JPH05198659A - Plasma processor - Google Patents
Plasma processorInfo
- Publication number
- JPH05198659A JPH05198659A JP4031453A JP3145392A JPH05198659A JP H05198659 A JPH05198659 A JP H05198659A JP 4031453 A JP4031453 A JP 4031453A JP 3145392 A JP3145392 A JP 3145392A JP H05198659 A JPH05198659 A JP H05198659A
- Authority
- JP
- Japan
- Prior art keywords
- cassette
- wafer
- reaction chamber
- shaft
- robot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 235000012431 wafers Nutrition 0.000 claims description 43
- 230000003028 elevating effect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000002991 molded plastic Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32743—Means for moving the material to be treated for introducing the material into processing chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/14—Wafer cassette transporting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
- Manipulator (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明はロボットによってカセッ
トと反応チャンバー(ウェハ保持具)との間でウェハの
受け渡しを行なうプラズマ処理装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plasma processing apparatus for transferring a wafer between a cassette and a reaction chamber (wafer holder) by a robot.
【0002】[0002]
【従来の技術】シリコンウェハ表面にエッチングやアッ
シング等の処理を自動的に行なうプラズマ処理装置とし
て、未処理のウェハを上下方向に離間して多数枚収納し
たカセットを待機位置から搬送ラインに沿って移載位置
まで搬送し、次いでカセットごと載置台に移し、この載
置台上に固定されたカセットからロボットによってウェ
ハを1枚づつ或いは複数枚づつウェハ保持具に移し換
え、このウェハ保持具ごとウェハを反応チャンバー内に
入れて所定の処理を行なうようにしたものがある。2. Description of the Related Art As a plasma processing apparatus for automatically performing processing such as etching and ashing on the surface of a silicon wafer, a cassette containing a large number of unprocessed wafers vertically separated from a standby position along a transfer line. The wafer is transferred to a transfer position, and then the cassette is transferred to a mounting table, and the robot is transferred from the cassette fixed on the mounting table to the wafer holder one by one or a plurality of wafers. There is one that is put in a reaction chamber to perform a predetermined treatment.
【0003】そして、上記のウェハの移し換えはカセッ
トは固定したまま、ロボットのアームの動きのみによっ
て行なっている。即ち、ロボットのアームが伸びてカセ
ット内の最下段のウェハをロボットのハンド上に載せ、
アームを縮めて所定角度(180°)水平回転し、再び
アームを伸してウェハ保持体内にハンドを差し入れてウ
ェハを保持体に受け渡し、この後アームが縮んで所定角
度水平回転するとともに一段分アームが上昇して同様な
動きを繰り返すことで全部のウェハを移し換えるように
している。The above wafer transfer is performed only by the movement of the robot arm while the cassette is fixed. That is, the robot arm extends and the wafer at the bottom of the cassette is placed on the robot hand.
The arm is contracted and horizontally rotated by a predetermined angle (180 °), the arm is extended again, the hand is inserted into the wafer holder and the wafer is transferred to the holder, and then the arm is contracted and horizontally rotated by a predetermined angle and the arm is moved by one step. Is raised and the same movement is repeated to transfer all the wafers.
【0004】また、上記のカセットはプラスチックの一
体成形品で、その構造は図5に示すように、底板100
上に平行な2枚の側板101,101を立設し、これら
側板101の内側面にウェハWの周縁部が入り込む溝1
02…を形成している。Further, the above-mentioned cassette is an integrally molded plastic product, and its structure is as shown in FIG.
Two parallel side plates 101, 101 are erected on the upper side, and a groove 1 into which the peripheral edge of the wafer W enters the inner side surfaces of these side plates 101.
02 ... is formed.
【0005】[0005]
【発明が解決しようとする課題】上述した従来のプラズ
マ処理装置においては、載置台に固定したカセットの側
板の延長線上に反応チャンバーが位置していない場合が
多く、特に反応チャンバーを2つ設けたプラズマ処理装
置にあっては、側板の延長線と反応チャンバーとの位置
はズレることになる。In the above-described conventional plasma processing apparatus, the reaction chamber is often not located on the extension line of the side plate of the cassette fixed to the mounting table, and in particular, two reaction chambers are provided. In the plasma processing apparatus, the extension line of the side plate and the reaction chamber are displaced from each other.
