JPH05200350A - Device for cleaning end of substrate - Google Patents

Device for cleaning end of substrate

Info

Publication number
JPH05200350A
JPH05200350A JP3720192A JP3720192A JPH05200350A JP H05200350 A JPH05200350 A JP H05200350A JP 3720192 A JP3720192 A JP 3720192A JP 3720192 A JP3720192 A JP 3720192A JP H05200350 A JPH05200350 A JP H05200350A
Authority
JP
Japan
Prior art keywords
substrate
rectangular substrate
cleaning liquid
thin film
rectangular
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3720192A
Other languages
Japanese (ja)
Inventor
Koji Kizaki
幸治 木▲崎▼
Mikio Shoda
幹夫 庄田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP3720192A priority Critical patent/JPH05200350A/en
Publication of JPH05200350A publication Critical patent/JPH05200350A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To satisfactorily clean off an unnecessary thin film on the peripheral end face of a rectangular substrate without adversely affecting the film formed on the substrate and without leaving a cleaning soln. CONSTITUTION:A rectangular substrate 1 with a thin film formed on the surface by spin coating is held by a substrate holding means capable of being rotated on its vertical axis, a cleaning soln. is discharged from a nozzle 3 over the rear of the substrate 1 to clean off the unnecessary thin film, a gas nozzle 24 is provided to supply a gas at the corner of the rear of the substrate 1 to blow off the remaining deposit, hence the rear of the substrate 1 is cleaned, and the remaining deposit at the corner of the rear is removed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、回転塗布によって、フ
ォトレジスト塗布液や感光性ポリイミド樹脂やカラーフ
ィルター用の染色剤といった薄膜が表面に形成された液
晶用のガラス基板やフォトマスク用のガラス基板などの
角型基板に対し、その薄膜形成後の角型基板の裏面側に
洗浄液を吐出して、角型基板の周端面の不要薄膜を洗浄
除去する基板端縁洗浄装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glass substrate for a liquid crystal or a glass for a photomask on which a thin film such as a photoresist coating solution, a photosensitive polyimide resin or a dyeing agent for a color filter is formed by spin coating. The present invention relates to a substrate edge cleaning apparatus that discharges a cleaning liquid onto a rectangular substrate such as a substrate on the back surface side of the rectangular substrate after the thin film is formed to clean and remove unnecessary thin films on the peripheral end surface of the rectangular substrate.

【0002】[0002]

【従来の技術】上述のような薄膜が形成された角型基板
は、その製造工程等において、角型基板の表面に薄膜が
形成された後、各種処理工程を経る間に、カセットに挿
抜されたり、搬送機構に保持されたりする。このとき、
角型基板の端縁がカセット内の収納溝や搬送機構のチャ
ック部に接触することにより、角型基板の端縁の不要な
薄膜が剥離して発塵源になることが知られている。
2. Description of the Related Art A rectangular substrate having a thin film as described above is inserted into and removed from a cassette during various processing steps after the thin film is formed on the surface of the rectangular substrate in the manufacturing process or the like. Or it is held by the transport mechanism. At this time,
It is known that when the edge of the rectangular substrate comes into contact with the storage groove in the cassette or the chuck portion of the transport mechanism, the unnecessary thin film on the edge of the rectangular substrate peels off and becomes a dust source.

【0003】また、周端面の不要薄膜の一部がそのまま
乾燥して残存すると、後工程の装置を汚染し、殊に、近
年では、集積度が増大する傾向にあり、より一層歩留り
が低下する問題があった。
Further, if a part of the unnecessary thin film on the peripheral end face is dried and remains as it is, it contaminates the post-process equipment, and in particular, in recent years, the degree of integration tends to increase, and the yield further decreases. There was a problem.

【0004】そこで、薄膜を回転塗布する工程の最終段
階で、角型基板の周端面の不要薄膜を予め除去しておく
処理が施される。この不要薄膜を除去する技術として
は、例えば、特公昭58−19350号公報に開示され
ているものがあった。
Therefore, in the final stage of the step of spin-coating the thin film, a treatment for removing the unnecessary thin film on the peripheral end face of the rectangular substrate is performed in advance. As a technique for removing the unnecessary thin film, for example, there is one disclosed in Japanese Patent Publication No. 58-19350.

【0005】この従来例によれば、回転塗布が終了した
角型基板を低速で回転させながら、その角型基板の端縁
の下方の固定位置から洗浄液を吐出し、遠心力により角
型基板の端縁側に流れるに伴って洗浄液が不要薄膜を洗
浄除去し、更に、洗浄液が表面張力によって角型基板の
端縁の表面側にも回り込み、角型基板の周端面、およ
び、その角型基板の表面の端縁に形成されている不要薄
膜を洗浄除去し、しかる後に高速回転に切換え、洗浄に
伴って形成された液だまりから液滴を遠心力によって外
方に飛散し、角型基板の端縁側の表裏両面および周端面
それぞれに形成された不要薄膜を洗浄除去するように構
成している。
According to this conventional example, the cleaning liquid is discharged from a fixed position below the edge of the rectangular substrate while rotating the rectangular substrate after the spin coating at a low speed, and centrifugal force is applied to the rectangular substrate. The cleaning liquid cleans and removes the unnecessary thin film as it flows to the edge side, and the cleaning liquid also wraps around to the surface side of the edge of the rectangular substrate due to the surface tension, and the peripheral edge surface of the rectangular substrate and the rectangular substrate The unnecessary thin film formed on the edge of the surface is removed by washing, and after that, switching to high-speed rotation, the droplets are scattered outward by the centrifugal force from the liquid pool formed by washing, and the edge of the rectangular substrate The unnecessary thin films formed on both the front and back surfaces and the peripheral end surface on the edge side are cleaned and removed.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上述し
た角型基板の端縁の下方から洗浄液のみを吐出する従来
例の場合、以下の欠点があった。
However, the conventional example in which only the cleaning liquid is discharged from below the edge of the rectangular substrate has the following drawbacks.

【0007】その洗浄液としてアセトンのように揮発性
の高い有機溶剤を使用するときには、上述した回転によ
る振り切りと気化による乾燥のしやすさとから洗浄液が
残留する問題は少ないが、その気化熱により温度低下を
発生したり、蒸発に伴って洗浄液の蒸気圧が高くなるな
ど、温度や蒸気圧が不安定になって角型基板に形成され
る薄膜の膜厚均一性に悪影響を与えるため、できるだけ
揮発性の低い洗浄液を使用することが好ましく、その結
果として、気化による乾燥がしづらくなり、どうしても
洗浄液が残存してしまう欠点があった。
When an organic solvent having a high volatility such as acetone is used as the cleaning liquid, there is little problem that the cleaning liquid remains due to the above-mentioned shaking off due to rotation and the ease of drying due to evaporation, but the temperature is lowered by the heat of vaporization. Is generated, and the vapor pressure of the cleaning liquid increases with evaporation, which makes the temperature and vapor pressure unstable and adversely affects the film thickness uniformity of the thin film formed on the rectangular substrate. It is preferable to use a cleaning liquid having a low viscosity, and as a result, it becomes difficult to dry due to vaporization, and there is a drawback that the cleaning liquid remains.

【0008】本発明は、このような事情に鑑みてなされ
たものであって、角型基板に形成された薄膜への悪影響
を回避しながら、洗浄液を残存させることなく角型基板
の周端面の不要薄膜を良好に洗浄除去できるようにする
ことを目的とする。
The present invention has been made in view of the above circumstances, and avoids the adverse effect on the thin film formed on the rectangular substrate, while the cleaning liquid is not left on the peripheral end surface of the rectangular substrate. It is an object of the present invention to enable good cleaning and removal of unnecessary thin films.

【0009】[0009]

【課題を解決するための手段】本発明者は、低揮発性の
洗浄液を使用しての実験を繰り返すうちに、洗浄液の残
り方に規則性があることを発見した。
The present inventor has discovered that, while repeating experiments using a cleaning liquid having a low volatility, there is regularity in the remaining part of the cleaning liquid.

【0010】洗浄液は、低速回転時は従来例の如く遠心
力によって拡がり周端面を洗浄する。その後、振り切り
のために高速回転を行うと、各基板端縁の回転方向の下
手側の端に常に集まる。この原因は定かではないが、基
板表面と洗浄液の密着力と回転数に応じた遠心力との関
係で基板から離脱はできないが基板の回転移動運動に対
する追随性の遅れが発生することが原因と推測する。
The cleaning liquid spreads by centrifugal force during low speed rotation as in the prior art to clean the peripheral end face. After that, when the substrate is rotated at a high speed for shaking off, it is always gathered at the lower end of the edge of each substrate in the rotation direction. The cause of this is not clear, but due to the relationship between the adhesion between the substrate surface and the cleaning liquid and the centrifugal force depending on the number of revolutions, it is not possible to separate from the substrate, but there is a delay in the followability to the rotational movement of the substrate Infer.

【0011】本発明は、上述の再現性のある現象を利用
し、揮発性の低い有機溶剤を利用して均一性の優れた薄
膜塗布を行うとともに洗浄液残りを無くすため、以下の
手段を有する。
The present invention has the following means for utilizing the above-mentioned reproducible phenomenon, applying a thin film having excellent uniformity using an organic solvent having low volatility, and eliminating residual cleaning liquid.

【0012】すなわち、回転塗布によって表面に薄膜が
形成された角型基板を鉛直方向の軸芯周りで回転可能に
載置保持する基板保持手段と、その基板保持手段によっ
て保持された角型基板と一体回転自在に設けられて、角
型基板の裏面に洗浄液を吐出して不要薄膜を洗浄除去す
る洗浄液ノズルと、角型基板の裏面側で角部にガスを供
給して残存付着物を吹き飛ばすガスノズルとを備えて構
成する。
That is, a substrate holding means for mounting and holding a rectangular substrate having a thin film formed on its surface by spin coating so as to be rotatable about an axis in the vertical direction, and a rectangular substrate held by the substrate holding means. A cleaning liquid nozzle that is integrally rotatable and that discharges a cleaning liquid to the back surface of a rectangular substrate to clean and remove unnecessary thin films, and a gas nozzle that supplies gas to the corners on the back surface side of the rectangular substrate to blow away residual deposits. And is configured.

