JPH045659A - Photomask substrate supporting device - Google Patents

Photomask substrate supporting device

Info

Publication number
JPH045659A
JPH045659A JP2105466A JP10546690A JPH045659A JP H045659 A JPH045659 A JP H045659A JP 2105466 A JP2105466 A JP 2105466A JP 10546690 A JP10546690 A JP 10546690A JP H045659 A JPH045659 A JP H045659A
Authority
JP
Japan
Prior art keywords
photomask substrate
substrate
stage
photomask
regulate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2105466A
Other languages
Japanese (ja)
Inventor
Haruhiko Kususe
治彦 楠瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2105466A priority Critical patent/JPH045659A/en
Publication of JPH045659A publication Critical patent/JPH045659A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To improve accuracy by engaging one piece among 3 pieces of balls mounted to a photomask substrate with a pit on a stage side, engaging another one piece with a groove to regulate the rotating angle of the substrate and allowing the other one piece to regulate the inclination of the substrate. CONSTITUTION:The pits 5 each having a V-shaped section are provided in the positions respectively corresponding to the spherical bodies 3a, 3b, 3c atop a stage 2 and the V-grooves 6 are provided in these pits 5. The spherical bodies support the photomask substrate 1 to the stage 2 by respectively engaging with these grooves. The ball 3a is the 1st supporting point which is the center of the axis of rotation of the substrate 1. The ball 3b is the 2nd supporting point to determine the rotating angle of the substrate 1. The ball 3c is the 3rd supporting point to regulate the inclination of the substrate 1. The generation of a deviation in the substrate 1 is obviated in this way even if the substrate 1 is supported by the pressure of about the gravity to prevent the straining of the substrate 1. The accuracy of plotting positions is thus enhanced.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、露光装置、座標測定器などに使用するフォ
トマスク基板を支持するためのフォトマスク基板支持装
置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a photomask substrate support device for supporting a photomask substrate used in an exposure apparatus, a coordinate measuring device, or the like.

〔従来の技術〕[Conventional technology]

第12図、第13図は従来のフォトマスク基板支持装置
を示し、平板状のステージ(2)の上面に真空溝(21
)が形成されていて、排気ボート(22)から真空71
1(21)を真空引きすることにより、フォトマスク基
板を吸着してステージ(2)と略平行に支持するもので
ある。
12 and 13 show a conventional photomask substrate support device, in which a vacuum groove (21
) is formed and a vacuum 71 is drawn from the exhaust boat (22).
By evacuating stage 1 (21), the photomask substrate is attracted and supported substantially parallel to stage (2).

また、他の従来のフォトマスク基板支持装置として第1
4図、第15図に示すものがあり、ステージ(2)に、
高さ調整ねしく31)、押上ロッド(32)、レバー(
33)およびスプリング(34)からなるクランプ手段
を設け、フォトマスク基板(1)の微小な面積部分を機
械的にクランプするもので、電子ビーム露光装置のよう
に、ステージが真空中にあるため真空吸着ができない場
合に適用されている。
In addition, as another conventional photomask substrate support device, the first
There are those shown in Figures 4 and 15, and in stage (2),
Height adjustment screw 31), push-up rod (32), lever (
33) and a spring (34) to mechanically clamp a small area of the photomask substrate (1). Like an electron beam exposure device, the stage is in a vacuum, so it is not necessary to use a vacuum. It is applied when adsorption is not possible.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

以上のような従来のフォトマスク基板支持装置は、前者
にあっては、フォトマスク基板は真空吸着してステージ
に固定していたので、この面の吸着面の平面度が十分で
ない場合はフォトマスク基板がそり、このため露光装置
においては描画位置精度が悪化した。また後者では、フ
ォトマスク基板の微小な面を機械的にクランプして支持
するため、ステージ移動時の加速に対し、フォトマスク
基板がずれることを防ぐために充分大きな圧力でフォト
マスク基板をクランプする必要があった。
In the former type of conventional photomask substrate support device as described above, the photomask substrate is fixed to the stage by vacuum suction, so if the flatness of this suction surface is not sufficient, the photomask The substrate warped, resulting in poor drawing position accuracy in the exposure apparatus. In addition, in the latter case, the tiny surface of the photomask substrate is mechanically clamped and supported, so it is necessary to clamp the photomask substrate with a sufficiently large pressure to prevent it from shifting due to acceleration during stage movement. was there.

そのためこの圧力によりフォトマスク基板が歪み、描画
位置精度が悪化することがあった。
Therefore, this pressure sometimes distorts the photomask substrate and deteriorates the precision of the drawing position.

また、これらが露光袋Wでなく座標測定器の場合におい
ては、同じ理由により座標測定値の誤差となる問題点が
あった。
Furthermore, if these were a coordinate measuring device instead of the exposure bag W, there would be a problem of errors in the coordinate measurement values for the same reason.

この発明は上記のような問題点を解決するためになされ
たもので、支持したフォトマスク基板が歪むことがなく
、また、ステージ移動時の加速に対してフォトマスク基
板がずれることがないフォトマスク基板支持装置を得る
ことを目的とする。
This invention was made to solve the above problems, and provides a photomask in which the supported photomask substrate is not distorted and the photomask substrate does not shift due to acceleration during stage movement. The purpose is to obtain a substrate support device.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係るフォトマスク基板支持装置は、フォトマ
スク基板の下面の3箇所の部位に球を同定し、露光装置
または座標測定器のステージ側にこの球を受ける係合部
を設けることによって基板の支持を行う。
The photomask substrate support device according to the present invention identifies balls at three locations on the lower surface of the photomask substrate, and provides an engaging portion to receive the balls on the stage side of the exposure device or coordinate measuring device, thereby supporting the substrate. Provide support.

〔作 用〕[For production]

この発明においては、フォトマスク基板に取付けられた
3個の球の内1個はステージ側のビットに係合させ、フ
ォトマスク基板の回転軸の中心とする、また他の1個は
溝に係合させてフォトマスク基板の回転角度を規制する
。また残りの1個は平坦な部分に乗せフォトマスク基板
の傾斜のみを規制する。
In this invention, one of the three balls attached to the photomask substrate is engaged with the bit on the stage side and centered on the rotation axis of the photomask substrate, and the other one is engaged with the groove. In addition, the rotation angle of the photomask substrate is regulated. The remaining one is placed on a flat part to restrict only the inclination of the photomask substrate.

〔実施例〕〔Example〕

第1図〜第5図はこの発明の一実施例を示し、フォトマ
スク基板(1)下面の仮想三角形の頂点位置に、それぞ
れ球体(3a) 、 (3b) 、 (3c)が接着剤
(4)によって接着されている。ステージ(2)の上面
には、球体(3a) 、 (3b) 、 (3c)にそ
れぞれ対応する位置に、断面V字状のビット(5)、こ
のビット(5)に向かうV渭(6)および平坦面(7)
が設けられていて、球体(3a) 、 (3b) 、 
(3c)がそれぞれ係合することによってステージ(2
)にフォトマスク基板(1)を支持する。
FIGS. 1 to 5 show an embodiment of the present invention, in which spheres (3a), (3b), and (3c) are attached to adhesives (4 ) are glued together. On the top surface of the stage (2), there is a bit (5) with a V-shaped cross section at the positions corresponding to the spheres (3a), (3b), and (3c), and a V-shape (6) facing this bit (5). and flat surface (7)
are provided, and the spheres (3a), (3b),
(3c) are engaged with each other, so that the stage (2
) supports the photomask substrate (1).

球(3a)はフォトマスク基板(1)の回転軸中心とな
る第1の支持点、球(3b)はフォトマスク基板(1)
の回転角度を決定する第2の支持点、また、球(3c)
はフォトマスク基板(1)の傾斜を規制する第3の支持
点となっている。
The sphere (3a) is the first support point that is the rotation axis center of the photomask substrate (1), and the sphere (3b) is the rotation axis center of the photomask substrate (1).
The second support point that determines the rotation angle of the sphere (3c)
serves as a third support point that regulates the inclination of the photomask substrate (1).

かかる構成により、フォトマスク基板(1)に歪を与え
ない重力程度の圧力でフォトマスク基板(1)を支持し
ているにも拘わらず、フォトマスク基板(1)のずれを
生じることなく、描画位置精度を高めることができる。
With this configuration, even though the photomask substrate (1) is supported with a pressure similar to gravity that does not cause distortion to the photomask substrate (1), writing can be performed without causing displacement of the photomask substrate (1). Position accuracy can be improved.

なお、上記実施例では、V字状のビット、■溝を用いた
が、第6図に示すように、円筒形または角形のビット(
5)、溝(6)を用いてもよく、また第7図に示すよう
にU字形のビット(5)、渭(6)でもよい。さらに、
球体に代えて、第8図に示すように、半球体(3d)、
あるいは、第9図に示すように、円筒体(3e)として
もよく、断面が円弧状であればよい。
In the above embodiment, a V-shaped bit and a groove were used, but as shown in Fig. 6, a cylindrical or square bit (
5), grooves (6) may be used, or U-shaped bits (5) and ridges (6) may be used as shown in FIG. moreover,
Instead of a sphere, as shown in Figure 8, a hemisphere (3d),
Alternatively, as shown in FIG. 9, it may be a cylindrical body (3e) as long as it has an arcuate cross section.

また、球体のような突起側をフォトマスク基板に設けた
が、逆に、突起側をステージに配置し、フォトマスク基
板にピッI−や溝を形成してもよい。
Further, although the spherical protrusion side is provided on the photomask substrate, conversely, the protrusion side may be placed on the stage and pits and grooves may be formed on the photomask substrate.

さらに、第10図、第11図に示すように、ピッ)、(
5)、V講り6)に係合する球体(3a) 、−(3b
)はフォトマスク基板(1)に固着し、平坦面(7)に
当接する球体(3c)をステージ(2)に固着するなど
、種々の変形が考えられる。
Furthermore, as shown in FIGS. 10 and 11,
5), the sphere (3a) that engages with the V-shaped lever 6), -(3b)
) is fixed to the photomask substrate (1), and various modifications are possible, such as fixing the sphere (3c) that contacts the flat surface (7) to the stage (2).

また、フォトマスク基板に対する部品の固定は接着剤を
用いたが。金属等を用いて溶接してもよい。また融着し
てもよい。
In addition, adhesive was used to fix the components to the photomask substrate. Welding may be performed using metal or the like. Alternatively, it may be fused.

tた、本例ではステージがフォトマスク基板を直接支持
する構造としたが、カセットを介する構成としてもよい
。ただし、この場合は当然フォトマスク基板をカセット
に支持する部分は本発明の構造とする。
In addition, although this example has a structure in which the stage directly supports the photomask substrate, a structure in which the stage directly supports the photomask substrate may be adopted. However, in this case, the portion that supports the photomask substrate on the cassette naturally has the structure of the present invention.

また、ステージの加速度が重力によるフォトマスク基板
の支持力を上回り、フォトマスク基板がずれてしまう場
合は、球の真上の部分をフォトマスク基板に上部から必
要充分な圧力でステージ側に押し付ける機構を有するも
のとすればよい。
In addition, if the acceleration of the stage exceeds the supporting force of the photomask substrate due to gravity and the photomask substrate shifts, there is a mechanism that presses the part directly above the sphere against the photomask substrate from above against the stage side with necessary and sufficient pressure. It is sufficient to have the following.

また、本例ではフォトマスク基板の高さ及び傾斜角度は
固定であるが、必要であればビット、■清、及び平坦な
部分の高さを圧電駆動素子等で調整できる構造とするこ
とも考えられる。
In addition, in this example, the height and inclination angle of the photomask substrate are fixed, but if necessary, it may be possible to create a structure in which the height of the bits, holes, and flat parts can be adjusted using piezoelectric drive elements, etc. It will be done.