【0006】一方、ロボットのハンドがカセット内に進
入する際には、側板とハンドとが干渉しないような動き
としなければならない。その結果、ロボットとカセット
との間でのウェハ授受の動きと、ロボットとウェハ保持
具との間でのウェハ授受の動きとが対象的な動きとなら
ず、このためロボットの構造が極めて複雑なものとな
り、受け渡しの時間も短縮できない。On the other hand, when the robot hand enters the cassette, the side plate and the hand must move so as not to interfere with each other. As a result, the movement of the wafer transfer between the robot and the cassette and the movement of the wafer transfer between the robot and the wafer holder do not become symmetrical, which makes the structure of the robot extremely complicated. However, the delivery time cannot be shortened.
【0007】また、搬送ラインの向きを換えたり或いは
搬送ラインにカセットをセットする際にカセットの向き
を反応チャンバーに向けるようにすれば、上記の不利は
解消できるが、反応チャンバーが2つ以上ある場合には
このような手段は採れない。If the direction of the cassette is directed to the reaction chamber when the direction of the transfer line is changed or the cassette is set on the transfer line, the above disadvantage can be solved, but there are two or more reaction chambers. In such cases, such means cannot be adopted.
【0008】[0008]
【課題を解決するための手段】上記課題を解決すべく本
発明は、搬送ラインからウェハカセットを受け取る載置
台を固定せず、搬送ラインと直交する方向と反応チャン
バーを向く方向との間で回動可能とした。SUMMARY OF THE INVENTION In order to solve the above problems, the present invention does not fix a mounting table for receiving a wafer cassette from a transfer line, but rotates between a direction orthogonal to the transfer line and a direction facing the reaction chamber. It was possible to move.
【0009】[0009]
【作用】搬送ラインを走行してきたカセットは移載位置
において載置台上に移されて固定される。次いで載置台
が水平面内で反応チャンバーに向く方向まで回動し、そ
の結果カセットの側板の延長線上に反応チャンバーが位
置することとなる。The cassette that has traveled along the transfer line is moved and fixed on the mounting table at the transfer position. Then, the mounting table is rotated in the horizontal plane to the direction toward the reaction chamber, and as a result, the reaction chamber is positioned on the extension line of the side plate of the cassette.
【0010】[0010]
【実施例】以下に本発明の実施例を添付図面に基づいて
説明する。図1は本発明に係るプラズマ処理装置の全体
平面図であり、プラズマ処理装置は本体1に沿ってベル
トコンベア等からなる搬送ライン2が設けられ、また本
体1は搬送ライン2に沿って配置された2つのカセット
載置台3,3、これらカセット載置台3,3に対応して
配置された2つの反応チャンバー4,4及びこれらカセ
ット載置台3,3と反応チャンバー4,4の中間位置に
設けられる移載ロボット5からなる。Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 is an overall plan view of a plasma processing apparatus according to the present invention. In the plasma processing apparatus, a transfer line 2 including a belt conveyor is provided along a main body 1, and the main body 1 is arranged along the transfer line 2. Two cassette mounting tables 3 and 3, two reaction chambers 4 and 4 arranged corresponding to these cassette mounting tables 3 and 3, and an intermediate position between these cassette mounting tables 3 and 3 and reaction chambers 4 and 4. It consists of a transfer robot 5.
【0011】搬送ライン2は待機ステーションS1から
未処理のウェハWを収納したカセット6を移載位置S
2,S2まで搬送し、この移載位置S2においてカセッ
ト6を前記載置台3との間で授受する。The transfer line 2 transfers the cassette 6 containing the unprocessed wafer W from the standby station S1 to the transfer position S.
2 and S2, and the cassette 6 is transferred to and from the mounting table 3 at the transfer position S2.
【0012】反応チャンバー4は合成石英にて形成さ
れ、下方にはウェハ保持具7が設けられている。このウ
ェハ保持具は合成石英からなる4本の支柱の内側部にウ
ェハWの周縁部が嵌り込む溝が多数形成されるととも
に、昇降動自在とされ、上昇限の位置で反応チャンバー
4内に入り込んで反応チャンバー4の下面開口を閉塞す
る。The reaction chamber 4 is made of synthetic quartz, and a wafer holder 7 is provided below it. This wafer holder is provided with a large number of grooves into which the peripheral edge of the wafer W fits inside four pillars made of synthetic quartz, and can be moved up and down to enter the reaction chamber 4 at the upper limit position. The bottom opening of the reaction chamber 4 is closed with.