【0013】使用する洗浄液としては、フォトレジスト
塗布液を洗浄する場合には、シクロヘキサノン、ジイソ
ブチルケトン、酢酸ブチル、キシレン、エチレングリコ
ールモノメチルエーテル、エチレングリコールモノエチ
ルエーテルアセテートや、ジメチルホルムアミドなどを
用いることができる。
As the cleaning liquid to be used, when cleaning the photoresist coating liquid, cyclohexanone, diisobutyl ketone, butyl acetate, xylene, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether acetate, dimethylformamide or the like is used. it can.

【0014】ガスノズルから供給するガスとしては、窒
素ガスなどの不活性ガスや空気を用いることができる。
As the gas supplied from the gas nozzle, an inert gas such as nitrogen gas or air can be used.

【0015】[0015]

【作用】本発明の基板端縁洗浄装置の構成によれば、回
転塗布によって表面に均一に薄膜を形成した角型基板を
基板保持手段に載置保持して回転させ、その角型基板の
裏面に洗浄液を吐出すると、角型基板に付着した洗浄液
は、最初に基板全周端面へ回り込み、洗浄を行う。その
後、回転を続けると洗浄液は回転による遠心力で角型基
板から振り切られるまでの間に、各基板端縁の回転下手
側の端へ向かって基板周端縁に沿って移動し、回転方向
下手側の角部側に溜まる。その後、残存付着した洗浄液
をガスノズルから供給するガスにより吹き飛ばして除去
することができる。
According to the structure of the substrate edge cleaning apparatus of the present invention, the rectangular substrate having a thin film uniformly formed on its surface by spin coating is placed and held on the substrate holding means and rotated, and the rear surface of the rectangular substrate is rotated. When the cleaning liquid is discharged onto the substrate, the cleaning liquid adhering to the rectangular substrate first wraps around the entire circumference of the substrate to perform cleaning. After that, if the cleaning liquid continues to rotate, the cleaning liquid moves along the substrate peripheral edge toward the lower rotation side end of each substrate edge until it is shaken off from the rectangular substrate by the centrifugal force due to the rotation. Accumulate on the side corner. After that, the remaining adhered cleaning liquid can be blown off and removed by the gas supplied from the gas nozzle.

【0016】[0016]

【実施例】次に、本発明の実施例を図面を用いて説明す
る。
Embodiments of the present invention will now be described with reference to the drawings.

【0017】図1は、本発明に係る基板端縁洗浄装置の
実施例を示す一部切欠全体側面図であり、回転塗布によ
って表面に薄膜が形成された角型基板1を鉛直方向の軸
芯P周りで回転可能に載置保持する基板保持手段2が設
けられるとともに、その基板保持手段2に、角型基板1
と一体回転自在に洗浄液ノズル3…が設けられている。
FIG. 1 is a partially cutaway overall side view showing an embodiment of a substrate edge cleaning apparatus according to the present invention. A rectangular substrate 1 having a thin film formed on its surface by spin coating is used as a vertical axis core. Substrate holding means 2 for rotatably mounting and holding it around P is provided, and the square substrate 1 is attached to the substrate holding means 2.
Is provided with a cleaning liquid nozzle 3 ...

【0018】前記基板保持手段2は、角型基板1の外形
より大きく、角型基板1を水平姿勢で載置保持した状態
で前記鉛直方向の軸芯P周りで回転する回転台4と、そ
の回転台4の上面と角型基板1の下面との間に間隙がで
きるように、回転台4上に立設された基板支持用の多数
の基板支持ピン5…群と、角型基板1の角部に外方から
当接して位置決め保持する基板保持ピン6…と、回転台
4の上方において回転台4と平行に設置されて回転台4
と共に一体回転する上部回転板7とから構成されてい
る。
The substrate holding means 2 is larger than the outer shape of the rectangular substrate 1 and rotates about the vertical axis P in a state where the rectangular substrate 1 is placed and held in a horizontal posture, and a rotary table 4 thereof. A group of a large number of substrate supporting pins 5 for supporting the substrate, which are erected on the rotating table 4 so that a gap is formed between the upper surface of the rotating table 4 and the lower surface of the rectangular substrate 1, and the rectangular substrate 1 The substrate holding pins 6 that come into contact with the corners from the outside and are positioned and held, and the rotating table 4 installed above the rotating table 4 in parallel with the rotating table 4.
And an upper rotating plate 7 that rotates together with the upper rotating plate 7.

【0019】回転台4の外周上面には、図2の要部の一
部省略拡大側断面図に示すように、回転台4と同じ外形
寸法のスペーサリング8を介してリングプレート9が複
数箇所で連結され、一方、上部回転板7に上部支持板1
0が取り付けられ、その上部支持板10がリングプレー
ト9にノブボルト11を介して着脱自在に装着されるよ
うになっており、そして、連結ボルト12に外嵌した上
下の座金13,13の厚さに相当する隙間14が上下に
形成され、角型基板1の上下および回転台4の半径方向
外側を囲む廃液の排出部を構成し、回転台4と上部回転
板7とが角型基板1を上下に狭い空間を形成して挟むよ
うにして、それらが一体的に回転可能に構成されてい
る。
On the upper surface of the outer periphery of the rotary table 4, a plurality of ring plates 9 are provided through spacer rings 8 having the same external dimensions as the rotary table 4, as shown in an enlarged side sectional view of a part of FIG. , While the upper support plate 1 is connected to the upper rotary plate 7.
0, the upper support plate 10 is detachably attached to the ring plate 9 via the knob bolts 11, and the thicknesses of the upper and lower washers 13 and 13 externally fitted to the connecting bolts 12 are set. A gap 14 corresponding to the above is formed above and below, and constitutes a drainage portion of the waste liquid surrounding the top and bottom of the rectangular substrate 1 and the radial outside of the rotary table 4, and the rotary table 4 and the upper rotary plate 7 form the rectangular substrate 1. The upper and lower narrow spaces are sandwiched so that they are integrally rotatable.

