JPH057819B2 - - Google Patents
Info
- Publication number
- JPH057819B2 JPH057819B2 JP58153285A JP15328583A JPH057819B2 JP H057819 B2 JPH057819 B2 JP H057819B2 JP 58153285 A JP58153285 A JP 58153285A JP 15328583 A JP15328583 A JP 15328583A JP H057819 B2 JPH057819 B2 JP H057819B2
- Authority
- JP
- Japan
- Prior art keywords
- electron
- detector
- secondary electrons
- electron beam
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58153285A JPS6047358A (ja) | 1983-08-24 | 1983-08-24 | 電子線装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58153285A JPS6047358A (ja) | 1983-08-24 | 1983-08-24 | 電子線装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6047358A JPS6047358A (ja) | 1985-03-14 |
| JPH057819B2 true JPH057819B2 (enrdf_load_stackoverflow) | 1993-01-29 |
Family
ID=15559127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58153285A Granted JPS6047358A (ja) | 1983-08-24 | 1983-08-24 | 電子線装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6047358A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60212953A (ja) * | 1984-04-06 | 1985-10-25 | Hitachi Ltd | 電子線装置 |
| GB8604181D0 (en) * | 1986-02-20 | 1986-03-26 | Texas Instruments Ltd | Electron beam apparatus |
| JP2918554B2 (ja) * | 1988-04-08 | 1999-07-12 | 株式会社日立製作所 | 荷電粒子線用電界磁界形分離器 |
-
1983
- 1983-08-24 JP JP58153285A patent/JPS6047358A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6047358A (ja) | 1985-03-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4236742B2 (ja) | 走査形電子顕微鏡 | |
| EP0872873B1 (en) | Scanning electron microscope | |
| JP4037533B2 (ja) | 粒子線装置 | |
| JPH07296751A (ja) | X線管装置 | |
| JPH0736321B2 (ja) | 定量的電位測定用スペクトロメ−タ−対物レンズ装置 | |
| JPH0536371A (ja) | 粒子線装置 | |
| JPH08124513A (ja) | 電子検出器 | |
| JP2899629B2 (ja) | 荷電二次粒子の検出装置 | |
| CN108807118A (zh) | 一种扫描电子显微镜系统及样品探测方法 | |
| GB2071403A (en) | Secondary electron detector system for scanning electron microscope | |
| US20080149831A1 (en) | Beam Apparatus | |
| JP2632808B2 (ja) | 定量的電位測定用スペクトロメーター対物レンズ装置 | |
| US4358680A (en) | Charged particle spectrometers | |
| US3717761A (en) | Scanning electron microscope | |
| JPS5958749A (ja) | 複合対物および放射レンズ | |
| EP0084850B1 (en) | Apparatus for irradiation with charged particle beams | |
| JP3399989B2 (ja) | 荷電粒子エネルギー分析装置 | |
| JP2973136B2 (ja) | 粒子線装置 | |
| JPH10302705A (ja) | 走査電子顕微鏡 | |
| KR20000034962A (ko) | 하전입자의 이중-모드 검출 장치 및 방법 | |
| JPH0636346B2 (ja) | 荷電粒子線装置及びこれによる試料観察方法 | |
| JPH057819B2 (enrdf_load_stackoverflow) | ||
| JPH08138611A (ja) | 荷電粒子線装置 | |
| JP3432091B2 (ja) | 走査電子顕微鏡 | |
| JPH0935679A (ja) | 走査電子顕微鏡 |