【0013】移載ロボット5は垂直軸8を中心として多
関節アーム9が水平面内で回動可能とされ、アーム9の
先端にはウェハWを載せるハンド10が設けられてい
る。The transfer robot 5 has an articulated arm 9 rotatable about a vertical axis 8 in a horizontal plane, and a hand 10 for mounting a wafer W is provided at the tip of the arm 9.
【0014】次に図2乃至図4に基づき載置台3の詳細
につき説明する。ここで図2は載置台の平面図、図3は
図2のA−A線断面図、図4は図3のB方向矢視図であ
り、カセット載置台3はベース11に中空の支柱12を
立設し、この支柱12内にモータ13にて回転せしめら
れるスクリューシャフト14を配置し、また支柱12の
側壁に設けたレール15に昇降部材16を係合せしめる
とともに、昇降部材16に取り付けたナット17を前記
スクリューシャフト14に螺合し、スクリューシャフト
14の回転により昇降部材16が昇降動するようにして
いる。Next, details of the mounting table 3 will be described with reference to FIGS. 2 is a plan view of the mounting table, FIG. 3 is a sectional view taken along the line AA of FIG. 2, and FIG. 4 is a view in the direction of arrow B of FIG. The screw shaft 14 rotated by the motor 13 is arranged in the column 12, and the lifting member 16 is engaged with the rail 15 provided on the side wall of the column 12 and attached to the lifting member 16. The nut 17 is screwed onto the screw shaft 14 so that the lifting member 16 can be moved up and down by the rotation of the screw shaft 14.
【0015】昇降部材16の下面にはギヤボックス18
を取り付け、このギヤボックス18外側に固着したモー
タ19の回転を駆動プーリ20、タイミングベルト21
及び被動プーリ22を介してギヤボックス18内のウォ
ーム23に伝達し、更にウォーム23の回転をこれと噛
合するウォームギヤ24に伝達し、ウォームギヤ24の
軸25を回転せしめるようにしている。A gear box 18 is provided on the lower surface of the lifting member 16.
The rotation of the motor 19 fixed to the outside of the gear box 18 is driven by the drive pulley 20 and the timing belt 21.
Also, the rotation of the worm 23 is transmitted to the worm 23 in the gear box 18 via the driven pulley 22, and the rotation of the worm 23 is transmitted to the worm gear 24 meshing with the worm 23 to rotate the shaft 25 of the worm gear 24.
【0016】軸25の上端は昇降部材15に形成した開
口26から突出し、この上端にプレート27がネジ止め
され、このプレート27の下面にはストッパ28が取り
付けられ、モータ19の駆動によりギヤ列を介してプレ
ート27が所定角度水平回転した時にストッパ28が昇
降部材15に取り付けたリミットスイッチ29に当接し
てモータ19への通電を遮断してプレート27の回動を
停止する。そして本発明にあってはこの停止した位置に
おいてプレート27が反応チャンバー4の方向を向くよ
うに設定している。The upper end of the shaft 25 projects from an opening 26 formed in the elevating member 15, a plate 27 is screwed to the upper end, a stopper 28 is attached to the lower surface of the plate 27, and a gear train is driven by the motor 19. When the plate 27 is horizontally rotated by a predetermined angle, the stopper 28 comes into contact with the limit switch 29 attached to the elevating member 15 to cut off the power supply to the motor 19 and stop the rotation of the plate 27. In the present invention, the plate 27 is set to face the reaction chamber 4 at this stopped position.
【0017】また、プレート27には開口30が形成さ
れ、この開口30からプレート27上に載置されたカセ
ット6内にウェハWが残っているか否かを検知するセン
サ31を臨ませている。Further, an opening 30 is formed in the plate 27, and a sensor 31 for detecting whether or not the wafer W remains in the cassette 6 placed on the plate 27 is exposed from the opening 30.
【0018】以上において、ウェハWにプラズマ処理を
施すには、カセット6を待機位置S1から搬送ライン2
に沿って移載位置S2まで搬送し、移載位置S2におい
てカセット6ごと載置台3のプレート27上に移し、次
いでモータ19を駆動してプレート27を移載ロボット
5を中心として対向する反応チャンバー4に向くまで回
動させる。この操作により、カセット6の側板の延長線
上に反応チャンバー4が位置することとなり、ロボット
5のアーム9が伸縮動する際にカセット6の側板に干渉
することがない。In the above, in order to perform the plasma processing on the wafer W, the cassette 6 is moved from the standby position S1 to the transfer line 2.
