JPH0478166B2 - - Google Patents
Info
- Publication number
- JPH0478166B2 JPH0478166B2 JP62313899A JP31389987A JPH0478166B2 JP H0478166 B2 JPH0478166 B2 JP H0478166B2 JP 62313899 A JP62313899 A JP 62313899A JP 31389987 A JP31389987 A JP 31389987A JP H0478166 B2 JPH0478166 B2 JP H0478166B2
- Authority
- JP
- Japan
- Prior art keywords
- alignment
- wafer
- mark
- reticle
- objects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62313899A JPH01155620A (ja) | 1987-12-11 | 1987-12-11 | 位置合わせ方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62313899A JPH01155620A (ja) | 1987-12-11 | 1987-12-11 | 位置合わせ方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01155620A JPH01155620A (ja) | 1989-06-19 |
| JPH0478166B2 true JPH0478166B2 (enExample) | 1992-12-10 |
Family
ID=18046856
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62313899A Granted JPH01155620A (ja) | 1987-12-11 | 1987-12-11 | 位置合わせ方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01155620A (enExample) |
-
1987
- 1987-12-11 JP JP62313899A patent/JPH01155620A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01155620A (ja) | 1989-06-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |