JPH05175117A - Cleaner for edge of substrate - Google Patents

Cleaner for edge of substrate

Info

Publication number
JPH05175117A
JPH05175117A JP35713191A JP35713191A JPH05175117A JP H05175117 A JPH05175117 A JP H05175117A JP 35713191 A JP35713191 A JP 35713191A JP 35713191 A JP35713191 A JP 35713191A JP H05175117 A JPH05175117 A JP H05175117A
Authority
JP
Japan
Prior art keywords
solvent
substrate
rectangular substrate
edge
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP35713191A
Other languages
Japanese (ja)
Other versions
JP2659306B2 (en
Inventor
Yoshio Matsumura
吉雄 松村
Ritsu Kobayashi
律 小林
Tadashi Sasaki
忠司 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP3357131A priority Critical patent/JP2659306B2/en
Publication of JPH05175117A publication Critical patent/JPH05175117A/en
Application granted granted Critical
Publication of JP2659306B2 publication Critical patent/JP2659306B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Cleaning Or Drying Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To remove unnecessary thin films on the edge of a rectangular substrate effectively while dissolving them, by providing solvent nozzles for dissolving the unnecessary thin films while discharging a solvent, and by providing gas nozzles for blowing away dissolved materials from the edge of the rectangular substrate to the outside while discharging a gas, and further, by forcing the solvent and gas nozzles to make linear movements relatively to the end edge of the rectangular substrate and along it. CONSTITUTION:A first solvent nozzle for dissolving unnecessary thin films while discharging a solvent on the rear surface of the end edge of a rectangular substrate 1, and a first gas nozzle for blowing away dissolved materials from the end edge of the rectangular substrate 1 to the outside while discharging a gas are provided. On the other hand, on a supporting frame 24, a second solvent nozzle 26b for dissolving the unnecessary thin films while discharging the solvent on the surface of the end edge of the rectangular substrate 1 is provided. Also, on a supporting frame 25, a second gas nozzle 27b for blowing away the dissolved materials from the end edge of the rectangular substrate 1 to the outside while discharging the gas is provided. Further, a main body 18 of a cleaner is moved while making the attitude of the short side of the rectangular substrate 1 parallel with the moving direction of the main body 18, and thereby, the unnecessary thin films are removed while dissolving them.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、回転塗布によって、フ
ォトレジスト塗布液や感光性ポリイミド樹脂やカラーフ
ィルター用の染色剤といった薄膜が表面に形成された液
晶用のガラス基板やフォトマスク用のガラス基板などの
角型基板に対し、その薄膜形成後の角型基板の端縁に溶
剤を吐出して、角型基板端縁の不要薄膜を溶解除去する
基板端縁洗浄装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glass substrate for a liquid crystal or a glass for a photomask on which a thin film such as a photoresist coating solution, a photosensitive polyimide resin or a dyeing agent for a color filter is formed by spin coating. The present invention relates to a substrate edge cleaning device that discharges a solvent to an edge of a rectangular substrate such as a substrate after the thin film is formed to dissolve and remove an unnecessary thin film on the edge of the rectangular substrate.

【0002】[0002]

【従来の技術】上述のような薄膜が形成された角型基板
は、その製造工程等において、角型基板の表面に薄膜が
形成された後、各種処理工程を経る間に、カセットに挿
抜されたり、搬送機構に保持されたりする。このとき、
角型基板の端縁がカセット内の収納溝や搬送機構のチャ
ック部に接触することにより、角型基板の端縁の薄膜が
剥離して発塵源になることが知られている。
2. Description of the Related Art A rectangular substrate having a thin film as described above is inserted into and removed from a cassette during various processing steps after the thin film is formed on the surface of the rectangular substrate in the manufacturing process or the like. Or it is held by the transport mechanism. At this time,
It is known that when the edge of the rectangular substrate comes into contact with the storage groove in the cassette or the chuck portion of the transport mechanism, the thin film at the edge of the rectangular substrate peels off and becomes a dust source.

【0003】また、回転塗布時に裏面まで回り込んだ薄
膜の一部がそのまま乾燥して残存すると、後工程の装置
を汚染したり、露光時に角型基板が傾いて部分的に焦点
が合わない場合を生じ、歩留りが低下する問題があっ
た。殊に、近年では、集積度が増大する傾向にあり、よ
り一層歩留りが低下する問題があった。
In addition, when a part of the thin film that has reached the back surface during spin coating is dried and remains as it is, it contaminates a post-process apparatus, or when a rectangular substrate is tilted during exposure and is partially out of focus. There is a problem in that the yield is reduced. In particular, in recent years, there has been a problem that the degree of integration tends to increase and the yield further decreases.

【0004】そこで、薄膜を回転塗布する工程の最終段
階で、角型基板の端縁の薄膜を予め除去しておく処理が
施される。この薄膜を除去する技術としては、例えば、
特公昭58−19350号公報に開示されているものが
あった。
Therefore, in the final stage of the step of spin-coating the thin film, a treatment for removing the thin film at the edge of the rectangular substrate in advance is performed. As a technique for removing this thin film, for example,
Some of them were disclosed in Japanese Patent Publication No. 58-19350.

