JPS57108676A - Multiple terminals detector by diode matrix system - Google Patents

Multiple terminals detector by diode matrix system

Info

Publication number
JPS57108676A
JPS57108676A JP55184725A JP18472580A JPS57108676A JP S57108676 A JPS57108676 A JP S57108676A JP 55184725 A JP55184725 A JP 55184725A JP 18472580 A JP18472580 A JP 18472580A JP S57108676 A JPS57108676 A JP S57108676A
Authority
JP
Japan
Prior art keywords
track
circuit
tracks
sequentially
way
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55184725A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0454187B2 (enrdf_load_stackoverflow
Inventor
Kuniharu Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55184725A priority Critical patent/JPS57108676A/ja
Publication of JPS57108676A publication Critical patent/JPS57108676A/ja
Publication of JPH0454187B2 publication Critical patent/JPH0454187B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55184725A 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system Granted JPS57108676A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55184725A JPS57108676A (en) 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55184725A JPS57108676A (en) 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system

Publications (2)

Publication Number Publication Date
JPS57108676A true JPS57108676A (en) 1982-07-06
JPH0454187B2 JPH0454187B2 (enrdf_load_stackoverflow) 1992-08-28

Family

ID=16158268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55184725A Granted JPS57108676A (en) 1980-12-25 1980-12-25 Multiple terminals detector by diode matrix system

Country Status (1)

Country Link
JP (1) JPS57108676A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5235711U (enrdf_load_stackoverflow) * 1975-09-03 1977-03-14

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5235711U (enrdf_load_stackoverflow) * 1975-09-03 1977-03-14

Also Published As

Publication number Publication date
JPH0454187B2 (enrdf_load_stackoverflow) 1992-08-28

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