JPH0548624B2 - - Google Patents

Info

Publication number
JPH0548624B2
JPH0548624B2 JP60216879A JP21687985A JPH0548624B2 JP H0548624 B2 JPH0548624 B2 JP H0548624B2 JP 60216879 A JP60216879 A JP 60216879A JP 21687985 A JP21687985 A JP 21687985A JP H0548624 B2 JPH0548624 B2 JP H0548624B2
Authority
JP
Japan
Prior art keywords
bonding
ultrasonic
waveform
standard
tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60216879A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6276731A (ja
Inventor
Mitsusada Shibasaka
Masayuki Okino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Toshiba Corp
Original Assignee
Toshiba Corp
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Seiki Co Ltd filed Critical Toshiba Corp
Priority to JP60216879A priority Critical patent/JPS6276731A/ja
Publication of JPS6276731A publication Critical patent/JPS6276731A/ja
Publication of JPH0548624B2 publication Critical patent/JPH0548624B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10W72/0711—
    • H10W70/093—
    • H10W72/07141—
    • H10W72/075—
    • H10W72/07521—
    • H10W72/07531—
    • H10W72/07533—
    • H10W72/536—
    • H10W72/5363—

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
JP60216879A 1985-09-30 1985-09-30 超音波ボンデイング検査方法及び装置 Granted JPS6276731A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60216879A JPS6276731A (ja) 1985-09-30 1985-09-30 超音波ボンデイング検査方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60216879A JPS6276731A (ja) 1985-09-30 1985-09-30 超音波ボンデイング検査方法及び装置

Publications (2)

Publication Number Publication Date
JPS6276731A JPS6276731A (ja) 1987-04-08
JPH0548624B2 true JPH0548624B2 (cg-RX-API-DMAC10.html) 1993-07-22

Family

ID=16695342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60216879A Granted JPS6276731A (ja) 1985-09-30 1985-09-30 超音波ボンデイング検査方法及び装置

Country Status (1)

Country Link
JP (1) JPS6276731A (cg-RX-API-DMAC10.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0566915A (ja) * 1991-09-09 1993-03-19 Hitachi Ltd 曲線特徴量表示方法および装置
US8714015B2 (en) 2009-03-31 2014-05-06 Toyota Jidosha Kabushiki Kaisha Joint quality inspection and joint quality inspection method
CN111599709B (zh) * 2020-05-29 2022-03-29 上海华力微电子有限公司 一种晶圆键合界面缺陷的检测方法及存储介质

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6197940A (ja) * 1984-10-19 1986-05-16 Hitachi Ltd 電子部品用検査装置
JPS61144837A (ja) * 1984-12-19 1986-07-02 Seiko Epson Corp ボンデイング検査装置

Also Published As

Publication number Publication date
JPS6276731A (ja) 1987-04-08

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term