JPH0527831B2 - - Google Patents

Info

Publication number
JPH0527831B2
JPH0527831B2 JP59171665A JP17166584A JPH0527831B2 JP H0527831 B2 JPH0527831 B2 JP H0527831B2 JP 59171665 A JP59171665 A JP 59171665A JP 17166584 A JP17166584 A JP 17166584A JP H0527831 B2 JPH0527831 B2 JP H0527831B2
Authority
JP
Japan
Prior art keywords
address
memory
data
pin
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59171665A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60130839A (ja
Inventor
Ii Changu Iihyua
Eru Shuruman Maaku
Jei Guruodeisu Arugaadasu
Pii Myuurufuerudo Junia Hansu
Daburyuu Rodorigesu Chaaruzu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS60130839A publication Critical patent/JPS60130839A/ja
Publication of JPH0527831B2 publication Critical patent/JPH0527831B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59171665A 1983-12-19 1984-08-20 テスト装置 Granted JPS60130839A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US564853 1983-12-19
US06/564,853 US4639919A (en) 1983-12-19 1983-12-19 Distributed pattern generator

Publications (2)

Publication Number Publication Date
JPS60130839A JPS60130839A (ja) 1985-07-12
JPH0527831B2 true JPH0527831B2 (enExample) 1993-04-22

Family

ID=24256161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59171665A Granted JPS60130839A (ja) 1983-12-19 1984-08-20 テスト装置

Country Status (4)

Country Link
US (1) US4639919A (enExample)
EP (1) EP0149048B1 (enExample)
JP (1) JPS60130839A (enExample)
DE (1) DE3472839D1 (enExample)

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EP0337023A1 (en) * 1983-11-25 1989-10-18 Giordano Associates, Inc. Decompaction of stored test data in automatic test systems
KR900001976B1 (ko) * 1984-11-01 1990-03-30 가부시끼가이샤 히다찌세이사꾸쇼 다수 개의 패턴 발생기를 포함하는 패턴 검사 장치
DE3676377D1 (de) * 1985-01-31 1991-02-07 Hitachi Ltd Generator fuer testmuster.
DE3515802A1 (de) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Anordnung zur schnellen erzeugung von grossen pruefdatenwortmengen in einer pruefeinrichtung
JPH0750159B2 (ja) * 1985-10-11 1995-05-31 株式会社日立製作所 テストパタ−ン発生装置
US4931723A (en) * 1985-12-18 1990-06-05 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture
CA1251575A (en) 1985-12-18 1989-03-21 A. Keith Jeffrey Automatic test system having a "true tester-per-pin" architecture
JPH0746127B2 (ja) * 1986-05-20 1995-05-17 三菱電機株式会社 半導体試験装置
DE3752280T2 (de) * 1986-07-30 2000-02-03 Hitachi, Ltd. Mustergenerator
US4792951A (en) * 1986-09-11 1988-12-20 Grumman Aerospace Corporation Apparatus and method of stimulating an equipment
US4773071A (en) * 1986-10-02 1988-09-20 Grumman Aerospace Corporation Memory for storing response patterns in an automatic testing instrument
US5265101A (en) * 1987-09-14 1993-11-23 Texas Instruments Incorporated Function array sequencing for VLSI test system
DE3827959A1 (de) * 1988-08-17 1990-02-22 Siemens Ag Testgeraet zur funktionspruefung von elektroischen bausteinen
US5029171A (en) * 1989-05-25 1991-07-02 Hughes Aircraft Company Test vector generation system
US5127011A (en) * 1990-01-12 1992-06-30 International Business Machines Corporation Per-pin integrated circuit test system having n-bit interface
IL94115A (en) * 1990-04-18 1996-06-18 Ibm Israel Dynamic process for creating pseudo-random test templates for pompous hardware design violence
US5200963A (en) * 1990-06-26 1993-04-06 The United States Of America As Represented By The Administrator, National Aeronautics And Space Administration Self-checking on-line testable static ram
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
US5293080A (en) * 1990-10-09 1994-03-08 Hewlett-Packard Company Method and apparatus for generating test waveforms to be applied to a device under test
US5285453A (en) * 1990-12-28 1994-02-08 International Business Machines Corporation Test pattern generator for testing embedded arrays
DE4305442C2 (de) * 1993-02-23 1999-08-05 Hewlett Packard Gmbh Verfahren und Vorrichtung zum Erzeugen eines Testvektors
US5375091A (en) * 1993-12-08 1994-12-20 International Business Machines Corporation Method and apparatus for memory dynamic burn-in and test
US5805471A (en) * 1994-11-01 1998-09-08 Pycon, Inc. Driver board apparatus having SRAM and burn-in system and method using host computer
KR0157900B1 (ko) * 1995-10-02 1999-03-20 문정환 집적 회로내의 입출력 장치
DE69613560T2 (de) * 1996-04-30 2002-03-14 Agilent Technologies, Inc. Ein Prüfgerät für elektronische Schaltkreise oder Platinen mit komprimierten Datenfolgen
US6381506B1 (en) * 1996-11-27 2002-04-30 Victor Grappone Fail-safe microprocessor-based control and monitoring of electrical devices
US6014764A (en) * 1997-05-20 2000-01-11 Schlumberger Technologies Inc. Providing test vectors with pattern chaining definition
US5794175A (en) * 1997-09-09 1998-08-11 Teradyne, Inc. Low cost, highly parallel memory tester
US5825787A (en) * 1997-11-25 1998-10-20 Xilinx, Inc. System and method for accessing a test vector memory
US6115763A (en) * 1998-03-05 2000-09-05 International Business Machines Corporation Multi-core chip providing external core access with regular operation function interface and predetermined service operation services interface comprising core interface units and masters interface unit
GB9805054D0 (en) 1998-03-11 1998-05-06 Process Intelligence Limited Memory test system with buffer memory
US6158032A (en) * 1998-03-27 2000-12-05 International Business Machines Corporation Data processing system, circuit arrangement and program product including multi-path scan interface and methods thereof
JP2002131401A (ja) * 2000-10-27 2002-05-09 Ando Electric Co Ltd データログ取得回路、及びデータログ取得方法
US7062697B2 (en) * 2000-12-07 2006-06-13 Youngtek Electronics Corporation Pre-stored digital word generator
US6515914B2 (en) * 2001-03-21 2003-02-04 Micron Technology, Inc. Memory device and method having data path with multiple prefetch I/O configurations
US6779140B2 (en) * 2001-06-29 2004-08-17 Agilent Technologies, Inc. Algorithmically programmable memory tester with test sites operating in a slave mode
JP3610978B2 (ja) * 2002-06-13 2005-01-19 株式会社村田製作所 モジュール試験装置
US7103750B2 (en) * 2003-03-20 2006-09-05 International Business Machines Corporation Method and apparatus for finding repeated substrings in pattern recognition
KR100557221B1 (ko) * 2004-11-04 2006-03-07 삼성전자주식회사 메모리 모듈에서의 신호 무결성 테스트 방법 및 이를 위한메모리 모듈의 버퍼
US8046655B2 (en) * 2005-05-18 2011-10-25 Stmicroelectronics Pvt. Ltd. Area efficient memory architecture with decoder self test and debug capability
WO2007095996A1 (en) * 2006-02-23 2007-08-30 Mentor Graphics Corp. Cross-bar switching in an emulation environment
KR20080069778A (ko) * 2007-01-24 2008-07-29 삼성전자주식회사 멀티칩 테스트를 위한 반도체 메모리 장치의 테스트 회로및 그의 테스트 방법
US8295182B2 (en) * 2007-07-03 2012-10-23 Credence Systems Corporation Routed event test system and method
US7554858B2 (en) 2007-08-10 2009-06-30 Micron Technology, Inc. System and method for reducing pin-count of memory devices, and memory device testers for same
US7779313B2 (en) * 2008-03-30 2010-08-17 Advantest Corporation Testing apparatus and testing method
JP2011524039A (ja) * 2008-05-21 2011-08-25 ヴェリジー（シンガポール） プライベート リミテッド 反復ビット値パターンを決定する方法及び装置
KR102615807B1 (ko) * 2016-08-23 2023-12-20 에스케이하이닉스 주식회사 래치회로를 테스트할 수 있는 테스트방법을 제공하는 반도체장치
GB201711055D0 (en) * 2017-07-10 2017-08-23 Accelercomm Ltd Electronic device with bit pattern generation, integrated circuit and method for polar coding

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US31056A (en) * 1861-01-01 Nut-machine
US3772595A (en) * 1971-03-19 1973-11-13 Teradyne Inc Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals
USRE31056E (en) 1977-03-23 1982-10-12 Fairchild Camera & Instrument Corp. Computer controlled high-speed circuit for testing electronic devices
US4293950A (en) * 1978-04-03 1981-10-06 Nippon Telegraph And Telephone Public Corporation Test pattern generating apparatus
US4195770A (en) * 1978-10-24 1980-04-01 Burroughs Corporation Test generator for random access memories
JPS5585264A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
JPS5914840B2 (ja) * 1979-10-19 1984-04-06 日本電信電話株式会社 半導体メモリ試験用パタ−ン発生装置
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
US4370746A (en) * 1980-12-24 1983-01-25 International Business Machines Corporation Memory address selector
FR2506045A1 (fr) * 1981-05-15 1982-11-19 Thomson Csf Procede et dispositif de selection de circuits integres a haute fiabilite
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4493045A (en) * 1981-10-19 1985-01-08 Fairchild Camera & Instrument Corp. Test vector indexing method and apparatus
US4493079A (en) * 1982-08-18 1985-01-08 Fairchild Camera & Instrument Corp. Method and system for selectively loading test data into test data storage means of automatic digital test equipment
US4503537A (en) * 1982-11-08 1985-03-05 International Business Machines Corporation Parallel path self-testing system

Also Published As

Publication number Publication date
EP0149048B1 (en) 1988-07-20
EP0149048A1 (en) 1985-07-24
DE3472839D1 (en) 1988-08-25
JPS60130839A (ja) 1985-07-12
US4639919A (en) 1987-01-27

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