JPH0558502B2 - - Google Patents
Info
- Publication number
- JPH0558502B2 JPH0558502B2 JP867776A JP777686A JPH0558502B2 JP H0558502 B2 JPH0558502 B2 JP H0558502B2 JP 867776 A JP867776 A JP 867776A JP 777686 A JP777686 A JP 777686A JP H0558502 B2 JPH0558502 B2 JP H0558502B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- image memory
- scope
- image data
- flaw detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 75
- 238000001514 detection method Methods 0.000 claims description 29
- 238000012545 processing Methods 0.000 claims description 18
- 230000007547 defect Effects 0.000 description 66
- 239000011295 pitch Substances 0.000 description 23
- 238000010586 diagram Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 9
- 238000002592 echocardiography Methods 0.000 description 5
- 230000006870 function Effects 0.000 description 4
- 230000008676 import Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 3
- 239000012790 adhesive layer Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000003340 mental effect Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0609—Display arrangements, e.g. colour displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0609—Display arrangements, e.g. colour displays
- G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
- G01N29/0627—Cathode-ray tube displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0609—Display arrangements, e.g. colour displays
- G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60-6702 | 1985-01-19 | ||
JP670285 | 1985-01-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62240856A JPS62240856A (ja) | 1987-10-21 |
JPH0558502B2 true JPH0558502B2 (de) | 1993-08-26 |
Family
ID=11645647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61007776A Granted JPS62240856A (ja) | 1985-01-19 | 1986-01-17 | 超音波探傷装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4768155A (de) |
EP (1) | EP0189137B1 (de) |
JP (1) | JPS62240856A (de) |
DE (1) | DE3678001D1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020503509A (ja) * | 2017-03-29 | 2020-01-30 | 富士通株式会社 | 超音波スキャン・データを用いた欠陥検出 |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6009373A (en) * | 1987-06-01 | 1999-12-28 | Furuno Electric Company, Limited | Ship track and underwater conditions indicating system |
JPH0823583B2 (ja) * | 1987-06-01 | 1996-03-06 | 古野電気株式会社 | 航跡,探知情報表示装置 |
US4947351A (en) * | 1988-05-06 | 1990-08-07 | The United States Of America As Represented By The Secretary Of The Air Force | Ultrasonic scan system for nondestructive inspection |
JP2719152B2 (ja) * | 1988-07-30 | 1998-02-25 | 日立建機株式会社 | 超音波探傷装置 |
DE3908648A1 (de) * | 1989-03-16 | 1990-09-20 | Dornier Medizintechnik | Darstellung von ultraschall-bildern |
KR0171605B1 (ko) * | 1990-05-30 | 1999-05-01 | 오까다 모도 | 초음파 영상검사장치 |
US5167157A (en) * | 1991-03-26 | 1992-12-01 | Ball Corporation | Nondestructive inspection system for laminated products |
US5475613A (en) * | 1991-04-19 | 1995-12-12 | Kawasaki Jukogyo Kabushiki Kaisha | Ultrasonic defect testing method and apparatus |
JPH04326056A (ja) * | 1991-04-25 | 1992-11-16 | Olympus Optical Co Ltd | 超音波顕微鏡 |
JPH05306923A (ja) * | 1992-04-30 | 1993-11-19 | Takenaka Komuten Co Ltd | 面の三次元計測方法及び計測装置 |
US5576492A (en) * | 1995-01-26 | 1996-11-19 | United Technologies Corporation | Mechanical contour follower |
US6135958A (en) * | 1998-08-06 | 2000-10-24 | Acuson Corporation | Ultrasound imaging system with touch-pad pointing device |
US6941811B2 (en) * | 2003-08-04 | 2005-09-13 | Nan Ya Technology Corporation | Method and apparatus for detecting wafer flaw |
US7584664B2 (en) * | 2006-02-07 | 2009-09-08 | Sonoscan Inc. | Acoustic micro imaging device having at least one balanced linear motor assembly |
US8794072B2 (en) * | 2007-10-10 | 2014-08-05 | Sonoscan, Inc. | Scanning acoustic microscope with profilometer function |
DE102008002832B4 (de) * | 2008-04-24 | 2010-12-09 | Institut für Akustomikroskopie Dr. Krämer GmbH | Verfahren und Vorrichtung zur zerstörungsfreien Detektion von Defekten im Inneren von Halbleitermaterial |
DE102010007349B4 (de) * | 2009-02-09 | 2018-03-01 | Fuji Electric Co., Ltd. | Anomalienüberwachungsvorrichtung |
US9170236B2 (en) | 2010-11-23 | 2015-10-27 | Sonoscan, Inc. | Acoustic micro imaging device with a scan while loading feature |
US8770029B2 (en) * | 2011-10-04 | 2014-07-08 | General Electric Company | Method and apparatus for ultrasonic testing |
