JPH01144092A - 液晶表示パネル用プローバ - Google Patents
液晶表示パネル用プローバInfo
- Publication number
- JPH01144092A JPH01144092A JP30300087A JP30300087A JPH01144092A JP H01144092 A JPH01144092 A JP H01144092A JP 30300087 A JP30300087 A JP 30300087A JP 30300087 A JP30300087 A JP 30300087A JP H01144092 A JPH01144092 A JP H01144092A
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- display panel
- crystal display
- defect
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 61
- 239000000523 sample Substances 0.000 claims abstract description 53
- 230000007547 defect Effects 0.000 claims abstract description 36
- 230000007246 mechanism Effects 0.000 claims abstract description 31
- 238000012360 testing method Methods 0.000 claims abstract description 21
- 238000009966 trimming Methods 0.000 claims abstract description 15
- 238000001514 detection method Methods 0.000 claims abstract description 12
- 238000003384 imaging method Methods 0.000 claims description 30
- 238000005259 measurement Methods 0.000 claims description 11
- 230000001678 irradiating effect Effects 0.000 abstract description 3
- 238000007789 sealing Methods 0.000 abstract description 2
- 239000011521 glass Substances 0.000 description 12
- 239000000758 substrate Substances 0.000 description 12
- 230000002950 deficient Effects 0.000 description 11
- 230000008439 repair process Effects 0.000 description 10
- 230000006870 function Effects 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 6
- 239000011295 pitch Substances 0.000 description 5
- 230000004397 blinking Effects 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000003909 pattern recognition Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013073 enabling process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30300087A JPH01144092A (ja) | 1987-11-30 | 1987-11-30 | 液晶表示パネル用プローバ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30300087A JPH01144092A (ja) | 1987-11-30 | 1987-11-30 | 液晶表示パネル用プローバ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01144092A true JPH01144092A (ja) | 1989-06-06 |
JPH0520757B2 JPH0520757B2 (zh) | 1993-03-22 |
Family
ID=17915732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP30300087A Granted JPH01144092A (ja) | 1987-11-30 | 1987-11-30 | 液晶表示パネル用プローバ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01144092A (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03209422A (ja) * | 1990-01-12 | 1991-09-12 | Sharp Corp | 表示装置の欠陥修正装置 |
US5164851A (en) * | 1990-02-05 | 1992-11-17 | Sharp Kabushiki Kaisha | Active matrix display device having spare switching elements connectable to divisional subpixel electrodes |
US5229634A (en) * | 1990-08-11 | 1993-07-20 | Sharp Kabushiki Kaishi | Vertical power mosfet |
US5335102A (en) * | 1990-05-11 | 1994-08-02 | Sharp Kabushiki Kaisha | Liquid crystal display element and method for treating defective pixels therein |
US5532615A (en) * | 1992-11-25 | 1996-07-02 | Sharp Kabushiki Kaisha | Inspecting method, inspecting apparatus, and defect correcting method |
KR20030000411A (ko) * | 2001-06-25 | 2003-01-06 | 주식회사 에셀텍 | 엔디 야그 레이저를 이용한 티에프티-엘씨디 수리방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61194741A (ja) * | 1985-02-25 | 1986-08-29 | Hitachi Ltd | ビツト救済装置 |
JPS62225965A (ja) * | 1986-03-27 | 1987-10-03 | Tokyo Electron Ltd | 短絡検出装置 |
-
1987
- 1987-11-30 JP JP30300087A patent/JPH01144092A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61194741A (ja) * | 1985-02-25 | 1986-08-29 | Hitachi Ltd | ビツト救済装置 |
JPS62225965A (ja) * | 1986-03-27 | 1987-10-03 | Tokyo Electron Ltd | 短絡検出装置 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03209422A (ja) * | 1990-01-12 | 1991-09-12 | Sharp Corp | 表示装置の欠陥修正装置 |
US5164851A (en) * | 1990-02-05 | 1992-11-17 | Sharp Kabushiki Kaisha | Active matrix display device having spare switching elements connectable to divisional subpixel electrodes |
US5335102A (en) * | 1990-05-11 | 1994-08-02 | Sharp Kabushiki Kaisha | Liquid crystal display element and method for treating defective pixels therein |
US5229634A (en) * | 1990-08-11 | 1993-07-20 | Sharp Kabushiki Kaishi | Vertical power mosfet |
US5532615A (en) * | 1992-11-25 | 1996-07-02 | Sharp Kabushiki Kaisha | Inspecting method, inspecting apparatus, and defect correcting method |
KR20030000411A (ko) * | 2001-06-25 | 2003-01-06 | 주식회사 에셀텍 | 엔디 야그 레이저를 이용한 티에프티-엘씨디 수리방법 |
Also Published As
Publication number | Publication date |
---|---|
JPH0520757B2 (zh) | 1993-03-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |