JPH0520757B2 - - Google Patents
Info
- Publication number
- JPH0520757B2 JPH0520757B2 JP62303000A JP30300087A JPH0520757B2 JP H0520757 B2 JPH0520757 B2 JP H0520757B2 JP 62303000 A JP62303000 A JP 62303000A JP 30300087 A JP30300087 A JP 30300087A JP H0520757 B2 JPH0520757 B2 JP H0520757B2
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- display panel
- crystal display
- stage
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004973 liquid crystal related substance Substances 0.000 claims description 57
- 239000000523 sample Substances 0.000 claims description 50
- 230000007547 defect Effects 0.000 claims description 30
- 238000003384 imaging method Methods 0.000 claims description 30
- 230000007246 mechanism Effects 0.000 claims description 30
- 238000012360 testing method Methods 0.000 claims description 20
- 238000009966 trimming Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 10
- 238000005259 measurement Methods 0.000 claims description 10
- 230000001678 irradiating effect Effects 0.000 claims 1
- 239000010409 thin film Substances 0.000 description 14
- 230000002950 deficient Effects 0.000 description 12
- 101100311249 Schizosaccharomyces pombe (strain 972 / ATCC 24843) stg1 gene Proteins 0.000 description 11
- 239000011521 glass Substances 0.000 description 11
- 239000000758 substrate Substances 0.000 description 11
- 230000008439 repair process Effects 0.000 description 10
- 230000000694 effects Effects 0.000 description 9
- 230000006870 function Effects 0.000 description 9
- 238000000034 method Methods 0.000 description 6
- 230000004397 blinking Effects 0.000 description 4
- 239000011295 pitch Substances 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000003909 pattern recognition Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013073 enabling process Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30300087A JPH01144092A (ja) | 1987-11-30 | 1987-11-30 | 液晶表示パネル用プローバ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30300087A JPH01144092A (ja) | 1987-11-30 | 1987-11-30 | 液晶表示パネル用プローバ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01144092A JPH01144092A (ja) | 1989-06-06 |
| JPH0520757B2 true JPH0520757B2 (zh) | 1993-03-22 |
Family
ID=17915732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP30300087A Granted JPH01144092A (ja) | 1987-11-30 | 1987-11-30 | 液晶表示パネル用プローバ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01144092A (zh) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2824101B2 (ja) * | 1990-01-12 | 1998-11-11 | シャープ株式会社 | 表示装置の欠陥修正装置 |
| JP2514731B2 (ja) * | 1990-02-05 | 1996-07-10 | シャープ株式会社 | アクティブマトリクス表示装置 |
| DE69122162T2 (de) * | 1990-05-11 | 1997-03-06 | Sharp Kk | Anzeigevorrichtung mit aktiver Matrix und Methode zu ihrer Herstellung |
| JPH0494576A (ja) * | 1990-08-11 | 1992-03-26 | Sharp Corp | 縦型パワーｍｏｓ ｆｅｔ |
| US5532615A (en) * | 1992-11-25 | 1996-07-02 | Sharp Kabushiki Kaisha | Inspecting method, inspecting apparatus, and defect correcting method |
| KR20030000411A (ko) * | 2001-06-25 | 2003-01-06 | 주식회사 에셀텍 | 엔디 야그 레이저를 이용한 티에프티-엘씨디 수리방법 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61194741A (ja) * | 1985-02-25 | 1986-08-29 | Hitachi Ltd | ビツト救済装置 |
| JPS62225965A (ja) * | 1986-03-27 | 1987-10-03 | Tokyo Electron Ltd | 短絡検出装置 |
-
1987
- 1987-11-30 JP JP30300087A patent/JPH01144092A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61194741A (ja) * | 1985-02-25 | 1986-08-29 | Hitachi Ltd | ビツト救済装置 |
| JPS62225965A (ja) * | 1986-03-27 | 1987-10-03 | Tokyo Electron Ltd | 短絡検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01144092A (ja) | 1989-06-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |