JPH0547091B2 - - Google Patents
Info
- Publication number
- JPH0547091B2 JPH0547091B2 JP11886386A JP11886386A JPH0547091B2 JP H0547091 B2 JPH0547091 B2 JP H0547091B2 JP 11886386 A JP11886386 A JP 11886386A JP 11886386 A JP11886386 A JP 11886386A JP H0547091 B2 JPH0547091 B2 JP H0547091B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- reticle
- light
- detection means
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 45
- 238000001514 detection method Methods 0.000 claims description 29
- 239000000428 dust Substances 0.000 description 20
- 230000003287 optical effect Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000004907 flux Effects 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4719—Multiangle measurement using a optical fibre array
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95676—Masks, reticles, shadow masks
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61118863A JPS62274248A (ja) | 1986-05-23 | 1986-05-23 | 表面状態測定装置 |
US07/348,177 US4886975A (en) | 1986-02-14 | 1989-05-02 | Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces |
US07/406,090 US5017798A (en) | 1986-02-14 | 1989-09-12 | Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61118863A JPS62274248A (ja) | 1986-05-23 | 1986-05-23 | 表面状態測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62274248A JPS62274248A (ja) | 1987-11-28 |
JPH0547091B2 true JPH0547091B2 (fr) | 1993-07-15 |
Family
ID=14746996
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61118863A Granted JPS62274248A (ja) | 1986-02-14 | 1986-05-23 | 表面状態測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62274248A (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4875780A (en) * | 1988-02-25 | 1989-10-24 | Eastman Kodak Company | Method and apparatus for inspecting reticles |
JP3101290B2 (ja) * | 1989-03-15 | 2000-10-23 | キヤノン株式会社 | 表面状態検査装置、露光装置、及び表面状態検査方法 |
JP5506555B2 (ja) * | 2010-06-11 | 2014-05-28 | キヤノン株式会社 | 異物検査装置、それを用いた露光装置及びデバイスの製造方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61260632A (ja) * | 1985-05-15 | 1986-11-18 | Hitachi Ltd | 異物検査装置 |
-
1986
- 1986-05-23 JP JP61118863A patent/JPS62274248A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61260632A (ja) * | 1985-05-15 | 1986-11-18 | Hitachi Ltd | 異物検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS62274248A (ja) | 1987-11-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |