JPH0527252B2 - - Google Patents

Info

Publication number
JPH0527252B2
JPH0527252B2 JP59031413A JP3141384A JPH0527252B2 JP H0527252 B2 JPH0527252 B2 JP H0527252B2 JP 59031413 A JP59031413 A JP 59031413A JP 3141384 A JP3141384 A JP 3141384A JP H0527252 B2 JPH0527252 B2 JP H0527252B2
Authority
JP
Japan
Prior art keywords
wire
connection terminal
distance
terminal group
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59031413A
Other languages
Japanese (ja)
Other versions
JPS60176245A (en
Inventor
Zensaku Watanabe
Hitoshi Choma
Kuniaki Kida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP59031413A priority Critical patent/JPS60176245A/en
Publication of JPS60176245A publication Critical patent/JPS60176245A/en
Publication of JPH0527252B2 publication Critical patent/JPH0527252B2/ja
Granted legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • HELECTRICITY
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    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04042Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
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    • H01L2224/0554External layer
    • H01L2224/0555Shape
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    • H01L2224/061Disposition
    • H01L2224/0612Layout
    • H01L2224/0615Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry
    • H01L2224/06153Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry with a staggered arrangement, e.g. depopulated array
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
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    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
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    • H01L2224/494Connecting portions
    • H01L2224/4943Connecting portions the connecting portions being staggered
    • H01L2224/49431Connecting portions the connecting portions being staggered on the semiconductor or solid-state body
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/494Connecting portions
    • H01L2224/4943Connecting portions the connecting portions being staggered
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    • H01L2224/78Apparatus for connecting with wire connectors
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    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
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    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)
  • Electronic Switches (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

〔発明の技術分野〕 本発明はワイヤボンデイング方法に係り、特に
ハアクシミリなどに用いられるサーマルプリンテ
イングヘツドや金融機器などに用いられる密着型
イメージセンサ等の段差を介し、相対向して高密
度に配置された接続端子間をワイヤリングする際
にワイヤ間の接触も少なく、また接触の修繕も容
易にして、段差を有する接続端子間を高信頼性を
もつてワイヤリングすることが可能なワイヤボン
デイング方法に関するものである。 〔発明の技術的背景とその問題点〕 例えばフアクシミリに使用されているサーマル
プリンテイングヘツドを第1図及び第2図により
説明する。 即ち、セラミツク等の絶縁基板上に薄膜技術や
厚膜技術によつて一列に高密度に並べられた複数
の発熱抵抗体1と、シフトレジスタ、トランジス
タドライブ及びセレクタからなる発熱抵抗体駆動
用集積回路(以下集積回路という)2と各発熱抵
抗体1の一端10を共通接続した共通電極3と、
各発熱抵抗体1を集積回路2を介して選択的に通
電発熱させるための入力信号群4を主構成とし、
各発熱抵抗体1からの第1の接続端子群11は選
択的に出力される集積回路2からの第2の接続端
子群21に対応するように設けられ、それぞれの
接続端子間はワイヤのボンデイングにより接続さ
れている。 この第2の接続端子群21の接続端子数は、一
般に収束回路21個当り32の接続端子のものが
経済的に優れているといわれている。従つて発熱
抵抗体1は32個単位で集積回路2からの第2の接
続端子群21と接続されることになる。図におい
て5は集積回路2の出力信号用端子、6は集積回
路2への電源である。 このような構造のサーマルプリンテイングヘツ
ドによるフアクシミリの記録は所定の発熱抵抗体
1を選択的に通電して発熱させ、発熱抵抗体1に
熱転写フイルムを接触させ、この熱転写フイルム
を介して普通紙に転写されるようになつている。 この状態を第2図により説明すると、発熱抵抗
体1を高密度で紙面に直角方向に一列に並べたセ
ラミツクなどの抵抗基板40と、集束回路2を配
設したドライブ基板411及び共通電極3を配設
した共通電極基板412とはアルミニウム等の金
属からならヒートシンク42上に載置固定されて
いる。 この発熱抵抗体1上には熱軟化性インクを塗付
した熱転写フイルム43、普通紙44が発熱抵抗
体1と、この発熱抵抗体1に圧接摺動するプラテ
ンローラ45との間に挿入されており、このプラ
テンローラ45の矢印451の回転により熱転写
フイルム43と普通紙44が共に矢印50方向に
移動するようになつている。図において461
462は熱転写フイルム43の動きを支持する補
助ローラである。 またサーマルプリンテイングヘツドの接続は、
発熱抵抗体1からの第1の接続端子群11と集積
回路2の出力からの第2の接続端子群21とも接
続するワイヤ47、発熱抵抗体1の一端10と共
通電極3とを接続するワイヤ48、集積回路2と
入力信号群4とを接続するワイヤ49により第1
図のような回路に構成されることになる。 この構造で補助ローラ461,462間の熱転写
フイルム43に“たるみ”や“しわ”が生じると
発熱抵抗体1から熱転写フイルム43を介して普
通紙44への記録する位置がずれたり、発熱抵抗
体1の熱が均一に伝導せず、記録像の解像度を悪
くするばかりでなく、繊細な記録ができないこと
になるので補助ローラ461,462間の距離lは
できるだけ小さくすることが望ましい。 そのため、図のように抵抗基板40とドライブ
基板411及び共通電極基板412との間に段差h
を設け、距離lを小さくする技術が特開昭54−
139558号公報に示されている。 この公報によれば段差hが0.3mm程度では、通
常のワイヤボンデイング方法で、この段差h間の
接続は可能であつても、この程度の大きさでは補
助ローラ461,462間の距離lを小さくする効
果はほとんど望めない。即ち、通常、集積回路2
の厚さは0.3乃至0.5mmあるからである。このこと
から、段差hは0.5乃至1.5mmが必要となる。 次に第1図及び第2図の要部を第3図により説
明する。 即ち抵抗基板40上の発熱抵抗体からのリード
線の端部に接続端子111,112が千鳥状に配設
された第1の接続端子群11と、ドライブ基板4
1上の集積回路2の抵抗基板1側に出力用の接続
端子211,212が千鳥状に配設された第2の接
続端子群21とを段差hを介して相対向させて配
置し、第1の接続端子群11と第2の接続端子群
21それぞれの段差hに近いもの同志111と2
1、遠いもの同志112と212とを従来技術で
それぞれワイヤ471,472により接続する。 この場合、抵抗基板40とドライブ基板41が
同一平面にあるか、また集積回路2の厚さ分だけ
段差を有し、高い側から低い側にワイヤボンデイ
ングを行ない、このとき第1の接続端子群11と
第2の接続端子群21の接続方法として、第1の
接続端子群11、第2の接続端子群21の近距離
同志即ち111と212および遠距離同志即ち11
と212とを接続し、近距離同志のワイヤ471
の高さを遠距離同志のワイヤ472の高さより低
く配設するワイヤボンデイング方法が特開昭57−
165272号公報に示されている。 しかし、このワイヤボンデイング方法は直径
30μmの金ワイヤでフルオートボンダ{(株)新川、
型名SWB−FA−UTC−7}を用いた提案者ら
の実験によれば、段差の大きさが集積回路2の厚
さ分、すなわち0.3乃至0.5mmの範囲およびワイヤ
長さが2mm以下において有用でも段差が0.5mm以
上、ワイヤ長さが2mm以上になると、第3図に示
すように近距離同志のワイヤ471および遠距離
同志のワイヤ472の段差の高い部分において20μ
mから30μmと近接し極端な場合は第3図aのよ
うにワイヤ471,472が接触するものがみられ
た。また第3図aのように近距離同志のワイヤ4
1のうちには下側まで曲りを示すものが見られ
た。とくに接触するものはワイヤ471同志やワ
イヤ472同志にはなく、ワイヤ471とワイヤ4
2間において発生する。これはフルオートボン
ダの場合、ボンデイング中のワイヤ切れ対策とし
て金ワイヤの伸び率(常温で7乃至10%)の大き
いものを用いることから、ワイヤが高速で張られ
たのち縮むため、ワイヤループとしての安定を保
つための自由度は張つたワイヤに対して直角方向
のみとなり、ワイヤ倒れたなつてあらわれると考
えられる。また実験中におけるワイヤ倒れは1個
の集積回路内においては一方向性をもつている
し、またワイヤ471,472間の接触位置はワイ
ヤのほぼ中央であつた。更に第3図bに示すよう
に近距離同志のワイヤ471をボンデイングした
のち、遠距離同志のワイヤ472をボンデイング
しようとする、キヤピラリ51の降下時にこのキ
ヤピラリ51の先端や側端部がワイヤ471に接
触し、キヤピラリ51によるワイヤ踏み現象がみ
られ、ワイヤ471が471′のように変形するこ
ともある。これは、段差が0.5mm以上の所をボン
デイングするとき、ワイヤループ形状を決めるワ
イヤテンシヨン(通常ワイヤを挟み込む摩擦方式
をとつている)をゆるめて行なうためワイヤ47
は最初の接続点である接続端子211にボンデイ
ング後、次の接続点である接続端子472にボン
デイング中に長めになるため矢印方向に変形し、
最初の接続点である接続端子211の外方に変形
するため、ワイヤ471を最初の接続点である接
続端子212にボンデイングするときのキヤピラ
リ212にボンデイングするときのキヤピラリ5
1の降下時にワイヤ471を踏む現象が表われる。
この現象は、近距離同志の接続端子111,211
のボンデイング位置間の距離ISLと、遠距離同志
の接続端子112,212のボンデイング位置間の
距離OSLとの比が不適当、とくにh/ISL比が大
きいとこの傾向が顕著にあらわれることが実験的
に確認された。 〔発明の目的〕 この発明は上述した問題点に鑑みなされたもの
であり、ワイヤ間の接触事故を少なくし、高密度
化をはかり得る段差を有する電極群間のワイヤボ
ンデイング方法を提供することを目的としてい
る。 〔発明の概要〕 即ち、本発明は、段差をもつて対向するように
設けられた第1の接続端子群及び第2の接続端子
群のそれぞれ相対応する接続端子対間をワイヤの
ホンデイングにより接続するようになされたワイ
ヤボンデイング方法において、第1の接続端子群
と第2の接続端子群との段差hと、相対応する接
続端子対のボンデイング位置間の距離SLとの間
にh/SL=0.4乃至0.6の関係をもたせたことを特
徴とするワイヤボンデイング方法であり、第1の
接続端子群及び第2の接続端子群かそれぞれ千鳥
状に配設され、近距離同志および遠距離同志の接
続端子対をそれぞれ相対応させ、近距離同志の接
続端子対のボンデイング位置間の距離をISL、遠
距離同志の接続端子対のボンデイング位置間の距
離をOLSとした時、h/ISL=0.40乃至0.45、
h/OSL=0.50乃至0.60の関係を持たせたこと、
段差hが0.5乃至1.5mmの範囲であること、ワイヤ
のボンデイングが段差の低い側を先に、段差の高
い側を後にすることを実施態様としている。 〔発明の実施例〕 サーマルプリンテイングヘツドでは、発熱抵抗
体の数が前述のように数1000個程度と極めて多数
であるため駆動回路の集積化して、外部周辺回路
の低減を図つている。この場合に問題となるのは
数1000個という多数の発熱抵抗体と集積回路の出
力及び発熱抵抗体と共通電極をいかに作業能率よ
く高信頼性をもたせて接続し、かつボンデイング
中のワイヤ倒れをいかに容易に修繕できるかとい
う点である。 この点について発明者らは更に段差を介して対
向するように設けられた第1の接続端子群及び第
2の接続端子群のそれぞれ相対応する接続端子対
間をワイヤのボンデイングにより接続するワイヤ
ボンデイング方法について種々実験検討した結
果、段差が大きくなるとワイヤが長くなるのでワ
イヤ切れ対策からワイヤのテンシヨンもワイヤの
短かい場合に比較して小さくしなければならずワ
イヤのたるみを防止する必要から段差とボンデイ
ング位置間の比を最適化することにより、ワイヤ
のたるみもなくなることを見い出した。 この場合、段差の大きさが0.5mm以下であると
