JPH0560544B2 - - Google Patents

Info

Publication number
JPH0560544B2
JPH0560544B2 JP61210635A JP21063586A JPH0560544B2 JP H0560544 B2 JPH0560544 B2 JP H0560544B2 JP 61210635 A JP61210635 A JP 61210635A JP 21063586 A JP21063586 A JP 21063586A JP H0560544 B2 JPH0560544 B2 JP H0560544B2
Authority
JP
Japan
Prior art keywords
subject
light
image
imaging
imaging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP61210635A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6366445A (ja
Inventor
Susumu Maezuru
Hiroshi Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ikegami Tsushinki Co Ltd
Maki Manufacturing Co Ltd
Original Assignee
Ikegami Tsushinki Co Ltd
Maki Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ikegami Tsushinki Co Ltd, Maki Manufacturing Co Ltd filed Critical Ikegami Tsushinki Co Ltd
Priority to JP21063586A priority Critical patent/JPS6366445A/ja
Publication of JPS6366445A publication Critical patent/JPS6366445A/ja
Publication of JPH0560544B2 publication Critical patent/JPH0560544B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP21063586A 1986-09-09 1986-09-09 外観検査装置 Granted JPS6366445A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21063586A JPS6366445A (ja) 1986-09-09 1986-09-09 外観検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21063586A JPS6366445A (ja) 1986-09-09 1986-09-09 外観検査装置

Publications (2)

Publication Number Publication Date
JPS6366445A JPS6366445A (ja) 1988-03-25
JPH0560544B2 true JPH0560544B2 (nl) 1993-09-02

Family

ID=16592577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21063586A Granted JPS6366445A (ja) 1986-09-09 1986-09-09 外観検査装置

Country Status (1)

Country Link
JP (1) JPS6366445A (nl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3052320B2 (ja) * 1990-02-01 2000-06-12 井関農機株式会社 青果物の傷総面積算出装置
JPH04138306A (ja) * 1990-09-28 1992-05-12 Kao Corp 異常ラベルの検査装置
JP2818347B2 (ja) * 1993-02-18 1998-10-30 株式会社三協精機製作所 外観検査装置
JP3600010B2 (ja) * 1998-05-06 2004-12-08 エヌ・ティ・ティ・ファネット・システムズ株式会社 検査対象物の外観検査方法とその装置
FR2806478B1 (fr) * 2000-03-14 2002-05-10 Optomachines Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille
KR100827391B1 (ko) * 2006-12-26 2008-05-07 연세대학교 산학협력단 거울을 이용한 비접촉식 지문 영상 획득 장치
JP6897004B2 (ja) * 2016-04-15 2021-06-30 オムロン株式会社 光学式センサ取付用アダプタおよび光学式センサの取付位置の調整方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3206022A (en) * 1961-10-10 1965-09-14 Fmc Corp Color sorting apparatus
JPS5917104A (ja) * 1982-07-21 1984-01-28 Matsushita Electric Works Ltd 形状検査装置
JPS60102504A (ja) * 1983-11-09 1985-06-06 Yougo Honda 三次元物体の位置測定法
JPS60168577A (ja) * 1984-02-10 1985-09-02 株式会社安西製作所 光沢選別装置
JPS60235681A (ja) * 1984-04-19 1985-11-22 オ−エンス イリノイ インコ−ポレ−テッド 透明容器の欠陥検出選別方法および装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3206022A (en) * 1961-10-10 1965-09-14 Fmc Corp Color sorting apparatus
JPS5917104A (ja) * 1982-07-21 1984-01-28 Matsushita Electric Works Ltd 形状検査装置
JPS60102504A (ja) * 1983-11-09 1985-06-06 Yougo Honda 三次元物体の位置測定法
JPS60168577A (ja) * 1984-02-10 1985-09-02 株式会社安西製作所 光沢選別装置
JPS60235681A (ja) * 1984-04-19 1985-11-22 オ−エンス イリノイ インコ−ポレ−テッド 透明容器の欠陥検出選別方法および装置

Also Published As

Publication number Publication date
JPS6366445A (ja) 1988-03-25

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Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees