JPH0462349B2 - - Google Patents
Info
- Publication number
- JPH0462349B2 JPH0462349B2 JP60002135A JP213585A JPH0462349B2 JP H0462349 B2 JPH0462349 B2 JP H0462349B2 JP 60002135 A JP60002135 A JP 60002135A JP 213585 A JP213585 A JP 213585A JP H0462349 B2 JPH0462349 B2 JP H0462349B2
- Authority
- JP
- Japan
- Prior art keywords
- rail
- unit
- socket
- shuttle rail
- cam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60002135A JPS61161464A (ja) | 1985-01-11 | 1985-01-11 | Ic測定ユニツト |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60002135A JPS61161464A (ja) | 1985-01-11 | 1985-01-11 | Ic測定ユニツト |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61161464A JPS61161464A (ja) | 1986-07-22 |
| JPH0462349B2 true JPH0462349B2 (enExample) | 1992-10-06 |
Family
ID=11520891
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60002135A Granted JPS61161464A (ja) | 1985-01-11 | 1985-01-11 | Ic測定ユニツト |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61161464A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04282471A (ja) * | 1991-03-08 | 1992-10-07 | Nec Kyushu Ltd | 半導体集積回路測定装置 |
-
1985
- 1985-01-11 JP JP60002135A patent/JPS61161464A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61161464A (ja) | 1986-07-22 |
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