JPH0737804A - Cleaning device for substrate edge - Google Patents

Cleaning device for substrate edge

Info

Publication number
JPH0737804A
JPH0737804A JP20282793A JP20282793A JPH0737804A JP H0737804 A JPH0737804 A JP H0737804A JP 20282793 A JP20282793 A JP 20282793A JP 20282793 A JP20282793 A JP 20282793A JP H0737804 A JPH0737804 A JP H0737804A
Authority
JP
Japan
Prior art keywords
substrate
solvent
edge
gas
nozzle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20282793A
Other languages
Japanese (ja)
Inventor
Tadao Okamoto
伊雄 岡本
Yasumasa Shima
泰正 志摩
Yoshio Sakai
由雄 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP20282793A priority Critical patent/JPH0737804A/en
Publication of JPH0737804A publication Critical patent/JPH0737804A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enable the dissolved substance to be blown away from a specific position of a substrate surface and the title substrate edge to be cleaned without disturbing the evenness in the thickness of thin films coated on the substrate surface. CONSTITUTION:A square substrate 1 with a thin film formed thereon is held by a substrate holding means while a solvent is discharged from solvent nozzles 3a, 3b onto the surface and rear surface of the edge of the square substrate 1 to dissolve the needless thin film and gas is blown in spots against the surface of the square substrate 1 from gas nozzles 4a, 4b to blow away the dissolved substance from the edge of the square substrate 1.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、フォトレジスト塗布液
や感光性ポリイミド樹脂やカラーフィルター用の染色剤
といった薄膜が表面に形成された液晶用のガラス基板や
フォトマスク用のガラス基板、半導体ウエハなどの基板
に対し、その薄膜形成後の基板の端縁に溶剤を吐出し
て、基板の端縁に付着した不要薄膜を溶解除去するため
に、表面に薄膜が形成された基板を保持する基板保持手
段と、その基板保持手段によって保持された基板の端縁
の表裏両面の少なくともいずれか一方に溶剤を吐出して
不要薄膜を溶解する溶剤ノズルと、溶剤によって溶解さ
れた溶解物をガスの吹き付けにより基板の端縁よりも外
方に吹き飛ばすガスノズルとを備えた基板端縁洗浄装置
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal glass substrate, a photomask glass substrate, and a semiconductor wafer on which a thin film such as a photoresist coating solution, a photosensitive polyimide resin, or a dye for a color filter is formed. A substrate that holds a substrate with a thin film formed on its surface in order to dissolve and remove the unnecessary thin film adhering to the edge of the substrate by discharging the solvent to the edge of the substrate after the thin film is formed. A holding means, a solvent nozzle that discharges a solvent to at least one of the front and back surfaces of the edge of the substrate held by the substrate holding means to dissolve the unnecessary thin film, and the melted material dissolved by the solvent is sprayed with a gas. The present invention relates to a substrate edge cleaning device provided with a gas nozzle that blows the substrate outward from the edge.

【0002】[0002]

【従来の技術】上述のような基板端縁洗浄装置として
は、従来、特公平3−78777号公報に開示されてい
るものがあった。この従来例によれば、表面に薄膜が形
成された基板の周縁部の上面と下面に対向して第1の管
と第2の管が設けられるとともに、第1および第2の管
の間の間隙部でかつ基板端部の延長上に第3の管が設け
られ、第1および第2の管から基板の周縁部の上面と下
面に溶剤を供給するとともに、それらの溶剤ならびに溶
解除去された不要薄膜を第3の管から吸引排出できるよ
うに構成されている。
2. Description of the Related Art As a substrate edge cleaning device as described above, there is one disclosed in Japanese Patent Publication No. 3-78777. According to this conventional example, the first tube and the second tube are provided so as to face the upper surface and the lower surface of the peripheral portion of the substrate having the thin film formed on the surface thereof, and between the first and second tubes. A third pipe is provided in the gap and on the extension of the substrate end, and the solvent is supplied from the first and second pipes to the upper and lower surfaces of the peripheral portion of the substrate, and the solvent and the solvent are removed. The unnecessary thin film can be sucked and discharged from the third tube.

【0003】ところが、上述従来例の場合、第1および
第2の管の開口端と第3の管の開口端とが近接している
ものの、排気時にその吸引力を十分作用させることがで
きず、また、第3の管内において、気流の乱れを生じ、
第1および第2の管から吐出された溶剤をすぐに排出し
にくく、基板の端縁に近い位置で不測に残り、その残っ
た溶剤が基板の端部に付着してフォトレジストの塗布面
に侵入し、基板に塗布された膜厚の均一性を低下する欠
点があった。
However, in the case of the above-mentioned conventional example, although the open ends of the first and second pipes and the open end of the third pipe are close to each other, the suction force cannot be sufficiently exerted at the time of exhausting. , Also, in the third pipe, turbulence of the air flow is generated,
It is difficult to immediately discharge the solvent discharged from the first and second pipes, and it unexpectedly remains at a position near the edge of the substrate, and the remaining solvent adheres to the edge of the substrate and onto the photoresist coating surface. There is a drawback that it penetrates and reduces the uniformity of the film thickness applied to the substrate.

【0004】このような欠点を解消するため、本願出願
人は、先に、表面に薄膜が形成された基板を保持する基
板保持手段と、その基板保持手段によって保持された基
板の端縁の表裏両面に溶剤を吐出して不要薄膜を溶解す
る溶剤ノズルと、溶剤によって溶解された溶解物をガス
の吹き付けにより基板の端縁よりも外方に吹き飛ばすガ
スノズルとを備え、溶剤ノズルとガスノズルとを一体化
した状態で基板端縁と相対的に移動させ、基板の端縁を
洗浄するように構成した基板端縁洗浄装置を提案した
(特願平3−357131号参照)。
In order to solve such a drawback, the applicant of the present application has previously proposed a substrate holding means for holding a substrate having a thin film formed on its surface, and front and back surfaces of the edges of the substrate held by the substrate holding means. Equipped with a solvent nozzle that discharges the solvent on both sides to dissolve the unnecessary thin film, and a gas nozzle that blows the melted material dissolved by the solvent to the outside of the edge of the substrate by spraying the gas, the solvent nozzle and the gas nozzle are integrated In this state, a substrate edge cleaning device was proposed in which the substrate edge cleaning device is configured to move relative to the substrate edge so as to clean the substrate edge (see Japanese Patent Application No. 3-357131).

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上述提
案の基板端縁洗浄装置では、先端側をナイフ状に絞った
ガスノズルからガスを帯状に吹き出すように構成してお
り、吹き出された空気が基板表面に当たるに伴い、圧力
が低下して大きく拡がってしまい、基板表面の所望の箇
所に所望の圧力でガスを当てにくく、また、ガスの圧力
によって、基板表面に塗布された薄膜の膜厚の均一性を
乱してしまう欠点があった。
However, in the above-mentioned proposed substrate edge cleaning apparatus, the gas is blown out in a strip shape from the gas nozzle whose tip side is narrowed in a knife shape, and the blown out air is the surface of the substrate. As the pressure hits, the pressure drops and spreads widely, making it difficult to apply the gas to the desired location on the substrate surface at the desired pressure, and the uniformity of the film thickness of the thin film applied to the substrate surface due to the gas pressure. There was a drawback that disturbed.

【0006】本発明は、このような事情に鑑みてなされ
たものであって、基板表面の所望の位置において溶解物
を正確に吹き飛ばすことができるとともに、基板表面に
塗布された薄膜の膜厚の均一性を乱すこと無く端縁を洗
浄できる基板端縁洗浄装置を提供することを目的とす
る。
The present invention has been made in view of the above circumstances, and it is possible to accurately blow away a melted material at a desired position on the surface of a substrate and to control the film thickness of a thin film applied to the surface of the substrate. An object of the present invention is to provide a substrate edge cleaning device that can clean the edge without disturbing the uniformity.

【0007】[0007]

【課題を解決するための手段】請求項1に係る発明の基
板端縁洗浄装置は、上述のような目的を達成するため
に、表面に薄膜が形成された基板を保持する基板保持手
段と、その基板保持手段によって保持された基板の端縁
の表裏両面の少なくともいずれか一方に溶剤を吐出して
不要薄膜を溶解する溶剤ノズルと、溶剤によって溶解さ
れた溶解物をガスの吹き付けにより基板の端縁よりも外
方に吹き飛ばすガスノズルとを備えた基板端縁洗浄装置
において、ガスノズルからのガスを基板の表面にスポッ
ト状に吹き付けるように構成する。ガスを基板の表面に
スポット状に吹き付ける構成としては、ガスノズルの先
端の吐出部を針状に構成すれば良い(請求項2)。
In order to achieve the above-mentioned object, a substrate edge cleaning device of the invention according to claim 1 holds a substrate holding means for holding a substrate having a thin film formed on its surface, A solvent nozzle that discharges a solvent onto at least one of the front and back surfaces of the edge of the substrate held by the substrate holding means, and a solvent nozzle that dissolves the unnecessary thin film, and the dissolved material dissolved by the solvent is sprayed with a gas to the edge of the substrate. In a substrate edge cleaning device equipped with a gas nozzle that blows away from the edge, the gas from the gas nozzle is sprayed in a spot shape onto the surface of the substrate. The gas may be sprayed onto the surface of the substrate in a spot shape by forming the discharge portion at the tip of the gas nozzle into a needle shape (claim 2).