【0005】この従来例によれば、回転塗布が終了した
角型基板を低速で回転させながら、その角型基板の端縁
の下方から溶剤を吐出し、遠心力により角型基板の端縁
側に流れるに伴って溶剤が薄膜を溶解し、更に、溶剤が
表面張力によって角型基板の端縁の表面側にも回り込
み、その角型基板の表面の端縁に形成されている薄膜を
溶解し、しかる後に高速回転に切換え、溶解に伴って形
成された液だまりから液滴を遠心力によって外方に飛散
し、角型基板の端縁側の表裏両面および周端面それぞれ
に形成された薄膜を溶解除去するように構成している。
According to this conventional example, the solvent is discharged from below the edge of the square substrate while rotating the square substrate after the spin coating at low speed, and the solvent is discharged to the edge side of the square substrate by centrifugal force. As the solvent flows, the solvent dissolves the thin film, and further, the solvent also wraps around the surface side of the edge of the rectangular substrate due to surface tension, and dissolves the thin film formed on the edge of the surface of the rectangular substrate, After that, switch to high-speed rotation, and the droplets are scattered outward from the liquid pool formed by dissolution by centrifugal force to dissolve and remove the thin films formed on both the front and back surfaces on the edge side of the rectangular substrate and the peripheral edge surface. It is configured to do.

【0006】また、この従来例によれば、回転塗布が終
了した角型基板の上方側に、その角型基板と一体回転す
るように中空のピラミッド状のカバーを設けるとともに
そのカバーの頂部側からも溶剤を流下供給し、角型基板
の表面の端縁全周にわたり、所定幅の薄膜を溶解除去す
るように構成している。
Further, according to this conventional example, a hollow pyramid-shaped cover is provided on the upper side of the rectangular substrate on which the spin coating has been completed so as to rotate integrally with the rectangular substrate, and from the top side of the cover. Is also configured so that the solvent is supplied downward and the thin film having a predetermined width is dissolved and removed over the entire circumference of the edge of the surface of the rectangular substrate.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、上述し
た角型基板の端縁の下方から溶剤を吐出する従来例の場
合、角型基板のコーナー部に到達する溶剤の量が他の端
縁よりも少なくなり、そのコーナー部では溶剤が表面側
に回り込みにくく、薄膜を十分に溶解できない欠点があ
った。
However, in the case of the conventional example in which the solvent is discharged from below the edge of the rectangular substrate, the amount of the solvent reaching the corner of the rectangular substrate is higher than that of the other edges. There was a drawback that the solvent was less likely to flow to the surface side at the corners and the thin film could not be sufficiently dissolved.

【0008】一方、角型基板の上方側に中空のピラミッ
ド状のカバーを設ける従来例の場合、その頂部から供給
される溶剤が遠心力によって回転方向と反対側に流れ、
角型基板の各辺それぞれの一方のコーナー部側には溶剤
が流れず、現実的には薄膜を溶解除去できない。
On the other hand, in the case of a conventional example in which a hollow pyramid-shaped cover is provided on the upper side of a rectangular substrate, the solvent supplied from the top of the cover flows to the side opposite to the rotation direction due to centrifugal force.
The solvent does not flow to one corner side of each side of the rectangular substrate, and the thin film cannot be practically dissolved and removed.

【0009】本発明は、このような事情に鑑みてなされ
たものであって、角型基板の端縁の薄膜を良好に溶解除
去できるようにすることを目的とする。
The present invention has been made in view of the above circumstances, and an object thereof is to enable the thin film on the edge of the rectangular substrate to be dissolved and removed satisfactorily.

【0010】[0010]

【課題を解決するための手段】本発明の基板端縁洗浄装
置は、上述のような目的を達成するために、回転塗布に
よって表面に薄膜が形成された角型基板を載置保持する
基板保持手段と、その基板保持手段によって保持された
角型基板の端縁の表裏両面の少なくともいずれか一方に
溶剤を吐出して不要薄膜を溶解する溶剤ノズルと、ガス
を吐出して溶解物を角型基板の端縁よりも外方に吹き飛
ばすガスノズルと、溶剤ノズルおよびガスノズルを、角
型基板の端縁に沿わせて相対的に直線移動する移動手段
とを備えて構成する。
In order to achieve the above-mentioned object, a substrate edge cleaning device of the present invention is a substrate holder for mounting and holding a rectangular substrate having a thin film formed on its surface by spin coating. Means, a solvent nozzle that discharges a solvent onto at least one of the front and back surfaces of the edge of the rectangular substrate held by the substrate holding means to dissolve the unnecessary thin film, and a melt to discharge the melted material into a square shape. A gas nozzle that blows outward of the edge of the substrate, and a moving unit that moves the solvent nozzle and the gas nozzle relatively linearly along the edge of the rectangular substrate are configured.

【0011】使用する溶剤としては、フォトレジスト塗
布液を溶解する場合には、アセトン、メチルエチルケト
ン、メチルイソブチルケトン、シクロヘキサノン、ジイ
ソブチルケトンなどのケトン類や、酢酸エチル、酢酸ブ
チル、酢酸−n−アミル、蟻酸メチル、プロピオン酸エ
チル、フタル酸ジメチル、安息香酸エチルなどのエステ
ル類や、トルエン、キシレン、ベンゼン、エチルベンゼ
ンなどの芳香族炭化水素類や、四塩化炭素、トリクロル
エチレン、クロロホルム、1,1,1−トリクロルエタ
ン、モノクロルベンゼン、クロルナフタリンなどのハロ
ゲン化炭化水素類や、テトラヒドロブラン、ジエチルエ
ーテル、エチレングリコールモノメチルエーテル、エチ
レングリコールモノエチルエーテルアセテートなどのエ
ーテル類や、ジメチルホルムアミドやジメチルスルホキ
サイドなどを用いることができる。また、染色剤を溶解
する場合には、30〜60℃の温湯や、メタノール、エタノ
ール、プロパノールなどの低級アルコールや、アセトン
などを用いることができ、そして、これらの液体中に角
型基板との濡れを良くするために界面活性剤を添加して
も良い。ガスノズルから供給するガスとしては、窒素ガ
スなどの不活性ガスや空気を用いることができる。
As the solvent to be used, in the case of dissolving the photoresist coating solution, ketones such as acetone, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone and diisobutyl ketone, ethyl acetate, butyl acetate, acetic acid-n-amyl acetate, Esters such as methyl formate, ethyl propionate, dimethyl phthalate, and ethyl benzoate, aromatic hydrocarbons such as toluene, xylene, benzene, and ethylbenzene, carbon tetrachloride, trichloroethylene, chloroform, 1,1,1 -Halogenated hydrocarbons such as trichloroethane, monochlorobenzene, and chloronaphthalene; ethers such as tetrahydrobran, diethyl ether, ethylene glycol monomethyl ether, and ethylene glycol monoethyl ether acetate; Or the like can be used Le formamide or dimethyl sulphoxide. Further, when the dyeing agent is dissolved, warm water of 30 to 60 ° C., lower alcohol such as methanol, ethanol, propanol, acetone, etc. can be used, and the rectangular substrate is mixed with these liquids. A surfactant may be added to improve wetting. As the gas supplied from the gas nozzle, an inert gas such as nitrogen gas or air can be used.

【0012】[0012]

【作用】本発明の基板端縁洗浄装置の構成によれば、回
転塗布によって表面に均一に薄膜を形成した角型基板を
基板保持手段に載置保持し、その角型基板の端縁に沿わ
せて移動手段により溶剤ノズルおよびガスノズルを相対
的に直線移動し、溶剤ノズルから角型基板の表裏両面の
少なくともいずれか一方に溶剤を吐出して角型基板の端
縁の薄膜を溶解し、その溶解物をガスノズルからガスを
吐出することにより角型基板の端縁よりも外方に吹き飛
ばして除去することができる。
According to the structure of the substrate edge cleaning apparatus of the present invention, a rectangular substrate having a thin film uniformly formed on its surface by spin coating is placed and held on the substrate holding means, and the edge of the rectangular substrate is aligned. The solvent nozzle and the gas nozzle are relatively linearly moved by the moving means, and the solvent is discharged from the solvent nozzle to at least one of the front and back surfaces of the rectangular substrate to dissolve the thin film on the edge of the rectangular substrate. By discharging gas from the gas nozzle, the melted material can be blown away and removed from the edge of the rectangular substrate.

【0013】[0013]

【実施例】次に、本発明の実施例を図面を用いて説明す
る。
Embodiments of the present invention will now be described with reference to the drawings.

【0014】図1は、本発明の実施例に係る基板端縁洗
浄装置の概略斜視図であり、回転塗布によって表面に薄
膜が形成された角型基板1を載置保持する基板保持手段
2の横一側方に基板端縁洗浄具3が備えられて、基板端
縁洗浄装置4が構成されている。
FIG. 1 is a schematic perspective view of a substrate edge cleaning apparatus according to an embodiment of the present invention, showing a substrate holding means 2 for holding and holding a rectangular substrate 1 having a thin film formed on its surface by spin coating. A substrate edge cleaning tool 3 is provided on one lateral side, and a substrate edge cleaning device 4 is configured.

【0015】図2の一部切欠側面図、および、図3の全
体正面図に示すように、基台Bに、第1のエアーシリン
ダ5と一対のガイド6,6を介してモータ支持台7が昇
降可能に設けられ、そのモータ支持台7上に第1の電動
モータ8が設けられるとともに、第1の電動モータ8の
モータ軸8aに角型基板1を載置する基板載置プレート
9が中空筒軸10を介して一体的に設けられ、基板載置
プレート9上に載置した角型基板1を90°づつ回転でき
るように基板保持手段2が構成されている。
As shown in the partially cutaway side view of FIG. 2 and the overall front view of FIG. 3, the motor support base 7 is mounted on the base base B via the first air cylinder 5 and the pair of guides 6 and 6. Is provided so as to be able to move up and down, the first electric motor 8 is provided on the motor support base 7, and the substrate mounting plate 9 for mounting the rectangular substrate 1 on the motor shaft 8a of the first electric motor 8 is provided. The substrate holding means 2 is configured so as to be integrally provided via the hollow cylindrical shaft 10 and to rotate the rectangular substrate 1 placed on the substrate placing plate 9 by 90 °.

【0016】基板載置プレート9の上面に吸着孔11…
が形成されるとともに、基板載置プレート9内に吸着孔
11…それぞれに連通する第1の連通孔12が形成さ
れ、更に、中空筒軸10を回転可能に保持する軸受部材
13に吸気管14が接続されるとともに内部に第2の連
通孔15が形成され、また、その第2の連通孔15と同
レベルにおいて、中空筒軸10に径方向を向いた第3の
連通孔16が形成され、軸受部材13の内周面に上下方
向に所定間隔を隔ててO−リング17,17が設けられ
て第2の連通孔15と第3の連通孔16とを連通する環
状の空間が形成され、基板載置プレート9上に載置され
た角型基板1を真空吸着によって保持するように構成さ
れている。
The suction holes 11 are formed on the upper surface of the substrate mounting plate 9.
Is formed, and first suction holes 12 that communicate with the suction holes 11 ... Are formed in the substrate mounting plate 9, and further, the intake pipe 14 is provided in the bearing member 13 that rotatably holds the hollow cylindrical shaft 10. And a second communication hole 15 is formed inside, and at the same level as the second communication hole 15, a third communication hole 16 is formed in the hollow cylindrical shaft 10 in the radial direction. O-rings 17, 17 are provided on the inner peripheral surface of the bearing member 13 at predetermined intervals in the vertical direction to form an annular space that connects the second communication hole 15 and the third communication hole 16. The rectangular substrate 1 mounted on the substrate mounting plate 9 is configured to be held by vacuum suction.

【0017】前記基板端縁洗浄具3は、洗浄具本体18
と、それを角型基板1の端縁に沿わせて直線移動する移
動手段19と、洗浄具本体18を角型基板1の端縁に対
して遠近変位する位置調整手段20とから構成されてい
る。
The substrate edge cleaning tool 3 comprises a cleaning tool body 18
And moving means 19 for linearly moving it along the edge of the rectangular substrate 1, and position adjusting means 20 for displacing the cleaning tool main body 18 far and far with respect to the edge of the rectangular substrate 1. There is.

【0018】箱形状の第1の支持枠21に、角型基板1
の端縁に対して遠近する方向に固定位置を微調整可能に
アングル形状の第2の支持枠22が取り付けられるとと
もに、その第2の支持枠22に、上下方向に固定位置を
微調整可能に第3の支持枠23が取り付けられ、その第
3の支持枠23に第4および第5の支持枠24,25が
一体的に取り付けられ、第3の支持枠23に、角型基板
1の端縁の裏面に溶剤を吐出して不要薄膜を溶解する第
1の溶剤ノズル26aと、ガスを吐出して溶解物を角型
基板1の端縁よりも外方に吹き飛ばす第1のガスノズル
27aとが設けられ、一方、第4の支持枠24に、角型
基板1の端縁の表面に溶剤を吐出して不要薄膜を溶解す
る第2の溶剤ノズル26bが設けられるとともに、第5
の支持枠25に、ガスを吐出して溶解物を角型基板1の
端縁よりも外方に吹き飛ばす第2のガスノズル27bが
設けられ、角型基板1の端縁を洗浄する前記洗浄具本体
18が構成されている。
The rectangular substrate 1 is mounted on the first box-shaped support frame 21.
The angle-shaped second support frame 22 is attached so that the fixed position can be finely adjusted in the direction approaching or distant from the edge of the, and the fixed position can be finely adjusted in the vertical direction on the second support frame 22. The third support frame 23 is attached, the fourth and fifth support frames 24 and 25 are integrally attached to the third support frame 23, and the end of the rectangular substrate 1 is attached to the third support frame 23. The first solvent nozzle 26a that discharges the solvent to the back surface of the edge to dissolve the unnecessary thin film, and the first gas nozzle 27a that discharges the gas to blow the melted material to the outside of the edge of the rectangular substrate 1 are provided. On the other hand, the fourth support frame 24 is provided with a second solvent nozzle 26b that discharges a solvent onto the surface of the edge of the rectangular substrate 1 to dissolve the unnecessary thin film, and a fifth solvent nozzle 26b.
The supporting frame 25 is provided with a second gas nozzle 27b for discharging gas to blow the melted material outward than the edge of the rectangular substrate 1, and the cleaning tool body for cleaning the edge of the rectangular substrate 1 18 are configured.

【0019】前記第3および第4の支持枠23,24そ
れぞれに円形の穴28と円弧状の長穴29とにより取り
付け角度を変更可能に第1の中間ブラケット30が取り
付けられるとともに、その第1の中間ブラケット30
に、上下方向の長穴31,31により固定位置を上下方
向に調整可能に第2の中間ブラケット32が取り付けら
れ、下側の第2の中間ブラケット32に第1の溶剤ノズ
ル26aが保持されるとともに、上側の第2の中間ブラ
ケット32に第2の溶剤ノズル26bが保持され、角型
基板1の端縁に対する溶剤の吐出角度と、角型基板1の
表面および裏面との間隔とをそれぞれ調整できるように
構成されている。
A first intermediate bracket 30 is attached to each of the third and fourth support frames 23 and 24 by a circular hole 28 and an arcuate elongated hole 29 so that the attachment angle can be changed. Middle bracket 30
A second intermediate bracket 32 is attached to the second intermediate bracket 32 so that the fixing position can be adjusted in the vertical direction by the vertical elongated holes 31, 31, and the first solvent nozzle 26a is held by the lower second intermediate bracket 32. At the same time, the second solvent nozzle 26b is held by the upper second intermediate bracket 32, and the ejection angle of the solvent with respect to the edge of the rectangular substrate 1 and the distance between the front surface and the back surface of the rectangular substrate 1 are adjusted. It is configured to be able to.

【0020】前記第3および第5の支持枠23,25そ
れぞれに円形の穴33と円弧状の長穴34とにより取り
付け角度を変更可能に第3の中間ブラケット35が取り
付けられるとともに、その第3の中間ブラケット35
に、水平方向の長穴36,36により固定位置を水平方
向に調整可能に第4の中間ブラケット37が取り付けら
れ、更に、その第4の中間ブラケット37に、上下方向
の長穴38,38により固定位置を上下方向に調整可能
に第5の中間ブラケット39が取り付けられ、下側の第
5の中間ブラケット39に第1のガスノズル27aが保
持されるとともに、上側の第5の中間ブラケット39に
第2のガスノズル27bが保持され、角型基板1の端縁
に対するガスの吐出角度と、吐出位置と、角型基板1の
表面および裏面との間隔とをそれぞれ調整できるように
構成されている。
A third intermediate bracket 35 is attached to each of the third and fifth support frames 23 and 25 by a circular hole 33 and an arcuate elongated hole 34 so that the attachment angle can be changed. Intermediate bracket 35
A fourth intermediate bracket 37 is attached to the fourth intermediate bracket 37 by horizontally elongated holes 36, 36 so that the fixing position can be adjusted in the horizontal direction. Further, the fourth intermediate bracket 37 is provided with vertically elongated holes 38, 38. A fifth intermediate bracket 39 is attached so that the fixing position can be adjusted in the vertical direction, the first gas nozzle 27a is held by the lower fifth intermediate bracket 39, and the fifth intermediate bracket 39 is fixed by the upper fifth intermediate bracket 39. The second gas nozzle 27b is held, and the gas discharge angle and the discharge position of the gas relative to the edge of the rectangular substrate 1 and the distance between the front surface and the back surface of the rectangular substrate 1 can be adjusted.

【0021】前記基台Bに、一対のガイド40,40と
第2のエアーシリンダ41とを介して、角型基板1に対
して遠近する方向に駆動移動可能に取付台42が設けら
れ、洗浄具本体18を角型基板1の端縁に対して遠近変
位し、洗浄具本体18を角型基板1の長辺側端縁に沿わ
せて移動する状態と、短辺側端縁に沿わせて移動する状
態とに切換えることができるように前記位置調整手段2
0が構成されている。
A mounting base 42 is provided on the base B through a pair of guides 40, 40 and a second air cylinder 41 so that the mounting base 42 can be driven and moved in a direction toward and away from the rectangular substrate 1 for cleaning. A state in which the cleaning tool main body 18 is displaced far away from the edge of the rectangular substrate 1 and the cleaning tool main body 18 is moved along the long side edge of the rectangular substrate 1 and a short side edge thereof is moved. The position adjusting means 2 so that it can be switched to a moving state by
0 is configured.

【0022】前記取付台42に、主動プーリー43と従
動プーリー44とが取り付けられ、両プーリー43,4
4にベルト45が巻回されるとともに主動プーリー43
に第2の電動モータ46が連動連結され、そして、ベル
ト45に第1の支持枠21が一体的に取り付けられると
ともに、ガイド47を介して直線的に移動するように案
内され、洗浄具本体18を角型基板1の端縁に沿わせて
直線移動するように前記移動手段19が構成されてい
る。
A main pulley 43 and a follower pulley 44 are attached to the mount 42, and both pulleys 43, 4 are attached.
4 around which the belt 45 is wound and the driving pulley 43
The second electric motor 46 is interlocked and connected to the belt 45, and the first support frame 21 is integrally attached to the belt 45, and is guided to move linearly via the guide 47. The moving means 19 is configured to move linearly along the edge of the rectangular substrate 1.

【0023】第3の支持枠23に、排気路形成部材48
が設けられ、この排気路形成部材48の、第1および第
2の溶剤ノズル26a,26b、ならびに、第1および
第2のガスノズル27a,27b側の箇所に、外拡がり
の排気口49が形成されるとともに、排気路形成部材4
8に、排気手段(図示せず)に接続された排気管50が
接続され、ガスとともにそれによって吹き飛ばされた溶
解物を吸引排出し、吹き飛ばされた溶解物が不測に角型
基板1の外面に飛散付着することを確実に防止できるよ
うに構成されている。
An exhaust passage forming member 48 is provided on the third support frame 23.
The exhaust passage forming member 48 is provided with an exhaust port 49 having an outward expansion at the first and second solvent nozzles 26a and 26b and the first and second gas nozzles 27a and 27b. And the exhaust passage forming member 4
An exhaust pipe 50 connected to an exhaust means (not shown) is connected to 8 to suck and discharge the gas and the melted material blown away by the gas, and the blown-out melted material unexpectedly reaches the outer surface of the rectangular substrate 1. It is configured so as to be surely prevented from scattering and adhering.

【0024】前記排気管50、第1および第2溶剤ノズ
ル26a,26bそれぞれに接続された溶剤供給管51
a,51b、ならびに、第1および第2ガスノズル27
a,27bそれぞれに接続されたガス供給管52a,5
2bは、洗浄具本体18の移動を許容するようにいずれ
も可撓性を有する材料で構成されている。
A solvent supply pipe 51 connected to the exhaust pipe 50 and the first and second solvent nozzles 26a and 26b, respectively.
a, 51b, and first and second gas nozzles 27
gas supply pipes 52a and 5 connected to a and 27b, respectively
2b is made of a flexible material so as to allow the cleaning tool body 18 to move.

【0025】以上の構成により、図4の(a)の概略平
面図に示すように、回転塗布によって表面に薄膜が形成
された角型基板1を基板保持手段2に保持させ、角型基
板1の短辺を洗浄具本体18の移動方向と平行になる姿
勢にし、その状態で、溶剤とガスを吐出しながら洗浄具
本体18を移動させ、角型基板1の短辺側の表裏両面と
周端面の不要薄膜を溶解除去する。図中斜線部分Cが、
不要薄膜を溶解除去した箇所を示している。
With the above configuration, as shown in the schematic plan view of FIG. 4A, the rectangular substrate 1 having a thin film formed on its surface by spin coating is held by the substrate holding means 2, and the rectangular substrate 1 is held. The short side of the rectangular parallelepiped is parallel to the moving direction of the cleaning tool main body 18, and in that state, the cleaning tool main body 18 is moved while discharging the solvent and gas, and both sides of the rectangular substrate 1 on the front and back sides and the periphery thereof are surrounded. The unnecessary thin film on the end face is dissolved and removed. The shaded area C in the figure
The portion where the unnecessary thin film is dissolved and removed is shown.

【0026】次いで、図4の(b)の概略平面図に示す
ように、角型基板1を90°回転させて角型基板1の長辺
を洗浄具本体18の移動方向と平行になる姿勢にすると
ともに、位置調整手段20により洗浄具本体18を角型
基板1に近づく所定位置まで移動し、その状態で、前述
の場合と同様にして、溶剤とガスを吐出しながら洗浄具
本体18を移動させ、角型基板1の長辺側の表裏両面と
周端面の不要薄膜を溶解除去する。更に、90°回転させ
るとともに位置調整手段20により洗浄具本体18を所
定位置まで移動し、同様にして、残りの短辺部分および
長辺部分の表裏両面と周端面の不要薄膜を溶解除去し、
角型基板1の端縁全周の不要薄膜を溶解除去する。
Next, as shown in the schematic plan view of FIG. 4B, the rectangular substrate 1 is rotated by 90 ° so that the long side of the rectangular substrate 1 is parallel to the moving direction of the cleaning tool body 18. In addition, the position adjusting means 20 moves the cleaning tool main body 18 to a predetermined position approaching the rectangular substrate 1, and in that state, the cleaning tool main body 18 is ejected while discharging the solvent and gas in the same manner as in the case described above. By moving, the unnecessary thin films on the front and back surfaces on the long side of the rectangular substrate 1 and on the peripheral end surface are dissolved and removed. Further, while rotating 90 °, the cleaning tool body 18 is moved to a predetermined position by the position adjusting means 20, and in the same manner, the unnecessary thin films on the front and back surfaces and the peripheral end surface of the remaining short side portion and long side portion are dissolved and removed.
The unnecessary thin film around the entire edge of the rectangular substrate 1 is dissolved and removed.

【0027】上述実施例では、基板端縁洗浄装置をフォ
トレジスト塗布液などによる薄膜形成のための回転塗布
装置とは別に専用に構成し、スループットを向上できる
ように構成しているが、本発明としては、回転塗布装置
内に組み込み、回転塗布装置の基板保持手段を基板端縁
洗浄装置の基板保持手段2に兼用構成するものでも良
い。
In the above-described embodiment, the substrate edge cleaning device is configured separately from the spin coating device for forming a thin film using a photoresist coating liquid or the like so that the throughput can be improved. For example, it may be incorporated in the spin coater so that the substrate holding means of the spin coater is also used as the substrate holding means 2 of the substrate edge cleaning device.

【0028】また、上記実施例では、基板保持手段2に
対して洗浄具本体18を移動するように構成している
が、洗浄具本体18を固定し、その洗浄具本体18に対
して基板保持手段2を移動するように構成しても良く、
要するに、第1および第2の溶剤ノズル26a,26
b、ならびに、第1および第2のガスノズル27a,2
7bと角型基板1とを相対的に直線移動するように構成
するものであれば良い。
In the above embodiment, the cleaning tool main body 18 is moved with respect to the substrate holding means 2. However, the cleaning tool main body 18 is fixed and the substrate is held with respect to the cleaning tool main body 18. The means 2 may be configured to move,
In short, the first and second solvent nozzles 26a, 26
b, and the first and second gas nozzles 27a, 2
What is necessary is just to configure 7b and the rectangular substrate 1 so as to linearly move relative to each other.

【0029】また、洗浄具本体18を直交する方向に移
動可能に2個設け、一方を長辺用に、そして、他方を短
辺用にして、一挙に長短両端縁の不要薄膜を溶解除去
し、その後、角型基板1を 180°回転させ、残りの長短
両端縁の不要薄膜を溶解除去できるように構成しても良
い。この場合には、前述した位置調整手段20は不用で
ある。
Further, two cleaning tool main bodies 18 are provided so as to be movable in a direction orthogonal to each other, one for the long side and the other for the short side to dissolve and remove unnecessary thin films at both ends of the long and short edges. After that, the rectangular substrate 1 may be rotated by 180 ° to dissolve and remove the unnecessary thin films at the remaining long and short edges. In this case, the position adjusting means 20 described above is unnecessary.

【0030】また、上記実施例では、基板端縁の表裏両
面に溶剤を吐出するように構成しているが、例えば、回
転可能に保持された角型基板1の下方側に溶剤を供給
し、角型基板1の裏面に回り込んで形成される薄膜を溶
解除去するように構成した裏面洗浄タイプの回転塗布装
置で回転塗布により薄膜が形成された角型基板1に対し
ては、角型基板1の端縁の表面側にのみ溶剤を吐出する
ように構成するとか、あるいは、角型基板1の端縁の裏
面側にのみ溶剤を吐出して表面張力により表面側に回り
込ませるように構成するなど、角型基板1の端縁の表裏
両面の少なくともいずれか一方に溶剤を吐出するように
構成すれば良い。
Further, in the above-mentioned embodiment, the solvent is discharged to both the front and back surfaces of the edge of the substrate. For example, the solvent is supplied to the lower side of the rotatably held rectangular substrate 1, For a square substrate 1 on which a thin film is formed by spin coating in a back surface cleaning type spin coating device configured to dissolve and remove a thin film formed around the back surface of the square substrate 1, a square substrate The solvent is ejected only to the front surface side of the edge of No. 1, or the solvent is ejected only to the back surface side of the edge of the rectangular substrate 1 and wraps around the front side by surface tension. For example, the solvent may be discharged onto at least one of the front and back surfaces of the edge of the rectangular substrate 1.

【0031】なお、前記実施例のように角型基板1の表
裏両面に溶剤を吐出するようにした場合には、片側にだ
け吐出して表面張力で回り込ませる場合と比較して次の
ような特段の効果を有する。つまり、表裏各々の側へ溶
剤を吐出させる場合には、表面張力で回り込ませること
を一切考慮する必要がないので、基板の表裏各面に対し
て緩やかな流速で溶剤を吐出しなくてもよい。したがっ
て、基板への溶剤吐出は、基板表面にて溶剤が滞留する
ことなく、次々と新鮮な溶剤が供給されるような状態で
あるので、短時間に効率良く基板端縁で薄膜を除去でき
る。このため、基板表面側の端縁において、端縁よりや
や内側の薄膜が溶剤に膨潤されて、基板表面の膜厚均一
性を低下させる虞が無い。
When the solvent is discharged to both the front and back surfaces of the rectangular substrate 1 as in the above-described embodiment, the following case is compared with the case where the solvent is discharged to only one side and wrap around by the surface tension. Has a special effect. In other words, when the solvent is discharged to each of the front and back sides, it is not necessary to consider the wraparound by the surface tension, so that the solvent does not have to be discharged at a gentle flow rate to each of the front and back surfaces of the substrate. .. Therefore, when the solvent is discharged onto the substrate, the solvent is not accumulated on the substrate surface, and fresh solvent is supplied one after another, so that the thin film can be efficiently removed at the edge of the substrate in a short time. Therefore, at the edge on the substrate surface side, there is no possibility that the thin film slightly inside the edge will be swollen by the solvent and the film thickness uniformity on the substrate surface will be reduced.

【0032】また、取付台42の、洗浄具本体18の初
期位置に近い位置に、初期位置に移動した第1および第
2の溶剤ノズル26a,26bの先端側に接触して、そ
こに付着した溶剤の滴を移して除去する接触部材を設け
ても良い(実願平3−24476号参照)。
Further, at a position close to the initial position of the cleaning tool body 18 of the mounting base 42, the tip ends of the first and second solvent nozzles 26a and 26b moved to the initial position are brought into contact with and attached thereto. A contact member for transferring and removing the solvent droplets may be provided (see Japanese Patent Application No. 3-24476).

【0033】[0033]

【発明の効果】以上の説明から明らかなように、本発明
の基板端縁洗浄装置によれば、角型基板を回転させず
に、溶剤ノズルおよびガスノズルを角型基板の端縁に沿
わせて相対的に直線移動し、溶剤によって薄膜を溶解し
た溶解物を角型基板の端縁よりも外方に吹き飛ばすか
ら、角型基板を回転して遠心力を利用する従来例のよう
に溶剤の供給にムラを生じることを確実に回避でき、角
型基板の端縁の薄膜を良好に除去することができる。
As is apparent from the above description, according to the substrate edge cleaning apparatus of the present invention, the solvent nozzle and the gas nozzle are arranged along the edge of the rectangular substrate without rotating the rectangular substrate. The solvent moves in a straight line relative to the thin film dissolved by the solvent and blows away the melted material to the outside of the edge of the rectangular substrate.Therefore, the solvent is supplied as in the conventional example in which the rectangular substrate is rotated and centrifugal force is used. It is possible to surely avoid the occurrence of unevenness, and it is possible to favorably remove the thin film on the edge of the rectangular substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例に係る基板端縁洗浄装置の概略
斜視図である。
FIG. 1 is a schematic perspective view of a substrate edge cleaning device according to an embodiment of the present invention.

