JPH0560267B2 - - Google Patents
Info
- Publication number
- JPH0560267B2 JPH0560267B2 JP60066755A JP6675585A JPH0560267B2 JP H0560267 B2 JPH0560267 B2 JP H0560267B2 JP 60066755 A JP60066755 A JP 60066755A JP 6675585 A JP6675585 A JP 6675585A JP H0560267 B2 JPH0560267 B2 JP H0560267B2
- Authority
- JP
- Japan
- Prior art keywords
- diffusion region
- gate
- mos transistor
- insulating film
- floating gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000009792 diffusion process Methods 0.000 claims description 29
- 238000013500 data storage Methods 0.000 claims description 13
- 239000004065 semiconductor Substances 0.000 claims description 12
- 230000005641 tunneling Effects 0.000 claims description 6
- 239000010410 layer Substances 0.000 description 11
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 10
- 230000005684 electric field Effects 0.000 description 9
- 230000010354 integration Effects 0.000 description 7
- 230000015556 catabolic process Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
Landscapes
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60066755A JPS61225860A (ja) | 1985-03-30 | 1985-03-30 | 半導体記憶装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60066755A JPS61225860A (ja) | 1985-03-30 | 1985-03-30 | 半導体記憶装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61225860A JPS61225860A (ja) | 1986-10-07 |
JPH0560267B2 true JPH0560267B2 (fr) | 1993-09-01 |
Family
ID=13325014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60066755A Granted JPS61225860A (ja) | 1985-03-30 | 1985-03-30 | 半導体記憶装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61225860A (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2529885B2 (ja) * | 1989-03-10 | 1996-09-04 | 工業技術院長 | 半導体メモリ及びその動作方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51117838A (en) * | 1975-04-10 | 1976-10-16 | Shindengen Electric Mfg Co Ltd | Semiconductor memory device |
JPS55101192A (en) * | 1979-01-24 | 1980-08-01 | Xicor Inc | Method and unit for nonnvolatile memory |
JPS5715470A (en) * | 1980-06-30 | 1982-01-26 | Ibm | Electrically programmable/erasable mos memory cell |
-
1985
- 1985-03-30 JP JP60066755A patent/JPS61225860A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51117838A (en) * | 1975-04-10 | 1976-10-16 | Shindengen Electric Mfg Co Ltd | Semiconductor memory device |
JPS55101192A (en) * | 1979-01-24 | 1980-08-01 | Xicor Inc | Method and unit for nonnvolatile memory |
JPS5715470A (en) * | 1980-06-30 | 1982-01-26 | Ibm | Electrically programmable/erasable mos memory cell |
Also Published As
Publication number | Publication date |
---|---|
JPS61225860A (ja) | 1986-10-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5586073A (en) | Semiconductor device having a multi-layer channel structure | |
US5544103A (en) | Compact page-erasable eeprom non-volatile memory | |
US6768681B2 (en) | Non-volatile memory device | |
US5677556A (en) | Semiconductor device having inversion inducing gate | |
US5702966A (en) | Method of manufacturing a semiconductor memory device | |
US5412600A (en) | Non-volatile semiconductor device with selecting transistor formed between adjacent memory transistors | |
US4355375A (en) | Semiconductor memory device | |
JPH07288291A (ja) | 不揮発性半導体記憶装置 | |
JPH0343792B2 (fr) | ||
KR960016106B1 (ko) | 비 휘발성 반도체 메모리 장치 | |
US4477883A (en) | Electrically erasable programmable read only memory | |
US5394360A (en) | Non-volatile large capacity high speed memory with electron injection from a source into a floating gate | |
US5844271A (en) | Single layer polycrystalline silicon split-gate EEPROM cell having a buried control gate | |
US5463579A (en) | Semiconductor memory device with floating gate and method for driving the same | |
JPS5889871A (ja) | 電気的消去可能なプログラマブルリ−ドオンリメモリセル | |
US7006378B1 (en) | Array architecture and operation methods for a nonvolatile memory | |
US6653682B1 (en) | Non-volatile electrically alterable semiconductor memory device | |
US4486859A (en) | Electrically alterable read-only storage cell and method of operating same | |
JP3474614B2 (ja) | 不揮発性半導体メモリ装置及びその動作方法 | |
US8384149B2 (en) | Memory cell having a shared programming gate | |
JPH07120716B2 (ja) | 半導体記憶装置 | |
US6329688B1 (en) | Nonvolatile semiconductor memory device and method of manufacturing the same | |
JPH0560267B2 (fr) | ||
KR100488583B1 (ko) | 듀얼비트게이트분리형플래쉬메모리소자및그의구동방법 | |
JP2809802B2 (ja) | 不揮発性半導体記憶装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |