JPH0573585B2 - - Google Patents

Info

Publication number
JPH0573585B2
JPH0573585B2 JP60033972A JP3397285A JPH0573585B2 JP H0573585 B2 JPH0573585 B2 JP H0573585B2 JP 60033972 A JP60033972 A JP 60033972A JP 3397285 A JP3397285 A JP 3397285A JP H0573585 B2 JPH0573585 B2 JP H0573585B2
Authority
JP
Japan
Prior art keywords
pattern
optical sensor
picture
difference
sensor head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60033972A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61193054A (ja
Inventor
Masaru Hoshino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP60033972A priority Critical patent/JPS61193054A/ja
Publication of JPS61193054A publication Critical patent/JPS61193054A/ja
Publication of JPH0573585B2 publication Critical patent/JPH0573585B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
JP60033972A 1985-02-22 1985-02-22 印刷物の欠陥検知方法 Granted JPS61193054A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60033972A JPS61193054A (ja) 1985-02-22 1985-02-22 印刷物の欠陥検知方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60033972A JPS61193054A (ja) 1985-02-22 1985-02-22 印刷物の欠陥検知方法

Publications (2)

Publication Number Publication Date
JPS61193054A JPS61193054A (ja) 1986-08-27
JPH0573585B2 true JPH0573585B2 (ko) 1993-10-14

Family

ID=12401397

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60033972A Granted JPS61193054A (ja) 1985-02-22 1985-02-22 印刷物の欠陥検知方法

Country Status (1)

Country Link
JP (1) JPS61193054A (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6387238A (ja) * 1986-09-30 1988-04-18 Nec Corp 印刷物の検査装置
JP2597370B2 (ja) * 1987-10-14 1997-04-02 株式会社ヒューテック シート状被検材の有意差検出方法
JPH01263050A (ja) * 1988-04-15 1989-10-19 Nec Corp 印刷物の検査装置
JP2561951B2 (ja) * 1989-02-28 1996-12-11 大和製罐株式会社 ミスト検出方法及び装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59198156A (ja) * 1983-04-27 1984-11-09 Konan Camera Kenkyusho:Kk 輪転印刷における不良印刷部分の検出方法および装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59198156A (ja) * 1983-04-27 1984-11-09 Konan Camera Kenkyusho:Kk 輪転印刷における不良印刷部分の検出方法および装置

Also Published As

Publication number Publication date
JPS61193054A (ja) 1986-08-27

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