01-23 | 走査型表面仕事関数計測装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990005201U JPH0621166Y2 (ja) | 1990-01-23 | 1990-01-23 | 走査型表面仕事関数計測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0395549U JPH0395549U (enrdf_load_stackoverflow) | 1991-09-30 |
| JPH0621166Y2 true JPH0621166Y2 (ja) | 1994-06-01 |
Family
ID=31508917
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990005201U Expired - Lifetime JPH0621166Y2 (ja) | 1990-01-23 | 1990-01-23 | 走査型表面仕事関数計測装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0621166Y2 (enrdf_load_stackoverflow) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6238374A (ja) * | 1985-08-14 | 1987-02-19 | Canon Inc | 電子回路の評価システム |
| JPH0640002B2 (ja) * | 1988-03-15 | 1994-05-25 | 工業技術院長 | 探針位置制御方法 |
-
1990
- 1990-01-23 JP JP1990005201U patent/JPH0621166Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0395549U (enrdf_load_stackoverflow) | 1991-09-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |