JPH0439627B2 - - Google Patents

Info

Publication number
JPH0439627B2
JPH0439627B2 JP58096050A JP9605083A JPH0439627B2 JP H0439627 B2 JPH0439627 B2 JP H0439627B2 JP 58096050 A JP58096050 A JP 58096050A JP 9605083 A JP9605083 A JP 9605083A JP H0439627 B2 JPH0439627 B2 JP H0439627B2
Authority
JP
Japan
Prior art keywords
under test
logic circuit
test
pattern
initial state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58096050A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59221679A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP58096050A priority Critical patent/JPS59221679A/ja
Priority to US06/615,793 priority patent/US4583041A/en
Publication of JPS59221679A publication Critical patent/JPS59221679A/ja
Publication of JPH0439627B2 publication Critical patent/JPH0439627B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
JP58096050A 1983-05-31 1983-05-31 論理回路試験装置 Granted JPS59221679A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58096050A JPS59221679A (ja) 1983-05-31 1983-05-31 論理回路試験装置
US06/615,793 US4583041A (en) 1983-05-31 1984-05-31 Logic circuit test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58096050A JPS59221679A (ja) 1983-05-31 1983-05-31 論理回路試験装置

Publications (2)

Publication Number Publication Date
JPS59221679A JPS59221679A (ja) 1984-12-13
JPH0439627B2 true JPH0439627B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-06-30

Family

ID=14154632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58096050A Granted JPS59221679A (ja) 1983-05-31 1983-05-31 論理回路試験装置

Country Status (1)

Country Link
JP (1) JPS59221679A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4588945A (en) * 1983-06-13 1986-05-13 Hewlett-Packard Company High throughput circuit tester and test technique avoiding overdriving damage

Also Published As

Publication number Publication date
JPS59221679A (ja) 1984-12-13

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