【0020】前記上部回転板7は角型基板1の外形形状
より大きい円板に構成されて、上部支持板10の下面に
カラー15を介してボルト連結され、角型基板1と一定
の小間隔(例えば約10mm)をもって平行に対向するよう
になっている。
The upper rotary plate 7 is formed in a disk shape larger than the outer shape of the rectangular substrate 1, and is bolted to the lower surface of the upper support plate 10 via a collar 15 so that the upper rotary plate 7 and the rectangular substrate 1 have a constant small interval. They are parallel to each other (for example, about 10 mm).

【0021】上部回転板7の中央上面には着脱用の把手
16が取り付けられ、上部支持板10を取り外すこと
で、リングプレート9の中央開口から角型基板1および
薄膜形成のためのフォトレジスト塗布液を供給する塗布
液供給ノズル17を出し入れすることができるようにな
っている。
A handle 16 for attachment / detachment is attached to the central upper surface of the upper rotary plate 7, and by removing the upper support plate 10, the rectangular substrate 1 and photoresist for forming a thin film are applied from the central opening of the ring plate 9. The coating liquid supply nozzle 17 for supplying the liquid can be taken in and out.

【0022】前述した回転する部材の下方および周辺部
を囲んで廃液回収ケース18が固定配置され、その廃液
回収ケース18の底部は絞り込まれ、その下端に廃液排
出口18aが形成されるとともに、周方向の複数箇所に
は塗布液から蒸発した洗浄液ガスや塗布液ミストを排気
する排気口18bが形成されている。
A waste liquid recovery case 18 is fixedly arranged around the lower part and the peripheral part of the above-mentioned rotating member, the bottom part of the waste liquid recovery case 18 is narrowed down, and a waste liquid discharge port 18a is formed at the lower end of the waste liquid recovery case 18 and the periphery thereof is formed. Exhaust ports 18b for exhausting the cleaning liquid gas evaporated from the coating liquid and the coating liquid mist are formed at a plurality of positions in the direction.

【0023】前記基板支持ピン5…によって支持された
角型基板1の下方に位置させて、図3の要部の平面図に
示すように、角型基板1の裏面側で端縁の4辺それぞれ
に沿うとともにその両端側それぞれが回転軸芯P側に向
かうように前記洗浄液ノズル3…が支持ステー19…を
介して回転台4に取り付けられ、かつ、各辺の長さ方向
中間に近い箇所から回転方向上手側の一方の角部に至る
部分に、長手方向に所定間隔を隔てるとともに、吐出方
向を回転軸芯P側に向けた状態で噴出孔20…が形成さ
れ、角型基板1の裏面側で端縁の回転方向上手側半分の
箇所に洗浄液を吐出し、角型基板1の周端面の不要薄膜
を洗浄除去できるように構成されている。
It is positioned below the rectangular substrate 1 supported by the substrate support pins 5 and, as shown in the plan view of the main part of FIG. The cleaning liquid nozzles 3 are attached to the rotary table 4 via the support stays 19 so that both ends of the cleaning liquid nozzles 3 are directed toward the rotary shaft core P, and are located near the middle of each side in the length direction. From the side to the one corner on the side in the rotational direction, the ejection holes 20 are formed with a predetermined interval in the longitudinal direction, and the ejection direction is directed to the rotational axis P side. The cleaning liquid is discharged to the half of the back side on the upper side in the rotational direction of the edge so that the unnecessary thin film on the peripheral end surface of the rectangular substrate 1 can be cleaned and removed.

【0024】前記回転台4は、垂直に立設されて回転駆
動される中空筒状の縦向き回転軸21の上端に連結ボス
22を介して水平に取付けられ、その連結ボス22に形
成された第1の穴23…と縦向き回転軸21の内部空間
とを介して洗浄液ノズル3…に洗浄液を供給するように
構成されている。
The rotary table 4 is horizontally attached to an upper end of a hollow cylindrical vertical rotation shaft 21 which is vertically erected and driven to rotate, and is formed on the connection boss 22. The cleaning liquid is supplied to the cleaning liquid nozzles 3 through the first holes 23 and the internal space of the vertical rotation shaft 21.

【0025】図2の側断面図に示すように、回転台4の
角型基板1の裏面側で4個の角部それぞれに近い箇所
に、ガスノズル24が取り付けられている。
As shown in the side sectional view of FIG. 2, gas nozzles 24 are attached to the rotary table 4 on the back surface side of the rectangular substrate 1 at positions near the four corners.

【0026】ガスノズル24は、図4の(a)の斜視
図、および、図4の(b)の断面図〔図4の(a)のA
−A線断面図〕に示すように、ノズル本体25に先端側
が屈曲された第1のガス供給管26を取り付けて構成さ
れ、図2に示すように、その第1のガス供給管26と、
連結ボス22に形成された第2の穴27とが第2のガス
供給管26aを介して接続されている。
The gas nozzle 24 is shown in a perspective view of FIG. 4 (a) and a sectional view of FIG. 4 (b) [A in FIG. 4 (a)].
-A line cross-sectional view], it is configured by attaching a first gas supply pipe 26 having a bent tip end to the nozzle body 25, and as shown in FIG. 2, the first gas supply pipe 26,
The second hole 27 formed in the connection boss 22 is connected via the second gas supply pipe 26a.

【0027】連結ボス22の下端側には、図2に示すよ
うに、環状の穴28が形成されるとともに、パッキング
29を介して蓋部材30を取り付けることによりシール
され、前記第2の穴27と環状の穴28とが接続される
とともに、周方向の所定箇所において、環状の穴28
に、径方向外方に向かって貫通する第3の穴31が接続
されている。
As shown in FIG. 2, an annular hole 28 is formed at the lower end side of the connecting boss 22 and is sealed by attaching a lid member 30 via a packing 29, so that the second hole 27 is formed. And the annular hole 28 are connected, and the annular hole 28 is formed at a predetermined position in the circumferential direction.
Is connected to a third hole 31 that extends radially outward.

【0028】基板保持手段2が停止した状態で第3の穴
31の開口端に対向する箇所に、均圧弁機構32と電磁
弁33を介装したフレキシブルチューブ34を介して窒
素ガス供給源(図示せず)に接続された中間部材35が
設けられ、この中間部材35にエアーシリンダ36が連
動連結され、エアーシリンダ36の伸長によって中間部
材35に形成された第4の穴37と第3の穴31とを接
続するとともに、電磁弁33を開き、ガスノズル24か
ら角型基板1の裏面側の角部に窒素ガスを供給して残存
付着物を吹き飛ばすように構成されている。図中38
は、第4の穴37と第3の穴31とをシール状態で接続
するシールリングを示している。
A nitrogen gas supply source is provided at a position facing the open end of the third hole 31 in a state where the substrate holding means 2 is stopped, through a flexible tube 34 having a pressure equalizing valve mechanism 32 and a solenoid valve 33. An intermediate member 35 connected to the intermediate member 35 is provided, an air cylinder 36 is interlockingly connected to the intermediate member 35, and a fourth hole 37 and a third hole 37 formed in the intermediate member 35 by extension of the air cylinder 36. 31 is connected, the solenoid valve 33 is opened, and nitrogen gas is supplied from the gas nozzle 24 to the corners on the back surface side of the rectangular substrate 1 to blow away the remaining deposits. 38 in the figure
Shows a seal ring that connects the fourth hole 37 and the third hole 31 in a sealed state.

【0029】以上の構成により、塗布処理に際しては、
先ず上部支持板10を適宜手段で持ち上げて中央開口を
大きく開放し、角型基板1を基板支持ピン5…群に水平
姿勢に載置し、基板保持ピン6…に保持させる。
With the above structure, the coating process is
First, the upper support plate 10 is lifted by an appropriate means to open the central opening largely, and the rectangular substrate 1 is placed horizontally on the substrate support pins 5 ... Group and held by the substrate holding pins 6.

【0030】次に、塗布液供給ノズル17を中央開口の
中央に移動させるとともに角型基板1上の適当高さまで
下降させて、所定量の塗布液を角型基板1上の中央に滴
下供給する。
Next, the coating liquid supply nozzle 17 is moved to the center of the central opening and lowered to an appropriate height on the rectangular substrate 1, and a predetermined amount of the coating liquid is dropped and supplied to the center of the rectangular substrate 1. .

【0031】その後、塗布液供給ノズル17を退避させ
るとともに、上部支持板10をリングプレート9に装着
固定した上で、縦向き回転軸21を駆動して、回転台
4、上部支持板10および上部回転板7とともに角型基
板1を鉛直方向の軸芯回りで水平回転させる。この回転
によって角型基板1上の塗布液は遠心力により外方に拡
散流動して角型基板1上面に薄く塗布される。この場
合、回転台4と上部回転板7とで挟まれた空間内の空気
も角型基板1と共に回転し、角型基板1の周縁による風
切り現象を生じない状態で、塗布液は角型基板1上面に
均一に塗布される。
After that, the coating liquid supply nozzle 17 is retracted, the upper support plate 10 is mounted and fixed to the ring plate 9, and the vertical rotation shaft 21 is driven to rotate the rotary table 4, the upper support plate 10 and the upper part. The square substrate 1 is horizontally rotated around the vertical axis together with the rotating plate 7. By this rotation, the coating liquid on the rectangular substrate 1 is diffused and flows outward by the centrifugal force, and is thinly coated on the upper surface of the rectangular substrate 1. In this case, the air in the space sandwiched between the rotary table 4 and the upper rotary plate 7 also rotates together with the rectangular substrate 1, and the coating liquid is applied to the rectangular substrate 1 without causing a wind-breaking phenomenon due to the peripheral edge of the rectangular substrate 1. 1 is uniformly applied to the upper surface.

