JPH049466B2 - - Google Patents

Info

Publication number
JPH049466B2
JPH049466B2 JP5707685A JP5707685A JPH049466B2 JP H049466 B2 JPH049466 B2 JP H049466B2 JP 5707685 A JP5707685 A JP 5707685A JP 5707685 A JP5707685 A JP 5707685A JP H049466 B2 JPH049466 B2 JP H049466B2
Authority
JP
Japan
Prior art keywords
light source
circumferential
image data
flaw detection
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5707685A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61213752A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5707685A priority Critical patent/JPS61213752A/ja
Publication of JPS61213752A publication Critical patent/JPS61213752A/ja
Publication of JPH049466B2 publication Critical patent/JPH049466B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Input (AREA)
  • Closed-Circuit Television Systems (AREA)
JP5707685A 1985-03-20 1985-03-20 鏡面反射特性を有する回転面物体のキズ検出装置 Granted JPS61213752A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5707685A JPS61213752A (ja) 1985-03-20 1985-03-20 鏡面反射特性を有する回転面物体のキズ検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5707685A JPS61213752A (ja) 1985-03-20 1985-03-20 鏡面反射特性を有する回転面物体のキズ検出装置

Publications (2)

Publication Number Publication Date
JPS61213752A JPS61213752A (ja) 1986-09-22
JPH049466B2 true JPH049466B2 (enrdf_load_html_response) 1992-02-20

Family

ID=13045369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5707685A Granted JPS61213752A (ja) 1985-03-20 1985-03-20 鏡面反射特性を有する回転面物体のキズ検出装置

Country Status (1)

Country Link
JP (1) JPS61213752A (enrdf_load_html_response)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63153414A (ja) * 1986-12-17 1988-06-25 Haishisutemu Control Kk 空缶の検査装置
JPS6459145A (en) * 1987-08-31 1989-03-06 Kao Corp Analyzer of surface nature
JPH0711415B2 (ja) * 1987-11-16 1995-02-08 東洋製罐株式会社 鏡面的光沢のある凸曲面を有する容器口部の形状検査方法と装置
JPH02208504A (ja) * 1989-02-09 1990-08-20 Omron Tateisi Electron Co 球体検査装置
CN109799238B (zh) * 2019-01-24 2021-08-31 常州市武进信和精密机械有限公司 表面处理装置
CN110389089A (zh) * 2019-08-06 2019-10-29 哈尔滨工业大学 大口径反射镜表面颗粒污染物离线暗场检测装置

Also Published As

Publication number Publication date
JPS61213752A (ja) 1986-09-22

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term