【0008】使用する溶剤としては、フォトレジスト塗
布液を溶解する場合には、アセトン、メチルエチルケト
ン、メチルイソブチルケトン、シクロヘキサノン、ジイ
ソブチルケトンなどのケトン類や、酢酸エチル、酢酸ブ
チル、酢酸−n−アミル、蟻酸メチル、プロピオン酸エ
チル、フタル酸ジメチル、安息香酸エチルなどのエステ
ル類や、トルエン、キシレン、ベンゼン、エチルベンゼ
ンなどの芳香族炭化水素類や、四塩化炭素、トリクロル
エチレン、クロロホルム、1,1,1−トリクロルエタ
ン、モノクロルベンゼン、クロルナフタリンなどのハロ
ゲン化炭化水素類や、テトラヒドロブラン、ジエチルエ
ーテル、エチレングリコールモノメチルエーテル、エチ
レングリコールモノエチルエーテルアセテートなどのエ
ーテル類や、ジメチルホルムアミドやジメチルスルホキ
サイドなどを用いることができる。また、染色剤を溶解
する場合には、30〜60℃の温湯や、メタノール、エタノ
ール、プロパノールなどの低級アルコールや、アセトン
などを用いることができ、そして、これらの液体中に基
板との濡れを良くするために界面活性剤を添加しても良
い。
As the solvent to be used, in the case of dissolving the photoresist coating solution, ketones such as acetone, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone and diisobutyl ketone, ethyl acetate, butyl acetate, acetic acid-n-amyl acetate, Esters such as methyl formate, ethyl propionate, dimethyl phthalate, and ethyl benzoate, aromatic hydrocarbons such as toluene, xylene, benzene, and ethylbenzene, carbon tetrachloride, trichloroethylene, chloroform, 1,1,1 -Halogenated hydrocarbons such as trichloroethane, monochlorobenzene, and chloronaphthalene; ethers such as tetrahydrobran, diethyl ether, ethylene glycol monomethyl ether, and ethylene glycol monoethyl ether acetate; Or the like can be used Le formamide or dimethyl sulphoxide. Further, when the dyeing agent is dissolved, warm water of 30 to 60 ° C, lower alcohols such as methanol, ethanol and propanol, acetone, etc. can be used, and the substrate is wet in these liquids. A surfactant may be added to improve the quality.

【0009】[0009]

【作用】請求項1に係る発明の基板端縁洗浄装置の構成
によれば、表面に均一に薄膜を形成した基板を基板保持
手段に保持し、その基板の表裏両面の少なくともいずれ
か一方の端縁に溶剤ノズルから溶剤を吐出して基板の端
縁の薄膜を溶解し、その溶解した不要薄膜ならびに溶剤
を、ガスノズルから角型基板の端縁の所望の箇所にスポ
ット状に吹き付けたガスによって基板の端縁の外方に吹
き飛ばすことができる。
According to the structure of the substrate edge cleaning apparatus of the present invention, the substrate having the thin film uniformly formed on the surface thereof is held by the substrate holding means, and at least one of both ends of the front and back surfaces of the substrate is held. The solvent is discharged from the solvent nozzle to the edge to dissolve the thin film at the edge of the substrate, and the dissolved unnecessary thin film and solvent are sprayed from the gas nozzle to the desired location on the edge of the rectangular substrate in the shape of a spot on the substrate. Can be blown outside the edges of the.

【0010】[0010]

【実施例】次に、本発明の実施例を図面を用いて詳細に
説明する。図1は、本発明の第1実施例に係る基板端縁
洗浄装置の一部切欠全体概略側面図、図2は全体概略平
面図であり、回転塗布によって表面に薄膜が形成された
角型基板1を載置して真空吸着により保持する基板保持
手段2の周囲4箇所それぞれに、角型基板1の表面の端
縁に溶剤を吐出して不要薄膜を溶解する4本の溶剤ノズ
ル3a…と、溶剤および溶解した不要薄膜を角型基板1
の端縁の外方に吹き飛ばす4本のガスノズル4a…と、
角型基板1の裏面の端縁に溶剤を吐出して不要薄膜を溶
解する1本の溶剤ノズル3bと、溶剤および溶解した不
要薄膜を角型基板1の端縁の外方に吹き飛ばす1本のガ
スノズル4b…と、それらの溶剤および溶解した不要薄
膜を吸引する排気管5…とが備えられて、基板端縁洗浄
装置6が構成されている。
Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a schematic side view of the substrate edge cleaning apparatus according to a first embodiment of the present invention, with a part thereof being cut away, and FIG. 2 is a schematic plan view of the whole. Four solvent nozzles 3a ... Dissolving an unnecessary thin film by discharging a solvent to the edge of the surface of the rectangular substrate 1 at four locations around the substrate holding means 2 on which the substrate 1 is placed and held by vacuum suction. , Solvent and dissolved unnecessary thin film square substrate 1
Of the four gas nozzles 4a blown off the edges of the
One solvent nozzle 3b that discharges a solvent to the edge of the back surface of the rectangular substrate 1 to dissolve the unnecessary thin film, and one solvent nozzle 3b that blows the solvent and the dissolved unnecessary thin film to the outside of the edge of the rectangular substrate 1. The gas nozzles 4b and the exhaust pipes 5 for sucking the solvent and the dissolved unnecessary thin film are provided, and the substrate edge cleaning device 6 is configured.

【0011】排気管5に、接続チューブ7とドレンタン
ク8とを介して真空吸引源9が接続されるとともに、図
3の拡大断面図に示すように、排気管5の開口端5aに
近接させて針状の吐出部S1を有する上下の溶剤ノズル
3a…,3bが取り付けられている。
A vacuum suction source 9 is connected to the exhaust pipe 5 via a connecting tube 7 and a drain tank 8 and, as shown in the enlarged sectional view of FIG. Upper and lower solvent nozzles 3a, ..., 3b each having a needle-shaped ejection portion S1 are attached.

