JPH0545988Y2 - - Google Patents
Info
- Publication number
- JPH0545988Y2 JPH0545988Y2 JP1985177633U JP17763385U JPH0545988Y2 JP H0545988 Y2 JPH0545988 Y2 JP H0545988Y2 JP 1985177633 U JP1985177633 U JP 1985177633U JP 17763385 U JP17763385 U JP 17763385U JP H0545988 Y2 JPH0545988 Y2 JP H0545988Y2
- Authority
- JP
- Japan
- Prior art keywords
- external terminal
- test mode
- flop
- flip
- potential side
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985177633U JPH0545988Y2 (OSRAM) | 1985-11-19 | 1985-11-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985177633U JPH0545988Y2 (OSRAM) | 1985-11-19 | 1985-11-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6286566U JPS6286566U (OSRAM) | 1987-06-02 |
| JPH0545988Y2 true JPH0545988Y2 (OSRAM) | 1993-11-30 |
Family
ID=31119015
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985177633U Expired - Lifetime JPH0545988Y2 (OSRAM) | 1985-11-19 | 1985-11-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0545988Y2 (OSRAM) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2552103B2 (ja) * | 1983-12-28 | 1996-11-06 | セイコーエプソン株式会社 | 半導体集積回路 |
-
1985
- 1985-11-19 JP JP1985177633U patent/JPH0545988Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6286566U (OSRAM) | 1987-06-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4296338A (en) | Power on and low voltage reset circuit | |
| JP2772522B2 (ja) | パワーオン信号発生回路 | |
| US4992727A (en) | Integrated circuits | |
| JP2549109B2 (ja) | 半導体回路 | |
| US5065047A (en) | Digital circuit including fail-safe circuit | |
| US6211702B1 (en) | Input circuit | |
| JPH0545988Y2 (OSRAM) | ||
| JPS5928986B2 (ja) | 半導体集積回路 | |
| EP0403047A2 (en) | A frequency divider circuit | |
| JP2527050B2 (ja) | 半導体メモリ用センスアンプ回路 | |
| US5949797A (en) | Microcontroller test circuit | |
| JPH0220115A (ja) | パルス形信号を発生する回路 | |
| JP2856355B2 (ja) | 半導体集積回路 | |
| US4507570A (en) | Resettable one shot circuit having noise rejection | |
| JPH0316648B2 (OSRAM) | ||
| JPH03102911A (ja) | クロック信号発生回路 | |
| JPS62261976A (ja) | テスト入力回路 | |
| JP2526942B2 (ja) | クロック発生回路 | |
| JPH0351334B2 (OSRAM) | ||
| JP2577127Y2 (ja) | リセット信号入力回路 | |
| JP2656660B2 (ja) | 半導体集積回路 | |
| JPS6261172B2 (OSRAM) | ||
| JP2712411B2 (ja) | テスト回路 | |
| JPS6313551Y2 (OSRAM) | ||
| JPS61150515A (ja) | 半導体集積回路 |