JPH03137502A - Inspecting apparatus - Google Patents

Inspecting apparatus

Info

Publication number
JPH03137502A
JPH03137502A JP1276578A JP27657889A JPH03137502A JP H03137502 A JPH03137502 A JP H03137502A JP 1276578 A JP1276578 A JP 1276578A JP 27657889 A JP27657889 A JP 27657889A JP H03137502 A JPH03137502 A JP H03137502A
Authority
JP
Japan
Prior art keywords
image
inspected
lead
shadow
lower side
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1276578A
Other languages
English (en)
Other versions
JPH0769159B2 (ja
Inventor
Masaaki Koga
Kenji Furumoto
Nobuyo Kimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP1276578A priority Critical patent/JPH0769159B2/ja
Publication of JPH03137502A publication Critical patent/JPH03137502A/ja
Publication of JPH0769159B2 publication Critical patent/JPH0769159B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP1276578A 1989-10-23 1989-10-23 検査装置 Expired - Fee Related JPH0769159B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1276578A JPH0769159B2 (ja) 1989-10-23 1989-10-23 検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1276578A JPH0769159B2 (ja) 1989-10-23 1989-10-23 検査装置

Publications (2)

Publication Number Publication Date
JPH03137502A true JPH03137502A (en) 1991-06-12
JPH0769159B2 JPH0769159B2 (ja) 1995-07-26

Family

ID=17571422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1276578A Expired - Fee Related JPH0769159B2 (ja) 1989-10-23 1989-10-23 検査装置

Country Status (1)

Country Link
JP (1) JPH0769159B2 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0599635A (ja) * 1991-10-08 1993-04-23 Seiwa Sangyo Kk 外観検査装置
JP2006258433A (ja) * 2005-03-15 2006-09-28 Susumu Nakatani 平坦度等の測定装置および平坦度等の測定方法
US20180188184A1 (en) * 2015-08-26 2018-07-05 Abb Schweiz Ag Object multi-perspective inspection apparatus and method therefor
CN111480049A (zh) * 2017-11-15 2020-07-31 株式会社高迎科技 检查装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194403A (en) * 1985-09-11 1987-08-26 Matsushita Electronics Corp Visual inspection instrument
JPS62274205A (en) * 1986-05-23 1987-11-28 Hitachi Tokyo Electron Co Ltd Method and device for inspecting lead flatness

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194403A (en) * 1985-09-11 1987-08-26 Matsushita Electronics Corp Visual inspection instrument
JPS62274205A (en) * 1986-05-23 1987-11-28 Hitachi Tokyo Electron Co Ltd Method and device for inspecting lead flatness

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0599635A (ja) * 1991-10-08 1993-04-23 Seiwa Sangyo Kk 外観検査装置
JP2006258433A (ja) * 2005-03-15 2006-09-28 Susumu Nakatani 平坦度等の測定装置および平坦度等の測定方法
US20180188184A1 (en) * 2015-08-26 2018-07-05 Abb Schweiz Ag Object multi-perspective inspection apparatus and method therefor
US10488346B2 (en) * 2015-08-26 2019-11-26 Abb Schweiz Ag Object multi-perspective inspection apparatus and method therefor
US10788429B2 (en) 2015-08-26 2020-09-29 Abb Schweiz Ag Object multi-perspective inspection apparatus and method therefor
CN111480049A (zh) * 2017-11-15 2020-07-31 株式会社高迎科技 检查装置
EP3712554A4 (en) * 2017-11-15 2021-09-08 Koh Young Technology Inc INSPECTION DEVICE

Also Published As

Publication number Publication date
JPH0769159B2 (ja) 1995-07-26

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees