JPH0454336B2 - - Google Patents

Info

Publication number
JPH0454336B2
JPH0454336B2 JP58123240A JP12324083A JPH0454336B2 JP H0454336 B2 JPH0454336 B2 JP H0454336B2 JP 58123240 A JP58123240 A JP 58123240A JP 12324083 A JP12324083 A JP 12324083A JP H0454336 B2 JPH0454336 B2 JP H0454336B2
Authority
JP
Japan
Prior art keywords
electron beam
target
current
polarization
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58123240A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6017846A (ja
Inventor
Kazuyuki Koike
Kazunobu Hayakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58123240A priority Critical patent/JPS6017846A/ja
Publication of JPS6017846A publication Critical patent/JPS6017846A/ja
Publication of JPH0454336B2 publication Critical patent/JPH0454336B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58123240A 1983-07-08 1983-07-08 電子スピン偏極率検出器 Granted JPS6017846A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58123240A JPS6017846A (ja) 1983-07-08 1983-07-08 電子スピン偏極率検出器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58123240A JPS6017846A (ja) 1983-07-08 1983-07-08 電子スピン偏極率検出器

Publications (2)

Publication Number Publication Date
JPS6017846A JPS6017846A (ja) 1985-01-29
JPH0454336B2 true JPH0454336B2 (enExample) 1992-08-31

Family

ID=14855666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58123240A Granted JPS6017846A (ja) 1983-07-08 1983-07-08 電子スピン偏極率検出器

Country Status (1)

Country Link
JP (1) JPS6017846A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09257075A (ja) * 1996-03-25 1997-09-30 Daihatsu Motor Co Ltd 合成樹脂製の防振マウント用ブラケット

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2196175B (en) * 1986-10-03 1990-10-17 Trialsite Ltd Production of pulsed electron beams
JPH04206427A (ja) * 1990-11-30 1992-07-28 Hitachi Ltd スピン検出器
JP3383842B2 (ja) 2000-04-28 2003-03-10 北海道大学長 散乱ターゲット保持機構及び電子スピン分析器
JP3757263B2 (ja) 2000-05-02 2006-03-22 国立大学法人 北海道大学 電子スピン分析器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09257075A (ja) * 1996-03-25 1997-09-30 Daihatsu Motor Co Ltd 合成樹脂製の防振マウント用ブラケット

Also Published As

Publication number Publication date
JPS6017846A (ja) 1985-01-29

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