JPS48102653A - - Google Patents
Info
- Publication number
- JPS48102653A JPS48102653A JP3518472A JP3518472A JPS48102653A JP S48102653 A JPS48102653 A JP S48102653A JP 3518472 A JP3518472 A JP 3518472A JP 3518472 A JP3518472 A JP 3518472A JP S48102653 A JPS48102653 A JP S48102653A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3518472A JPS48102653A (zh) | 1972-04-10 | 1972-04-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3518472A JPS48102653A (zh) | 1972-04-10 | 1972-04-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS48102653A true JPS48102653A (zh) | 1973-12-24 |
Family
ID=12434746
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3518472A Pending JPS48102653A (zh) | 1972-04-10 | 1972-04-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS48102653A (zh) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61176839A (ja) * | 1985-01-31 | 1986-08-08 | Kanebo Ltd | 透明または半透明の板状体の欠点検査装置 |
| JPS61176838A (ja) * | 1985-01-31 | 1986-08-08 | Kanebo Ltd | 透明または半透明の板状体の欠点検査方法 |
| JPS61181948A (ja) * | 1985-02-06 | 1986-08-14 | Kanebo Ltd | 透明または半透明の板状体の欠点検査方法 |
| JP2009168507A (ja) * | 2008-01-11 | 2009-07-30 | Nsk Ltd | 透明基板のエッジ位置検出方法及びエッジ位置検出装置 |
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1972
- 1972-04-10 JP JP3518472A patent/JPS48102653A/ja active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61176839A (ja) * | 1985-01-31 | 1986-08-08 | Kanebo Ltd | 透明または半透明の板状体の欠点検査装置 |
| JPS61176838A (ja) * | 1985-01-31 | 1986-08-08 | Kanebo Ltd | 透明または半透明の板状体の欠点検査方法 |
| JPH0511573B2 (zh) * | 1985-01-31 | 1993-02-15 | Kanebo Ltd | |
| JPH0511574B2 (zh) * | 1985-01-31 | 1993-02-15 | Kanebo Ltd | |
| JPS61181948A (ja) * | 1985-02-06 | 1986-08-14 | Kanebo Ltd | 透明または半透明の板状体の欠点検査方法 |
| JP2009168507A (ja) * | 2008-01-11 | 2009-07-30 | Nsk Ltd | 透明基板のエッジ位置検出方法及びエッジ位置検出装置 |