JPH0481352B2 - - Google Patents

Info

Publication number
JPH0481352B2
JPH0481352B2 JP58102381A JP10238183A JPH0481352B2 JP H0481352 B2 JPH0481352 B2 JP H0481352B2 JP 58102381 A JP58102381 A JP 58102381A JP 10238183 A JP10238183 A JP 10238183A JP H0481352 B2 JPH0481352 B2 JP H0481352B2
Authority
JP
Japan
Prior art keywords
layer
semiconductor
semiconductor substrate
substrate
amorphous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58102381A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59227168A (ja
Inventor
Noritada Sato
Yasukazu Seki
Masaya Yabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Corporate Research and Development Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Corporate Research and Development Ltd filed Critical Fuji Electric Co Ltd
Priority to JP58102381A priority Critical patent/JPS59227168A/ja
Priority to US06/613,890 priority patent/US4692782A/en
Publication of JPS59227168A publication Critical patent/JPS59227168A/ja
Publication of JPH0481352B2 publication Critical patent/JPH0481352B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H10F30/295—Surface barrier or shallow PN junction radiation detectors, e.g. surface barrier alpha-particle detectors
    • H10F30/2955—Shallow PN junction radiation detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H10F30/295—Surface barrier or shallow PN junction radiation detectors, e.g. surface barrier alpha-particle detectors

Landscapes

  • Light Receiving Elements (AREA)
  • Measurement Of Radiation (AREA)
JP58102381A 1983-06-08 1983-06-08 半導体放射線検出器 Granted JPS59227168A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58102381A JPS59227168A (ja) 1983-06-08 1983-06-08 半導体放射線検出器
US06/613,890 US4692782A (en) 1983-06-08 1984-05-24 Semiconductor radioactive ray detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58102381A JPS59227168A (ja) 1983-06-08 1983-06-08 半導体放射線検出器

Publications (2)

Publication Number Publication Date
JPS59227168A JPS59227168A (ja) 1984-12-20
JPH0481352B2 true JPH0481352B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-12-22

Family

ID=14325872

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58102381A Granted JPS59227168A (ja) 1983-06-08 1983-06-08 半導体放射線検出器

Country Status (2)

Country Link
US (1) US4692782A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS59227168A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61131568A (ja) * 1984-11-30 1986-06-19 Fuji Electric Co Ltd 半導体放射線検出器
JPS61152083A (ja) * 1984-12-25 1986-07-10 Fuji Electric Co Ltd 半導体放射線検出素子
JPS6281020U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1985-11-08 1987-05-23
US5156979A (en) * 1986-01-21 1992-10-20 Fuji Electric Co., Ltd. Semiconductor-based radiation-detector element
JPS62293681A (ja) * 1986-06-12 1987-12-21 Fuji Electric Co Ltd 半導体放射線検出素子
JP2697767B2 (ja) * 1986-07-23 1998-01-14 浜松ホトニクス 株式会社 放射線撮像装置
JP2568536B2 (ja) * 1987-02-09 1997-01-08 株式会社島津製作所 エネルギ分散型ｘ線検出装置
JPS63140648U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1987-03-06 1988-09-16
DE3850157T2 (de) * 1987-03-23 1995-02-09 Hitachi Ltd Photoelektrische Umwandlungsanordnung.
JPH02260466A (ja) * 1989-03-30 1990-10-23 Matsushita Electric Ind Co Ltd 半導体放射線検出器
US5070027A (en) * 1989-02-23 1991-12-03 Matsushita Electric Industrial Co., Ltd. Method of forming a heterostructure diode
US5166757A (en) * 1989-03-31 1992-11-24 Nippon Steel Corporation Dry-etched amorphous silicon device with recessed electrode
GB9416149D0 (en) * 1994-08-10 1994-09-28 Univ Strathclyde Vesicle formulation
US6011264A (en) * 1994-08-11 2000-01-04 Urigal Technologies, Ltd. Apparatus, system and method for gamma ray and x-ray detection
IL110637A (en) * 1994-08-11 2001-10-31 Urigal Techn Ltd Apparatus, system and method for gamma-ray and x-ray detection
WO1996035236A1 (de) * 1995-05-05 1996-11-07 Forschungszentrum Jülich GmbH Detektor zum anzeigen einer ionisierenden strahlung und verfahren für seine herstellung
US5677539A (en) * 1995-10-13 1997-10-14 Digirad Semiconductor radiation detector with enhanced charge collection
US6037595A (en) * 1995-10-13 2000-03-14 Digirad Corporation Radiation detector with shielding electrode
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
GB2307785B (en) * 1995-11-29 1998-04-29 Simage Oy Forming contacts on semiconductor substrates for radiation detectors and imaging devices
GB2345188B (en) * 1998-12-22 2001-02-14 Hitachi Ltd Semiconductor radiation detector and manufacture thereof
AUPR174800A0 (en) 2000-11-29 2000-12-21 Australian National University, The Semiconductor processing
US7828983B2 (en) * 2001-11-29 2010-11-09 Transform Solar Pty Ltd Semiconductor texturing process
JP2007109905A (ja) * 2005-10-14 2007-04-26 Hitachi Ltd 放射線検出器
GB0908583D0 (en) * 2009-05-19 2009-06-24 Durham Scient Crystals Ltd Semiconductor device contacts
KR102630173B1 (ko) * 2017-12-27 2024-01-26 엘지디스플레이 주식회사 엑스레이검출장치
JP7015959B1 (ja) * 2021-07-29 2022-02-03 株式会社堀場製作所 放射線検出素子の製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3278811A (en) * 1960-10-04 1966-10-11 Hayakawa Denki Kogyo Kabushiki Radiation energy transducing device
US3668480A (en) * 1970-07-21 1972-06-06 Ibm Semiconductor device having many fold iv characteristics
US4214253A (en) * 1977-06-13 1980-07-22 General Electric Company Radiation detector

Also Published As

Publication number Publication date
US4692782A (en) 1987-09-08
JPS59227168A (ja) 1984-12-20

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