JPH0454187B2 - - Google Patents

Info

Publication number
JPH0454187B2
JPH0454187B2 JP55184725A JP18472580A JPH0454187B2 JP H0454187 B2 JPH0454187 B2 JP H0454187B2 JP 55184725 A JP55184725 A JP 55184725A JP 18472580 A JP18472580 A JP 18472580A JP H0454187 B2 JPH0454187 B2 JP H0454187B2
Authority
JP
Japan
Prior art keywords
terminal
direction line
probe
line
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55184725A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57108676A (en
Inventor
Kuniharu Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55184725A priority Critical patent/JPS57108676A/ja
Publication of JPS57108676A publication Critical patent/JPS57108676A/ja
Publication of JPH0454187B2 publication Critical patent/JPH0454187B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55184725A 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system Granted JPS57108676A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55184725A JPS57108676A (en) 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55184725A JPS57108676A (en) 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system

Publications (2)

Publication Number Publication Date
JPS57108676A JPS57108676A (en) 1982-07-06
JPH0454187B2 true JPH0454187B2 (enrdf_load_stackoverflow) 1992-08-28

Family

ID=16158268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55184725A Granted JPS57108676A (en) 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system

Country Status (1)

Country Link
JP (1) JPS57108676A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5520513Y2 (enrdf_load_stackoverflow) * 1975-09-03 1980-05-16

Also Published As

Publication number Publication date
JPS57108676A (en) 1982-07-06

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