JPH0455139U - - Google Patents

Info

Publication number
JPH0455139U
JPH0455139U JP9762590U JP9762590U JPH0455139U JP H0455139 U JPH0455139 U JP H0455139U JP 9762590 U JP9762590 U JP 9762590U JP 9762590 U JP9762590 U JP 9762590U JP H0455139 U JPH0455139 U JP H0455139U
Authority
JP
Japan
Prior art keywords
wafer
foreign matter
inspection device
coordinates
alignment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9762590U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9762590U priority Critical patent/JPH0455139U/ja
Publication of JPH0455139U publication Critical patent/JPH0455139U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は本考案を示す概念図である。 1……ウエーハホールダ、2……ウエーハオサ
エ(固定)、3……ウエーハオサエ(可動)、4
……基準ウエーハ、5……アライメント位置A,
B、6……アライメント原点、7……ウエーハ座
標。
FIGS. 1 and 2 are conceptual diagrams showing the present invention. 1...Wafer holder, 2...Wafer support (fixed), 3...Wafer support (movable), 4
...Reference wafer, 5...Alignment position A,
B, 6... Alignment origin, 7... Wafer coordinates.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ウエーハ異物検査装置及び、ウエーハ異物検査
装置のウエーハ座標を元に異物の形状観察または
、分析を行う検査装置等において、ウエーハ座標
のアライメント原点をウエーハ外部に設けること
を特徴としたウエーハ座標アライメント。
A wafer coordinate alignment characterized in that an alignment origin of the wafer coordinates is provided outside the wafer in a wafer foreign matter inspection device and an inspection device that observes or analyzes the shape of a foreign matter based on the wafer coordinates of the wafer foreign matter inspection device.
JP9762590U 1990-09-19 1990-09-19 Pending JPH0455139U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9762590U JPH0455139U (en) 1990-09-19 1990-09-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9762590U JPH0455139U (en) 1990-09-19 1990-09-19

Publications (1)

Publication Number Publication Date
JPH0455139U true JPH0455139U (en) 1992-05-12

Family

ID=31838162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9762590U Pending JPH0455139U (en) 1990-09-19 1990-09-19

Country Status (1)

Country Link
JP (1) JPH0455139U (en)

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