JPH0551842B2 - - Google Patents

Info

Publication number
JPH0551842B2
JPH0551842B2 JP58014561A JP1456183A JPH0551842B2 JP H0551842 B2 JPH0551842 B2 JP H0551842B2 JP 58014561 A JP58014561 A JP 58014561A JP 1456183 A JP1456183 A JP 1456183A JP H0551842 B2 JPH0551842 B2 JP H0551842B2
Authority
JP
Japan
Prior art keywords
difference signal
inflection point
signal
scanning
video signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58014561A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59141007A (ja
Inventor
Tsutomu Tachibana
Yasuhide Nakai
Manabu Nakatsuka
Yutaka Yoshima
Shigenori Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP1456183A priority Critical patent/JPS59141007A/ja
Publication of JPS59141007A publication Critical patent/JPS59141007A/ja
Publication of JPH0551842B2 publication Critical patent/JPH0551842B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP1456183A 1983-02-02 1983-02-02 光学的エツジ位置検出方法 Granted JPS59141007A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1456183A JPS59141007A (ja) 1983-02-02 1983-02-02 光学的エツジ位置検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1456183A JPS59141007A (ja) 1983-02-02 1983-02-02 光学的エツジ位置検出方法

Publications (2)

Publication Number Publication Date
JPS59141007A JPS59141007A (ja) 1984-08-13
JPH0551842B2 true JPH0551842B2 (enExample) 1993-08-03

Family

ID=11864563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1456183A Granted JPS59141007A (ja) 1983-02-02 1983-02-02 光学的エツジ位置検出方法

Country Status (1)

Country Link
JP (1) JPS59141007A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1001439A3 (fr) * 1988-02-12 1989-10-31 Nationale Herstal Fn Sa Fab Procede de mesure dimensionnelle a haute vitesse et haute precision par camera a reseau photosensible.

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2507040B2 (de) * 1974-04-24 1977-03-03 Zygo Corp., Middlefield, Conn. (V.StA.) Optoelektronische messvorrichtung fuer die lage einer kontrastierenden kante eines gegenstandes

Also Published As

Publication number Publication date
JPS59141007A (ja) 1984-08-13

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