Along to the transfer position S2, and at the transfer position S2, the cassette 6 is transferred onto the plate 27 of the mounting table 3, and then the motor 19 is driven to move the plate 27 to the reaction chamber facing the transfer robot 5. Rotate until it faces 4. By this operation, the reaction chamber 4 is positioned on the extension line of the side plate of the cassette 6, and when the arm 9 of the robot 5 expands and contracts, it does not interfere with the side plate of the cassette 6.
【0019】次いで、プレート27上に固定されたカセ
ット6内にロボット5のアーム9が伸びてカセット内の
最下段のウェハWをロボットのハンド10上に載せ、ア
ームを縮めて180°水平回転し、再びアーム9を伸し
てウェハ保持具7内にハンド10を差し入れてウェハW
を保持具7に受け渡し、この後アーム9が縮んで180
°水平回転するとともに一段分アームが上昇し、前記と
同様の動きを繰り返すことで全部のウェハWを保持具7
に移し換え、保持具7が上昇して反応チャンバー4内に
保持具7ごとウェハWを入れ、真空引きしたプラズマを
発生せしめて所定の処理を行ない、処理が終了したなら
ば前記と逆の動作によりカセット6内にウェハWを戻
し、更にカセット6を搬送ライン2に戻して次工程に送
る。Then, the arm 9 of the robot 5 extends into the cassette 6 fixed on the plate 27, the wafer W at the lowest stage in the cassette is placed on the robot hand 10, and the arm is contracted and horizontally rotated by 180 °. , The arm 9 is extended again, the hand 10 is inserted into the wafer holder 7, and the wafer W
To the holder 7, and then the arm 9 contracts
The arm is raised by one step as it horizontally rotates, and the same movement as described above is repeated to hold all the wafers W.
The wafer W is moved together with the holder 7 into the reaction chamber 4 and the wafer W is placed in the reaction chamber 4 to generate a vacuumed plasma to perform a predetermined process. When the process is completed, the reverse operation is performed. Then, the wafer W is returned to the cassette 6, and then the cassette 6 is returned to the transfer line 2 and sent to the next step.
【0020】尚、図示例にあっては載置台3と反応チャ
ンバー4をそれぞれ2台づつ設けている。そこで、例え
ば右側の載置台3から右側の反応チャンバー4にウェハ
Wを移載する時のプレート27の回動角が問題となる
が、この場合も左側の反応チャンバー4にウェハWを移
載する時と同じだけプレート27を回動させる。このよ
うにすればロボット5のアームの伸縮動は全く同じとな
り、アーム9の水平面での回動角のみを変えれば済むの
で制御が簡単になる。In the illustrated example, two mounting tables 3 and two reaction chambers 4 are provided. Therefore, for example, the rotation angle of the plate 27 when transferring the wafer W from the mounting table 3 on the right side to the reaction chamber 4 on the right side becomes a problem. In this case as well, the wafer W is transferred to the reaction chamber 4 on the left side. The plate 27 is rotated as much as the time. In this way, the expansion and contraction movements of the arm of the robot 5 become exactly the same, and only the rotation angle of the arm 9 on the horizontal plane needs to be changed, and the control becomes simple.
【0021】[0021]
【発明の効果】以上に説明したように本発明によれば、
搬送ラインからウェハカセットを受け取る載置台を、搬
送ラインと直交する方向と反応チャンバーを向く方向と
の間で回動可能としたので、カセットの側板の延長線上
に反応チャンバーが位置することとなり、その結果、ロ
ボットとカセットとの間でのウェハ授受の動きと、ロボ
ットとウェハ保持具との間でのウェハ授受の動きとが対
象的な動きとなり、このためロボットの動きと構造を単
純なものにすることができ、コストダウンと受け渡し時
間の短縮が図れる。As described above, according to the present invention,
Since the mounting table that receives the wafer cassette from the transfer line is rotatable between the direction orthogonal to the transfer line and the direction facing the reaction chamber, the reaction chamber is located on the extension line of the side plate of the cassette. As a result, the movement of the wafer transfer between the robot and the cassette and the movement of the wafer transfer between the robot and the wafer holder are the target movements, which simplifies the movement and structure of the robot. The cost can be reduced and the delivery time can be shortened.
【図1】本発明に係るプラズマ処理装置の全体平面図FIG. 1 is an overall plan view of a plasma processing apparatus according to the present invention.
【図2】載置台の平面図FIG. 2 is a plan view of a mounting table.
【図3】図2のA−A線断面図3 is a sectional view taken along the line AA of FIG.
【図4】図3のB方向矢視図4 is a view in the direction of arrow B in FIG.
【図5】ウェハカセットの斜視図FIG. 5 is a perspective view of a wafer cassette.
2…搬送ライン、3…載置台、4…反応チャンバー、5
…移載ロボット、6…カセット、7…ウェハ保持具、1
1…ベース、16…昇降部材、27…プレート、W…ウ
ェハ。2 ... conveying line, 3 ... mounting table, 4 ... reaction chamber, 5
... Transfer robot, 6 ... Cassette, 7 ... Wafer holder, 1
1 ... Base, 16 ... Elevating member, 27 ... Plate, W ... Wafer.
Claims (2)
セットの授受を行なうカセット載置台と、プラズマ雰囲
気でウェハに各種処理を施す反応チャンバーと、反応チ
ャンバーとカセットとの間でのウェハの移載を伸縮動す
るアームで行なうロボットを備えたプラズマ処理装置に
おいて、前記載置台は搬送ラインと直交する方向と反応
チャンバーを向く方向との間で回動可能とされているこ
とを特徴とするプラズマ処理装置。1. A cassette mounting table for transferring a cassette containing wafers to and from a transfer line, a reaction chamber for performing various kinds of processing on a wafer in a plasma atmosphere, and a wafer transfer between the reaction chamber and the cassette. In a plasma processing apparatus equipped with a robot for performing loading and retracting arms, the mounting table is rotatable between a direction orthogonal to the transfer line and a direction facing the reaction chamber. Processing equipment.
いることを特徴とする請求項1に記載のプラズマ処理装
置。2. The plasma processing apparatus according to claim 1, wherein the mounting table can be moved up and down intermittently.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4031453A JP2947380B2 (en) | 1992-01-22 | 1992-01-22 | Plasma processing equipment |
US08/752,293 US5709519A (en) | 1992-01-22 | 1993-01-22 | Plasma processing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4031453A JP2947380B2 (en) | 1992-01-22 | 1992-01-22 | Plasma processing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05198659A true JPH05198659A (en) | 1993-08-06 |
JP2947380B2 JP2947380B2 (en) | 1999-09-13 |
Family
ID=12331675
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4031453A Expired - Lifetime JP2947380B2 (en) | 1992-01-22 | 1992-01-22 | Plasma processing equipment |
Country Status (2)
Country | Link |
---|---|
US (1) | US5709519A (en) |
JP (1) | JP2947380B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20050067751A (en) * | 2003-12-29 | 2005-07-05 | 동부아남반도체 주식회사 | Elevator rotation device and rotation method of loadlock chamber |
CN112359337A (en) * | 2020-11-12 | 2021-02-12 | 昆山英利悦电子有限公司 | Portable coating machine carrier with regulatory function |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6712577B2 (en) * | 1994-04-28 | 2004-03-30 | Semitool, Inc. | Automated semiconductor processing system |
US5944475A (en) * | 1996-10-11 | 1999-08-31 | Asyst Technologies, Inc. | Rotated, orthogonal load compatible front-opening interface |
US6082950A (en) * | 1996-11-18 | 2000-07-04 | Applied Materials, Inc. | Front end wafer staging with wafer cassette turntables and on-the-fly wafer center finding |
US6152070A (en) | 1996-11-18 | 2000-11-28 | Applied Materials, Inc. | Tandem process chamber |
US5893795A (en) * | 1997-07-11 | 1999-04-13 | Applied Materials, Inc. | Apparatus for moving a cassette |
US10069030B2 (en) * | 2015-12-14 | 2018-09-04 | Solarcity Corporation | Load lock solar cell transfer system |
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KR20050067751A (en) * | 2003-12-29 | 2005-07-05 | 동부아남반도체 주식회사 | Elevator rotation device and rotation method of loadlock chamber |
CN112359337A (en) * | 2020-11-12 | 2021-02-12 | 昆山英利悦电子有限公司 | Portable coating machine carrier with regulatory function |
Also Published As
Publication number | Publication date |
---|---|
US5709519A (en) | 1998-01-20 |
JP2947380B2 (en) | 1999-09-13 |
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