【図2】一部切欠全体側面図である。FIG. 2 is a side view of the entire partially cutaway structure.

【図3】全体正面図である。FIG. 3 is an overall front view.

【図4】基板の端縁洗浄動作を説明する概略平面図であ
る。
FIG. 4 is a schematic plan view illustrating an edge cleaning operation of a substrate.

【符号の説明】[Explanation of symbols]

1…角型基板 2…基板保持手段 19…移動手段 26a…第1の溶剤ノズル 26b…第2の溶剤ノズル 27a…第1のガスノズル 27b…第2のガスノズル DESCRIPTION OF SYMBOLS 1 ... Rectangular substrate 2 ... Substrate holding means 19 ... Moving means 26a ... 1st solvent nozzle 26b ... 2nd solvent nozzle 27a ... 1st gas nozzle 27b ... 2nd gas nozzle

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 回転塗布によって表面に薄膜が形成され
た角型基板を載置保持する基板保持手段と、 その基板保持手段によって保持された前記角型基板の端
縁の表裏両面の少なくともいずれか一方に溶剤を吐出し
て不要薄膜を溶解する溶剤ノズルと、 ガスを吐出して溶解物を前記角型基板の端縁よりも外方
に吹き飛ばすガスノズルと、 前記溶剤ノズルおよびガスノズルを、前記角型基板の端
縁に沿わせて相対的に直線移動する移動手段と、 を備えた基板端縁洗浄装置。
1. A substrate holding means for placing and holding a square substrate having a thin film formed on its surface by spin coating, and at least one of front and back surfaces of an edge of the square substrate held by the substrate holding means. A solvent nozzle that discharges a solvent to one side to dissolve the unnecessary thin film, a gas nozzle that discharges a gas to blow the melted material outward beyond the edge of the rectangular substrate, the solvent nozzle and the gas nozzle A substrate edge cleaning device comprising: a moving unit that relatively linearly moves along an edge of the substrate.
JP3357131A 1991-12-24 1991-12-24 Substrate edge cleaning device Expired - Lifetime JP2659306B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3357131A JP2659306B2 (en) 1991-12-24 1991-12-24 Substrate edge cleaning device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3357131A JP2659306B2 (en) 1991-12-24 1991-12-24 Substrate edge cleaning device

Publications (2)

Publication Number Publication Date
JPH05175117A true JPH05175117A (en) 1993-07-13
JP2659306B2 JP2659306B2 (en) 1997-09-30

Family

ID=18452541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3357131A Expired - Lifetime JP2659306B2 (en) 1991-12-24 1991-12-24 Substrate edge cleaning device

Country Status (1)

Country Link
JP (1) JP2659306B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07297120A (en) * 1994-04-26 1995-11-10 Dainippon Screen Mfg Co Ltd Equipment for cleaning fringe of substrate
US5688411A (en) * 1995-03-09 1997-11-18 Tokyo Ohka Kogyo Co., Ltd. Method of and apparatus for removing coating from edge of substrate
US6015467A (en) * 1996-03-08 2000-01-18 Tokyo Ohka Kogyo Co., Ltd. Method of removing coating from edge of substrate
US6793764B1 (en) 1996-02-27 2004-09-21 Micron Technology, Inc. Chemical dispensing system for semiconductor wafer processing
US7012702B2 (en) 2002-01-09 2006-03-14 Dainippon Screen Mfg. Co., Ltd. Measuring apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6461917A (en) * 1987-09-02 1989-03-08 Toshiba Corp Device for removing coating film of end section of substrate
JPH01253923A (en) * 1988-04-01 1989-10-11 Mitsubishi Electric Corp Coating-film eliminating device
JPH02157763A (en) * 1988-12-09 1990-06-18 Sharp Corp Resist removing device
JP3112928U (en) * 2005-03-28 2005-09-02 真知子 高橋 Cushion-type diapers and wipes

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6461917A (en) * 1987-09-02 1989-03-08 Toshiba Corp Device for removing coating film of end section of substrate
JPH01253923A (en) * 1988-04-01 1989-10-11 Mitsubishi Electric Corp Coating-film eliminating device
JPH02157763A (en) * 1988-12-09 1990-06-18 Sharp Corp Resist removing device
JP3112928U (en) * 2005-03-28 2005-09-02 真知子 高橋 Cushion-type diapers and wipes

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07297120A (en) * 1994-04-26 1995-11-10 Dainippon Screen Mfg Co Ltd Equipment for cleaning fringe of substrate
US5688411A (en) * 1995-03-09 1997-11-18 Tokyo Ohka Kogyo Co., Ltd. Method of and apparatus for removing coating from edge of substrate
US6793764B1 (en) 1996-02-27 2004-09-21 Micron Technology, Inc. Chemical dispensing system for semiconductor wafer processing
US7470344B1 (en) 1996-02-27 2008-12-30 Micron Technology, Inc. Chemical dispensing system for semiconductor wafer processing
US6015467A (en) * 1996-03-08 2000-01-18 Tokyo Ohka Kogyo Co., Ltd. Method of removing coating from edge of substrate
US7012702B2 (en) 2002-01-09 2006-03-14 Dainippon Screen Mfg. Co., Ltd. Measuring apparatus

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