JPH044754U - - Google Patents

Info

Publication number
JPH044754U
JPH044754U JP4306490U JP4306490U JPH044754U JP H044754 U JPH044754 U JP H044754U JP 4306490 U JP4306490 U JP 4306490U JP 4306490 U JP4306490 U JP 4306490U JP H044754 U JPH044754 U JP H044754U
Authority
JP
Japan
Prior art keywords
electrode pads
output electrode
input electrode
semiconductor device
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4306490U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4306490U priority Critical patent/JPH044754U/ja
Publication of JPH044754U publication Critical patent/JPH044754U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP4306490U 1990-04-24 1990-04-24 Pending JPH044754U (US07709020-20100504-C00041.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4306490U JPH044754U (US07709020-20100504-C00041.png) 1990-04-24 1990-04-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4306490U JPH044754U (US07709020-20100504-C00041.png) 1990-04-24 1990-04-24

Publications (1)

Publication Number Publication Date
JPH044754U true JPH044754U (US07709020-20100504-C00041.png) 1992-01-16

Family

ID=31555158

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4306490U Pending JPH044754U (US07709020-20100504-C00041.png) 1990-04-24 1990-04-24

Country Status (1)

Country Link
JP (1) JPH044754U (US07709020-20100504-C00041.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8211716B2 (en) 2008-03-27 2012-07-03 Renesas Electronics Corporation Manufacturing method of a semiconductor device, a semiconductor wafer, and a test method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8211716B2 (en) 2008-03-27 2012-07-03 Renesas Electronics Corporation Manufacturing method of a semiconductor device, a semiconductor wafer, and a test method

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