JPH0436050Y2 - - Google Patents
Info
- Publication number
- JPH0436050Y2 JPH0436050Y2 JP18587085U JP18587085U JPH0436050Y2 JP H0436050 Y2 JPH0436050 Y2 JP H0436050Y2 JP 18587085 U JP18587085 U JP 18587085U JP 18587085 U JP18587085 U JP 18587085U JP H0436050 Y2 JPH0436050 Y2 JP H0436050Y2
- Authority
- JP
- Japan
- Prior art keywords
- frame
- image
- signal
- information
- epma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 claims description 16
- 238000004453 electron probe microanalysis Methods 0.000 claims 3
- 239000000523 sample Substances 0.000 description 15
- 238000001878 scanning electron micrograph Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18587085U JPH0436050Y2 (enrdf_load_html_response) | 1985-12-02 | 1985-12-02 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18587085U JPH0436050Y2 (enrdf_load_html_response) | 1985-12-02 | 1985-12-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62112847U JPS62112847U (enrdf_load_html_response) | 1987-07-18 |
JPH0436050Y2 true JPH0436050Y2 (enrdf_load_html_response) | 1992-08-26 |
Family
ID=31134901
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18587085U Expired JPH0436050Y2 (enrdf_load_html_response) | 1985-12-02 | 1985-12-02 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0436050Y2 (enrdf_load_html_response) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007015472A1 (ja) * | 2005-08-04 | 2007-02-08 | Sii Nanotechnology Inc. | X線分析装置及び方法 |
-
1985
- 1985-12-02 JP JP18587085U patent/JPH0436050Y2/ja not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007015472A1 (ja) * | 2005-08-04 | 2007-02-08 | Sii Nanotechnology Inc. | X線分析装置及び方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS62112847U (enrdf_load_html_response) | 1987-07-18 |
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