【0012】また、溶剤ノズル3a…,3bそれぞれに
近接したそれよりも角型基板1の中心側に針状の吐出部
S2を有する上側のガスノズル4a…とピストル状のガ
スノズル4bとが取り付けられ、図4の平面図に示すよ
うに、角型基板1の表面側でその端縁に溶剤ノズル3a
…からスポット状に溶剤を供給するとともに、ガスノズ
ル4a…からもスポット状にガスを供給し、溶剤ならび
に溶剤によって溶解された溶解物をガスによって角型基
板1の端縁の外方に吹き飛ばすように構成されている。
Further, upper gas nozzles 4a having a needle-shaped discharge portion S2 and a pistol-shaped gas nozzle 4b are attached to the center of the rectangular substrate 1 closer to the solvent nozzles 3a, 3b, respectively. As shown in the plan view of FIG. 4, the solvent nozzle 3a is provided on the edge of the rectangular substrate 1 on the front surface side.
While supplying the solvent in a spot shape from the gas nozzle 4a, the solvent and the melted material dissolved by the solvent are blown off to the outside of the edge of the rectangular substrate 1 by the gas. It is configured.

【0013】前記ガスノズル4a…の針状の吐出部S2
の開口面積は、溶剤ノズル3a…の針状の吐出部S1の
開口面積の約2倍程度であり、そして、溶剤ノズル3a
…とガスノズル4a…とが角型基板1の端縁に直交する
方向の同一直線上に位置するように並設されている。
The needle-shaped discharge portion S2 of the gas nozzles 4a.
Is about twice as large as the opening area of the needle-shaped ejection portion S1 of the solvent nozzle 3a ... And the solvent nozzle 3a.
And the gas nozzles 4a are arranged side by side so as to be located on the same straight line in the direction orthogonal to the edge of the rectangular substrate 1.

【0014】前記溶剤ノズル3a…,3b、ガスノズル
4a…,4bおよび排気管5がノズルブロック10に一
体的に取り付けられ、そのノズルブロック10を取り付
けた支持アーム11が、固定フレーム12に付設した上
下一対のガイド13,13を介して、角型基板1の端縁
に沿って移動可能に設けられている。
, 3b, the gas nozzles 4a, ..., 4b and the exhaust pipe 5 are integrally attached to a nozzle block 10, and a support arm 11 to which the nozzle block 10 is attached is attached to a fixed frame 12 and is attached to the upper and lower sides. It is movably provided along the edge of the rectangular substrate 1 via a pair of guides 13, 13.

【0015】基板保持手段2に保持された角型基板1の
ひとつの角部に対応する箇所に、正逆転可能な駆動機構
としての電動モータ14を設けたモータブラケット15
が立設されるとともに、電動モータ14の駆動軸に駆動
プーリー16が連動連結されている。
A motor bracket 15 provided with an electric motor 14 as a drive mechanism capable of forward and reverse rotations at a position corresponding to one corner of the rectangular substrate 1 held by the substrate holding means 2.
Is erected, and a drive pulley 16 is linked to the drive shaft of the electric motor 14.

【0016】基板保持手段2に保持された角型基板1の
ひとつの角部に対応する箇所に1個の遊転プーリー17
が、そして、他の3箇所の角部に対応する箇所に2個づ
つの遊転プーリー17,17がそれぞれ設けられ、駆動
プーリー16と遊転プーリー17…とにわたって一対の
ワイヤー18,18が巻回され、そのワイヤー18,1
8の所定の四箇所それぞれに支持アーム11が連結さ
れ、電動モータ14の正逆転により、四個のノズルブロ
ック10…それぞれを角型基板1の各辺に沿わせて往復
移動し、角型基板1の端縁を洗浄できるように構成され
ている。
One idler pulley 17 is provided at a position corresponding to one corner of the rectangular substrate 1 held by the substrate holding means 2.
However, two idling pulleys 17, 17 are provided at the positions corresponding to the other three corners, and a pair of wires 18, 18 are wound around the drive pulley 16 and the idling pulley 17 ... Turned, that wire 18,1
8, a support arm 11 is connected to each of four predetermined positions, and the electric motor 14 rotates forward and backward to reciprocally move each of the four nozzle blocks 10 along each side of the rectangular substrate 1. It is configured so that one edge can be washed.

【0017】以上の構成により、角型基板1の端縁を洗
浄するときには、先ず、ガスノズル4a…,4bからの
ガスの吐出と排気管5からの排気とを開始してからノズ
ルブロック10…の移動を開始し、ノズルブロック10
が角型基板1の端部にきたことをセンサ(図示せず)で
検出するに伴って溶剤ノズル3a…,3bから溶剤を供
給する。しかる後、ノズルブロック10を設定回数往復
移動させて、溶剤およびガスの供給により角型基板1の
端縁に対する洗浄を行い、その洗浄処理が終了して、ノ
ズルブロック10が角型基板1の端部から外れたことを
センサ(図示せず)で検出するに伴って溶剤ノズル3a
…,3bからの溶剤の供給を停止し、そして、ノズルブ
ロック10が原点位置に復帰したときにガスノズル4a
…,4bからのガスの吐出と排気管5からの排気とを停
止し、角型基板1の四辺の端縁に対する洗浄処理を一挙
に行うことができるようになっている。
With the above configuration, when cleaning the edge of the rectangular substrate 1, first, the discharge of gas from the gas nozzles 4a, 4b and the exhaust from the exhaust pipe 5 are started, and then the nozzle block 10 ... Start moving, nozzle block 10
The solvent is supplied from the solvent nozzles 3a, ..., 3b when a sensor (not shown) detects that the liquid has come to the end of the rectangular substrate 1. After that, the nozzle block 10 is moved back and forth a set number of times to clean the edge of the rectangular substrate 1 by supplying the solvent and gas, and the cleaning process is completed, and the nozzle block 10 is moved to the edge of the rectangular substrate 1. When the sensor (not shown) detects that the solvent nozzle 3a comes off, the solvent nozzle 3a
The gas nozzle 4a is stopped when the supply of the solvent from 3b is stopped and the nozzle block 10 is returned to the origin position.
.., 4b, and the exhaust from the exhaust pipe 5 are stopped, so that the cleaning processing can be performed at once on the four edges of the rectangular substrate 1.

【0018】図5の(a)は、本発明に係る基板端縁洗
浄装置の第2実施例を示す要部の側面図であり、第1実
施例と異なるところは次の通りである。すなわち、排気
管5の開口端5aに近い所定長さの部分が、角型基板1
の面に平行で、かつ、基板面に直交する方向での長さが
等しくなるように構成されている。他の構成は第1実施
例と同じであり、同一図番を付すことにより、その説明
は省略する。
FIG. 5A is a side view of the essential portions of a second embodiment of the substrate edge cleaning device according to the present invention. The difference from the first embodiment is as follows. That is, the portion of the predetermined length near the opening end 5a of the exhaust pipe 5 is the rectangular substrate 1
Is parallel to the surface of the substrate and has the same length in the direction orthogonal to the surface of the substrate. The other structure is the same as that of the first embodiment, and the description thereof is omitted by giving the same drawing numbers.

【0019】図5の(b)は、本発明に係る基板端縁洗
浄装置の第3実施例を示す要部の側面図であり、第2実
施例と異なるところは次の通りである。排気管5の開口
端5aに近い箇所に、角型基板1の表面側にのみ溶剤を
吐出する溶剤ノズル3a…が差し込まれ、角型基板1の
表面の端縁に溶剤を吐出して洗浄処理できるように構成
されている。他の構成は第2実施例と同じであり、同一
図番を付すことにより、その説明は省略する。
FIG. 5 (b) is a side view of the essential portions showing a third embodiment of the substrate edge cleaning apparatus according to the present invention. The difference from the second embodiment is as follows. A solvent nozzle 3a for ejecting a solvent only on the front surface side of the rectangular substrate 1 is inserted at a position near the opening end 5a of the exhaust pipe 5, and the solvent is ejected to the edge of the surface of the rectangular substrate 1 for cleaning processing. It is configured to be able to. The other structure is the same as that of the second embodiment, and the description thereof will be omitted by giving the same drawing numbers.

【0020】図5の(c)は、本発明に係る基板端縁洗
浄装置の第4実施例を示す要部の側面図であり、第3実
施例と異なるところは次の通りである。排気管5の開口
端5aに近い箇所に、溶剤ノズル3a…よりも開口端側
に位置させてガスノズル4a…が設けられている。他の
構成は第3実施例と同じであり、同一図番を付すことに
より、その説明は省略する。
FIG. 5 (c) is a side view of the essential portions showing a fourth embodiment of the substrate edge cleaning apparatus according to the present invention. The difference from the third embodiment is as follows. Gas nozzles 4a are provided near the opening end 5a of the exhaust pipe 5 so as to be located closer to the opening end than the solvent nozzles 3a. The other structure is the same as that of the third embodiment, and the description thereof will be omitted by giving the same drawing numbers.

【0021】図6の(a)は、本発明に係る基板端縁洗
浄装置の第5実施例を示す要部の平面図であり、第1実
施例と異なるところは次の通りである。角型基板1の表
面に溶剤を供給する溶剤ノズル3a…が四本であるのに
対して、ガスを供給するガスノズル4a…が倍の八本設
けられている。また、ガスノズル4a…の針状の吐出部
S2の開口面積が、溶剤ノズル3a…の針状の吐出部S
1の開口面積と等しい小径に構成されている。他の構成
は第1実施例と同じであり、同一図番を付すことによ
り、その説明は省略する。
FIG. 6A is a plan view of an essential part showing a fifth embodiment of the substrate edge cleaning device according to the present invention. The difference from the first embodiment is as follows. The number of solvent nozzles 3a for supplying a solvent to the surface of the rectangular substrate 1 is four, whereas the number of gas nozzles 4a for supplying a gas is eight. Further, the opening area of the needle-shaped ejection portion S2 of the gas nozzles 4a ...
It has a small diameter equal to the opening area of 1. The other structure is the same as that of the first embodiment, and the description thereof is omitted by giving the same drawing numbers.

【0022】図6の(b)は、本発明に係る基板端縁洗
浄装置の第6実施例を示す要部の平面図であり、第1実
施例と異なるところは次の通りである。角型基板1の表
面に溶剤を供給する溶剤ノズル3a…が四本であるのに
対して、ガスを供給するガスノズル4a…が五本設けら
れ、そして、隣合うガスノズル4a,4a…間それぞれ
に対応する位置に溶剤ノズル3a…が設けられている。
また、ガスノズル4a…の針状の吐出部S2の開口面積
が、溶剤ノズル3a…の針状の吐出部S1の開口面積と
等しい小径に構成されている。他の構成は第1実施例と
同じであり、同一図番を付すことにより、その説明は省
略する。
FIG. 6B is a plan view of the essential portions showing a sixth embodiment of the substrate edge cleaning device according to the present invention. The difference from the first embodiment is as follows. There are four solvent nozzles 3a for supplying a solvent to the surface of the rectangular substrate 1, whereas five gas nozzles 4a for supplying a gas are provided, and the gas nozzles 4a, 4a, ... Are adjacent to each other. Solvent nozzles 3a ... Are provided at corresponding positions.
Further, the opening area of the needle-shaped ejection portion S2 of the gas nozzles 4a is configured to have a small diameter equal to the opening area of the needle-shaped ejection portion S1 of the solvent nozzles 3a. The other structure is the same as that of the first embodiment, and the description thereof is omitted by giving the same drawing numbers.

【0023】図7は、本発明に係る基板端縁洗浄装置の
第7実施例を示す要部の側面図、図8は、図7のA−A
線矢視図、図9は要部の拡大図であり、第1実施例と異
なるところは次の通りである。ケーシング本体19内に
溶剤パイプ20とガスパイプ21とが水平姿勢で取り付
けられている。溶剤パイプ20には、角型基板1の表面
に溶剤を供給する8本の溶剤ノズル3a…と溶剤供給管
22とが接続され、一方、ガスパイプ21には、角型基
板1の表面にガスを供給する8本のガスノズル4a…と
ガス供給管23とが接続されている。
FIG. 7 is a side view of an essential part showing a seventh embodiment of the substrate edge cleaning device according to the present invention, and FIG. 8 is a line A--A of FIG.
9 is an enlarged view of the main part, and is different from the first embodiment in the following points. A solvent pipe 20 and a gas pipe 21 are mounted in a horizontal position inside the casing body 19. The solvent pipe 20 is connected to eight solvent nozzles 3a for supplying a solvent to the surface of the rectangular substrate 1 and a solvent supply pipe 22, while the gas pipe 21 supplies gas to the surface of the rectangular substrate 1. The eight gas nozzles 4a for supplying and the gas supply pipe 23 are connected.

【0024】ノズルブロック10に取り付けられた排気
管5に前記ケーシング本体19が着脱可能に取り付けら
れるとともに、排気管5に、角型基板1の裏面に溶剤を
供給する8本の溶剤ノズル3b…が取り付けられてい
る。
The casing body 19 is detachably attached to the exhaust pipe 5 attached to the nozzle block 10, and eight solvent nozzles 3b for supplying a solvent to the back surface of the rectangular substrate 1 are attached to the exhaust pipe 5. It is installed.

【0025】また、ノズルブロック10に中継ブロック
24が取り付けられ、その中継ブロック24と、溶剤供
給管22、ガス供給管23、排気管5に接続された吸気
管25、および、裏面側の溶剤ノズル3b…に対する溶
剤供給管26それぞれとがチューブ27を介して接続さ
れている。他の構成は第1実施例と同じであり、同一図
番を付すことにより、その説明は省略する。
Further, the relay block 24 is attached to the nozzle block 10, and the relay block 24, the solvent supply pipe 22, the gas supply pipe 23, the intake pipe 25 connected to the exhaust pipe 5, and the solvent nozzle on the back surface side. Each of the solvent supply pipes 26 for 3b ... Is connected via a tube 27. The other structure is the same as that of the first embodiment, and the description thereof is omitted by giving the same drawing numbers.

【0026】この第7実施例の構成によれば、溶剤ノズ
ル3a…とガスノズル4a…とがケーシング本体19に
一体的に取り付けられているため、それぞれを個別に取
り付ける場合に比べ、溶剤の吐出位置とガスの吐出位置
との相対的な位置精度を高くできる利点を有している。
According to the structure of the seventh embodiment, since the solvent nozzles 3a ... And the gas nozzles 4a ... Are integrally attached to the casing body 19, the solvent discharge position is different from the case where they are individually attached. This has the advantage that the relative positional accuracy between the gas discharge position and the gas discharge position can be increased.

【0027】上述実施例では、基板端縁洗浄装置をフォ
トレジスト塗布液などによる薄膜形成のための回転塗布
装置とは別に専用に構成し、スループットを向上できる
ように構成しているが、本発明としては、回転塗布装置
内に組み込み、回転塗布装置の基板保持手段を基板端縁
洗浄装置の基板保持手段2に兼用構成するものでも良
い。
In the above-described embodiment, the substrate edge cleaning device is configured separately from the spin coating device for forming a thin film using a photoresist coating liquid or the like so that the throughput can be improved. For example, it may be incorporated in the spin coater so that the substrate holding means of the spin coater is also used as the substrate holding means 2 of the substrate edge cleaning device.

【0028】また、上記実施例では、基板保持手段2に
保持された角型基板1の四辺それぞれに対応して溶剤ノ
ズル3a…,3bとガスノズル4a…,4bと排気管5
とを設けているが、本発明としては、一辺あるいは二辺
にのみ対応させて設け、角型基板1を保持して回転させ
る構成と組合わせ、角型基板1を90°あるいは 180°づ
つ回転させながらその端縁の洗浄を行うように構成する
ものでも良い。
In the above embodiment, the solvent nozzles 3a ... 3b, the gas nozzles 4a ... 4b, and the exhaust pipe 5 are provided corresponding to the four sides of the rectangular substrate 1 held by the substrate holding means 2.
However, according to the present invention, the rectangular substrate 1 is rotated by 90 ° or 180 ° in combination with the configuration in which it is provided so as to correspond to only one side or two sides, and the rectangular substrate 1 is held and rotated. It may be configured such that the edge thereof is cleaned while performing the cleaning.

【0029】また、上記実施例では、溶剤ノズル3a
…,3bとガスノズル4a…,4bとを角型基板1の表
裏両面の端縁に対して洗浄するように設けているが、本
発明としては、表裏両面のいずれか一方の端縁に対して
洗浄するように設けるように構成するものでも良い。ま
た、裏面側のガスノズル4bの吐出部を針状に構成して
も良い。
In the above embodiment, the solvent nozzle 3a is used.
, 3b and gas nozzles 4a, 4b are provided so as to clean the edges of the front and back surfaces of the rectangular substrate 1. However, according to the present invention, one of the edges of the front and back surfaces is cleaned. It may be configured to be provided for cleaning. Further, the discharge portion of the gas nozzle 4b on the back surface side may be formed in a needle shape.

【0030】また、本発明は角型基板1に限らず、円形
の基板を洗浄処理する基板端縁洗浄装置にも適用でき
る。
The present invention is not limited to the rectangular substrate 1, but can be applied to a substrate edge cleaning device for cleaning a circular substrate.

【0031】[0031]

【発明の効果】以上の説明から明らかなように、請求項
1に係る発明の基板端縁洗浄装置によれば、溶剤ノズル
から吐出された溶剤によって溶解した不要薄膜ならびに
溶剤を基板の端縁の外方に吹き飛ばすのに、ガスノズル
からガスを基板表面にスポット状に吹き付けるから、基
板表面の所望の位置に十分な圧力でガスを吹き付けるこ
とができ、基板表面に当たるに伴っての圧力低下が少な
く、基板表面でのガスの拡がりを少なくでき、基板表面
の所望の位置において溶解物を正確に吹き飛ばすことが
できるとともに、基板表面に塗布された薄膜の膜厚の均
一性を乱すこと無く基板端縁を洗浄できるようになっ
た。
As is apparent from the above description, according to the substrate edge cleaning device of the first aspect of the present invention, the unnecessary thin film dissolved by the solvent discharged from the solvent nozzle and the solvent are removed from the edge of the substrate. To blow it outward, since the gas is sprayed from the gas nozzle to the substrate surface in a spot shape, it is possible to spray the gas at a desired position on the substrate surface with sufficient pressure, and the pressure drop with hitting the substrate surface is small, The spread of gas on the substrate surface can be reduced, the melt can be accurately blown off at the desired position on the substrate surface, and the edge of the substrate can be removed without disturbing the uniformity of the film thickness of the thin film applied to the substrate surface. You can now wash.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例に係る基板端縁洗浄装置の
一部切欠全体概略側面図である。
FIG. 1 is a schematic side view of the substrate edge cleaning device according to a first embodiment of the present invention, in which some parts are cut away.

【図2】全体概略平面図である。FIG. 2 is an overall schematic plan view.

【図3】要部の拡大側面図である。FIG. 3 is an enlarged side view of a main part.

【図4】要部の平面図である。FIG. 4 is a plan view of a main part.

【図5】(a)は、本発明の第2実施例に係る基板端縁
洗浄装置の要部の側面図、(b)は、本発明の第3実施
例に係る基板端縁洗浄装置の要部の側面図、(c)は、
本発明の第4実施例に係る基板端縁洗浄装置の要部の側
面図である。
5A is a side view of a main part of a substrate edge cleaning apparatus according to a second embodiment of the present invention, and FIG. 5B is a side view of a substrate edge cleaning apparatus according to a third embodiment of the present invention. A side view of the main part, (c) is
It is a side view of the principal part of a substrate edge cleaning device according to a fourth embodiment of the present invention.

【図6】(a)は、本発明の第5実施例に係る基板端縁
洗浄装置の要部の平面図、(b)は、本発明の第6実施
例に係る基板端縁洗浄装置の要部の平面図である。
FIG. 6A is a plan view of a main part of a substrate edge cleaning apparatus according to a fifth embodiment of the present invention, and FIG. 6B is a plan view of a substrate edge cleaning apparatus according to a sixth embodiment of the present invention. FIG.

【図7】本発明に係る基板端縁洗浄装置の第7実施例を
示す要部の側面図である。
FIG. 7 is a side view of essential parts showing a seventh embodiment of the substrate edge cleaning device according to the present invention.

【図8】図7のA−A線矢視図である。8 is a view taken along the line AA of FIG.

