JPH0442782Y2 - - Google Patents

Info

Publication number
JPH0442782Y2
JPH0442782Y2 JP1985162539U JP16253985U JPH0442782Y2 JP H0442782 Y2 JPH0442782 Y2 JP H0442782Y2 JP 1985162539 U JP1985162539 U JP 1985162539U JP 16253985 U JP16253985 U JP 16253985U JP H0442782 Y2 JPH0442782 Y2 JP H0442782Y2
Authority
JP
Japan
Prior art keywords
contact
package
pin
contact pin
lead terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1985162539U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6271577U (US07223432-20070529-C00017.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985162539U priority Critical patent/JPH0442782Y2/ja
Publication of JPS6271577U publication Critical patent/JPS6271577U/ja
Application granted granted Critical
Publication of JPH0442782Y2 publication Critical patent/JPH0442782Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
JP1985162539U 1985-10-23 1985-10-23 Expired JPH0442782Y2 (US07223432-20070529-C00017.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985162539U JPH0442782Y2 (US07223432-20070529-C00017.png) 1985-10-23 1985-10-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985162539U JPH0442782Y2 (US07223432-20070529-C00017.png) 1985-10-23 1985-10-23

Publications (2)

Publication Number Publication Date
JPS6271577U JPS6271577U (US07223432-20070529-C00017.png) 1987-05-07
JPH0442782Y2 true JPH0442782Y2 (US07223432-20070529-C00017.png) 1992-10-09

Family

ID=31089895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985162539U Expired JPH0442782Y2 (US07223432-20070529-C00017.png) 1985-10-23 1985-10-23

Country Status (1)

Country Link
JP (1) JPH0442782Y2 (US07223432-20070529-C00017.png)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2784570B2 (ja) * 1987-06-09 1998-08-06 日本テキサス・インスツルメンツ 株式会社 ソケツト
JP2002296297A (ja) * 2001-03-29 2002-10-09 Isao Kimoto 接触子組立体
JP2011122942A (ja) * 2009-12-10 2011-06-23 Micronics Japan Co Ltd プローブ装置
JP2011181194A (ja) * 2010-02-26 2011-09-15 Chichibu Fuji Co Ltd 測定用端子及び測定用端子の製造方法
EP2725363B9 (de) * 2012-10-24 2015-03-25 Multitest elektronische Systeme GmbH Kontaktfeder für einen Prüfsockel für die Hochstrom-Prüfung eines elektronischen Bauteils

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4826442U (US07223432-20070529-C00017.png) * 1971-08-02 1973-03-30
JPS59146955U (ja) * 1983-03-22 1984-10-01 山一電機工業株式会社 被接続器体取り出し装置付接続器

Also Published As

Publication number Publication date
JPS6271577U (US07223432-20070529-C00017.png) 1987-05-07

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