JPH0513006Y2 - - Google Patents
Info
- Publication number
- JPH0513006Y2 JPH0513006Y2 JP1986177868U JP17786886U JPH0513006Y2 JP H0513006 Y2 JPH0513006 Y2 JP H0513006Y2 JP 1986177868 U JP1986177868 U JP 1986177868U JP 17786886 U JP17786886 U JP 17786886U JP H0513006 Y2 JPH0513006 Y2 JP H0513006Y2
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- plasma
- lower electrode
- wafer
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Drying Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986177868U JPH0513006Y2 (enrdf_load_stackoverflow) | 1986-11-19 | 1986-11-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986177868U JPH0513006Y2 (enrdf_load_stackoverflow) | 1986-11-19 | 1986-11-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63164219U JPS63164219U (enrdf_load_stackoverflow) | 1988-10-26 |
JPH0513006Y2 true JPH0513006Y2 (enrdf_load_stackoverflow) | 1993-04-06 |
Family
ID=31119471
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986177868U Expired - Lifetime JPH0513006Y2 (enrdf_load_stackoverflow) | 1986-11-19 | 1986-11-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0513006Y2 (enrdf_load_stackoverflow) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5681678A (en) * | 1979-12-05 | 1981-07-03 | Toshiba Corp | Method and apparatus for plasma etching |
JPS6045024A (ja) * | 1983-08-23 | 1985-03-11 | Toshiba Corp | ドライエツチング装置 |
-
1986
- 1986-11-19 JP JP1986177868U patent/JPH0513006Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS63164219U (enrdf_load_stackoverflow) | 1988-10-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2011049566A (ja) | センサ基板及び基板処理装置 | |
JP2006303077A (ja) | 半導体チップの製造方法 | |
JPH0571668B2 (enrdf_load_stackoverflow) | ||
JP2003229408A (ja) | プラズマ処理装置 | |
TWI570803B (zh) | A deep silicon etch method | |
JPS6210687B2 (enrdf_load_stackoverflow) | ||
JP2002009043A (ja) | エッチング装置及びそれを用いた半導体装置の製造方法 | |
JPH0513006Y2 (enrdf_load_stackoverflow) | ||
JPH07335570A (ja) | プラズマ処理における基板温度制御方法 | |
JP3166745B2 (ja) | プラズマ処理装置ならびにプラズマ処理方法 | |
JP3362093B2 (ja) | エッチングダメージの除去方法 | |
JP3002496B2 (ja) | 半導体ウェハのドライエッチング方法 | |
JP3118497B2 (ja) | プラズマ処理装置及びプラズマ処理方法 | |
JPS63260033A (ja) | プラズマ反応処理装置 | |
KR100572131B1 (ko) | 실리콘 웨이퍼의 가장자리, 측면, 하부면을 동시에식각하기 위한 플라즈마 식각장치 | |
JPS61190944A (ja) | ドライエツチング装置 | |
TWI620247B (zh) | 蝕刻形成矽通孔的方法與矽通孔刻蝕裝置 | |
JP3084834B2 (ja) | 半導体デバイスの製造方法 | |
JPH06302555A (ja) | プラズマエッチング装置 | |
JPH0241167B2 (enrdf_load_stackoverflow) | ||
JPS5871626A (ja) | プラズマエツチング装置 | |
JP2000299306A (ja) | 誘導結合型プラズマエッチング装置 | |
JPH0787192B2 (ja) | プラズマ反応処理装置 | |
JPS6348827A (ja) | 反応性イオンエツチング方法 | |
JPH069490Y2 (ja) | 半導体ウエハのプラズマアツシング装置 |