【図9】要部の拡大図である。FIG. 9 is an enlarged view of a main part.

【符号の説明】[Explanation of symbols]

1…角型基板 2…基板保持手段 3a、3b…溶剤ノズル 4a、4b…排気管 S2…ガスノズルの吐出部 DESCRIPTION OF SYMBOLS 1 ... Square substrate 2 ... Substrate holding means 3a, 3b ... Solvent nozzle 4a, 4b ... Exhaust pipe S2 ... Gas nozzle discharge part

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 表面に薄膜が形成された基板を保持する
基板保持手段と、その基板保持手段によって保持された
前記基板の端縁の表裏両面の少なくともいずれか一方に
溶剤を吐出して不要薄膜を溶解する溶剤ノズルと、溶剤
によって溶解された溶解物をガスの吹き付けにより前記
基板の端縁よりも外方に吹き飛ばすガスノズルとを備え
た基板端縁洗浄装置において、 前記ガスノズルからのガスを前記基板の表面にスポット
状に吹き付けるように構成したことを特徴とする基板端
縁洗浄装置。
1. An unnecessary thin film by discharging a solvent onto at least one of a substrate holding means for holding a substrate having a thin film formed on its surface and both front and back surfaces of an edge of the substrate held by the substrate holding means. In a substrate edge cleaning device comprising a solvent nozzle that dissolves a solvent, and a gas nozzle that blows a melted material dissolved by a solvent outward from the edge of the substrate by blowing gas, wherein the gas from the gas nozzle is used as the substrate. A substrate edge cleaning device, which is configured to be sprayed on the surface of the substrate in a spot shape.
【請求項2】 請求項1に記載のガスノズルの先端の吐
出部を針状に構成してある基板端縁洗浄装置。
2. A substrate edge cleaning device in which the discharge portion at the tip of the gas nozzle according to claim 1 is formed in a needle shape.
JP20282793A 1993-07-22 1993-07-22 Cleaning device for substrate edge Pending JPH0737804A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20282793A JPH0737804A (en) 1993-07-22 1993-07-22 Cleaning device for substrate edge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20282793A JPH0737804A (en) 1993-07-22 1993-07-22 Cleaning device for substrate edge

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2001111163A Division JP3643783B2 (en) 2001-04-10 2001-04-10 Substrate edge cleaning apparatus and substrate edge cleaning method

Publications (1)

Publication Number Publication Date
JPH0737804A true JPH0737804A (en) 1995-02-07

Family

ID=16463852

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20282793A Pending JPH0737804A (en) 1993-07-22 1993-07-22 Cleaning device for substrate edge

Country Status (1)

Country Link
JP (1) JPH0737804A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11150176A (en) * 1997-11-18 1999-06-02 Tokyo Electron Ltd Method and equipment for substrate holding, and substrate processing method
KR100447012B1 (en) * 1997-01-24 2004-11-06 동경 엘렉트론 주식회사 Coating film removal method and coating film removal device around the substrate
JP2009125643A (en) * 2007-11-21 2009-06-11 Dainippon Screen Mfg Co Ltd Substrate treatment apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100447012B1 (en) * 1997-01-24 2004-11-06 동경 엘렉트론 주식회사 Coating film removal method and coating film removal device around the substrate
JPH11150176A (en) * 1997-11-18 1999-06-02 Tokyo Electron Ltd Method and equipment for substrate holding, and substrate processing method
JP2009125643A (en) * 2007-11-21 2009-06-11 Dainippon Screen Mfg Co Ltd Substrate treatment apparatus

Similar Documents

Publication Publication Date Title
KR100284559B1 (en) Treatment method and processing device
JP3694641B2 (en) Substrate processing apparatus, development processing apparatus, and development processing method
JPH10163104A (en) Developing apparatus for manufacturing semiconductor device and manufacturing method therefor
KR100283442B1 (en) Developing apparatus and developing method
JPH06208948A (en) Substrate edge cleaning device
TW201503227A (en) Substrate liquid processing apparatus, and substrate liquid processing method
JPH1057877A (en) Substrate treating device and substrate treating method
JPH0737804A (en) Cleaning device for substrate edge
JP3580664B2 (en) Developing device and developing method
JPH06196401A (en) Cleaning apparatus for edge of substrate
JP3643783B2 (en) Substrate edge cleaning apparatus and substrate edge cleaning method
JP3452711B2 (en) Substrate edge processing equipment
JP3114084B2 (en) Processing method and processing apparatus
JPH06310422A (en) Apparatus for cleaning end edge of board
JP2659306B2 (en) Substrate edge cleaning device
JP2708337B2 (en) Substrate edge cleaning device
JP3483367B2 (en) Substrate edge processing apparatus and substrate edge processing method
JP4011040B2 (en) Developing apparatus and developing method
JP3851370B2 (en) Substrate drainer
JP3402883B2 (en) Substrate edge processing equipment
JP3654763B2 (en) Substrate processing equipment
JP2562706Y2 (en) Substrate edge cleaning device
JP3462643B2 (en) Substrate edge processing equipment
JPH06333819A (en) Substrate end edge cleaning device
JPH05185012A (en) Substrate edge cleaning device