さらに、本例ではフォトマスク基板の下部に球を取り付
ける構造としたが、反対に上部に取り付け、フォトマス
ク基板の下部から押し上げて支持する構造としてもよい
Further, in this example, the ball is attached to the bottom of the photomask substrate, but it may be attached to the top and supported by being pushed up from the bottom of the photomask substrate.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように、この発明は、球体など
を溝およびビットに係合させてフォトマスク基板を支持
するため、フォトマスク基板にかかる重力による力程度
の小さい固定圧力でもステージ移動時の加速度が充分小
さい場合はフォトマスク基板のずれがない支持が可能と
なる。そのため、フォトマスク基板の歪みが少なく、露
光装置においては描画位置精度が、また座標測定器にお
いては座標測定精度が向上する。
As is clear from the above description, the present invention supports the photomask substrate by engaging a sphere or the like with the groove and the bit, so that even a small fixed pressure, which is similar to the force of gravity applied to the photomask substrate, can be applied to the photomask substrate during stage movement. If the acceleration is sufficiently small, the photomask substrate can be supported without shifting. Therefore, the distortion of the photomask substrate is reduced, and the accuracy of the drawing position in the exposure device and the coordinate measurement accuracy in the coordinate measuring device are improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例の平面図、第2図〜第5図
はそれぞれ第1図の■−■線、I[[−I線、IV−I
V線およびV−■線に沿う平面による断面図、第6図〜
第11図はそれぞれ他の実施例の要部断面図、第12図
は従来のフォトマスクの基板支持装置の平面図、第13
図は第12図のxm−xm線に沿う平面による断面図、
第14図は従来の他のフォトマスク基板支持装置の平面
図、第15図は第14図のxv−xv線に沿う平面によ
る断面図である。 (1)・・フォトマスク基板、(2)・・ステージ、(
3a)〜(3c)・・球体(第1、第2、第3の支持点
)、(5)・・ビット、(6)・・■溝、(7)・・平
坦面。 なお、各図中、同一符号は同−又は相当部分を示す。
FIG. 1 is a plan view of an embodiment of the present invention, and FIGS.
Cross-sectional view taken along the V line and the V-■ line, Fig. 6~
11 is a cross-sectional view of a main part of another embodiment, FIG. 12 is a plan view of a conventional photomask substrate support device, and FIG. 13 is a plan view of a conventional photomask substrate support device.
The figure is a cross-sectional view taken along the xm-xm line in Fig. 12,
FIG. 14 is a plan view of another conventional photomask substrate support device, and FIG. 15 is a sectional view taken along the line xv-xv in FIG. 14. (1)...Photomask substrate, (2)...Stage, (
3a) to (3c)...Sphere (first, second, third support points), (5)...Bit, (6)...■Groove, (7)...Flat surface. In each figure, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】  フォトマスク基板を平板状のステージに略平行に支持
するフォトマスク基板支持装置において、断面円弧状の
突起体と凹部との係合でなり、前記フォトマスク基板と
前記ステージ間の仮想三角形の2つの頂点にそれぞれ配
置された、前記フォトマスク基板の回転軸の中心となる
第1の支持点と、前記フォトマスク基板の回転角度を決
定する第2の支持点と、 断面円弧状の突起体と平坦面との係合でなり、前記仮想
三角形の他の1つの頂点に配置され、前記フォトマスク
基板の傾斜を規制する第3の支持点と、 を備えてなることを特徴とするフォトマスク基板支持装
置。
[Scope of Claims] In a photomask substrate support device that supports a photomask substrate substantially parallel to a flat stage, the distance between the photomask substrate and the stage is formed by engagement between a protrusion having an arcuate cross section and a recess. a first support point that is the center of the rotation axis of the photomask substrate, and a second support point that determines the rotation angle of the photomask substrate, which are arranged at two vertices of a virtual triangle, respectively; and a cross-sectional circle. a third support point formed by engagement between an arcuate protrusion and a flat surface, disposed at one other vertex of the virtual triangle, and regulating the inclination of the photomask substrate; Photomask substrate support device.
JP2105466A 1990-04-23 1990-04-23 Photomask substrate supporting device Pending JPH045659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2105466A JPH045659A (en) 1990-04-23 1990-04-23 Photomask substrate supporting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2105466A JPH045659A (en) 1990-04-23 1990-04-23 Photomask substrate supporting device

Publications (1)

Publication Number Publication Date
JPH045659A true JPH045659A (en) 1992-01-09

Family

ID=14408358

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2105466A Pending JPH045659A (en) 1990-04-23 1990-04-23 Photomask substrate supporting device

Country Status (1)

Country Link
JP (1) JPH045659A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4761581A (en) * 1986-05-09 1988-08-02 Hitachi, Ltd. Magnetic wedge
JP2007220987A (en) * 2006-02-17 2007-08-30 Ushio Inc Retainer of plane board
US7686458B2 (en) 2004-08-18 2010-03-30 Mitsubishi Electric Corporation Supporting mechanism of reflector and projection apparatus
US7867403B2 (en) * 2006-06-05 2011-01-11 Jason Plumhoff Temperature control method for photolithographic substrate
JP2013215880A (en) * 2012-04-05 2013-10-24 Boeing Co:The Mount for calibration standard

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62272260A (en) * 1986-05-20 1987-11-26 Oak Seisakusho:Kk Exposing and printing frame device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62272260A (en) * 1986-05-20 1987-11-26 Oak Seisakusho:Kk Exposing and printing frame device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4761581A (en) * 1986-05-09 1988-08-02 Hitachi, Ltd. Magnetic wedge
US7686458B2 (en) 2004-08-18 2010-03-30 Mitsubishi Electric Corporation Supporting mechanism of reflector and projection apparatus
JP2007220987A (en) * 2006-02-17 2007-08-30 Ushio Inc Retainer of plane board
JP4569492B2 (en) * 2006-02-17 2010-10-27 ウシオ電機株式会社 Flat plate holder
US7867403B2 (en) * 2006-06-05 2011-01-11 Jason Plumhoff Temperature control method for photolithographic substrate
JP2013215880A (en) * 2012-04-05 2013-10-24 Boeing Co:The Mount for calibration standard

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