JPH0511573B2 - - Google Patents

Info

Publication number
JPH0511573B2
JPH0511573B2 JP60018151A JP1815185A JPH0511573B2 JP H0511573 B2 JPH0511573 B2 JP H0511573B2 JP 60018151 A JP60018151 A JP 60018151A JP 1815185 A JP1815185 A JP 1815185A JP H0511573 B2 JPH0511573 B2 JP H0511573B2
Authority
JP
Japan
Prior art keywords
transparent
plate
line array
imaging device
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60018151A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61176838A (ja
Inventor
Masami Okino
Yasuhiro Osada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanebo Ltd
Original Assignee
Kanebo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanebo Ltd filed Critical Kanebo Ltd
Priority to JP1815185A priority Critical patent/JPS61176838A/ja
Publication of JPS61176838A publication Critical patent/JPS61176838A/ja
Publication of JPH0511573B2 publication Critical patent/JPH0511573B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1815185A 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査方法 Granted JPS61176838A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1815185A JPS61176838A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1815185A JPS61176838A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査方法

Publications (2)

Publication Number Publication Date
JPS61176838A JPS61176838A (ja) 1986-08-08
JPH0511573B2 true JPH0511573B2 (zh) 1993-02-15

Family

ID=11963609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1815185A Granted JPS61176838A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査方法

Country Status (1)

Country Link
JP (1) JPS61176838A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000018922A (ja) * 1998-07-02 2000-01-21 Toshiba Eng Co Ltd 厚み欠陥検査装置及びその検査方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0750038B2 (ja) * 1990-10-04 1995-05-31 三井東圧化学株式会社 プラスチックフィルムのシースルー特性の測定方法
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3806557B2 (ja) * 1999-10-25 2006-08-09 トタニ技研工業株式会社 プラスチックフィルムのヒートシール位置検出装置
JP4650096B2 (ja) * 2005-05-20 2011-03-16 凸版印刷株式会社 塗布ムラ検査方法及びそのプログラム
WO2010117004A1 (ja) * 2009-04-09 2010-10-14 旭硝子株式会社 光透過性板状物のリーム検出方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102653A (zh) * 1972-04-10 1973-12-24

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102653A (zh) * 1972-04-10 1973-12-24

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000018922A (ja) * 1998-07-02 2000-01-21 Toshiba Eng Co Ltd 厚み欠陥検査装置及びその検査方法

Also Published As

Publication number Publication date
JPS61176838A (ja) 1986-08-08

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