従来技術によるワイヤボンデイング方法が可能で
あるが段差が0.5mm以上になると前述した問題点
があり、段差が1.5mm以上になるとワイヤが長く
なり、ボンデイング中に最初にボンデイングした
ワイヤと接続電極のボンデイング位置に引張り力
が働き、はくりをまねく危険性が高まると同時に
ワイヤに内在している曲がり(通常カール現象と
云う)が発生し、隣接ワイヤとの接触が多くな
り、例えば1mmに9個の接続端子を有するような
高密度配線には適さない。従つて、本発明のワイ
ヤボンデイング方法における段差の範囲は0.5mm
から1.5mmが最適となる。またワイヤのボンデイ
ングを段差の高い側を先にすると、段差の低い側
をボンデイングする際、特に金やアルミニウムの
ワイヤを使用するとボンデイング部のすぐ上のワ
イヤのネツク部に引張り力が働き、極端な場合は
ボンデイング位置の剥離を引き起こす危険がある
し、またボンデイングの適用製品の補助ローラ間
を小さくするという制約条件から段差の低い側を
先にボンデイングした方が好ましい。 次に本発明のワイヤボンデイング方法の一実施
例を第4図により説明する。但し、第3図と同一
符号は同一部を示す。 即ち、図示しない複数個の発熱抵抗対に接続さ
れた導出線がその先端において、千鳥状の接続端
子111,112からなる第1の接続端子群11と
して配設されている抵抗基板40はヒートシンク
42上の図示しない位置合せマークと抵抗基板4
0上の発熱抵抗対との位置合わせを行ない装着に
より載置される。 また集積回路2が接着載置されたドライブ基板
411は抵抗基板40の接続端子111,112と、
ドライブ基板41上の集積回路2の千鳥状の接続
端子211,212からなる第2の接続端子群21
と適正な距離を保ち、顕微鏡等により近距離同
志、遠距離同志の接続端子111と211及び11
と212の位置出しが行なわれ、ヒートシンク4
2上に接着載置される。 この場合抵抗基板40の高さと集積回路2面上
の高さの差即ち段差hは第2図に示したプラテン
ローラ径40mm、補助ローラ径10mmで考えると1mm
前後が望ましいので、本実施例では1mmとした。
この時、抵抗基板40側の千鳥状の第1接続端子
群11と、集積回路2側の千鳥状の第2の接続端
子群21とは遠距離同志即ち111と211および
近距離同志即ち112と212のものが相対向して
配設され、これらをワイヤでボンデイングするこ
とによりサーマルプリンテイングヘツドが完成す
る。 ここでボンデイング位置間の段差hとボンデイ
ング位置間距離の近距離同志の距離OSL及び遠
距離同志の距離ISLの比即ちボンデイング段差比
は、ボンデイング段差比=h/ISL=h/OSLで
表わされる。また、ISLとOSLを含めてSLとす
ばh/SLとなる。 次に従来の方法によるボンデイング段差比のも
のを含めて0.25から0.80まで変化させたボンデイ
ング結果を下表に示す。但し、ボンデイングは低
い側を先に行なつた。
[Technical Field of the Invention] The present invention relates to a wire bonding method, and particularly relates to a wire bonding method, in which wire bonding methods are used to bond devices such as thermal printing heads used in high-speed cameras and contact type image sensors used in financial instruments, etc. This invention relates to a wire bonding method that reduces contact between wires when wiring between connected terminals that have been connected to each other, makes it easy to repair contacts, and enables highly reliable wiring between connecting terminals that have differences in level. It is. [Technical Background of the Invention and Problems Therewith] A thermal printing head used, for example, in a facsimile machine will be explained with reference to FIGS. 1 and 2. That is, a plurality of heating resistors 1 are arranged in a line with high density using thin film technology or thick film technology on an insulating substrate such as ceramic, and an integrated circuit for driving the heating resistors consisting of a shift register, a transistor drive, and a selector. (hereinafter referred to as an integrated circuit) 2 and a common electrode 3 to which one end 10 of each heating resistor 1 is commonly connected;
Mainly composed of an input signal group 4 for selectively energizing each heating resistor 1 to generate heat via an integrated circuit 2,
A first group of connection terminals 11 from each heating resistor 1 is provided to correspond to a second group of connection terminals 21 from the integrated circuit 2 that is selectively output, and wire bonding is used between each connection terminal. connected by. Regarding the number of connection terminals in the second connection terminal group 21, it is generally said that 32 connection terminals per 21 convergence circuits is economically advantageous. Therefore, the heating resistors 1 are connected to the second connection terminal group 21 from the integrated circuit 2 in units of 32. In the figure, 5 is an output signal terminal of the integrated circuit 2, and 6 is a power supply to the integrated circuit 2. To record a facsimile using a thermal printing head with such a structure, a predetermined heat generating resistor 1 is selectively energized to generate heat, a thermal transfer film is brought into contact with the heat generating resistor 1, and the facsimile is printed onto plain paper through the thermal transfer film. It is beginning to be transcribed. To explain this state with reference to FIG. 2, there is a resistance substrate 40 made of ceramic or the like in which heating resistors 1 are arranged in a row at a high density in a direction perpendicular to the plane of the paper, a drive substrate 41 1 on which a focusing circuit 2 is arranged, and a common electrode 3. The common electrode substrate 41 2 on which the common electrode substrate 41 2 is made of metal such as aluminum is placed and fixed on a heat sink 42 . On this heating resistor 1, a thermal transfer film 43 coated with heat-softening ink and plain paper 44 are inserted between the heating resistor 1 and a platen roller 45 that slides into pressure contact with this heating resistor 1. As the platen roller 45 rotates in the direction of arrow 451 , both the thermal transfer film 43 and the plain paper 44 move in the direction of arrow 50. In the figure, 46 1 ,