US10761066B2 (en) * | 2016-06-24 | 2020-09-01 | Kbr Wyle Services, Llc | Micro-resolution ultrasonic nondestructive imaging method |
JP7233853B2 (ja) * | 2018-05-11 | 2023-03-07 | 三菱重工業株式会社 | 超音波検査装置、方法、プログラム及び超音波検査システム |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT334433B (de) * | 1971-12-28 | 1976-01-10 | Kretztechnik Gmbh | Verfahren zur gemeinsamen abbildung von in bildlicher form darstellbaren informationen auf einem bildmonitor, insbesondere einem fernsehschirm |
JPS5311473B2 (de) * | 1974-07-03 | 1978-04-21 | ||
US4098130A (en) * | 1977-03-11 | 1978-07-04 | General Electric Company | Energy reflection flaw detection system |
JPS5468090A (en) * | 1977-11-10 | 1979-05-31 | Tokyo Shibaura Electric Co | Ultrasonic scanner |
DE2825588A1 (de) * | 1978-06-10 | 1979-12-13 | Krautkraemer Gmbh | Verfahren zur automatischen bildung von pruefbefunden bei der zerstoerungsfreien werkstoffpruefung mit ultraschallimpulsen |
US4213183A (en) * | 1979-03-22 | 1980-07-15 | Adaptronics, Inc. | System for nondestructive evaluation of material flaw characteristics |
US4294118A (en) * | 1979-10-29 | 1981-10-13 | Sumitomo Kinzoku Kogyo Kabushiki Kaisha | Fully automatic ultrasonic flaw detection apparatus |
CA1139872A (en) * | 1980-01-11 | 1983-01-18 | Jiri Vrba | Nondestructive system for testing the thickness of boiler tubes in boilers |
US4361043A (en) * | 1980-11-03 | 1982-11-30 | General Electric Company | Reference voltage generation means for controlling a display |
DE3071885D1 (en) * | 1980-11-04 | 1987-02-12 | Boeing Co | Method for the analysis of scanned data |
JPS57120857A (en) * | 1981-01-19 | 1982-07-28 | Chugoku Electric Power Co Ltd:The | Method and device for identification of ultrasonic echo |
DE3139570C2 (de) * | 1981-10-05 | 1983-09-29 | Krautkrämer GmbH, 5000 Köln | Verfahren und Schaltungsvorrichtung zur Bestimmung und Darstellung von Maximalwerten der von Reflektoren in einem Prüfstück reflektierten Ultraschallsignale |
US4543827A (en) * | 1982-07-12 | 1985-10-01 | Sumitomo Rubber Industries | Method for measuring physical properties of material |
US4470303A (en) * | 1982-09-20 | 1984-09-11 | General Electric Company | Quantitative volume backscatter imaging |
US4472972A (en) * | 1982-10-27 | 1984-09-25 | General Electric Company | Ultrasound imaging system employing operator controlled filter for reflected signal attenuation compensation |
JPS59122942A (ja) * | 1982-12-28 | 1984-07-16 | Toshiba Corp | 超音波顕微鏡装置 |
EP0127157B2 (de) * | 1983-05-25 | 1993-06-09 | Aloka Co. Ltd. | Ultraschall-Diagnose-Vorrichtung |
US4520671A (en) * | 1983-06-10 | 1985-06-04 | General Electric Company | Method and means for real time image zoom display in an ultrasonic scanning system |
US4671292A (en) * | 1985-04-30 | 1987-06-09 | Dymax Corporation | Concentric biopsy probe |
-
1986
- 1986-01-17 JP JP61007776A patent/JPS62240856A/ja active Granted
- 1986-01-17 EP EP86100581A patent/EP0189137B1/de not_active Expired - Lifetime
- 1986-01-17 DE DE8686100581T patent/DE3678001D1/de not_active Expired - Lifetime
- 1986-01-21 US US06/820,607 patent/US4768155A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020503509A (ja) * | 2017-03-29 | 2020-01-30 | 富士通株式会社 | 超音波スキャン・データを用いた欠陥検出 |
Also Published As
Publication number | Publication date |
---|---|
JPS62240856A (ja) | 1987-10-21 |
US4768155A (en) | 1988-08-30 |
EP0189137B1 (de) | 1991-03-13 |
EP0189137A3 (en) | 1987-04-08 |
EP0189137A2 (de) | 1986-07-30 |
DE3678001D1 (de) | 1991-04-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0558502B2 (de) | ||
KR0171606B1 (ko) | 초음파 영상검사장치 | |
JP2719152B2 (ja) | 超音波探傷装置 | |
JP3499747B2 (ja) | 携帯用超音波探傷器 | |
US6073477A (en) | Digital bond tester | |
KR0171605B1 (ko) | 초음파 영상검사장치 | |
JP3171340B2 (ja) | 超音波映像探査装置 | |
JPS63177056A (ja) | 超音波検査方法 | |
JP2640878B2 (ja) | 超音波映像検査装置 | |
JP2612351B2 (ja) | 超音波検査装置 | |
JP3626987B2 (ja) | 超音波探知装置及びそれを使用した超音波探知方法 | |
JPH09257773A (ja) | 欠陥のサイジングのための超音波送受信装置及びその超音波送受信方法 | |
JP2881702B2 (ja) | 超音波探査映像装置の焦点合わせ方法およびこの方法を用いる超音波探査映像装置 | |
WO2022270363A1 (ja) | アレイ型超音波送受信装置 | |
WO2021256019A1 (ja) | 超音波診断装置、超音波診断装置の制御方法および超音波診断装置用プロセッサ | |
JPH1062395A (ja) | 超音波探傷方法及び装置 | |
JPH0249156A (ja) | 超音波断層検出方法および装置 | |
JP3040051B2 (ja) | 超音波映像検査装置 | |
JPS61266907A (ja) | 表面状態検出装置 | |
JPS61200466A (ja) | 超音波探傷装置 | |
JP2625465B2 (ja) | 超音波探傷装置 | |
JPH06213878A (ja) | 超音波映像検査装置 | |
JP2824846B2 (ja) | 超音波測定方式 | |
JPH01132957A (ja) | 超音波探傷装置 | |
JPH01224660A (ja) | 超音波探傷装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |