JPH0454336B2 - - Google Patents
Info
- Publication number
- JPH0454336B2 JPH0454336B2 JP58123240A JP12324083A JPH0454336B2 JP H0454336 B2 JPH0454336 B2 JP H0454336B2 JP 58123240 A JP58123240 A JP 58123240A JP 12324083 A JP12324083 A JP 12324083A JP H0454336 B2 JPH0454336 B2 JP H0454336B2
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- target
- current
- polarization
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000010287 polarization Effects 0.000 claims description 29
- 238000010894 electron beam technology Methods 0.000 claims description 26
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- 229910052737 gold Inorganic materials 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 2
- 230000010363 phase shift Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58123240A JPS6017846A (ja) | 1983-07-08 | 1983-07-08 | 電子スピン偏極率検出器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58123240A JPS6017846A (ja) | 1983-07-08 | 1983-07-08 | 電子スピン偏極率検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6017846A JPS6017846A (ja) | 1985-01-29 |
| JPH0454336B2 true JPH0454336B2 (enExample) | 1992-08-31 |
Family
ID=14855666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58123240A Granted JPS6017846A (ja) | 1983-07-08 | 1983-07-08 | 電子スピン偏極率検出器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6017846A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09257075A (ja) * | 1996-03-25 | 1997-09-30 | Daihatsu Motor Co Ltd | 合成樹脂製の防振マウント用ブラケット |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2196175B (en) * | 1986-10-03 | 1990-10-17 | Trialsite Ltd | Production of pulsed electron beams |
| JPH04206427A (ja) * | 1990-11-30 | 1992-07-28 | Hitachi Ltd | スピン検出器 |
| JP3383842B2 (ja) | 2000-04-28 | 2003-03-10 | 北海道大学長 | 散乱ターゲット保持機構及び電子スピン分析器 |
| JP3757263B2 (ja) | 2000-05-02 | 2006-03-22 | 国立大学法人 北海道大学 | 電子スピン分析器 |
-
1983
- 1983-07-08 JP JP58123240A patent/JPS6017846A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09257075A (ja) * | 1996-03-25 | 1997-09-30 | Daihatsu Motor Co Ltd | 合成樹脂製の防振マウント用ブラケット |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6017846A (ja) | 1985-01-29 |
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