46 2 is an auxiliary roller that supports the movement of the thermal transfer film 43. Also, the connection of the thermal printing head is
A wire 47 that also connects the first connection terminal group 11 from the heat generating resistor 1 and the second connection terminal group 21 from the output of the integrated circuit 2, and a wire that connects one end 10 of the heat generating resistor 1 and the common electrode 3. 48, the first wire 49 connecting the integrated circuit 2 and the input signal group 4
The circuit will be configured as shown in the figure. With this structure, if "sag" or "wrinkle" occurs in the thermal transfer film 43 between the auxiliary rollers 46 1 and 46 2 , the recording position from the heating resistor 1 to the plain paper 44 via the thermal transfer film 43 may shift, or heat generation may occur. It is desirable that the distance l between the auxiliary rollers 46 1 and 46 2 be as small as possible because the heat of the resistor 1 is not conducted uniformly, which not only deteriorates the resolution of the recorded image but also prevents delicate recording. . Therefore, as shown in the figure, there is a step h between the resistance board 40, the drive board 41 1 , and the common electrode board 41 2 .
The technology for reducing the distance l by providing
This is shown in Publication No. 139558. According to this publication, if the height difference h is about 0.3 mm, it is possible to connect the height difference h using the normal wire bonding method, but if the height difference h is about 0.3 mm, the distance l between the auxiliary rollers 46 1 and 46 2 is possible. There is little hope of reducing the effect. That is, typically integrated circuit 2
This is because the thickness is 0.3 to 0.5 mm. From this, the height difference h needs to be 0.5 to 1.5 mm. Next, the main parts of FIGS. 1 and 2 will be explained with reference to FIG. 3. That is, a first connection terminal group 11 in which connection terminals 11 1 and 11 2 are arranged in a staggered manner at the end of a lead wire from a heat generating resistor on a resistance board 40;
A second connection terminal group 21 in which output connection terminals 21 1 , 21 2 are arranged in a staggered manner on the resistor substrate 1 side of the integrated circuit 2 on the integrated circuit 1 is arranged opposite to the second connection terminal group 21 through a step h. , those close to the step h between the first connection terminal group 11 and the second connection terminal group 21 11 1 and 2
1 1 , distant comrades 11 2 and 21 2 are connected by wires 47 1 and 47 2 , respectively, using conventional techniques. In this case, the resistor board 40 and the drive board 41 are on the same plane, or have a step corresponding to the thickness of the integrated circuit 2, and wire bonding is performed from the higher side to the lower side. 11 and the second connection terminal group 21, close distance comrades of the first connection terminal group 11 and second connection terminal group 21, namely 11 1 and 21 2 , and long distance comrades, ie 11
Connect 2 and 21 2 and connect the short distance comrade wire 47 1
A wire bonding method in which the height of the wire 47 is lower than the height of the long-distance wire 472 was disclosed in Japanese Patent Application Laid-Open No. 57-
This is shown in Publication No. 165272. However, this wire bonding method
Fully automatic bonder with 30μm gold wire {Shinkawa Co., Ltd.
According to experiments conducted by the proposers using the model name SWB-FA-UTC-7}, the size of the step is equal to the thickness of the integrated circuit 2, that is, in the range of 0.3 to 0.5 mm, and the wire length is 2 mm or less. Even if it is useful, if the height difference is 0.5 mm or more and the wire length is 2 mm or more, the wire 47 1 of the short distance and the wire 47 2 of the long distance have a height of 20 μm in the high step part, as shown in FIG.
In extreme cases where the wires were close to each other by 30 μm from m, there were cases where the wires 47 1 and 47 2 came into contact as shown in FIG. 3a. Also, as shown in Fig. 3a, wires 4 of close distance
Some of the 7 1 's had curves down to the bottom. In particular, wires 47 1 and 47 2 do not come in contact with each other, but wire 47 1 and wire 4
7 Occurs between 2 . This is because fully automatic bonders use gold wire with a high elongation rate (7 to 10% at room temperature) to prevent wire breakage during bonding, so the wire is stretched at high speed and then shrinks, resulting in a wire loop. The only degree of freedom to maintain stability is in the direction perpendicular to the stretched wire, and it is thought that the wire will fall and sag. Further, during the experiment, the wire collapse was unidirectional within one integrated circuit, and the contact position between the wires 47 1 and 47 2 was approximately at the center of the wires. Furthermore, as shown in FIG. 3b, after bonding the wires 47 1 that are close together, when the capillary 51 is lowered to bond the wire 47 2 that is long distance comrades, the tip and side ends of the capillary 51 become wires. 47 1 , a wire stepping phenomenon by the capillary 51 is observed, and the wire 47 1 may be deformed as 47 1 ′. This is because when bonding where the step is 0.5 mm or more, the wire tension (which usually uses a friction method that pinches the wire) that determines the wire loop shape is loosened.
1 deforms in the direction of the arrow because it becomes longer during bonding to the connection terminal 21 1 which is the first connection point, and then to the connection terminal 47 2 which is the next connection point,
The capillary 5 when bonding the wire 47 1 to the capillary 21 2 when bonding the wire 47 1 to the connection terminal 21 2 which is the first connection point is deformed outward from the connection terminal 21 1 which is the first connection point.
1 appears when the wire 47 1 is stepped on.
This phenomenon is caused by the connection terminals 11 1 , 21 1
The ratio between the distance ISL between the bonding positions of the long-distance terminals and the distance OSL between the bonding positions of the long-distance connecting terminals 11 2 and 21 2 is inappropriate, and this tendency may be particularly noticeable when the h/ISL ratio is large. Confirmed experimentally. [Object of the Invention] The present invention has been made in view of the above-mentioned problems, and it is an object of the present invention to provide a wire bonding method between electrode groups having steps that can reduce contact accidents between wires and increase density. The purpose is [Summary of the Invention] That is, the present invention connects corresponding pairs of connecting terminals of a first connecting terminal group and a second connecting terminal group that are provided so as to face each other with a difference in level by wire honing. In the wire bonding method, h/SL=between the step h between the first connecting terminal group and the second connecting terminal group and the distance SL between the bonding positions of the corresponding pair of connecting terminals. This is a wire bonding method characterized by having a relationship of 0.4 to 0.6, in which the first connection terminal group and the second connection terminal group are arranged in a staggered manner, and the connection between close and long distances is possible. When the terminal pairs are made to correspond to each other, and the distance between the bonding positions of the close-distance pair of connecting terminals is ISL, and the distance between the bonding positions of the long-distance pair of connecting terminals is OLS, h/ISL = 0.40 to 0.45. ,
having a relationship of h/OSL=0.50 to 0.60;
The embodiment is such that the height difference h is in the range of 0.5 to 1.5 mm, and the wire bonding is performed on the side with the lower height difference first and the side with the higher height difference later. [Embodiments of the Invention] In a thermal printing head, the number of heating resistors is extremely large, approximately several thousand as described above, and therefore, the drive circuit is integrated to reduce the number of external peripheral circuits. In this case, the problem is how to efficiently connect the several thousand heat-generating resistors to the output of the integrated circuit, the heat-generating resistors, and the common electrode with high reliability, and how to prevent wires from falling during bonding. The point is how easily it can be repaired. Regarding this point, the inventors further proposed a wire bonding method in which pairs of corresponding connection terminals of a first connection terminal group and a second connection terminal group, which are provided to face each other with a step in between, are connected by wire bonding. As a result of various experiments and studies on this method, we found that as the height difference increases, the wire becomes longer, so in order to prevent wire breakage, the tension of the wire must be smaller than when the wire is short. It has been found that by optimizing the ratio between bonding positions, wire slack can also be eliminated. In this case, if the size of the step is 0.5 mm or less, the conventional wire bonding method is possible, but if the step is 0.5 mm or more, the above-mentioned problem will occur, and if the step is 1.5 mm or more, the wire will become longer. During bonding, a tensile force acts on the bonding position of the first bonded wire and the connecting electrode, increasing the risk of peeling, and at the same time, the inherent bending of the wire (usually called a curl phenomenon) occurs, causing the adjacent This increases the number of contacts with wires, making it unsuitable for high-density wiring, such as one having nine connection terminals per millimeter. Therefore, the range of the step in the wire bonding method of the present invention is 0.5 mm.
1.5mm is optimal. Also, if you bond the wire to the side with a higher level difference first, when bonding the side with a lower level difference, especially if gold or aluminum wire is used, a tensile force will be applied to the neck of the wire immediately above the bonding area, resulting in extreme In this case, there is a risk of peeling off at the bonding position, and also because of the constraint of reducing the distance between the auxiliary rollers of the product to which bonding is applied, it is preferable to bond the side with the lower level difference first. Next, an embodiment of the wire bonding method of the present invention will be described with reference to FIG. However, the same reference numerals as in FIG. 3 indicate the same parts. That is, the resistance board 40 has lead wires connected to a plurality of pairs of heating resistors (not shown) disposed at their tips as a first connection terminal group 11 consisting of connection terminals 11 1 and 11 2 in a staggered manner. Alignment marks (not shown) on the heat sink 42 and the resistor board 4
It is placed by aligning with the heat generating resistor pair on 0 and mounting it. Further, the drive board 41 1 on which the integrated circuit 2 is adhesively mounted has connection terminals 11 1 and 11 2 of the resistor board 40,
A second connection terminal group 21 consisting of staggered connection terminals 21 1 , 21 2 of the integrated circuit 2 on the drive board 41
Keeping an appropriate distance from the terminal, use a microscope etc. to connect the connection terminals 11 1 and 21 1 and 11 of the close and long distance comrades.
2 and 21 2 are positioned, and the heat sink 4
2. In this case, the difference between the height of the resistor board 40 and the height on the surface of the integrated circuit 2, that is, the step h, is 1 mm, assuming that the platen roller diameter is 40 mm and the auxiliary roller diameter is 10 mm, as shown in FIG.
Since the front and back sides are desirable, in this example it is set to 1 mm.
At this time, the staggered first connection terminal group 11 on the resistance board 40 side and the staggered second connection terminal group 21 on the integrated circuit 2 side are long-distance comrades, ie, 11 1 and 21 1 , and short-distance comrades, ie. 11 2 and 21 2 are arranged facing each other, and the thermal printing head is completed by bonding them with wire. Here, the ratio of the step h between the bonding positions to the short-distance distance OSL and the long-distance distance ISL of the distance between the bonding positions, that is, the bonding step ratio is expressed as bonding step ratio=h/ISL=h/OSL. Also, including ISL and OSL, SL becomes subh/SL. Next, the table below shows the bonding results with the bonding step ratio varied from 0.25 to 0.80, including those using the conventional method. However, bonding was performed on the lower side first.

【表】【table】

〔発明の効果〕〔Effect of the invention〕

本発明のワイヤボンデイング方法を用いること
により接続したワイヤ間の接触が極めて少なくな
るばかりでなく、接触が生じても容易に修繕可能
となる。さらに製品の歩留りも向上するとともに
修繕個所も少なくなることによりワイヤボンデイ
ングの作業能率が向上する。またワイヤの曲がり
も少ないことからワイヤ保護を行うエンキヤツプ
剤のワイヤ間の通りが良くなることによりエンキ
ヤツプ工程でのワイヤの接触を未然に防止でき
る。 更に、このような段差を設けることにより補助
ローラ間の距離が小さくでき熱転写フイルムのた
るみ、しわの発生も防止でき、普通紙への微細な
転写が可能となる。
By using the wire bonding method of the present invention, not only is contact between connected wires extremely reduced, but even if contact occurs, it can be easily repaired. Furthermore, the yield of the product is improved and the number of repair parts is reduced, which improves the work efficiency of wire bonding. Furthermore, since the wires are less bent, the encapsulant that protects the wires can pass more easily between the wires, thereby preventing the wires from coming into contact during the encapping process. Furthermore, by providing such a step difference, the distance between the auxiliary rollers can be reduced, preventing the thermal transfer film from sagging or wrinkling, and making fine transfer onto plain paper possible.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はサーマルプリンテイングヘツドの説明
図、第2図はサーマルプリンテイングヘツドを用
い熱転写フイルムを介して普通紙へ記録する状態
を示す説明用断面図、第3図は従来のワイヤボン
デイング方法による段差ボンデイングを示す図で
あり、第3図aは説明用平面図、第3図bは説明
用断面図、第4図は本発明のワイヤボンデイング
方法の一実施例による段差ボンデイングを示す図
であり、第4図aは説明用平面図、第4図bは説
明用断面図である。 1……発熱抵抗体、2……集積回路、3……共
通電極、4……入力信号群、11,21……接続
端子群、111,112,211,212……接続端
子、40……抵抗基板、41……ドライブ基板、
412……共通電極基板、42……ヒートシンク、
43……熱転写フイルム、44……普通紙、45
……プラテンローラ、461,462……補助ロー
ラ、47,471,472,471′,48,49…
…ワイヤ、51……キヤピラリ。
Figure 1 is an explanatory diagram of a thermal printing head, Figure 2 is an explanatory cross-sectional view showing how the thermal printing head is used to record on plain paper via a thermal transfer film, and Figure 3 is an explanatory diagram of a conventional wire bonding method. 3A is a plan view for explanation, FIG. 3B is a cross-sectional view for explanation, and FIG. 4 is a diagram showing step bonding according to an embodiment of the wire bonding method of the present invention. , FIG. 4a is an explanatory plan view, and FIG. 4b is an explanatory cross-sectional view. DESCRIPTION OF SYMBOLS 1... Heating resistor, 2... Integrated circuit, 3... Common electrode, 4... Input signal group, 11, 21... Connection terminal group, 11 1 , 11 2 , 21 1 , 21 2 ... Connection terminal , 40...Resistance board, 41...Drive board,
41 2 ...Common electrode substrate, 42...Heat sink,
43...Thermal transfer film, 44...Plain paper, 45
...Platen roller, 46 1 , 46 2 ... Auxiliary roller, 47, 47 1 , 47 2 , 47 1 ', 48, 49...
...Wire, 51...Capillary.

