JPH0534105Y2 - - Google Patents
Info
- Publication number
- JPH0534105Y2 JPH0534105Y2 JP19372885U JP19372885U JPH0534105Y2 JP H0534105 Y2 JPH0534105 Y2 JP H0534105Y2 JP 19372885 U JP19372885 U JP 19372885U JP 19372885 U JP19372885 U JP 19372885U JP H0534105 Y2 JPH0534105 Y2 JP H0534105Y2
- Authority
- JP
- Japan
- Prior art keywords
- recognition
- entire surface
- illuminance
- amount
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 claims description 6
- 238000005286 illumination Methods 0.000 claims description 4
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19372885U JPH0534105Y2 (OSRAM) | 1985-12-17 | 1985-12-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19372885U JPH0534105Y2 (OSRAM) | 1985-12-17 | 1985-12-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62101232U JPS62101232U (OSRAM) | 1987-06-27 |
| JPH0534105Y2 true JPH0534105Y2 (OSRAM) | 1993-08-30 |
Family
ID=31150024
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19372885U Expired - Lifetime JPH0534105Y2 (OSRAM) | 1985-12-17 | 1985-12-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0534105Y2 (OSRAM) |
-
1985
- 1985-12-17 JP JP19372885U patent/JPH0534105Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62101232U (OSRAM) | 1987-06-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR960006966B1 (ko) | 본딩와이어 검사장치 | |
| KR960006968B1 (ko) | 본딩와이어 검사장치 및 방법 | |
| JPS5928337A (ja) | プロジエクシヨンアライナ | |
| CN100402974C (zh) | 检查装置 | |
| JP2969403B2 (ja) | ボンデイングワイヤ検査装置 | |
| KR960005092B1 (ko) | 본딩와이어 검사방법 | |
| KR960005090B1 (ko) | 본딩와이어 검사장치 | |
| KR100197178B1 (ko) | 본딩 와이어 검사방법 | |
| JPH0534105Y2 (OSRAM) | ||
| JPS6318209A (ja) | 照明方式 | |
| JPS6479874A (en) | Device for inspecting external appearance of electronic parts | |
| KR102242093B1 (ko) | 메탈 마스크 검사 장치 | |
| JPH0861928A (ja) | 外観検査用照明装置 | |
| JPH04178545A (ja) | 透明帯状体の検査方法及び装置 | |
| KR950003643B1 (ko) | 새도우 마스크 검사용 영상취득 장치 | |
| JPH03137502A (ja) | 検査装置 | |
| JP2002267611A (ja) | 検査装置 | |
| CN209432686U (zh) | 一种用于检测物体的装置 | |
| JP2004069580A (ja) | マクロ検査装置およびマクロ検査方法 | |
| JPH03181807A (ja) | 視覚装置 | |
| KR200156139Y1 (ko) | 반도체 웨이퍼 검사장치 | |
| JPS63163260A (ja) | 外観検査装置 | |
| JPS63247648A (ja) | 外観検査装置 | |
| JPS6038167Y2 (ja) | 計測用照明装置 | |
| JPS63151842A (ja) | 外観検査装置 |