JPS6017846A - 電子スピン偏極率検出器 - Google Patents

電子スピン偏極率検出器

Info

Publication number
JPS6017846A
JPS6017846A JP58123240A JP12324083A JPS6017846A JP S6017846 A JPS6017846 A JP S6017846A JP 58123240 A JP58123240 A JP 58123240A JP 12324083 A JP12324083 A JP 12324083A JP S6017846 A JPS6017846 A JP S6017846A
Authority
JP
Japan
Prior art keywords
electron
electron beam
current
polarization
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58123240A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0454336B2 (enExample
Inventor
Kazuyuki Koike
和幸 小池
Kazunobu Hayakawa
早川　和延
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58123240A priority Critical patent/JPS6017846A/ja
Publication of JPS6017846A publication Critical patent/JPS6017846A/ja
Publication of JPH0454336B2 publication Critical patent/JPH0454336B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58123240A 1983-07-08 1983-07-08 電子スピン偏極率検出器 Granted JPS6017846A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58123240A JPS6017846A (ja) 1983-07-08 1983-07-08 電子スピン偏極率検出器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58123240A JPS6017846A (ja) 1983-07-08 1983-07-08 電子スピン偏極率検出器

Publications (2)

Publication Number Publication Date
JPS6017846A true JPS6017846A (ja) 1985-01-29
JPH0454336B2 JPH0454336B2 (enExample) 1992-08-31

Family

ID=14855666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58123240A Granted JPS6017846A (ja) 1983-07-08 1983-07-08 電子スピン偏極率検出器

Country Status (1)

Country Link
JP (1) JPS6017846A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4839520A (en) * 1986-10-03 1989-06-13 Garth Simon C J Production of pulsed electron beams
US5166522A (en) * 1990-11-30 1992-11-24 Hitachi, Ltd. Spin detector
US6639218B2 (en) 2000-05-02 2003-10-28 Hokkaido University Electron spin analyzer
US6674073B2 (en) 2000-04-28 2004-01-06 Hokkaido University Scattering target-holding mechanism and an electron spin analyzer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3522961B2 (ja) * 1996-03-25 2004-04-26 ダイハツ工業株式会社 合成樹脂製の防振マウント用ブラケット

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4839520A (en) * 1986-10-03 1989-06-13 Garth Simon C J Production of pulsed electron beams
US5166522A (en) * 1990-11-30 1992-11-24 Hitachi, Ltd. Spin detector
EP0490170A3 (enExample) * 1990-11-30 1994-02-23 Hitachi Ltd
US6674073B2 (en) 2000-04-28 2004-01-06 Hokkaido University Scattering target-holding mechanism and an electron spin analyzer
US6639218B2 (en) 2000-05-02 2003-10-28 Hokkaido University Electron spin analyzer

Also Published As

Publication number Publication date
JPH0454336B2 (enExample) 1992-08-31

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