Claims (1)

【特許請求の範囲】 1 段差をもつて対向するように設けられた第1
の接続端子群及び第2の接続端子群のそれぞれ相
対応する接続端子対間をワイヤのボンデイングに
より接続するようになされたワイヤボンデイング
方法において、前記第1の接続端子群と前記第2
の接続端子群との段差hと前記相対応する接続端
子対のボンデイング位置間の距離SLとの間に
h/SL=0.4乃至0.6の関係を持たせたことを特徴
とするワイヤボンデイング方法。 2 第1の接続端子群及び第2の接続端子群がそ
れぞれ千鳥状に配設され、近距離同志および遠距
離同志の接続端子対をそれぞれ相対応させ、前記
近距離同志の接続端子対のボンデイング位置間の
距離をISL、前記遠距離同志の接続端子対のボン
デイング位置間の距離をOSLとした時、h/ISL
=0.40乃至0.45、h/OSL=0.50乃至0.60の関係
を持たせたことを特徴とする特許請求の範囲第1
項記載のワイヤボンデイング方法。 3 段差hが0.5乃至1.5mmの範囲であることを特
徴とする特許請求の範囲第1項または第2項記載
のワイヤボンデイング方法。 4 ワイヤのボンデイングが段差の低い側を先
に、段差の高い側を後にすることを特徴とする特
許請求の範囲第1項乃至第3項のいずれかに記載
のワイヤボンデイング方法。
[Scope of Claims] 1. First parts provided opposite to each other with a difference in level.
In the wire bonding method, the first connection terminal group and the second connection terminal group are connected by wire bonding between corresponding connection terminal pairs of the connection terminal group and the second connection terminal group, respectively.
A wire bonding method characterized in that a relationship h/SL=0.4 to 0.6 is established between the height difference h between the connecting terminal group and the distance SL between the bonding positions of the corresponding pair of connecting terminals. 2. The first connection terminal group and the second connection terminal group are arranged in a staggered manner, and the short-distance connection terminal pairs and the long-distance connection terminal pairs are made to correspond to each other, respectively, and bonding of the short-distance connection terminal pairs is performed. When the distance between the positions is ISL and the distance between the bonding positions of the long-distance pair of connection terminals is OSL, h/ISL
=0.40 to 0.45, and h/OSL=0.50 to 0.60.
Wire bonding method described in section. 3. The wire bonding method according to claim 1 or 2, wherein the step h is in the range of 0.5 to 1.5 mm. 4. The wire bonding method according to any one of claims 1 to 3, characterized in that the wire is bonded on the side with a lower level difference first and the side with a higher level difference last.
JP59031413A 1984-02-23 1984-02-23 Wire bonding method Granted JPS60176245A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59031413A JPS60176245A (en) 1984-02-23 1984-02-23 Wire bonding method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59031413A JPS60176245A (en) 1984-02-23 1984-02-23 Wire bonding method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP1187996A Division JP2645235B2 (en) 1996-01-26 1996-01-26 Wire bonding method

Publications (2)

Publication Number Publication Date
JPS60176245A JPS60176245A (en) 1985-09-10
JPH0527252B2 true JPH0527252B2 (en) 1993-04-20

Family

ID=12330567

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59031413A Granted JPS60176245A (en) 1984-02-23 1984-02-23 Wire bonding method

Country Status (1)

Country Link
JP (1) JPS60176245A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6238154U (en) * 1985-08-23 1987-03-06
US5168368A (en) * 1991-05-09 1992-12-01 International Business Machines Corporation Lead frame-chip package with improved configuration
US5296744A (en) * 1991-07-12 1994-03-22 Vlsi Technology, Inc. Lead frame assembly and method for wiring same
JP2019111752A (en) * 2017-12-25 2019-07-11 東芝ホクト電子株式会社 Thermal print head and thermal printer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60128628A (en) * 1983-12-15 1985-07-09 Fuji Electric Co Ltd Semiconductor element
JPS61128628A (en) * 1984-11-27 1986-06-16 Mitsubishi Electric Corp Dynamic logical circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60128628A (en) * 1983-12-15 1985-07-09 Fuji Electric Co Ltd Semiconductor element
JPS61128628A (en) * 1984-11-27 1986-06-16 Mitsubishi Electric Corp Dynamic logical circuit

Also Published As

Publication number Publication date
JPS60176245A (en) 1985-09-10

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