【0032】角型基板1上を流動して外周に至った余剰
の塗布液は、角型基板1の周縁から回転台4と上部回転
板7とで挟まれた空間の周部にミスト状に飛散し、スペ
ーサリング8の上下に形成されている隙間14を通って
廃液回収ケース18内に流出する。
Excess coating liquid flowing on the rectangular substrate 1 and reaching the outer periphery is formed as a mist from the peripheral edge of the rectangular substrate 1 to the peripheral portion of the space sandwiched between the rotary table 4 and the upper rotary plate 7. It scatters and flows into the waste liquid recovery case 18 through the gaps 14 formed above and below the spacer ring 8.

【0033】このような回転塗布処理の間、あるいは、
回転塗布処理を終了した後に、洗浄液ノズル3…を介し
て、回転している角型基板1の裏面側の端縁に洗浄液を
吐出することによって、洗浄液を角型基板1の裏面の端
縁に近い位置から外周側に向けて流動し、角型基板1の
周端面へ回り込み、回転による遠心力で振り切られるま
での間に、基板端縁の回転方向下手側へ向かって基板端
縁に沿って移動するので、角型基板1の端面に付着した
塗布液ミスト、あるいは、付着しようとする塗布液ミス
トを洗い流し、スペーサリング8の隙間14を通って廃
液回収ケース18に流出し、廃液だけを排液口18aか
ら回収排出してゆく。
During such spin coating process, or
After the spin coating process is completed, the cleaning liquid is discharged to the edge on the back surface side of the rotating rectangular substrate 1 through the cleaning liquid nozzles 3 ... Flowing from the near position toward the outer peripheral side, wrapping around the peripheral end surface of the rectangular substrate 1 and being shaken off by the centrifugal force due to the rotation, along the substrate edge toward the lower side in the rotation direction of the substrate edge. Since it moves, the coating liquid mist adhering to the end surface of the rectangular substrate 1 or the coating liquid mist that is about to adhere is washed away, flows out to the waste liquid recovery case 18 through the gap 14 of the spacer ring 8, and only the waste liquid is discharged. The liquid is collected and discharged from the liquid port 18a.

【0034】洗浄液による洗浄処理の後に回転を停止
し、エアーシリンダ36を伸長して中間部材35を連結
ボス22の外周面に押圧してから電磁弁33を開き、角
型基板1の裏面の角部に窒素ガスを供給して残存付着物
を吹き飛ばす。すなわち、洗浄液による洗浄処理に際し
ては、回転による遠心力を受けて、洗浄液が角型基板1
の裏面の角部に向かって流れ、その角部に滞留すること
になり、また、長方形状の角型基板1においては、角型
基板1から飛散し、周部や回転台4上面から跳ね返った
洗浄液が、角型基板1の長辺の回転方向下手側の角部に
集中して付着しやすく、そのようにして付着した洗浄液
や前述の滞留した洗浄液といった残存付着物を吹き飛ば
すのである。
After the cleaning process with the cleaning liquid, the rotation is stopped, the air cylinder 36 is extended to press the intermediate member 35 against the outer peripheral surface of the connecting boss 22, and the solenoid valve 33 is opened. Nitrogen gas is supplied to the parts to blow away the remaining deposits. That is, during the cleaning process with the cleaning liquid, the cleaning liquid receives the centrifugal force due to the rotation, and the cleaning liquid is applied to the rectangular substrate 1.
Flow toward the corners on the back surface of the sheet and stay at the corners. Further, in the rectangular rectangular substrate 1, it scatters from the rectangular substrate 1 and bounces from the peripheral portion and the upper surface of the turntable 4. The cleaning liquid easily concentrates and adheres to the corner of the long side of the rectangular substrate 1 on the lower side in the rotation direction, and the remaining adhered substances such as the cleaning liquid thus adhered and the above-mentioned accumulated cleaning liquid are blown off.

【0035】図5は、ガスノズル24の変形例を示し、
(a)は斜視図、(b)は断面図〔図5の(a)のB−
B線断面図〕であり、ノズル本体25に取り付けられた
第1のガス供給管26Aが、角部側程高くなる傾斜反射
面Fと、その傾斜反射面Fに向けて窒素ガスを吐出する
小径穴39とを備えて構成され、吐出した窒素ガスを傾
斜反射面Fで反射させて角型基板1の裏面の角部に供給
するように構成されている。
FIG. 5 shows a modification of the gas nozzle 24,
(A) is a perspective view, (b) is a sectional view [B- of (a) of FIG.
B line sectional view], the first gas supply pipe 26A attached to the nozzle body 25 has an inclined reflection surface F that becomes higher toward the corners, and a small diameter that discharges nitrogen gas toward the inclined reflection surface F. The hole 39 is provided, and the discharged nitrogen gas is reflected by the inclined reflection surface F and supplied to the corner portion of the back surface of the rectangular substrate 1.

【0036】上記実施例では、エアーシリンダ36によ
って中間部材35を連結ボス22に押圧する状態と離間
する状態とに変位し、回転停止時に窒素ガスを供給する
ように構成しているが、本発明としては、前述のような
エアーシリンダ36による変位構成に代えて、連結ボス
22をシール状態で回転可能に外嵌する筒体を設け、そ
の筒体の内周面と連結ボス22の外周面との間で常時接
続されるようにガス流路を形成する、いわゆるロータリ
ージョイント構成を採用しても良い。また、窒素ガスの
供給が角型基板1の回転停止時であることに着目し、ガ
スノズル24を角型基板1の裏面とは離して固定状態で
設けても良い。
In the above-described embodiment, the intermediate member 35 is displaced by the air cylinder 36 into a state in which it is pressed against the connecting boss 22 and a state in which it is separated, and nitrogen gas is supplied when rotation is stopped. In place of the displacement structure by the air cylinder 36 as described above, a cylindrical body is provided which rotatably fits the coupling boss 22 in a sealed state, and the inner peripheral surface of the cylindrical body and the outer peripheral surface of the coupling boss 22 are provided. A so-called rotary joint configuration may be adopted in which the gas flow path is formed so as to be constantly connected between the two. Further, paying attention to the fact that the supply of nitrogen gas is when the rotation of the rectangular substrate 1 is stopped, the gas nozzle 24 may be provided in a fixed state apart from the back surface of the rectangular substrate 1.

【0037】上記実施例では、角型基板1の4箇所の角
部それぞれに向けて窒素ガスを供給するように構成して
いるが、例えば、長方形の角型基板1に対して、その裏
面の長辺の回転方向下手側の角部2箇所にのみ洗浄液を
供給するように構成する場合には、洗浄液を供給する角
部側2箇所にのみ向けて窒素ガスを供給するように構成
すれば良い。
In the above embodiment, the nitrogen gas is supplied to each of the four corners of the rectangular substrate 1. However, for example, the rectangular rectangular substrate 1 is provided on the back surface of the rectangular substrate 1. When the cleaning liquid is supplied only to the two corners on the lower side in the rotation direction of the long side, the nitrogen gas may be supplied only to the two corners supplying the cleaning liquid. .

【0038】上記実施例では、角型基板1の表面にフォ
トレジスト塗布液を供給して回転塗布する回転塗布装置
に基板端縁洗浄装置を組み込んでいるが、本発明として
は、回転塗布装置とは別に専用に構成し、回転塗布装置
で回転塗布によって薄膜が形成された角型基板1を、適
当な搬送手段により汚染の無い状態で搬入し、その角型
基板1の端縁を洗浄するとともに残存付着物をガスで吹
き飛ばすように構成するものでも良い。
In the above-mentioned embodiment, the substrate edge cleaning device is incorporated in the spin coating device for supplying the photoresist coating liquid to the surface of the rectangular substrate 1 to spin-coat it. Separately, a square substrate 1 having a thin film formed by spin coating with a spin coating device is carried in by a suitable transporting means without contamination and the edge of the square substrate 1 is cleaned. It may be configured to blow off the remaining deposits with a gas.

【0039】また、上記実施例では、角型基板1を載置
保持するのに、基板支持ピン5…と基板保持ピン6…と
により、載置保持の際の角型基板1に対する接触面積が
極力少なくなるように構成しているが、本発明として
は、例えば、真空吸着によって角型基板1を保持するよ
うに構成するものでも良い。
Further, in the above embodiment, in order to mount and hold the rectangular substrate 1, the contact area with respect to the rectangular substrate 1 at the time of mounting and holding is set by the substrate supporting pins 5 ... And the substrate holding pins 6. Although the configuration is made as small as possible, the present invention may be configured to hold the rectangular substrate 1 by vacuum suction, for example.

【0040】また、上記実施例では、基板保持手段2
を、角型基板1と一体回転する上部回転板7を備えて構
成し、回転に伴う気流の影響を回避して、角型基板1の
表面に形成されている薄膜の膜厚分布に悪影響を与えず
に洗浄できるように構成しているが、本発明としては、
周囲を開放した状態で洗浄するように構成するものでも
良い。
In the above embodiment, the substrate holding means 2
Is provided with an upper rotary plate 7 that rotates integrally with the rectangular substrate 1 to avoid the influence of the air flow associated with the rotation and adversely affect the film thickness distribution of the thin film formed on the surface of the rectangular substrate 1. The present invention is configured so that it can be washed without giving it.
It may be configured so as to be washed with the surroundings open.

【0041】[0041]

【発明の効果】以上の説明から明らかなように、本発明
の基板端縁洗浄装置によれば、回転状態の角型基板の裏
面に洗浄液を吐出することにより、その洗浄液を、基板
周端面へ回り込ませ、不要な薄膜を洗浄除去し、その
後、角部側に溜まって残存付着した洗浄液をガスノズル
から供給するガスにより吹き飛ばして除去するから、揮
発性の低い洗浄液を使用しても、その洗浄液が角型基板
の裏面側角部に残存することを回避でき、揮発性の高い
洗浄液を使用する場合のように、揮発に伴う気化熱によ
る温度低下や、その揮発蒸気による蒸気圧増大などに起
因して膜厚分布が不安定になるなどといった角型基板に
形成された薄膜への悪影響を回避しながら、洗浄液を残
存させることなく角型基板の周端面の不要薄膜を良好に
洗浄除去できるようになった。
As is apparent from the above description, according to the substrate edge cleaning device of the present invention, the cleaning liquid is discharged to the back surface of the rotating rectangular substrate, so that the cleaning liquid is directed to the peripheral edge surface of the substrate. Wrap it around to clean and remove unnecessary thin films, and then blow off the cleaning liquid remaining on the corners and remaining and adhering by the gas supplied from the gas nozzle.Therefore, even if a cleaning liquid with low volatility is used, the cleaning liquid remains It is possible to avoid remaining on the corners on the back side of the rectangular substrate, and as in the case of using a highly volatile cleaning liquid, it is caused by the temperature decrease due to the heat of vaporization due to volatilization and the increase in vapor pressure due to the volatile vapor. It is possible to satisfactorily clean and remove unnecessary thin films on the peripheral edge surface of the rectangular substrate without leaving the cleaning liquid while avoiding adverse effects on the thin film formed on the rectangular substrate, such as unstable film thickness distribution. They became.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る基板端縁洗浄装置の実施例を示す
一部切欠全体側面図である。
FIG. 1 is a partially cutaway overall side view showing an embodiment of a substrate edge cleaning device according to the present invention.

【図2】要部の拡大側面図である。FIG. 2 is an enlarged side view of a main part.

【図3】要部の平面図である。FIG. 3 is a plan view of a main part.

【図4】(a)はガスノズルの斜視図、(b)は図4の
(a)のA−A線断面図である。
4A is a perspective view of a gas nozzle, and FIG. 4B is a sectional view taken along the line AA of FIG.

【図5】(a)はガスノズルの変形例を示す斜視図、
(b)は図5の(a)のB−B線断面図である。
FIG. 5A is a perspective view showing a modified example of the gas nozzle,
FIG. 6B is a sectional view taken along line BB of FIG.

【符号の説明】[Explanation of symbols]

1…角型基板 2…基板保持手段 3…洗浄液ノズル 24…ガスノズル P…鉛直方向の軸芯 DESCRIPTION OF SYMBOLS 1 ... Rectangular substrate 2 ... Substrate holding means 3 ... Cleaning liquid nozzle 24 ... Gas nozzle P ... Vertical axis

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 回転塗布によって表面に薄膜が形成され
た角型基板を鉛直方向の軸芯周りで回転可能に載置保持
する基板保持手段と、 その基板保持手段によって保持された前記角型基板と一
体回転自在に設けられて、前記角型基板の裏面に洗浄液
を吐出して不要薄膜を洗浄除去する洗浄液ノズルと、 前記角型基板の裏面側で角部にガスを供給して残存付着
物を吹き飛ばすガスノズルと、 を備えた基板端縁洗浄装置。
1. A substrate holding means for mounting and holding a rectangular substrate having a thin film formed on its surface by spin coating so as to be rotatable about an axis in the vertical direction, and the rectangular substrate held by the substrate holding means. A cleaning liquid nozzle that is rotatably integrated with the rectangular substrate to discharge a cleaning liquid to the back surface of the rectangular substrate to clean and remove unnecessary thin films; A substrate edge cleaning device equipped with a gas nozzle that blows away gas.
JP3720192A 1992-01-27 1992-01-27 Device for cleaning end of substrate Pending JPH05200350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3720192A JPH05200350A (en) 1992-01-27 1992-01-27 Device for cleaning end of substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3720192A JPH05200350A (en) 1992-01-27 1992-01-27 Device for cleaning end of substrate

Publications (1)

Publication Number Publication Date
JPH05200350A true JPH05200350A (en) 1993-08-10

Family

ID=12490966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3720192A Pending JPH05200350A (en) 1992-01-27 1992-01-27 Device for cleaning end of substrate

Country Status (1)

Country Link
JP (1) JPH05200350A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5688411A (en) * 1995-03-09 1997-11-18 Tokyo Ohka Kogyo Co., Ltd. Method of and apparatus for removing coating from edge of substrate
US5718763A (en) * 1994-04-04 1998-02-17 Tokyo Electron Limited Resist processing apparatus for a rectangular substrate
US5725663A (en) * 1996-01-31 1998-03-10 Solitec Wafer Processing, Inc. Apparatus for control of contamination in spin systems
US6015467A (en) * 1996-03-08 2000-01-18 Tokyo Ohka Kogyo Co., Ltd. Method of removing coating from edge of substrate
US7615117B2 (en) 2003-03-10 2009-11-10 Tokyo Electron Limited Coating and processing apparatus and method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5718763A (en) * 1994-04-04 1998-02-17 Tokyo Electron Limited Resist processing apparatus for a rectangular substrate
US5853803A (en) * 1994-04-04 1998-12-29 Tokyo Electron Limited Resist processing method and apparatus
US5688411A (en) * 1995-03-09 1997-11-18 Tokyo Ohka Kogyo Co., Ltd. Method of and apparatus for removing coating from edge of substrate
US5725663A (en) * 1996-01-31 1998-03-10 Solitec Wafer Processing, Inc. Apparatus for control of contamination in spin systems
US6015467A (en) * 1996-03-08 2000-01-18 Tokyo Ohka Kogyo Co., Ltd. Method of removing coating from edge of substrate
US7615117B2 (en) 2003-03-10 2009-11-10 Tokyo Electron Limited Coating and processing apparatus and method
US8277884B2 (en) 2003-03-10 2012-10-02 Tokyo Electron Limited Coating and processing apparatus and method

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