JPH0445761B2 - - Google Patents

Info

Publication number
JPH0445761B2
JPH0445761B2 JP58159683A JP15968383A JPH0445761B2 JP H0445761 B2 JPH0445761 B2 JP H0445761B2 JP 58159683 A JP58159683 A JP 58159683A JP 15968383 A JP15968383 A JP 15968383A JP H0445761 B2 JPH0445761 B2 JP H0445761B2
Authority
JP
Japan
Prior art keywords
tire
radiation
detector
cylinder
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58159683A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6052708A (ja
Inventor
Mikyuki Sorioka
Shosuke Yokoo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bridgestone Corp
Original Assignee
Bridgestone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bridgestone Corp filed Critical Bridgestone Corp
Priority to JP58159683A priority Critical patent/JPS6052708A/ja
Publication of JPS6052708A publication Critical patent/JPS6052708A/ja
Publication of JPH0445761B2 publication Critical patent/JPH0445761B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58159683A 1983-08-31 1983-08-31 タイヤのコ−ド配列検査機 Granted JPS6052708A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58159683A JPS6052708A (ja) 1983-08-31 1983-08-31 タイヤのコ−ド配列検査機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58159683A JPS6052708A (ja) 1983-08-31 1983-08-31 タイヤのコ−ド配列検査機

Publications (2)

Publication Number Publication Date
JPS6052708A JPS6052708A (ja) 1985-03-26
JPH0445761B2 true JPH0445761B2 (zh) 1992-07-27

Family

ID=15699038

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58159683A Granted JPS6052708A (ja) 1983-08-31 1983-08-31 タイヤのコ−ド配列検査機

Country Status (1)

Country Link
JP (1) JPS6052708A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01132950A (ja) * 1987-11-18 1989-05-25 Sumitomo Rubber Ind Ltd ゴム引コード布の検査方法および装置
JP4804788B2 (ja) * 2005-04-28 2011-11-02 横浜ゴム株式会社 タイヤの非破壊検査装置
JP4872811B2 (ja) * 2007-06-05 2012-02-08 横浜ゴム株式会社 タイヤの検査装置および方法
CN101893585B (zh) * 2010-04-27 2011-12-07 丹东奥龙射线仪器有限公司 简易翻新轮胎x射线检测支撑及旋转装置
JP6975100B2 (ja) * 2018-06-06 2021-12-01 アンリツ株式会社 Ｘ線検査装置

Also Published As

Publication number Publication date
JPS6052708A (ja) 1985-03-26

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